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VEB KOMBINAT ZENTRONIK X 5230 SOEMMERDA
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VEB KOMBINAT ZENTRONIK X 5230 SOEMMERDA
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Application filed by VEB KOMBINAT ZENTRONIK X 5230 SOEMMERDAfiledCriticalVEB KOMBINAT ZENTRONIK X 5230 SOEMMERDA
Publication of DE2324234A1publicationCriticalpatent/DE2324234A1/de
Publication of DE2324234B2publicationCriticalpatent/DE2324234B2/de
G06V10/00—Arrangements for image or video recognition or understanding
G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
G06V10/993—Evaluation of the quality of the acquired pattern
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Engineering & Computer Science
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DE2324234A1972-06-151973-05-14Verfahren zur Prüfung von Schriftzeichen sowie Vorrichtung und Auswerteschaltung zur Durchführung des Verfahrens
GrantedDE2324234B2
(de)
Verfahren und Vorrichtung zur Erkennung von Fremdkörpern und Oberflächendefekten auf einer transparenten Vorlage sowie zur Korrektur von dadurch verursachten Bildfehlern einer Abbildung der Vorlage
Legal Events
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C3
Grant after two publication steps (3rd publication)