DE19780296T1 - Treiberschaltung mit Temperaturkorrekturschaltung - Google Patents
Treiberschaltung mit TemperaturkorrekturschaltungInfo
- Publication number
- DE19780296T1 DE19780296T1 DE19780296T DE19780296T DE19780296T1 DE 19780296 T1 DE19780296 T1 DE 19780296T1 DE 19780296 T DE19780296 T DE 19780296T DE 19780296 T DE19780296 T DE 19780296T DE 19780296 T1 DE19780296 T1 DE 19780296T1
- Authority
- DE
- Germany
- Prior art keywords
- circuit
- temperature correction
- driver circuit
- driver
- correction circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
- H03K17/145—Modifications for compensating variations of physical values, e.g. of temperature in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00369—Modifications for compensating variations of temperature, supply voltage or other physical parameters
- H03K19/00384—Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP07822896A JP3650460B2 (ja) | 1996-03-06 | 1996-03-06 | 温度補正付きドライバ回路 |
PCT/JP1997/000103 WO1997033370A1 (fr) | 1996-03-06 | 1997-01-20 | Circuit de commande compense en temperature |
Publications (2)
Publication Number | Publication Date |
---|---|
DE19780296T1 true DE19780296T1 (de) | 1998-05-07 |
DE19780296C2 DE19780296C2 (de) | 2002-10-10 |
Family
ID=13656199
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19780296T Expired - Fee Related DE19780296C2 (de) | 1996-03-06 | 1997-01-20 | Treiberschaltung mit Temperaturkorrekturschaltung |
Country Status (8)
Country | Link |
---|---|
US (1) | US5973542A (de) |
JP (1) | JP3650460B2 (de) |
KR (1) | KR100252721B1 (de) |
CN (1) | CN1098561C (de) |
DE (1) | DE19780296C2 (de) |
GB (1) | GB2316559B (de) |
TW (1) | TW320684B (de) |
WO (1) | WO1997033370A1 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6204720B1 (en) * | 1998-10-09 | 2001-03-20 | Elantec Semiconductor, Inc. | Load current control circuitry for power supplies driving a common load for providing a uniform temperature distribution |
US6415388B1 (en) * | 1998-10-30 | 2002-07-02 | Intel Corporation | Method and apparatus for power throttling in a microprocessor using a closed loop feedback system |
EP0961409B1 (de) | 1999-02-10 | 2001-09-26 | Agilent Technologies Inc. a Delaware Corporation | Ausgleich von Zeitfehlern , die verursacht sind durch dynamische thermische Fehlpaarungen |
US20030076154A1 (en) * | 2001-10-17 | 2003-04-24 | Kaveh Shakeri | Controlling circuit power consumption through supply voltage control |
US7395527B2 (en) | 2003-09-30 | 2008-07-01 | International Business Machines Corporation | Method and apparatus for counting instruction execution and data accesses |
US8381037B2 (en) | 2003-10-09 | 2013-02-19 | International Business Machines Corporation | Method and system for autonomic execution path selection in an application |
US7895382B2 (en) | 2004-01-14 | 2011-02-22 | International Business Machines Corporation | Method and apparatus for qualifying collection of performance monitoring events by types of interrupt when interrupt occurs |
US7415705B2 (en) | 2004-01-14 | 2008-08-19 | International Business Machines Corporation | Autonomic method and apparatus for hardware assist for patching code |
US7323898B2 (en) * | 2005-07-18 | 2008-01-29 | Teradyne, Inc. | Pin electronics driver |
US7342407B2 (en) | 2006-01-31 | 2008-03-11 | Advantest Corporation | Temperature compensation circuit and testing apparatus |
CN102938650A (zh) * | 2012-11-09 | 2013-02-20 | 华为技术有限公司 | 对信号进行补偿的方法、串行器以及解串器 |
US9322719B2 (en) * | 2013-05-29 | 2016-04-26 | Intel IP Corporation | Input stage for temperature measurement system |
