DE112008000339B4 - Einfach- und multi-spektrales Beleuchtungssystem und Verfahren - Google Patents

Einfach- und multi-spektrales Beleuchtungssystem und Verfahren Download PDF

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Publication number
DE112008000339B4
DE112008000339B4 DE112008000339.4T DE112008000339T DE112008000339B4 DE 112008000339 B4 DE112008000339 B4 DE 112008000339B4 DE 112008000339 T DE112008000339 T DE 112008000339T DE 112008000339 B4 DE112008000339 B4 DE 112008000339B4
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Germany
Prior art keywords
light
axis
circuit board
stencil
long
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE112008000339.4T
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German (de)
English (en)
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DE112008000339T5 (de
Inventor
David P. Prince
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Illinois Tool Works Inc
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Illinois Tool Works Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Illinois Tool Works Inc filed Critical Illinois Tool Works Inc
Publication of DE112008000339T5 publication Critical patent/DE112008000339T5/de
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Publication of DE112008000339B4 publication Critical patent/DE112008000339B4/de
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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41F—PRINTING MACHINES OR PRESSES
    • B41F15/00—Screen printers
    • B41F15/02—Manually-operable devices
    • B41F15/06—Manually-operable devices with auxiliary equipment, e.g. for drying printed articles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
    • H05K3/1216—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by screen printing or stencil printing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8822—Dark field detection
    • G01N2021/8825—Separate detection of dark field and bright field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
    • G01N2021/95646—Soldering
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/163—Monitoring a manufacturing process
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/51—Plural diverse manufacturing apparatus including means for metal shaping or assembling
    • Y10T29/5193—Electrical connector or terminal

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mechanical Engineering (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Screen Printers (AREA)
  • Inking, Control Or Cleaning Of Printing Machines (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
DE112008000339.4T 2007-02-16 2008-01-03 Einfach- und multi-spektrales Beleuchtungssystem und Verfahren Active DE112008000339B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/707,757 US7710611B2 (en) 2007-02-16 2007-02-16 Single and multi-spectral illumination system and method
US11/707,757 2007-02-16
PCT/US2008/050068 WO2008100646A2 (en) 2007-02-16 2008-01-03 Single and multi-spectral illumination system and method

Publications (2)

Publication Number Publication Date
DE112008000339T5 DE112008000339T5 (de) 2009-11-19
DE112008000339B4 true DE112008000339B4 (de) 2021-08-26

Family

ID=39671890

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112008000339.4T Active DE112008000339B4 (de) 2007-02-16 2008-01-03 Einfach- und multi-spektrales Beleuchtungssystem und Verfahren

Country Status (8)

Country Link
US (1) US7710611B2 (https=)
JP (1) JP2010519733A (https=)
KR (1) KR20090125057A (https=)
CN (1) CN101606448B (https=)
DE (1) DE112008000339B4 (https=)
GB (1) GB2458428B (https=)
IL (1) IL199930A (https=)
WO (1) WO2008100646A2 (https=)

