DE1929429C3 - Vorrichtung zur spektrochemischen Analyse eines Materials - Google Patents
Vorrichtung zur spektrochemischen Analyse eines MaterialsInfo
- Publication number
- DE1929429C3 DE1929429C3 DE1929429A DE1929429A DE1929429C3 DE 1929429 C3 DE1929429 C3 DE 1929429C3 DE 1929429 A DE1929429 A DE 1929429A DE 1929429 A DE1929429 A DE 1929429A DE 1929429 C3 DE1929429 C3 DE 1929429C3
- Authority
- DE
- Germany
- Prior art keywords
- passage
- cathode
- arc
- discharge
- anode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000463 material Substances 0.000 title claims description 22
- 238000004458 analytical method Methods 0.000 title claims description 8
- 230000005855 radiation Effects 0.000 claims description 10
- 238000005259 measurement Methods 0.000 claims description 8
- 238000010521 absorption reaction Methods 0.000 claims description 6
- 238000001816 cooling Methods 0.000 claims 4
- 238000010891 electric arc Methods 0.000 claims 3
- 230000035945 sensitivity Effects 0.000 claims 2
- 230000003595 spectral effect Effects 0.000 claims 2
- 229910052582 BN Inorganic materials 0.000 claims 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims 1
- 230000002411 adverse Effects 0.000 claims 1
- 239000004020 conductor Substances 0.000 claims 1
- 230000000694 effects Effects 0.000 claims 1
- 238000000840 electrochemical analysis Methods 0.000 claims 1
- 239000011810 insulating material Substances 0.000 claims 1
- 230000002452 interceptive effect Effects 0.000 claims 1
- 239000007788 liquid Substances 0.000 claims 1
- 238000010309 melting process Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 239000002689 soil Substances 0.000 claims 1
- 239000007789 gas Substances 0.000 description 24
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- 229910052786 argon Inorganic materials 0.000 description 3
- ZSLUVFAKFWKJRC-IGMARMGPSA-N 232Th Chemical compound [232Th] ZSLUVFAKFWKJRC-IGMARMGPSA-N 0.000 description 2
- 229910052776 Thorium Inorganic materials 0.000 description 2
- 230000003628 erosive effect Effects 0.000 description 2
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 239000000443 aerosol Substances 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000000110 cooling liquid Substances 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000002459 sustained effect Effects 0.000 description 1
- WLTSUBTXQJEURO-UHFFFAOYSA-N thorium tungsten Chemical compound [W].[Th] WLTSUBTXQJEURO-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Plasma & Fusion (AREA)
- Engineering & Computer Science (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US73763368A | 1968-06-17 | 1968-06-17 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| DE1929429A1 DE1929429A1 (de) | 1969-12-18 |
| DE1929429B2 DE1929429B2 (de) | 1977-11-10 |
| DE1929429C3 true DE1929429C3 (de) | 1978-06-29 |
Family
ID=24964656
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE1929429A Expired DE1929429C3 (de) | 1968-06-17 | 1969-06-10 | Vorrichtung zur spektrochemischen Analyse eines Materials |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3685911A (OSRAM) |
| JP (1) | JPS5144430B1 (OSRAM) |
| DE (1) | DE1929429C3 (OSRAM) |
| FR (1) | FR2011101A1 (OSRAM) |
| GB (1) | GB1261596A (OSRAM) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54161219U (OSRAM) * | 1978-05-01 | 1979-11-10 | ||
| JPS54171925U (OSRAM) * | 1978-05-22 | 1979-12-05 | ||
| DE3405075A1 (de) * | 1984-02-13 | 1985-08-14 | Siemens AG, 1000 Berlin und 8000 München | Vorrichtung zur atomspektroskopie einer analysensubstanz |
| US4789783A (en) * | 1987-04-02 | 1988-12-06 | Cook Robert D | Discharge ionization detector |
| DE3817502A1 (de) * | 1987-05-22 | 1988-12-08 | Palitex Project Co Gmbh | Verfahren zum betrieb garnverarbeitender einrichtungen |
| US4965540A (en) * | 1987-12-23 | 1990-10-23 | Hewlett-Packard Company | Microwave resonant cavity |
| US5105123A (en) * | 1988-10-27 | 1992-04-14 | Battelle Memorial Institute | Hollow electrode plasma excitation source |
| CA2001237A1 (en) * | 1988-10-27 | 1990-04-27 | Nathan E. Ballou | Hollow electrode plasma excitation source |
| US5353113A (en) * | 1993-07-15 | 1994-10-04 | Cetac Technologies Incorporated | Single and multiple radiation transparent afterglow electric discharge detector systems |
| US5382804A (en) * | 1993-07-15 | 1995-01-17 | Cetac Technologies Inc. | Compact photoinization systems |
| AT406527B (de) | 1997-03-04 | 2000-06-26 | Bernhard Dr Platzer | Vorrichtung zum analysieren gasförmiger proben |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL6403239A (OSRAM) * | 1964-03-26 | 1965-09-27 | ||
| US3512030A (en) * | 1967-06-16 | 1970-05-12 | Vitro Corp Of America | High intensity source of selected radiation |
-
1968
- 1968-06-17 US US737633A patent/US3685911A/en not_active Expired - Lifetime
-
1969
- 1969-06-10 DE DE1929429A patent/DE1929429C3/de not_active Expired
- 1969-06-16 GB GB30399/69A patent/GB1261596A/en not_active Expired
- 1969-06-17 FR FR6920137A patent/FR2011101A1/fr not_active Withdrawn
- 1969-06-17 JP JP44047353A patent/JPS5144430B1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| DE1929429B2 (de) | 1977-11-10 |
| GB1261596A (en) | 1972-01-26 |
| JPS5144430B1 (OSRAM) | 1976-11-29 |
| DE1929429A1 (de) | 1969-12-18 |
| US3685911A (en) | 1972-08-22 |
| FR2011101A1 (OSRAM) | 1970-02-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| SH | Request for examination between 03.10.1968 and 22.04.1971 | ||
| C3 | Grant after two publication steps (3rd publication) | ||
| 8339 | Ceased/non-payment of the annual fee |