DE10327497A1 - Vorrichtung zum Eichen einer Hochfrequenzsignalmessausrüstung - Google Patents

Vorrichtung zum Eichen einer Hochfrequenzsignalmessausrüstung Download PDF

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Publication number
DE10327497A1
DE10327497A1 DE10327497A DE10327497A DE10327497A1 DE 10327497 A1 DE10327497 A1 DE 10327497A1 DE 10327497 A DE10327497 A DE 10327497A DE 10327497 A DE10327497 A DE 10327497A DE 10327497 A1 DE10327497 A1 DE 10327497A1
Authority
DE
Germany
Prior art keywords
transmission path
calibration
signal transmission
voltage
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE10327497A
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German (de)
English (en)
Inventor
Hiroshi Sagamihara Sakayori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Verigy Singapore Pte Ltd
Original Assignee
Agilent Technologies Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Japan Ltd filed Critical Agilent Technologies Japan Ltd
Publication of DE10327497A1 publication Critical patent/DE10327497A1/de
Ceased legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
DE10327497A 2002-06-21 2003-06-17 Vorrichtung zum Eichen einer Hochfrequenzsignalmessausrüstung Ceased DE10327497A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002181122A JP4216528B2 (ja) 2002-06-21 2002-06-21 高周波信号測定装置の校正装置
JP2002/181122 2002-06-21

Publications (1)

Publication Number Publication Date
DE10327497A1 true DE10327497A1 (de) 2004-02-26

Family

ID=29728279

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10327497A Ceased DE10327497A1 (de) 2002-06-21 2003-06-17 Vorrichtung zum Eichen einer Hochfrequenzsignalmessausrüstung

Country Status (3)

Country Link
US (1) US6958612B2 (https=)
JP (1) JP4216528B2 (https=)
DE (1) DE10327497A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7489145B2 (en) * 2005-12-14 2009-02-10 Daihen Corporation Plasma processing system
JP4726679B2 (ja) * 2006-03-31 2011-07-20 ルネサスエレクトロニクス株式会社 半導体試験方法および半導体装置
US8446143B2 (en) * 2008-06-27 2013-05-21 National Instruments Corporation Self-calibration circuit with gyrated output impedance
US20100150561A1 (en) * 2008-12-12 2010-06-17 Seung-Hyun Cho Optical receiver, optical line terminal and method of recovering received signals
JP6672046B2 (ja) * 2016-04-05 2020-03-25 日置電機株式会社 測定装置
US10908183B2 (en) * 2017-11-06 2021-02-02 National Instruments Corporation Active probe powered through driven coax cable
US11662378B2 (en) * 2021-08-13 2023-05-30 Xilinx, Inc. Reference less glitch detection circuitry with autocalibration

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3112952C2 (de) * 1981-03-31 1994-05-05 Walther Bender Gmbh & Co Kg Di Verfahren und Einrichtung zum Bestimmen der Gesamtableitungsimpedanz in einem ungeerdeten Wechselstromnetz
US5933013A (en) * 1995-11-22 1999-08-03 Advantest Corp. Calibration circuit for calibrating frequency characteristics of an AC/DC converter
US6215295B1 (en) * 1997-07-25 2001-04-10 Smith, Iii Richard S. Photonic field probe and calibration means thereof
US6459335B1 (en) * 2000-09-29 2002-10-01 Microchip Technology Incorporated Auto-calibration circuit to minimize input offset voltage in an integrated circuit analog input device

Also Published As

Publication number Publication date
US6958612B2 (en) 2005-10-25
JP2004028607A (ja) 2004-01-29
JP4216528B2 (ja) 2009-01-28
US20030234654A1 (en) 2003-12-25

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Legal Events

Date Code Title Description
OR8 Request for search as to paragraph 43 lit. 1 sentence 1 patent law
8105 Search report available
8127 New person/name/address of the applicant

Owner name: AGILENT TECHNOLOGIES, INC., PALO ALTO, CALIF., US

8110 Request for examination paragraph 44
8127 New person/name/address of the applicant

Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG

8131 Rejection