JPS52149148A - Method of and apparatus for measuring thickness of film on sheet - Google Patents
Method of and apparatus for measuring thickness of film on sheetInfo
- Publication number
- JPS52149148A JPS52149148A JP6414776A JP6414776A JPS52149148A JP S52149148 A JPS52149148 A JP S52149148A JP 6414776 A JP6414776 A JP 6414776A JP 6414776 A JP6414776 A JP 6414776A JP S52149148 A JPS52149148 A JP S52149148A
- Authority
- JP
- Japan
- Prior art keywords
- sheet
- film
- measuring thickness
- measuring
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6414776A JPS52149148A (en) | 1976-06-03 | 1976-06-03 | Method of and apparatus for measuring thickness of film on sheet |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6414776A JPS52149148A (en) | 1976-06-03 | 1976-06-03 | Method of and apparatus for measuring thickness of film on sheet |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS52149148A true JPS52149148A (en) | 1977-12-12 |
Family
ID=13249664
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6414776A Pending JPS52149148A (en) | 1976-06-03 | 1976-06-03 | Method of and apparatus for measuring thickness of film on sheet |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS52149148A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5562303A (en) * | 1978-11-01 | 1980-05-10 | Kanai Hiroyuki | Measuring device for card web unevenness |
JPH04233745A (en) * | 1990-08-09 | 1992-08-21 | Applied Materials Inc | Method and apparatus for measurement in situ of thickness of thin film deposited on wafer |
JP2002309260A (en) * | 2001-04-09 | 2002-10-23 | Nippon Steel Chem Co Ltd | Cutting method for coke oven port and apparatus therfor |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS48104568A (en) * | 1972-04-14 | 1973-12-27 | ||
JPS4957859A (en) * | 1972-06-07 | 1974-06-05 | ||
JPS49134351A (en) * | 1973-04-25 | 1974-12-24 |
-
1976
- 1976-06-03 JP JP6414776A patent/JPS52149148A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS48104568A (en) * | 1972-04-14 | 1973-12-27 | ||
JPS4957859A (en) * | 1972-06-07 | 1974-06-05 | ||
JPS49134351A (en) * | 1973-04-25 | 1974-12-24 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5562303A (en) * | 1978-11-01 | 1980-05-10 | Kanai Hiroyuki | Measuring device for card web unevenness |
JPS6125082B2 (en) * | 1978-11-01 | 1986-06-13 | Kanai Hiroyuki | |
JPH04233745A (en) * | 1990-08-09 | 1992-08-21 | Applied Materials Inc | Method and apparatus for measurement in situ of thickness of thin film deposited on wafer |
JPH07101704B2 (en) * | 1990-08-09 | 1995-11-01 | アプライド マテリアルズ インコーポレイテッド | Method and apparatus for in-situ measurement of thin film thickness deposited on a wafer |
JP2002309260A (en) * | 2001-04-09 | 2002-10-23 | Nippon Steel Chem Co Ltd | Cutting method for coke oven port and apparatus therfor |
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