JP4216528B2 - 高周波信号測定装置の校正装置 - Google Patents

高周波信号測定装置の校正装置 Download PDF

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Publication number
JP4216528B2
JP4216528B2 JP2002181122A JP2002181122A JP4216528B2 JP 4216528 B2 JP4216528 B2 JP 4216528B2 JP 2002181122 A JP2002181122 A JP 2002181122A JP 2002181122 A JP2002181122 A JP 2002181122A JP 4216528 B2 JP4216528 B2 JP 4216528B2
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Japan
Prior art keywords
signal transmission
transmission path
signal
voltage
calibration
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Expired - Fee Related
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JP2002181122A
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English (en)
Japanese (ja)
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JP2004028607A (ja
JP2004028607A5 (https=
Inventor
寛 酒寄
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Verigy Singapore Pte Ltd
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Verigy Singapore Pte Ltd
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Priority to JP2002181122A priority Critical patent/JP4216528B2/ja
Priority to US10/455,659 priority patent/US6958612B2/en
Priority to DE10327497A priority patent/DE10327497A1/de
Publication of JP2004028607A publication Critical patent/JP2004028607A/ja
Publication of JP2004028607A5 publication Critical patent/JP2004028607A5/ja
Application granted granted Critical
Publication of JP4216528B2 publication Critical patent/JP4216528B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP2002181122A 2002-06-21 2002-06-21 高周波信号測定装置の校正装置 Expired - Fee Related JP4216528B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2002181122A JP4216528B2 (ja) 2002-06-21 2002-06-21 高周波信号測定装置の校正装置
US10/455,659 US6958612B2 (en) 2002-06-21 2003-06-05 Apparatus for calibrating high frequency signal measurement equipment
DE10327497A DE10327497A1 (de) 2002-06-21 2003-06-17 Vorrichtung zum Eichen einer Hochfrequenzsignalmessausrüstung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002181122A JP4216528B2 (ja) 2002-06-21 2002-06-21 高周波信号測定装置の校正装置

Publications (3)

Publication Number Publication Date
JP2004028607A JP2004028607A (ja) 2004-01-29
JP2004028607A5 JP2004028607A5 (https=) 2005-10-13
JP4216528B2 true JP4216528B2 (ja) 2009-01-28

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ID=29728279

Family Applications (1)

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JP2002181122A Expired - Fee Related JP4216528B2 (ja) 2002-06-21 2002-06-21 高周波信号測定装置の校正装置

Country Status (3)

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US (1) US6958612B2 (https=)
JP (1) JP4216528B2 (https=)
DE (1) DE10327497A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7489145B2 (en) * 2005-12-14 2009-02-10 Daihen Corporation Plasma processing system
JP4726679B2 (ja) * 2006-03-31 2011-07-20 ルネサスエレクトロニクス株式会社 半導体試験方法および半導体装置
US8446143B2 (en) * 2008-06-27 2013-05-21 National Instruments Corporation Self-calibration circuit with gyrated output impedance
US20100150561A1 (en) * 2008-12-12 2010-06-17 Seung-Hyun Cho Optical receiver, optical line terminal and method of recovering received signals
JP6672046B2 (ja) * 2016-04-05 2020-03-25 日置電機株式会社 測定装置
US10908183B2 (en) * 2017-11-06 2021-02-02 National Instruments Corporation Active probe powered through driven coax cable
US11662378B2 (en) * 2021-08-13 2023-05-30 Xilinx, Inc. Reference less glitch detection circuitry with autocalibration

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3112952C2 (de) * 1981-03-31 1994-05-05 Walther Bender Gmbh & Co Kg Di Verfahren und Einrichtung zum Bestimmen der Gesamtableitungsimpedanz in einem ungeerdeten Wechselstromnetz
US5933013A (en) * 1995-11-22 1999-08-03 Advantest Corp. Calibration circuit for calibrating frequency characteristics of an AC/DC converter
US6215295B1 (en) * 1997-07-25 2001-04-10 Smith, Iii Richard S. Photonic field probe and calibration means thereof
US6459335B1 (en) * 2000-09-29 2002-10-01 Microchip Technology Incorporated Auto-calibration circuit to minimize input offset voltage in an integrated circuit analog input device

Also Published As

Publication number Publication date
US6958612B2 (en) 2005-10-25
DE10327497A1 (de) 2004-02-26
JP2004028607A (ja) 2004-01-29
US20030234654A1 (en) 2003-12-25

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