DE112005000395T5 - System und Verfahren zur Übergabe von Baugruppen - Google Patents

System und Verfahren zur Übergabe von Baugruppen Download PDF

Info

Publication number
DE112005000395T5
DE112005000395T5 DE112005000395T DE112005000395T DE112005000395T5 DE 112005000395 T5 DE112005000395 T5 DE 112005000395T5 DE 112005000395 T DE112005000395 T DE 112005000395T DE 112005000395 T DE112005000395 T DE 112005000395T DE 112005000395 T5 DE112005000395 T5 DE 112005000395T5
Authority
DE
Germany
Prior art keywords
trays
tray
stack
sorted
platform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE112005000395T
Other languages
German (de)
English (en)
Inventor
Kenneth B. Ramona Uekert
Samer San Marcos Kabbani
Larry San Diego Stuckley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Delta Design Inc
Original Assignee
Delta Design Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Delta Design Inc filed Critical Delta Design Inc
Publication of DE112005000395T5 publication Critical patent/DE112005000395T5/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G60/00—Simultaneously or alternatively stacking and de-stacking of articles
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2201/00—Indexing codes relating to handling devices, e.g. conveyors, characterised by the type of product or load being conveyed or handled
    • B65G2201/02—Articles
    • B65G2201/0235—Containers
    • B65G2201/0258—Trays, totes or bins
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
DE112005000395T 2004-02-18 2005-02-02 System und Verfahren zur Übergabe von Baugruppen Withdrawn DE112005000395T5 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US54610304P 2004-02-18 2004-02-18
US60/546,103 2004-02-18
US10/916,626 2004-08-12
US10/916,626 US20050180844A1 (en) 2004-02-18 2004-08-12 Device handling system and method
PCT/US2005/002646 WO2005082752A2 (en) 2004-02-18 2005-02-02 Device handling system and method

Publications (1)

Publication Number Publication Date
DE112005000395T5 true DE112005000395T5 (de) 2007-03-01

Family

ID=34841234

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112005000395T Withdrawn DE112005000395T5 (de) 2004-02-18 2005-02-02 System und Verfahren zur Übergabe von Baugruppen

Country Status (5)

Country Link
US (1) US20050180844A1 (ja)
JP (1) JP2007527003A (ja)
KR (1) KR20060127195A (ja)
DE (1) DE112005000395T5 (ja)
WO (1) WO2005082752A2 (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112005003767B4 (de) * 2005-11-21 2015-08-27 Hirata Corp. Ablage-Halteeinrichtung
KR102052435B1 (ko) * 2016-03-31 2019-12-05 가부시키가이샤 코쿠사이 엘렉트릭 반도체 장치의 제조 방법, 기판 장전 방법 및 기록 매체
CA3084671A1 (en) * 2017-12-19 2019-06-27 Boston Semi Equipment, Llc Kit-less pick and place handler
CA3153043A1 (en) * 2019-09-03 2021-03-11 DWFritz Automation, Inc. Tray exchange and dispositioning systems, methods, and apparatuses
KR20210156053A (ko) * 2020-06-17 2021-12-24 (주)테크윙 전자부품 테스트용 핸들링시스템
TWI804322B (zh) * 2022-05-20 2023-06-01 鴻勁精密股份有限公司 置盤裝置及作業機