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US8413577B2 (en) * 2008-11-19 2013-04-09 Illinois Tool Works Inc. Vertically separated pass through conveyor system and method in surface mount technology process equipment
IT1392991B1 (it) * 2009-02-23 2012-04-02 Applied Materials Inc Procedimento di stampa serigrafica autoregolantesi
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EP2380738B1 (de) * 2010-04-22 2014-05-28 Manz AG Drucksieb und Verfahren zur Einstellung der relativen Lage eines Druckmusters und eines Substrats
US8474377B2 (en) * 2010-12-08 2013-07-02 Illinois Tool Works Inc. Combination stencil printer and dispenser and related methods
US9243726B2 (en) 2012-10-03 2016-01-26 Aarne H. Reid Vacuum insulated structure with end fitting and method of making same
WO2014058460A1 (en) * 2012-10-08 2014-04-17 Dwfritz Automation Inc. Simultaneous-view object insertion systems, apparatuses and methods
JP2014091247A (ja) * 2012-11-02 2014-05-19 Panasonic Corp 半田印刷機及び半田印刷機の半田にじみ検査方法
US11176635B2 (en) * 2013-01-25 2021-11-16 Cyberoptics Corporation Automatic programming of solder paste inspection system
US8939074B2 (en) * 2013-03-12 2015-01-27 Illinois Tool Works Inc. Color-based linear three dimensional acquisition system and method
WO2014184855A1 (ja) * 2013-05-13 2014-11-20 富士機械製造株式会社 部品実装機
US9743527B2 (en) * 2013-08-09 2017-08-22 CyberOptics Corporaiton Stencil programming and inspection using solder paste inspection system
US9463918B2 (en) 2014-02-20 2016-10-11 Aarne H. Reid Vacuum insulated articles and methods of making same
JP6654805B2 (ja) * 2015-03-12 2020-02-26 日東電工株式会社 配線回路基板の製造方法および検査方法
US9370925B1 (en) 2015-03-25 2016-06-21 Illinois Tool Works Inc. Stencil printer having stencil shuttle assembly
US9370924B1 (en) 2015-03-25 2016-06-21 Illinois Tool Works Inc. Dual action stencil wiper assembly for stencil printer
US10723117B2 (en) 2015-04-07 2020-07-28 Illinois Tool Works Inc. Lift tool assembly for stencil printer
US10703089B2 (en) 2015-04-07 2020-07-07 Illinois Tool Works Inc. Edge lock assembly for a stencil printer
US9370923B1 (en) 2015-04-07 2016-06-21 Illinois Tool Works Inc. Lift tool assembly for stencil printer
US10497908B2 (en) 2015-08-24 2019-12-03 Concept Group, Llc Sealed packages for electronic and energy storage devices
US10065256B2 (en) * 2015-10-30 2018-09-04 Concept Group Llc Brazing systems and methods
EP3423854A4 (en) 2016-03-04 2020-01-01 Concept Group LLC VACUUM-INSULATED ARTICLES WITH IMPROVEMENT OF REFLECTIVE MATERIAL
MX2019005662A (es) 2016-11-15 2019-11-21 Concept Group Llc Artículos mejorados aislados al vacío con aislamiento microporoso.
US11008153B2 (en) 2016-11-15 2021-05-18 Concept Group Llp Multiply-insulated assemblies
JP2020531764A (ja) 2017-08-25 2020-11-05 コンセプト グループ エルエルシー 複合的ジオメトリおよび複合的材料の断熱部品
JP6783739B2 (ja) 2017-10-31 2020-11-11 株式会社東芝 検査システムおよび検査方法
CN110132960B (zh) * 2018-02-09 2021-12-14 飞旭电子(苏州)有限公司 电路板组件的检测方法
US10780515B2 (en) 2018-04-26 2020-09-22 Raytheon Technologies Corporation Auto-adaptive braze dispensing systems and methods
KR102528016B1 (ko) * 2018-10-05 2023-05-02 삼성전자주식회사 솔더 부재 실장 방법 및 시스템
JP7402634B2 (ja) * 2019-08-01 2023-12-21 株式会社Fuji マスク印刷機、供給位置案内装置
IT202100031832A1 (it) * 2021-12-20 2023-06-20 Scuola Univ Professionale Della Svizzera Italiana Supsi Apparato di acquisizione di informazioni tridimensionali di oggetti e superfici per un sistema di visione artificiale per l'ispezione ottica automatica della qualità visiva di un oggetto sottostante, in particolare assemblaggi elettronici, schede elettroniche e simili
MX2024007600A (es) * 2021-12-20 2024-08-15 Scuola Univ Professionale Della Svizzera Italiana Supsi Aparato para adquirir informacion tridimensional de objetos y superficies para un sistema de vision artificial para la inspeccion optica automatica de la calidad visual de un objeto subyacente, en particular ensamblajes electronicos, placas de circuitos y lo similar.
US11947094B1 (en) * 2023-03-23 2024-04-02 Illinois Tool Works Inc. Dual camera prism assembly for stencil printer