US9885685B2 (en) | 2014-10-10 | 2018-02-06 | Ford Global Technologies, Llc | Compensating oxygen sensor aging |
US10082308B2 (en) | 2015-02-06 | 2018-09-25 | Johnson Controls Technology Company | Thermostat with heat rise compensation based on wireless data transmission |
US10317862B2 (en) | 2015-02-06 | 2019-06-11 | Johnson Controls Technology Company | Systems and methods for heat rise compensation |
US11493220B2 (en) | 2015-02-06 | 2022-11-08 | Johnson Controls Technology Company | Systems and methods for heat rise compensation |
CN115250124B (zh) * | 2021-04-26 | 2024-01-19 | 瑞昱半导体股份有限公司 | 收发器电路与传送功率偏差补偿方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4523154A (en) * | 1983-05-18 | 1985-06-11 | Genrad, Inc. | Enhanced-accuracy semiconductor power amplifier |
NZ216904A (en) * | 1985-07-22 | 1989-01-06 | Beale David George | Audio amplifier with overload limiting |
US4924112A (en) * | 1988-10-31 | 1990-05-08 | Motorola Inc. | Microprocessor having high current drive and feedback for temperature control |
US4975598A (en) * | 1988-12-21 | 1990-12-04 | Intel Corporation | Temperature, voltage, and process compensated output driver |
US4952818A (en) * | 1989-05-17 | 1990-08-28 | International Business Machines Corporation | Transmission line driver circuits |
US5021684A (en) * | 1989-11-09 | 1991-06-04 | Intel Corporation | Process, supply, temperature compensating CMOS output buffer |
US5066873A (en) * | 1989-12-04 | 1991-11-19 | Altera Corporation | Integrated circuits with reduced switching noise |
US5017807A (en) * | 1990-07-05 | 1991-05-21 | At&T Bell Laboratories | Output buffer having capacitive drive shunt for reduced noise |
JP3288727B2 (ja) * | 1991-05-24 | 2002-06-04 | 株式会社東芝 | 出力回路 |
JPH0579481A (ja) * | 1991-09-19 | 1993-03-30 | Daikin Ind Ltd | ロータリ圧縮機 |
JP2688035B2 (ja) * | 1992-02-14 | 1997-12-08 | テキサス インスツルメンツ インコーポレイテッド | 温度補償回路及び動作方法 |
JPH0579481U (ja) * | 1992-03-30 | 1993-10-29 | 横河電機株式会社 | Lsiテスタ |
US5311084A (en) * | 1992-06-23 | 1994-05-10 | At&T Bell Laboratories | Integrated circuit buffer with controlled rise/fall time |
JPH0786900A (ja) * | 1993-09-17 | 1995-03-31 | Fujitsu Ltd | 半導体装置 |
JPH0897693A (ja) * | 1994-09-20 | 1996-04-12 | Mazda Motor Corp | 出力バッファ補償回路 |
-
1996
- 1996-03-06 JP JP07822896A patent/JP3650460B2/ja not_active Expired - Fee Related
-
1997
- 1997-01-20 CN CN97190002A patent/CN1098561C/zh not_active Expired - Fee Related
- 1997-01-20 US US08/913,350 patent/US5973542A/en not_active Expired - Fee Related
- 1997-01-20 DE DE19780296T patent/DE19780296C2/de not_active Expired - Fee Related
- 1997-01-20 KR KR1019970704687A patent/KR100252721B1/ko not_active IP Right Cessation
- 1997-01-20 GB GB9722767A patent/GB2316559B/en not_active Expired - Fee Related
- 1997-01-20 WO PCT/JP1997/000103 patent/WO1997033370A1/ja active IP Right Grant
- 1997-02-17 TW TW086101828A patent/TW320684B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US5973542A (en) | 1999-10-26 |
JP3650460B2 (ja) | 2005-05-18 |
DE19780296C2 (de) | 2002-10-10 |
GB2316559A (en) | 1998-02-25 |
JPH09246944A (ja) | 1997-09-19 |
GB2316559B (en) | 2000-12-13 |
KR100252721B1 (ko) | 2000-04-15 |
CN1178041A (zh) | 1998-04-01 |
GB2316559A8 (en) | 1998-03-12 |
KR19980701298A (ko) | 1998-05-15 |
CN1098561C (zh) | 2003-01-08 |
WO1997033370A1 (fr) | 1997-09-12 |
GB9722767D0 (en) | 1997-12-24 |
TW320684B (de) | 1997-11-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8607 | Notification of search results after publication | ||
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |
Effective date: 20110802 |