DE19781735T1 - Integriertes Gerät zum kapazitiven Messen von Nanometerabständen - Google Patents
Integriertes Gerät zum kapazitiven Messen von NanometerabständenInfo
- Publication number
- DE19781735T1 DE19781735T1 DE19781735T DE19781735T DE19781735T1 DE 19781735 T1 DE19781735 T1 DE 19781735T1 DE 19781735 T DE19781735 T DE 19781735T DE 19781735 T DE19781735 T DE 19781735T DE 19781735 T1 DE19781735 T1 DE 19781735T1
- Authority
- DE
- Germany
- Prior art keywords
- integrated device
- capacitive measurement
- nanometer distances
- nanometer
- distances
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/24—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance
- G01D5/241—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance by relative movement of capacitor electrodes
- G01D5/2417—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance by relative movement of capacitor electrodes by varying separation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/13—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by measuring the force required to restore a proofmass subjected to inertial forces to a null position
- G01P15/131—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by measuring the force required to restore a proofmass subjected to inertial forces to a null position with electrostatic counterbalancing means
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SI9600141A SI9600141B (sl) | 1996-04-30 | 1996-04-30 | Integriran kapacitivni merilnik nanometrijskih razdalj |
PCT/SI1997/000016 WO1997041406A1 (en) | 1996-04-30 | 1997-04-30 | Integrated device for capacitive measuring of nanometer distances |
Publications (1)
Publication Number | Publication Date |
---|---|
DE19781735T1 true DE19781735T1 (de) | 1999-04-08 |
Family
ID=20431837
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19781735T Pending DE19781735T1 (de) | 1996-04-30 | 1997-04-30 | Integriertes Gerät zum kapazitiven Messen von Nanometerabständen |
DE19781735A Expired - Fee Related DE19781735B4 (de) | 1996-04-30 | 1997-04-30 | Integriertes Gerät zum kapazitiven Messen von Nanometerabständen |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19781735A Expired - Fee Related DE19781735B4 (de) | 1996-04-30 | 1997-04-30 | Integriertes Gerät zum kapazitiven Messen von Nanometerabständen |
Country Status (5)
Country | Link |
---|---|
US (1) | US6323660B1 (de) |
AU (1) | AU2420197A (de) |
DE (2) | DE19781735T1 (de) |
SI (1) | SI9600141B (de) |
WO (1) | WO1997041406A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10122912A1 (de) * | 2001-05-11 | 2002-11-21 | Infineon Technologies Ag | Vorrichtung und Verfahren zum Erzeugen einer vorbestimmten Positionsbeziehung zweier zueinander beweglicher Elektroden |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6828800B2 (en) * | 2000-12-14 | 2004-12-07 | Yeda Research And Development Co. Ltd. | Single-molecule detector |
US7015715B2 (en) * | 2003-03-24 | 2006-03-21 | Indigo Systems Corporation | Hybrid gap measurement circuit |
US7492167B2 (en) * | 2003-11-05 | 2009-02-17 | Yeda Research And Development Co. Ltd. | Method and device for monitoring and controlling fluid locomotion |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB612973A (en) | 1946-06-12 | 1948-11-19 | Whessoe Ltd | Improvements in gas holders |
US4539835A (en) * | 1983-10-28 | 1985-09-10 | Control Data Corporation | Calibration apparatus for capacitance height gauges |
FR2578323B1 (fr) * | 1985-03-01 | 1987-11-20 | Metravib Sa | Capteur integre de grandeurs mecaniques a effet capacitif et procede de fabrication. |
EP0257724A3 (de) * | 1986-08-27 | 1990-01-17 | Ohmatoi Naoyuki | Wandler mit drei Elektroden für Phasenvergleich und Pulsphasenabgleichungskette zum Gebrauch mit dem Wandler |
GB8914910D0 (en) * | 1989-06-29 | 1989-08-23 | Vg Instr Group | Charge transducer |
JPH0486574A (ja) * | 1990-07-30 | 1992-03-19 | Tokyo Kasoode Kenkyusho:Kk | 被搬送体の帯電電位計測装置 |
US5065103A (en) * | 1990-03-27 | 1991-11-12 | International Business Machines Corporation | Scanning capacitance - voltage microscopy |
GB9303111D0 (en) * | 1993-02-17 | 1993-03-31 | Hitachi Europ Ltd | Displacement transducer |
US5936237A (en) * | 1995-07-05 | 1999-08-10 | Van Der Weide; Daniel Warren | Combined topography and electromagnetic field scanning probe microscope |
US5886532A (en) * | 1995-10-04 | 1999-03-23 | Uva Patent Foundation | Nanometer distance regulation using electromechanical power dissipation |
US5710052A (en) * | 1995-10-17 | 1998-01-20 | Advanced Micro Devices, Inc. | Scanning spreading resistance probe |
US6002131A (en) * | 1998-03-25 | 1999-12-14 | The Board Of Trustees Of The Leland Stanford Junior University | Scanning probe potentiometer |
-
1996
- 1996-04-30 SI SI9600141A patent/SI9600141B/sl not_active IP Right Cessation
-
1997
- 1997-04-30 DE DE19781735T patent/DE19781735T1/de active Pending
- 1997-04-30 AU AU24201/97A patent/AU2420197A/en not_active Abandoned
- 1997-04-30 WO PCT/SI1997/000016 patent/WO1997041406A1/en active Application Filing
- 1997-04-30 DE DE19781735A patent/DE19781735B4/de not_active Expired - Fee Related
- 1997-04-30 US US09/171,988 patent/US6323660B1/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10122912A1 (de) * | 2001-05-11 | 2002-11-21 | Infineon Technologies Ag | Vorrichtung und Verfahren zum Erzeugen einer vorbestimmten Positionsbeziehung zweier zueinander beweglicher Elektroden |
Also Published As
Publication number | Publication date |
---|---|
SI9600141B (sl) | 2002-12-31 |
SI9600141A (en) | 1997-10-31 |
DE19781735B4 (de) | 2006-03-23 |
AU2420197A (en) | 1997-11-19 |
WO1997041406A1 (en) | 1997-11-06 |
US6323660B1 (en) | 2001-11-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8110 | Request for examination paragraph 44 |