DE2153102A1 - Prüfgerät - Google Patents
PrüfgerätInfo
- Publication number
- DE2153102A1 DE2153102A1 DE19712153102 DE2153102A DE2153102A1 DE 2153102 A1 DE2153102 A1 DE 2153102A1 DE 19712153102 DE19712153102 DE 19712153102 DE 2153102 A DE2153102 A DE 2153102A DE 2153102 A1 DE2153102 A1 DE 2153102A1
- Authority
- DE
- Germany
- Prior art keywords
- circuit
- signal
- signals
- switch
- oscillator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims description 112
- 239000000872 buffer Substances 0.000 claims description 269
- 238000010615 ring circuit Methods 0.000 claims description 81
- 230000000007 visual effect Effects 0.000 claims description 22
- 230000003287 optical effect Effects 0.000 claims description 11
- 230000001934 delay Effects 0.000 claims description 6
- 230000000717 retained effect Effects 0.000 claims description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 35
- 230000003111 delayed effect Effects 0.000 description 32
- 230000000670 limiting effect Effects 0.000 description 32
- 238000000034 method Methods 0.000 description 29
- 230000001960 triggered effect Effects 0.000 description 24
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 20
- 229910052710 silicon Inorganic materials 0.000 description 20
- 239000010703 silicon Substances 0.000 description 20
- 238000005070 sampling Methods 0.000 description 18
- 230000008569 process Effects 0.000 description 17
- 239000003990 capacitor Substances 0.000 description 16
- 230000001052 transient effect Effects 0.000 description 16
- 230000006870 function Effects 0.000 description 12
- 238000005259 measurement Methods 0.000 description 11
- 230000008859 change Effects 0.000 description 10
- 230000007704 transition Effects 0.000 description 10
- 230000000994 depressogenic effect Effects 0.000 description 9
- 238000004458 analytical method Methods 0.000 description 7
- 239000000523 sample Substances 0.000 description 7
- 230000003068 static effect Effects 0.000 description 7
- 238000012544 monitoring process Methods 0.000 description 6
- 230000003252 repetitive effect Effects 0.000 description 6
- 230000010349 pulsation Effects 0.000 description 5
- 230000004044 response Effects 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 239000004020 conductor Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005401 electroluminescence Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000002829 reductive effect Effects 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 241000282887 Suidae Species 0.000 description 2
- 230000036626 alertness Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 230000000881 depressing effect Effects 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 230000000977 initiatory effect Effects 0.000 description 2
- 230000002452 interceptive effect Effects 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- 238000012552 review Methods 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 238000013024 troubleshooting Methods 0.000 description 2
- 230000016776 visual perception Effects 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 238000010418 babysitting Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000012217 deletion Methods 0.000 description 1
- 230000037430 deletion Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000008447 perception Effects 0.000 description 1
- 239000013641 positive control Substances 0.000 description 1
- 230000036544 posture Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
- 238000012549 training Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/04—Arrangements for displaying electric variables or waveforms for producing permanent records
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
- G01R19/16595—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window) with multi level indication
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Measuring Frequencies, Analyzing Spectra (AREA)
- Measurement Of Current Or Voltage (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US8829870A | 1970-11-10 | 1970-11-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE2153102A1 true DE2153102A1 (de) | 1972-05-18 |
Family
ID=22210561
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19712153102 Pending DE2153102A1 (de) | 1970-11-10 | 1971-10-25 | Prüfgerät |
Country Status (4)
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51127806A (en) * | 1975-04-28 | 1976-11-08 | Murata Manufacturing Co | Screen printing plate |
JPS5258606A (en) * | 1975-11-07 | 1977-05-14 | Hitachi Ltd | Printing metal mask |
JPS5361406A (en) * | 1976-11-10 | 1978-06-01 | Matsushita Electric Ind Co Ltd | Gravure plate |
US4507740A (en) * | 1981-09-08 | 1985-03-26 | Grumman Aerospace Corporation | Programmable signal analyzer |
KR900002280Y1 (ko) * | 1985-04-23 | 1990-03-17 | 미쓰비시전기주식회사 | 승객 콘베이어 장치 |
DE102006031027A1 (de) * | 2006-07-05 | 2008-01-24 | Atmel Germany Gmbh | Verfahren zur Funktionskontrolle von wenigstens einem analogen Schaltungsblock |
-
1971
- 1971-09-16 FR FR7133823A patent/FR2113837B1/fr not_active Expired
- 1971-09-17 GB GB4334771A patent/GB1319189A/en not_active Expired
- 1971-10-25 DE DE19712153102 patent/DE2153102A1/de active Pending
- 1971-10-25 JP JP8402471A patent/JPS4710294A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
GB1319189A (en) | 1973-06-06 |
FR2113837A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1972-06-30 |
JPS4710294A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1972-05-24 |
FR2113837B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1977-04-22 |
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