FR2056316A5 - - Google Patents

Info

Publication number
FR2056316A5
FR2056316A5 FR7023251A FR7023251A FR2056316A5 FR 2056316 A5 FR2056316 A5 FR 2056316A5 FR 7023251 A FR7023251 A FR 7023251A FR 7023251 A FR7023251 A FR 7023251A FR 2056316 A5 FR2056316 A5 FR 2056316A5
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7023251A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Arris Technology Inc
Original Assignee
Arris Technology Inc
General Instrument Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arris Technology Inc, General Instrument Corp filed Critical Arris Technology Inc
Application granted granted Critical
Publication of FR2056316A5 publication Critical patent/FR2056316A5/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2644—Adaptations of individual semiconductor devices to facilitate the testing thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
FR7023251A 1969-08-21 1970-06-23 Expired FR2056316A5 (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US85190369A 1969-08-21 1969-08-21

Publications (1)

Publication Number Publication Date
FR2056316A5 true FR2056316A5 (enExample) 1971-05-14

Family

ID=25312013

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7023251A Expired FR2056316A5 (enExample) 1969-08-21 1970-06-23

Country Status (3)

Country Link
US (1) US3621387A (enExample)
DE (1) DE2040063A1 (enExample)
FR (1) FR2056316A5 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2481461A1 (fr) * 1980-04-25 1981-10-30 Radiotechnique Compelec Dispositif programmable, pour tester les durees d'un signal electrique, notamment d'impulsions
FR2613563A1 (fr) * 1987-04-03 1988-10-07 Commissariat Energie Atomique Dispositif de mesure en temps reel de la sensibilite et/ou de la linearite d'un recepteur optique

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3714571A (en) * 1970-03-04 1973-01-30 Digital General Corp Apparatus and method for testing electrical systems having pulse signal responses
US3772595A (en) * 1971-03-19 1973-11-13 Teradyne Inc Method and apparatus for testing a digital logic fet by monitoring currents the device develops in response to input signals
JPS5425787B2 (enExample) * 1972-04-25 1979-08-30
US3916306A (en) * 1973-09-06 1975-10-28 Ibm Method and apparatus for testing high circuit density devices
US3883801A (en) * 1973-11-07 1975-05-13 Bell Telephone Labor Inc Fault testing of logic circuits
US3883802A (en) * 1973-12-14 1975-05-13 Ibm Process for stress testing FET gates without the use of test patterns
US4000460A (en) * 1974-07-01 1976-12-28 Xerox Corporation Digital circuit module test system
CA1044760A (en) * 1974-10-09 1978-12-19 Lim C. Hwa Methods and equipment for testing reflection points of transmission lines
US4005361A (en) * 1975-11-04 1977-01-25 Lockheed Electronics Co., Inc. Performance assurance apparatus for phased antenna array drives
US4009437A (en) * 1976-03-31 1977-02-22 Burroughs Corporation Net analyzer for electronic circuits
JPS5361374A (en) * 1976-11-15 1978-06-01 Shin Shirasuna Electric Corp Method of measuring electrical analog quantity
US4176780A (en) * 1977-12-06 1979-12-04 Ncr Corporation Method and apparatus for testing printed circuit boards
US4174805A (en) * 1978-04-13 1979-11-20 Ncr Corporation Method and apparatus for transmitting data to a predefined destination bus
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
USRE31828E (en) * 1978-05-05 1985-02-05 Zehntel, Inc. In-circuit digital tester
JPS5618766A (en) * 1979-07-26 1981-02-21 Fujitsu Ltd Testing apparatus for logic circuit
US4290137A (en) * 1979-12-26 1981-09-15 Honeywell Information Systems Inc. Apparatus and method of testing CML circuits
WO1982002096A1 (en) * 1980-12-15 1982-06-24 Corp Ivac Electrical monitoring system
US5231637A (en) * 1988-01-27 1993-07-27 Oki Electric Industry Co., Ltd. Apparatus for testing a PLA by measuring a current consumed by the PLO when activated with known codes
DE19633922B4 (de) * 1996-08-22 2006-02-09 Siemens Ag Verfahren und Einrichtung zum Testen Digitalsignale verarbeitender integrierter Schaltungen
US6774656B2 (en) * 2000-11-01 2004-08-10 International Business Machines Corporation Self-test for leakage current of driver/receiver stages
US8935297B2 (en) * 2001-12-10 2015-01-13 Patrick J. Coyne Method and system for the management of professional services project information
US7672452B2 (en) * 2002-05-03 2010-03-02 General Instrument Corporation Secure scan
JP5711889B2 (ja) * 2010-01-27 2015-05-07 スパンション エルエルシー リコンフィギュラブル回路および半導体集積回路
US8669828B1 (en) * 2010-10-21 2014-03-11 Altera Corporation Decoupling capacitor control circuitry
WO2017058947A1 (en) * 2015-09-28 2017-04-06 Red Balloon Security, Inc. Injectable hardware and software attestation of sensory input data
US10949591B1 (en) * 2018-11-20 2021-03-16 Synopsys, Inc. Hardware based state signature generation and check for test and debug of semiconductor circuit functionality

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3219927A (en) * 1958-09-15 1965-11-23 North American Aviation Inc Automatic functional test equipment utilizing digital programmed storage means

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2481461A1 (fr) * 1980-04-25 1981-10-30 Radiotechnique Compelec Dispositif programmable, pour tester les durees d'un signal electrique, notamment d'impulsions
FR2613563A1 (fr) * 1987-04-03 1988-10-07 Commissariat Energie Atomique Dispositif de mesure en temps reel de la sensibilite et/ou de la linearite d'un recepteur optique
EP0289377A1 (fr) * 1987-04-03 1988-11-02 Commissariat A L'energie Atomique Dispositif de mesure en temps réel de la sensibilité et/ou de la linéarité d'un récepteur optique

Also Published As

Publication number Publication date
US3621387A (en) 1971-11-16
DE2040063A1 (de) 1971-03-18

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Legal Events

Date Code Title Description
ST Notification of lapse