NL7301496A - - Google Patents

Info

Publication number
NL7301496A
NL7301496A NL7301496A NL7301496A NL7301496A NL 7301496 A NL7301496 A NL 7301496A NL 7301496 A NL7301496 A NL 7301496A NL 7301496 A NL7301496 A NL 7301496A NL 7301496 A NL7301496 A NL 7301496A
Authority
NL
Netherlands
Application number
NL7301496A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to NL7301496A priority Critical patent/NL7301496A/xx
Priority to GB123174A priority patent/GB1454641A/en
Priority to DE19742402728 priority patent/DE2402728C3/de
Priority to FR7402881A priority patent/FR2216578B1/fr
Priority to CA191,367A priority patent/CA995825A/en
Publication of NL7301496A publication Critical patent/NL7301496A/xx
Priority to US05/737,733 priority patent/US4100409A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/282Static spectrometers using electrostatic analysers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
NL7301496A 1973-02-02 1973-02-02 NL7301496A (enrdf_load_stackoverflow)

Priority Applications (6)

Application Number Priority Date Filing Date Title
NL7301496A NL7301496A (enrdf_load_stackoverflow) 1973-02-02 1973-02-02
GB123174A GB1454641A (en) 1973-02-02 1974-01-10 Device for analysing a surface layer
DE19742402728 DE2402728C3 (de) 1973-02-02 1974-01-21 Vorrichtung zum Analysieren einer Oberflachenschicht durch Ionenzerstreuung
FR7402881A FR2216578B1 (enrdf_load_stackoverflow) 1973-02-02 1974-01-29
CA191,367A CA995825A (en) 1973-02-02 1974-01-30 Device for anylysing a surface layer by means of ion scattering
US05/737,733 US4100409A (en) 1973-02-02 1976-11-01 Device for analyzing a surface layer by means of ion scattering

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7301496A NL7301496A (enrdf_load_stackoverflow) 1973-02-02 1973-02-02

Publications (1)

Publication Number Publication Date
NL7301496A true NL7301496A (enrdf_load_stackoverflow) 1974-08-06

Family

ID=19818135

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7301496A NL7301496A (enrdf_load_stackoverflow) 1973-02-02 1973-02-02

Country Status (5)

Country Link
CA (1) CA995825A (enrdf_load_stackoverflow)
DE (1) DE2402728C3 (enrdf_load_stackoverflow)
FR (1) FR2216578B1 (enrdf_load_stackoverflow)
GB (1) GB1454641A (enrdf_load_stackoverflow)
NL (1) NL7301496A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4107526A (en) * 1976-03-22 1978-08-15 Minnesota Mining And Manufacturing Company Ion scattering spectrometer with modified bias
DE2856244A1 (de) * 1978-12-27 1980-07-03 Kernforschungsanlage Juelich Elektronenstosspektrometer
DE2922128A1 (de) * 1979-05-31 1980-12-11 Strahlen Umweltforsch Gmbh Ionenquelle fuer einen massenanalysator
JPS6037644A (ja) * 1983-08-10 1985-02-27 Anelva Corp 表面分析装置

Also Published As

Publication number Publication date
FR2216578A1 (enrdf_load_stackoverflow) 1974-08-30
DE2402728C3 (de) 1981-01-15
CA995825A (en) 1976-08-24
GB1454641A (en) 1976-11-03
DE2402728B2 (de) 1980-04-30
FR2216578B1 (enrdf_load_stackoverflow) 1983-08-05
DE2402728A1 (de) 1974-08-08

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Legal Events

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