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3236374A (en) * 1964-02-10 1966-02-22 Universal Instruments Corp Line testing and handling apparatus
US3664499A (en) * 1970-11-06 1972-05-23 Fairchild Camera Instr Co High speed automatic sequential tester-handler
US3844423A (en) * 1972-12-08 1974-10-29 Hartman Metal Fab Inc Pallet accumulator
US4845843A (en) * 1985-10-28 1989-07-11 Cimm, Inc. System for configuring, automating and controlling the test and repair of printed circuit boards
US5313156A (en) * 1991-12-04 1994-05-17 Advantest Corporation Apparatus for automatic handling
CN1043874C (zh) * 1993-02-27 1999-06-30 海德堡印刷机械股份公司 产生单个纸张堆垛的装置
EP1012875B1 (en) * 1997-06-16 2002-09-04 Matsushita Electric Industrial Co., Ltd. Tray storing and feeding apparatus
US6227373B1 (en) * 1997-07-14 2001-05-08 Delta Design, Inc. Electronic device handling system and method
JPH11297791A (ja) * 1998-04-14 1999-10-29 Advantest Corp トレイ移送アーム及びこれを用いたトレイの移載装置、ｉｃ試験装置並びにトレイの取り廻し方法
KR100285658B1 (ko) * 1998-11-06 2001-04-02 정문술 핸들러의멀티스택커
JP4202498B2 (ja) * 1998-12-15 2008-12-24 株式会社アドバンテスト 部品ハンドリング装置
JP4028263B2 (ja) * 2002-03-15 2007-12-26 ヤマハ発動機株式会社 部品収納装置

Also Published As

Publication number Publication date
KR20060127195A (ko) 2006-12-11
JP2007527003A (ja) 2007-09-20
WO2005082752A2 (en) 2005-09-09
US20050180844A1 (en) 2005-08-18
WO2005082752A3 (en) 2007-02-08

Similar Documents

Publication Publication Date Title
DE19523969C2 (de) Bausteintransportvorrichtung und Verfahren zum wiederholten Testen von Bausteinen für IC-Handhabungseinrichtung
EP1877752B1 (de) Vorrichtung zur handhabung und zuordnung mikrotomierter gewebeproben
DE102004002708B4 (de) Sortierhandler für Burn-In-Tester
DE19680786B4 (de) Halbleiterbauelement-Testgerät
EP3762319B1 (de) Kommissionierstation und verfahren zum automatischen kommissionieren von waren
DE112005003685B4 (de) Vorrichtung zum Handhaben von Werkstücken
DE112005000395T5 (de) System und Verfahren zur Übergabe von Baugruppen
DE102012111867B4 (de) Sortiergerät
DE10225332B4 (de) Einlagerungspuffer und Verfahren zum Einlagern von Stückgütern für ein automatisiertes Stückgutlager
DE102011053547B4 (de) Verfahren und System zum Lagern und Kommissionieren von Artikeln, insbesondere von Apothekenartikeln
DE102018110502A1 (de) Kommissioniereinrichtung zum Kommissionieren von einem Vorratsbehälter in einen Auftragsbehälter und entsprechendes Verfahren
KR102401058B1 (ko) 소자핸들러
DE102012022922A1 (de) Verfahren und Vorrichtung für die Bearbeitung von Wertdokumenten
DE102019211245A1 (de) Transportbehältergreifer
DE19962703B4 (de) Verfahren und Vorrichtung zum Steuern des Beladens/Entladens von Halbleiterbauelementen
KR100295774B1 (ko) 번인테스터용 소팅 핸들러
DE102019208704A1 (de) Einrichtung und Verfahren zum Polieren von Halbleiterscheiben
EP4168809A1 (de) Verfahren und vorrichtung zum scannen von objektträgern unter verwendung mindestens zweier objektträgerscanner
DE102007007819A1 (de) Modulare Flächenmagazin-Bereitstellungsvorrichtung für Bestücksysteme
DE19625876B4 (de) Automatisches Prüfmanipulatorsystem für IC-Prüfer
EP3528188B1 (de) Vorrichtung zur aufnahme mehrerer behälter, system zur speicherung von sicherheitsdokumenten und verfahren zum disponieren von sicherheitsdokumenten
CN115108232B (zh) 用于血站的挑袋机构、血盘和用于控制挑袋机构的方法
WO2023227801A1 (de) Sortiervorrichtung
DE4313884C2 (de) Hochgeschwindigkeits-/Bereitstellungs- und Transporteinrichtung und Bereitstellungs und Transportverfahren
DE102021108457A1 (de) Sortiervorrichtung

Legal Events

Date Code Title Description
8139 Disposal/non-payment of the annual fee