IT970500B - Interferometro - Google Patents

Interferometro

Info

Publication number
IT970500B
IT970500B IT31660/72A IT3166072A IT970500B IT 970500 B IT970500 B IT 970500B IT 31660/72 A IT31660/72 A IT 31660/72A IT 3166072 A IT3166072 A IT 3166072A IT 970500 B IT970500 B IT 970500B
Authority
IT
Italy
Prior art keywords
interferometer
Prior art date
Application number
IT31660/72A
Other languages
English (en)
Original Assignee
Perkin Elmer Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Perkin Elmer Corp filed Critical Perkin Elmer Corp
Application granted granted Critical
Publication of IT970500B publication Critical patent/IT970500B/it

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02078Caused by ambiguity
    • G01B9/02079Quadrature detection, i.e. detecting relatively phase-shifted signals
    • G01B9/02081Quadrature detection, i.e. detecting relatively phase-shifted signals simultaneous quadrature detection, e.g. by spatial phase shifting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45Multiple detectors for detecting interferometer signals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
IT31660/72A 1971-11-15 1972-11-15 Interferometro IT970500B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US19858171A 1971-11-15 1971-11-15

Publications (1)

Publication Number Publication Date
IT970500B true IT970500B (it) 1974-04-10

Family

ID=22733971

Family Applications (1)

Application Number Title Priority Date Filing Date
IT31660/72A IT970500B (it) 1971-11-15 1972-11-15 Interferometro

Country Status (6)

Country Link
US (1) US3771875A (it)
JP (1) JPS4862456A (it)
CH (1) CH546946A (it)
DE (1) DE2255446A1 (it)
FR (1) FR2160682B1 (it)
IT (1) IT970500B (it)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5081577A (it) * 1973-11-22 1975-07-02
JPS5122463A (it) * 1974-08-17 1976-02-23 Kurashiki Boseki Kk
JPS6024404B2 (ja) * 1978-01-13 1985-06-12 ナシヨナル・リサ−チ・デイベロツプメント・コ−ポレイシヨン 干渉計システム
US4255048A (en) * 1979-04-06 1981-03-10 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Direction sensitive laser velocimeter
FR2483609A1 (fr) * 1980-05-30 1981-12-04 Balasubramanian N Dispositif et procede de determination interferometrique d'une difference de longueur de chemin optique
JPS57127331A (en) * 1981-01-30 1982-08-07 Anritsu Corp Waveform shaping device
US4702603A (en) * 1985-07-23 1987-10-27 Cmx Systems, Inc. Optical phase decoder for interferometers
GB8718803D0 (en) * 1987-08-07 1987-09-16 Renishaw Plc Optical detection system
US5604592A (en) * 1994-09-19 1997-02-18 Textron Defense Systems, Division Of Avco Corporation Laser ultrasonics-based material analysis system and method using matched filter processing

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3601490A (en) * 1966-12-30 1971-08-24 Keuffel & Esser Co Laser interferometer

Also Published As

Publication number Publication date
FR2160682A1 (it) 1973-06-29
FR2160682B1 (it) 1974-08-19
DE2255446A1 (de) 1973-05-24
US3771875A (en) 1973-11-13
CH546946A (de) 1974-03-15
JPS4862456A (it) 1973-08-31

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