DE1215813B - Verfahren zum AEtzen eines Halbleiterbauelements zum Verkleinern der pn-UEbergangsflaeche - Google Patents

Verfahren zum AEtzen eines Halbleiterbauelements zum Verkleinern der pn-UEbergangsflaeche

Info

Publication number
DE1215813B
DE1215813B DEN22341A DEN0022341A DE1215813B DE 1215813 B DE1215813 B DE 1215813B DE N22341 A DEN22341 A DE N22341A DE N0022341 A DEN0022341 A DE N0022341A DE 1215813 B DE1215813 B DE 1215813B
Authority
DE
Germany
Prior art keywords
etching
junction
current
semiconductor component
tunnel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DEN22341A
Other languages
German (de)
English (en)
Inventor
Albert Schmitz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of DE1215813B publication Critical patent/DE1215813B/de
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3063Electrolytic etching
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23FNON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F1/00Etching metallic material by chemical means
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23FNON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F1/00Etching metallic material by chemical means
    • C23F1/02Local etching
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F3/00Electrolytic etching or polishing
    • C25F3/02Etching
    • C25F3/12Etching of semiconducting materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Power Engineering (AREA)
  • Materials Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mechanical Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Electrochemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Weting (AREA)
DEN22341A 1961-11-15 1962-11-12 Verfahren zum AEtzen eines Halbleiterbauelements zum Verkleinern der pn-UEbergangsflaeche Pending DE1215813B (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL271429 1961-11-15

Publications (1)

Publication Number Publication Date
DE1215813B true DE1215813B (de) 1966-05-05

Family

ID=19753412

Family Applications (1)

Application Number Title Priority Date Filing Date
DEN22341A Pending DE1215813B (de) 1961-11-15 1962-11-12 Verfahren zum AEtzen eines Halbleiterbauelements zum Verkleinern der pn-UEbergangsflaeche

Country Status (7)

Country Link
BE (1) BE624780A (US06262066-20010717-C00315.png)
CH (1) CH417776A (US06262066-20010717-C00315.png)
DE (1) DE1215813B (US06262066-20010717-C00315.png)
DK (1) DK106101C (US06262066-20010717-C00315.png)
GB (1) GB1023666A (US06262066-20010717-C00315.png)
NL (1) NL271429A (US06262066-20010717-C00315.png)
SE (1) SE301190B (US06262066-20010717-C00315.png)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1255899A (fr) * 1959-08-05 1961-03-10 Ibm Oscillateur et son procédé de fabrication

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1255899A (fr) * 1959-08-05 1961-03-10 Ibm Oscillateur et son procédé de fabrication

Also Published As

Publication number Publication date
CH417776A (de) 1966-07-31
NL271429A (US06262066-20010717-C00315.png)
SE301190B (US06262066-20010717-C00315.png) 1968-05-27
DK106101C (da) 1966-12-19
GB1023666A (en) 1966-03-23
BE624780A (US06262066-20010717-C00315.png)

Similar Documents

Publication Publication Date Title
DE949512C (de) Verfahren zur Herstellung von Halbleiterkoerpern
DE966492C (de) Elektrisch steuerbares Schaltelement aus Halbleitermaterial
DE1146982B (de) Verfahren zur Herstellung von Halbleiterzonen mit genauer Dicke zwischen flaechenhaften PN-UEbergaengen in einkristallinen Halbleiterkoerpern von Halbleiterbauelementen,insbesondere von Dreizonentransistoren
DE1032404B (de) Verfahren zur Herstellung von Flaechenhalbleiterelementen mit p-n-Schichten
DE1092131B (de) Transistor und Verfahren zu dessen Herstellung
DE2142146A1 (de) Halbleiteranordnung und Verfahren zur Herstellung einer derartigen Anordnung
DE1246890B (de) Diffusionsverfahren zum Herstellen eines Halbleiterbauelements
DE1521093A1 (de) Verfahren zur Ausbildung einer Oxydschicht auf einem Halbleiterkoerper
DE1024640B (de) Verfahren zur Herstellung von Kristalloden
DE2259829B2 (de) Verfahren zur anodischen Bildung einer Oxidschicht auf mindestens 5% Gallium enthaltenden Verbindungshalbleitern, insbesondere GaP.GaAs, AIGaP, InGaP und InGaAs in einem wässrigen Elektrolyten
DE2162445C3 (de) Verfahren zur Herstellung einer Halbleiteranordnung
DE2158681C3 (de) Verfahren zur Behandlung eines lichtemittierenden Halbleiter-Bauelements mit PN-Übergang
DE1215813B (de) Verfahren zum AEtzen eines Halbleiterbauelements zum Verkleinern der pn-UEbergangsflaeche
DE1126513B (de) Verfahren zur Bearbeitung von Halbleiteranordnungen
AT238257B (de) Verfahren zur Herstellung einer Halbleitervorrichtung
DE1194064B (de) Verfahren zum elektrolytischen AEtzen der Ober-flaeche eines mit Legierungselektroden aus einer Bleilegierung versehenen npn-Transistors mit einem Halbleiterkoerper aus Germanium
DE2924702A1 (de) Verfahren zur herstellung von halbleitervorrichtungen und vorrichtung hierfuer
DE1464319C3 (de) H albleite rvorrichtung
DE1104617B (de) Verfahren zum elektrolytischen AEtzen einer Halbleiteranordnung mit einem Halbleiterkoerper aus im wesentlichen einkristallinem Halbleitermaterial
DE1253825B (de) Verfahren zum Herstellen eines Halbleiterbauelements mit einem Halbleiterkoerper aus Galliumarsenid durch AEtzen
DE1123406B (de) Verfahren zur Herstellung von legierten Halbleiteranordnungen
AT234152B (de) Verfahren zur Herstellung einer Halbleitervorrichtung
AT206937B (de) Halbleitervorrichtung und Verfahren zu deren Herstellung
DE1954443C3 (de) Halbleiterbauelement mit einem Schottky-Übergang und Verfahren zu seiner Herstellung
DE1121224B (de) Transistor mit dicht nebeneinander einlegierten Emitter- und Basiselektroden und Verfahren zu dessen Herstellung