DE2329181A1 - Einrichtung zum messen einer eigenschaft eines bandmaterials - Google Patents

Einrichtung zum messen einer eigenschaft eines bandmaterials

Info

Publication number
DE2329181A1
DE2329181A1 DE19732329181 DE2329181A DE2329181A1 DE 2329181 A1 DE2329181 A1 DE 2329181A1 DE 19732329181 DE19732329181 DE 19732329181 DE 2329181 A DE2329181 A DE 2329181A DE 2329181 A1 DE2329181 A1 DE 2329181A1
Authority
DE
Germany
Prior art keywords
wavelength
absorption
radiation
property
dipl
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19732329181
Other languages
German (de)
English (en)
Inventor
Robert Beaty Mounsey
Carl Richard Soltesz
Paul Williams
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INFRA SYSTEMS Inc
Original Assignee
INFRA SYSTEMS Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INFRA SYSTEMS Inc filed Critical INFRA SYSTEMS Inc
Publication of DE2329181A1 publication Critical patent/DE2329181A1/de
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE19732329181 1972-06-07 1973-06-07 Einrichtung zum messen einer eigenschaft eines bandmaterials Pending DE2329181A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26069572A 1972-06-07 1972-06-07

Publications (1)

Publication Number Publication Date
DE2329181A1 true DE2329181A1 (de) 1973-12-20

Family

ID=22990219

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19732329181 Pending DE2329181A1 (de) 1972-06-07 1973-06-07 Einrichtung zum messen einer eigenschaft eines bandmaterials

Country Status (4)

Country Link
JP (1) JPS4957859A (enExample)
DE (1) DE2329181A1 (enExample)
FR (1) FR2188836A5 (enExample)
IT (1) IT988911B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0169664A1 (en) * 1984-06-21 1986-01-29 Kabushiki Kaisha Toshiba Apparatus for determining the degree of oxidation of an oxide coating

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52149148A (en) * 1976-06-03 1977-12-12 Aakon Inc Method of and apparatus for measuring thickness of film on sheet
US8050486B2 (en) 2006-05-16 2011-11-01 The Boeing Company System and method for identifying a feature of a workpiece
US9052294B2 (en) * 2006-05-31 2015-06-09 The Boeing Company Method and system for two-dimensional and three-dimensional inspection of a workpiece

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0169664A1 (en) * 1984-06-21 1986-01-29 Kabushiki Kaisha Toshiba Apparatus for determining the degree of oxidation of an oxide coating

Also Published As

Publication number Publication date
IT988911B (it) 1975-04-30
FR2188836A5 (enExample) 1974-01-18
JPS4957859A (enExample) 1974-06-05

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