DE69115733T2 - Schaltungselementmessapparat und -verfahren - Google Patents
Schaltungselementmessapparat und -verfahrenInfo
- Publication number
- DE69115733T2 DE69115733T2 DE1991615733 DE69115733T DE69115733T2 DE 69115733 T2 DE69115733 T2 DE 69115733T2 DE 1991615733 DE1991615733 DE 1991615733 DE 69115733 T DE69115733 T DE 69115733T DE 69115733 T2 DE69115733 T2 DE 69115733T2
- Authority
- DE
- Germany
- Prior art keywords
- measuring apparatus
- circuit element
- element measuring
- circuit
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2040559A JP2975389B2 (ja) | 1990-02-21 | 1990-02-21 | 回路素子測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69115733D1 DE69115733D1 (de) | 1996-02-08 |
DE69115733T2 true DE69115733T2 (de) | 1996-05-15 |
Family
ID=12583813
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE1991615733 Expired - Fee Related DE69115733T2 (de) | 1990-02-21 | 1991-02-20 | Schaltungselementmessapparat und -verfahren |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0443835B1 (de) |
JP (1) | JP2975389B2 (de) |
CA (1) | CA2036127A1 (de) |
DE (1) | DE69115733T2 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ES2638765T3 (es) | 2005-01-21 | 2017-10-24 | Abb Research Ltd | Procedimiento y dispositivo para caracterizar las propiedades lineales de un componente eléctrico |
JP5926518B2 (ja) * | 2011-09-07 | 2016-05-25 | 日置電機株式会社 | 測定装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH026268U (de) * | 1988-06-28 | 1990-01-16 | ||
JP2698615B2 (ja) * | 1988-07-05 | 1998-01-19 | 日本ヒューレット・パッカード株式会社 | 回路素子測定装置 |
-
1990
- 1990-02-21 JP JP2040559A patent/JP2975389B2/ja not_active Expired - Fee Related
-
1991
- 1991-02-11 CA CA 2036127 patent/CA2036127A1/en not_active Abandoned
- 1991-02-20 DE DE1991615733 patent/DE69115733T2/de not_active Expired - Fee Related
- 1991-02-20 EP EP19910301344 patent/EP0443835B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CA2036127A1 (en) | 1991-08-22 |
EP0443835A3 (en) | 1992-05-13 |
DE69115733D1 (de) | 1996-02-08 |
JPH03243868A (ja) | 1991-10-30 |
EP0443835A2 (de) | 1991-08-28 |
JP2975389B2 (ja) | 1999-11-10 |
EP0443835B1 (de) | 1995-12-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US |
|
8339 | Ceased/non-payment of the annual fee |