DE2255446A1 - Interferometer - Google Patents

Interferometer

Info

Publication number
DE2255446A1
DE2255446A1 DE2255446A DE2255446A DE2255446A1 DE 2255446 A1 DE2255446 A1 DE 2255446A1 DE 2255446 A DE2255446 A DE 2255446A DE 2255446 A DE2255446 A DE 2255446A DE 2255446 A1 DE2255446 A1 DE 2255446A1
Authority
DE
Germany
Prior art keywords
signal
signals
original
component
phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE2255446A
Other languages
German (de)
English (en)
Inventor
John J Russo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Biosystems Inc
Original Assignee
Perkin Elmer Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Perkin Elmer Corp filed Critical Perkin Elmer Corp
Publication of DE2255446A1 publication Critical patent/DE2255446A1/de
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02078Caused by ambiguity
    • G01B9/02079Quadrature detection, i.e. detecting relatively phase-shifted signals
    • G01B9/02081Quadrature detection, i.e. detecting relatively phase-shifted signals simultaneous quadrature detection, e.g. by spatial phase shifting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45Multiple detectors for detecting interferometer signals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
DE2255446A 1971-11-15 1972-11-11 Interferometer Pending DE2255446A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US19858171A 1971-11-15 1971-11-15

Publications (1)

Publication Number Publication Date
DE2255446A1 true DE2255446A1 (de) 1973-05-24

Family

ID=22733971

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2255446A Pending DE2255446A1 (de) 1971-11-15 1972-11-11 Interferometer

Country Status (6)

Country Link
US (1) US3771875A (OSRAM)
JP (1) JPS4862456A (OSRAM)
CH (1) CH546946A (OSRAM)
DE (1) DE2255446A1 (OSRAM)
FR (1) FR2160682B1 (OSRAM)
IT (1) IT970500B (OSRAM)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5081577A (OSRAM) * 1973-11-22 1975-07-02
JPS5122463A (OSRAM) * 1974-08-17 1976-02-23 Kurashiki Boseki Kk
WO1979000506A1 (en) * 1978-01-13 1979-08-09 Nat Res Dev Interferometer systems
US4255048A (en) * 1979-04-06 1981-03-10 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Direction sensitive laser velocimeter
FR2483609A1 (fr) * 1980-05-30 1981-12-04 Balasubramanian N Dispositif et procede de determination interferometrique d'une difference de longueur de chemin optique
JPS57127331A (en) * 1981-01-30 1982-08-07 Anritsu Corp Waveform shaping device
US4702603A (en) * 1985-07-23 1987-10-27 Cmx Systems, Inc. Optical phase decoder for interferometers
GB8718803D0 (en) * 1987-08-07 1987-09-16 Renishaw Plc Optical detection system
US5638396A (en) * 1994-09-19 1997-06-10 Textron Systems Corporation Laser ultrasonics-based material analysis system and method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3601490A (en) * 1966-12-30 1971-08-24 Keuffel & Esser Co Laser interferometer

Also Published As

Publication number Publication date
CH546946A (de) 1974-03-15
US3771875A (en) 1973-11-13
JPS4862456A (OSRAM) 1973-08-31
IT970500B (it) 1974-04-10
FR2160682A1 (OSRAM) 1973-06-29
FR2160682B1 (OSRAM) 1974-08-19

Similar Documents

Publication Publication Date Title
DE2237564C3 (de) Verfahren zur berührungslosen optischen Messung von Bewegungsgrößen, wie Geschwindigkeiten und Verschiebestrecken und Einrichtung zur Durchführung des Verfahrens
DE4201511B4 (de) Positionsdetektor und Verfahren zur Positionsmessung
DE3306709C2 (OSRAM)
DE2127483A1 (de) Verfahren zur interferentiellen Messung von Langen, Winkeln, Gangunter schieden oder Geschwindigkeiten
DE4033013C2 (de) Polarisationsoptische Anordnung
DE2240968A1 (de) Optisches verfahren zur messung der relativen verschiebung eines beugungsgitters sowie einrichtungen zu seiner durchfuehrung
DE2714236A1 (de) Vorrichtung zur optischen mehrfachspeicherung
DE2122920C2 (de) Verfahren zum Messen von Drehgeschwindigkeiten und Einrichtung zum Durchführen des Verfahrens
DE2636211B1 (de) Interferometrisches verfahren zur abstands- oder ebenheitsmessung
DE2027869C3 (de) Verfahren und Anordnung zur Phasenstabilisierung
DE2255446A1 (de) Interferometer
DE69106289T2 (de) Optischer Faserkreisel.
EP0491749B1 (de) Vorrichtung zur absoluten zweidimensionalen positionsmessung
DE1614662C3 (de) Ringlaser
DE2941618C2 (OSRAM)
DE69421877T2 (de) Lasersonde für Geschwindigkeits- und Neigungsmessung
EP3477264B1 (de) Optische positionsmesseinrichtung
DE4224190A1 (de) Faseroptischer Stromsensor
DE69202780T2 (de) Verfahren und Vorrichtung für interferometrische Absolutmessungen physikalischer Grössen.
DE2401475A1 (de) Verfahren zur messung der relativlageaenderung
DE3338583A1 (de) Verfahren und anordnung zur optischen messung von abstandsaenderungen
DE2634210C2 (de) Interferometer
DE2111936C3 (de) Interferometrische Anordnung zur Lieferung verschachtelter, gegeneinander phasenverschobener elektrischer Signale
DE1773400A1 (de) Verfahren und Einrichtung zur interferometrischen Messung von mehreren Laengen mit monochromatischen Lichtbuendeln
DE3114355A1 (de) "optische anordnung zum messen der schwingungen eines gegenstandes mit reflektierender oberflaeche"