DE2155803C3 - Verfahren zum Herstellen einer integrierten Schaltung - Google Patents

Verfahren zum Herstellen einer integrierten Schaltung

Info

Publication number
DE2155803C3
DE2155803C3 DE2155803A DE2155803A DE2155803C3 DE 2155803 C3 DE2155803 C3 DE 2155803C3 DE 2155803 A DE2155803 A DE 2155803A DE 2155803 A DE2155803 A DE 2155803A DE 2155803 C3 DE2155803 C3 DE 2155803C3
Authority
DE
Germany
Prior art keywords
integrated circuit
formats
format
mask
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2155803A
Other languages
German (de)
English (en)
Other versions
DE2155803B2 (de
DE2155803A1 (de
Inventor
Jeffrey George Wappinger Falls Koens
Robert Donald Hopewell Junction Merillat
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE2155803A1 publication Critical patent/DE2155803A1/de
Publication of DE2155803B2 publication Critical patent/DE2155803B2/de
Application granted granted Critical
Publication of DE2155803C3 publication Critical patent/DE2155803C3/de
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/10Integrated device layouts
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/942Masking
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/49004Electrical device making including measuring or testing of device or component part
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/49117Conductor or circuit manufacturing

Landscapes

  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Hardware Redundancy (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Image Processing (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
DE2155803A 1970-11-23 1971-11-10 Verfahren zum Herstellen einer integrierten Schaltung Expired DE2155803C3 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US9197270A 1970-11-23 1970-11-23

Publications (3)

Publication Number Publication Date
DE2155803A1 DE2155803A1 (de) 1972-05-25
DE2155803B2 DE2155803B2 (de) 1979-09-27
DE2155803C3 true DE2155803C3 (de) 1980-07-17

Family

ID=22230560

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2155803A Expired DE2155803C3 (de) 1970-11-23 1971-11-10 Verfahren zum Herstellen einer integrierten Schaltung

Country Status (5)

Country Link
US (1) US3698072A (OSRAM)
JP (1) JPS5135352B1 (OSRAM)
DE (1) DE2155803C3 (OSRAM)
FR (1) FR2115167B1 (OSRAM)
GB (1) GB1302630A (OSRAM)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5465217A (en) * 1993-08-16 1995-11-07 Motorola, Inc. Method for automatic tab artwork building
US6760640B2 (en) * 2002-03-14 2004-07-06 Photronics, Inc. Automated manufacturing system and method for processing photomasks
US7640529B2 (en) * 2002-07-30 2009-12-29 Photronics, Inc. User-friendly rule-based system and method for automatically generating photomask orders
US7669167B2 (en) * 2002-07-30 2010-02-23 Photronics, Inc. Rule based system and method for automatically generating photomask orders by conditioning information from a customer's computer system
US6842881B2 (en) * 2002-07-30 2005-01-11 Photronics, Inc. Rule based system and method for automatically generating photomask orders in a specified order format
US20060122724A1 (en) * 2004-12-07 2006-06-08 Photoronics, Inc. 15 Secor Road P.O. Box 5226 Brookfield, Connecticut 06804 System and method for automatically generating a tooling specification using a logical operations utility that can be used to generate a photomask order

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3461547A (en) * 1965-07-13 1969-08-19 United Aircraft Corp Process for making and testing semiconductive devices
US3615466A (en) * 1968-11-19 1971-10-26 Ibm Process of producing an array of integrated circuits on semiconductor substrate

Also Published As

Publication number Publication date
FR2115167B1 (OSRAM) 1976-06-04
DE2155803B2 (de) 1979-09-27
FR2115167A1 (OSRAM) 1972-07-07
DE2155803A1 (de) 1972-05-25
GB1302630A (OSRAM) 1973-01-10
JPS5135352B1 (OSRAM) 1976-10-01
US3698072A (en) 1972-10-17

Similar Documents

Publication Publication Date Title
DE2311034C2 (de) Verfahren zum Prüfen eines integrierte logische Verknüpfungs- und Speicherglieder enthaltenden Halbleiterchips
DE3013833C2 (de) Vorrichtung zur Prüfung eines auf einem Gegenstand befindlichen Musters auf Fehler
DE3126721A1 (de) "datenverarbeitungsgeraet mit einem programmierbaren festspeicher"
DE69029539T2 (de) Verfahren und Gerät mit Block-Kode-kodierter Fehlerkorrektur
DE2715029C3 (de) Schaltungsanordnung zur Diagnose oder Prüfung von funktionellen Hardware-Fehlern in einer digitalen EDV-Anlage
DE2155803C3 (de) Verfahren zum Herstellen einer integrierten Schaltung
DE3411015C2 (OSRAM)
DE1937249A1 (de) Selbstpruefende Fehlererkennungsschaltung
DE1250163B (de) Einrichtung zur Paritätsprüfung von Speicherworten
DE4005393A1 (de) Einrichtung zur signaltechnisch sicheren darstellung eines meldebildes
DE1962532A1 (de) Korrekturvorrichtung fuer Liniengraphik
DE3440680A1 (de) Verfahren und vorrichtung zur dezimaldivision
DE2933830C2 (de) Programmierbarer Polynomgenerator
DE1205743B (de) Verfahren und Vorrichtung zur maschinellen Zeichenerkennung
DE2559258A1 (de) Verfahren zum zeilenausschliessen in druckwerken durch vergroessern der wortabstaende
DE3443272A1 (de) Verfahren und anordnung zur fehlererkennung in datenverarbeitungsanlagen
DE3638256A1 (de) Schaltung zur erzeugung kuenstlicher fehler fuer eine datenverarbeitungsanlage
DE19851690A1 (de) Residuum-Prüfung von Datenumwandlungen
DE2225665C3 (de) Verfahren zum Herstellen einer integrierten Schaltung
DE2710479A1 (de) Geraet und verfahren zur verbesserung des stoerschutzes von steuersignalen in elektrostatographischen verarbeitungsgeraeten
DE1424756B2 (de) Schaltungsanordnung zum fehlergesicherten Einführen oder Wiedereinführer, von Programmen in den Hauptspeicher einer datenverarbeitenden Anlage
EP0843256B1 (de) Nachbildung eines Bedingungscodes bei Codetransformationen
EP0560342B1 (de) Verfahren zum Untersuchen des Ablaufs eines in einer Hardware-Beschreibungssprache geschriebenen Programms
DE2210204B2 (de) Optisches KartenlesegeräL
DE69525429T2 (de) Testen von Daten

Legal Events

Date Code Title Description
OD Request for examination
C3 Grant after two publication steps (3rd publication)
8339 Ceased/non-payment of the annual fee