DE10327497A1 - Vorrichtung zum Eichen einer Hochfrequenzsignalmessausrüstung - Google Patents
Vorrichtung zum Eichen einer Hochfrequenzsignalmessausrüstung Download PDFInfo
- Publication number
- DE10327497A1 DE10327497A1 DE10327497A DE10327497A DE10327497A1 DE 10327497 A1 DE10327497 A1 DE 10327497A1 DE 10327497 A DE10327497 A DE 10327497A DE 10327497 A DE10327497 A DE 10327497A DE 10327497 A1 DE10327497 A1 DE 10327497A1
- Authority
- DE
- Germany
- Prior art keywords
- transmission path
- calibration
- signal transmission
- voltage
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000005259 measurement Methods 0.000 claims abstract description 14
- 230000008054 signal transmission Effects 0.000 claims description 65
- 230000006698 induction Effects 0.000 claims description 13
- 239000000523 sample Substances 0.000 claims description 7
- 230000004044 response Effects 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 description 25
- 230000000694 effects Effects 0.000 description 6
- 235000014676 Phragmites communis Nutrition 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 241000219492 Quercus Species 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002181122A JP4216528B2 (ja) | 2002-06-21 | 2002-06-21 | 高周波信号測定装置の校正装置 |
| JP2002/181122 | 2002-06-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE10327497A1 true DE10327497A1 (de) | 2004-02-26 |
Family
ID=29728279
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE10327497A Ceased DE10327497A1 (de) | 2002-06-21 | 2003-06-17 | Vorrichtung zum Eichen einer Hochfrequenzsignalmessausrüstung |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6958612B2 (https=) |
| JP (1) | JP4216528B2 (https=) |
| DE (1) | DE10327497A1 (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7489145B2 (en) * | 2005-12-14 | 2009-02-10 | Daihen Corporation | Plasma processing system |
| JP4726679B2 (ja) * | 2006-03-31 | 2011-07-20 | ルネサスエレクトロニクス株式会社 | 半導体試験方法および半導体装置 |
| US8446143B2 (en) * | 2008-06-27 | 2013-05-21 | National Instruments Corporation | Self-calibration circuit with gyrated output impedance |
| US20100150561A1 (en) * | 2008-12-12 | 2010-06-17 | Seung-Hyun Cho | Optical receiver, optical line terminal and method of recovering received signals |
| JP6672046B2 (ja) * | 2016-04-05 | 2020-03-25 | 日置電機株式会社 | 測定装置 |
| US10908183B2 (en) * | 2017-11-06 | 2021-02-02 | National Instruments Corporation | Active probe powered through driven coax cable |
| US11662378B2 (en) * | 2021-08-13 | 2023-05-30 | Xilinx, Inc. | Reference less glitch detection circuitry with autocalibration |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3112952C2 (de) * | 1981-03-31 | 1994-05-05 | Walther Bender Gmbh & Co Kg Di | Verfahren und Einrichtung zum Bestimmen der Gesamtableitungsimpedanz in einem ungeerdeten Wechselstromnetz |
| US5933013A (en) * | 1995-11-22 | 1999-08-03 | Advantest Corp. | Calibration circuit for calibrating frequency characteristics of an AC/DC converter |
| US6215295B1 (en) * | 1997-07-25 | 2001-04-10 | Smith, Iii Richard S. | Photonic field probe and calibration means thereof |
| US6459335B1 (en) * | 2000-09-29 | 2002-10-01 | Microchip Technology Incorporated | Auto-calibration circuit to minimize input offset voltage in an integrated circuit analog input device |
-
2002
- 2002-06-21 JP JP2002181122A patent/JP4216528B2/ja not_active Expired - Fee Related
-
2003
- 2003-06-05 US US10/455,659 patent/US6958612B2/en not_active Expired - Lifetime
- 2003-06-17 DE DE10327497A patent/DE10327497A1/de not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US6958612B2 (en) | 2005-10-25 |
| JP2004028607A (ja) | 2004-01-29 |
| JP4216528B2 (ja) | 2009-01-28 |
| US20030234654A1 (en) | 2003-12-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OR8 | Request for search as to paragraph 43 lit. 1 sentence 1 patent law | ||
| 8105 | Search report available | ||
| 8127 | New person/name/address of the applicant |
Owner name: AGILENT TECHNOLOGIES, INC., PALO ALTO, CALIF., US |
|
| 8110 | Request for examination paragraph 44 | ||
| 8127 | New person/name/address of the applicant |
Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG |
|
| 8131 | Rejection |