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US5060063A (en) 1990-07-30 1991-10-22 Mpm Corporation Viewing and illuminating video probe with viewing means for simultaneously viewing object and device images along viewing axis and translating them along optical axis
DE4136543A1 (de) 1990-11-07 1992-05-14 Mitsubishi Electric Corp Schaltungsplatte und vorrichtung zum erkennen der position einer schaltungsplatte
DE19605255A1 (de) 1995-02-14 1996-08-29 Fujitsu Ltd Verfahren und Vorrichtung zum Betrachten von Beschaltungs- bzw. Verdrahtungsmustern in einer gedruckten Schaltungsplatte
JP2000022393A (ja) 1998-06-30 2000-01-21 Yamaha Motor Co Ltd 認識用照明装置
WO2001063988A1 (en) 2000-02-23 2001-08-30 Kistech Limited Method of printing and printing machine
DE10128476A1 (de) 2001-06-12 2003-01-02 Siemens Dematic Ag Optische Sensorvorrichtung zur visuellen Erfassung von Substraten
US6738505B1 (en) 1999-05-04 2004-05-18 Speedline Technologies, Inc. Method and apparatus for detecting solder paste deposits on substrates
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US20070175343A1 (en) 2006-02-01 2007-08-02 Speedline Technologies, Inc. Off-axis illumination assembly and method

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Publication number Priority date Publication date Assignee Title
US34615A (en) 1862-03-04 Improvement in cartridges for fire-arms
US5060063A (en) 1990-07-30 1991-10-22 Mpm Corporation Viewing and illuminating video probe with viewing means for simultaneously viewing object and device images along viewing axis and translating them along optical axis
DE4136543A1 (de) 1990-11-07 1992-05-14 Mitsubishi Electric Corp Schaltungsplatte und vorrichtung zum erkennen der position einer schaltungsplatte
DE19605255A1 (de) 1995-02-14 1996-08-29 Fujitsu Ltd Verfahren und Vorrichtung zum Betrachten von Beschaltungs- bzw. Verdrahtungsmustern in einer gedruckten Schaltungsplatte
JP2000022393A (ja) 1998-06-30 2000-01-21 Yamaha Motor Co Ltd 認識用照明装置
US6738505B1 (en) 1999-05-04 2004-05-18 Speedline Technologies, Inc. Method and apparatus for detecting solder paste deposits on substrates
US6891967B2 (en) 1999-05-04 2005-05-10 Speedline Technologies, Inc. Systems and methods for detecting defects in printed solder paste
WO2001063988A1 (en) 2000-02-23 2001-08-30 Kistech Limited Method of printing and printing machine
DE10128476A1 (de) 2001-06-12 2003-01-02 Siemens Dematic Ag Optische Sensorvorrichtung zur visuellen Erfassung von Substraten
JP2007010497A (ja) 2005-06-30 2007-01-18 Ckd Corp 基板の検査装置
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Title
„OFF-AXIS ILLUMINATING ASSEMBLY AND METHOD" (Außer-Achse-Beleuchtungsvorrichtung und Verfahren), welche am 1. Februar 2006 eingereicht wurde

Also Published As

Publication number Publication date
WO2008100646A2 (en) 2008-08-21
CN101606448A (zh) 2009-12-16
KR20090125057A (ko) 2009-12-03
US7710611B2 (en) 2010-05-04
CN101606448B (zh) 2011-12-28
DE112008000339T5 (de) 2009-11-19
GB2458428A (en) 2009-09-23
GB2458428B (en) 2012-01-18
JP2010519733A (ja) 2010-06-03
IL199930A (en) 2016-06-30
GB0913116D0 (en) 2009-09-02
WO2008100646A3 (en) 2009-01-08
IL199930A0 (en) 2010-04-15
US20080197170A1 (en) 2008-08-21

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