DE2040063A1 - Testgeraet - Google Patents
TestgeraetInfo
- Publication number
- DE2040063A1 DE2040063A1 DE19702040063 DE2040063A DE2040063A1 DE 2040063 A1 DE2040063 A1 DE 2040063A1 DE 19702040063 DE19702040063 DE 19702040063 DE 2040063 A DE2040063 A DE 2040063A DE 2040063 A1 DE2040063 A1 DE 2040063A1
- Authority
- DE
- Germany
- Prior art keywords
- signal
- circuit
- output
- input
- output signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims description 158
- 230000006870 function Effects 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 6
- 238000013500 data storage Methods 0.000 claims 3
- 238000007493 shaping process Methods 0.000 description 11
- 238000011990 functional testing Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 6
- 238000005070 sampling Methods 0.000 description 5
- 239000011159 matrix material Substances 0.000 description 4
- 238000004590 computer program Methods 0.000 description 3
- 230000005669 field effect Effects 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 230000003134 recirculating effect Effects 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000011056 performance test Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 241001163743 Perlodes Species 0.000 description 1
- 238000013142 basic testing Methods 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2644—Adaptations of individual semiconductor devices to facilitate the testing thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US85190369A | 1969-08-21 | 1969-08-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2040063A1 true DE2040063A1 (de) | 1971-03-18 |
Family
ID=25312013
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19702040063 Pending DE2040063A1 (de) | 1969-08-21 | 1970-08-12 | Testgeraet |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US3621387A (enExample) |
| DE (1) | DE2040063A1 (enExample) |
| FR (1) | FR2056316A5 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2481461A1 (fr) * | 1980-04-25 | 1981-10-30 | Radiotechnique Compelec | Dispositif programmable, pour tester les durees d'un signal electrique, notamment d'impulsions |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3714571A (en) * | 1970-03-04 | 1973-01-30 | Digital General Corp | Apparatus and method for testing electrical systems having pulse signal responses |
| US3772595A (en) * | 1971-03-19 | 1973-11-13 | Teradyne Inc | Method and apparatus for testing a digital logic fet by monitoring currents the device develops in response to input signals |
| JPS5425787B2 (enExample) * | 1972-04-25 | 1979-08-30 | ||
| US3916306A (en) * | 1973-09-06 | 1975-10-28 | Ibm | Method and apparatus for testing high circuit density devices |
| US3883801A (en) * | 1973-11-07 | 1975-05-13 | Bell Telephone Labor Inc | Fault testing of logic circuits |
| US3883802A (en) * | 1973-12-14 | 1975-05-13 | Ibm | Process for stress testing FET gates without the use of test patterns |
| US4000460A (en) * | 1974-07-01 | 1976-12-28 | Xerox Corporation | Digital circuit module test system |
| CA1044760A (en) * | 1974-10-09 | 1978-12-19 | Lim C. Hwa | Methods and equipment for testing reflection points of transmission lines |
| US4005361A (en) * | 1975-11-04 | 1977-01-25 | Lockheed Electronics Co., Inc. | Performance assurance apparatus for phased antenna array drives |
| US4009437A (en) * | 1976-03-31 | 1977-02-22 | Burroughs Corporation | Net analyzer for electronic circuits |
| JPS5361374A (en) * | 1976-11-15 | 1978-06-01 | Shin Shirasuna Electric Corp | Method of measuring electrical analog quantity |
| US4176780A (en) * | 1977-12-06 | 1979-12-04 | Ncr Corporation | Method and apparatus for testing printed circuit boards |
| US4174805A (en) * | 1978-04-13 | 1979-11-20 | Ncr Corporation | Method and apparatus for transmitting data to a predefined destination bus |
| US4216539A (en) * | 1978-05-05 | 1980-08-05 | Zehntel, Inc. | In-circuit digital tester |
| USRE31828E (en) * | 1978-05-05 | 1985-02-05 | Zehntel, Inc. | In-circuit digital tester |
| JPS5618766A (en) * | 1979-07-26 | 1981-02-21 | Fujitsu Ltd | Testing apparatus for logic circuit |
| US4290137A (en) * | 1979-12-26 | 1981-09-15 | Honeywell Information Systems Inc. | Apparatus and method of testing CML circuits |
| WO1982002096A1 (en) * | 1980-12-15 | 1982-06-24 | Corp Ivac | Electrical monitoring system |
| FR2613563B1 (fr) * | 1987-04-03 | 1994-04-08 | Commissariat A Energie Atomique | Dispositif de mesure en temps reel de la sensibilite et/ou de la linearite d'un recepteur optique |
| US5231637A (en) * | 1988-01-27 | 1993-07-27 | Oki Electric Industry Co., Ltd. | Apparatus for testing a PLA by measuring a current consumed by the PLO when activated with known codes |
| DE19633922B4 (de) * | 1996-08-22 | 2006-02-09 | Siemens Ag | Verfahren und Einrichtung zum Testen Digitalsignale verarbeitender integrierter Schaltungen |
| US6774656B2 (en) * | 2000-11-01 | 2004-08-10 | International Business Machines Corporation | Self-test for leakage current of driver/receiver stages |
| US8935297B2 (en) * | 2001-12-10 | 2015-01-13 | Patrick J. Coyne | Method and system for the management of professional services project information |
| US7672452B2 (en) * | 2002-05-03 | 2010-03-02 | General Instrument Corporation | Secure scan |
| JP5711889B2 (ja) * | 2010-01-27 | 2015-05-07 | スパンション エルエルシー | リコンフィギュラブル回路および半導体集積回路 |
| US8669828B1 (en) * | 2010-10-21 | 2014-03-11 | Altera Corporation | Decoupling capacitor control circuitry |
| WO2017058947A1 (en) * | 2015-09-28 | 2017-04-06 | Red Balloon Security, Inc. | Injectable hardware and software attestation of sensory input data |
| US10949591B1 (en) * | 2018-11-20 | 2021-03-16 | Synopsys, Inc. | Hardware based state signature generation and check for test and debug of semiconductor circuit functionality |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3219927A (en) * | 1958-09-15 | 1965-11-23 | North American Aviation Inc | Automatic functional test equipment utilizing digital programmed storage means |
-
1969
- 1969-08-21 US US851903A patent/US3621387A/en not_active Expired - Lifetime
-
1970
- 1970-06-23 FR FR7023251A patent/FR2056316A5/fr not_active Expired
- 1970-08-12 DE DE19702040063 patent/DE2040063A1/de active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2481461A1 (fr) * | 1980-04-25 | 1981-10-30 | Radiotechnique Compelec | Dispositif programmable, pour tester les durees d'un signal electrique, notamment d'impulsions |
Also Published As
| Publication number | Publication date |
|---|---|
| US3621387A (en) | 1971-11-16 |
| FR2056316A5 (enExample) | 1971-05-14 |
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