DE102015221209A1 - Optische Baugruppe mit einem Schutzelement und optische Anordnung damit - Google Patents

Optische Baugruppe mit einem Schutzelement und optische Anordnung damit Download PDF

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Publication number
DE102015221209A1
DE102015221209A1 DE102015221209.2A DE102015221209A DE102015221209A1 DE 102015221209 A1 DE102015221209 A1 DE 102015221209A1 DE 102015221209 A DE102015221209 A DE 102015221209A DE 102015221209 A1 DE102015221209 A1 DE 102015221209A1
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DE
Germany
Prior art keywords
membrane
optical
facet
optical assembly
oxide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE102015221209.2A
Other languages
German (de)
English (en)
Inventor
Dirk Heinrich Ehm
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss SMT GmbH
Original Assignee
Carl Zeiss SMT GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss SMT GmbH filed Critical Carl Zeiss SMT GmbH
Priority to DE102015221209.2A priority Critical patent/DE102015221209A1/de
Priority to PCT/EP2016/075845 priority patent/WO2017072195A1/en
Priority to EP16788086.3A priority patent/EP3368948B1/en
Priority to JP2018522015A priority patent/JP6805248B2/ja
Priority to TW105134737A priority patent/TWI745312B/zh
Publication of DE102015221209A1 publication Critical patent/DE102015221209A1/de
Priority to US15/965,913 priority patent/US11022893B2/en
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/7015—Details of optical elements
    • G03F7/70175—Lamphouse reflector arrangements or collector mirrors, i.e. collecting light from solid angle upstream of the light source
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/14—Protective coatings, e.g. hard coatings
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/18—Coatings for keeping optical surfaces clean, e.g. hydrophobic or photo-catalytic films
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
    • G02B26/0841—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD the reflecting element being moved or deformed by electrostatic means
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/08—Mirrors
    • G02B5/0891—Ultraviolet [UV] mirrors
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
    • G03F1/64—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • G03F7/70116—Off-axis setting using a programmable means, e.g. liquid crystal display [LCD], digital micromirror device [DMD] or pupil facets
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
    • G03F7/70916—Pollution mitigation, i.e. mitigating effect of contamination or debris, e.g. foil traps

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Public Health (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Epidemiology (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Chemical & Material Sciences (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Optical Elements Other Than Lenses (AREA)
DE102015221209.2A 2015-10-29 2015-10-29 Optische Baugruppe mit einem Schutzelement und optische Anordnung damit Ceased DE102015221209A1 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
DE102015221209.2A DE102015221209A1 (de) 2015-10-29 2015-10-29 Optische Baugruppe mit einem Schutzelement und optische Anordnung damit
PCT/EP2016/075845 WO2017072195A1 (en) 2015-10-29 2016-10-26 Optical assembly with a protective element and optical arrangement therewith
EP16788086.3A EP3368948B1 (en) 2015-10-29 2016-10-26 Optical assembly with a protective element and optical arrangement therewith
JP2018522015A JP6805248B2 (ja) 2015-10-29 2016-10-26 保護素子を有する光学アセンブリおよびそのような光学アセンブリを有する光学装置
TW105134737A TWI745312B (zh) 2015-10-29 2016-10-27 具有保護元件的光學組件以及具有此光學組件的光學配置
US15/965,913 US11022893B2 (en) 2015-10-29 2018-04-28 Optical assembly with a protective element and optical arrangement therewith

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102015221209.2A DE102015221209A1 (de) 2015-10-29 2015-10-29 Optische Baugruppe mit einem Schutzelement und optische Anordnung damit

Publications (1)

Publication Number Publication Date
DE102015221209A1 true DE102015221209A1 (de) 2017-05-04

Family

ID=57209463

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102015221209.2A Ceased DE102015221209A1 (de) 2015-10-29 2015-10-29 Optische Baugruppe mit einem Schutzelement und optische Anordnung damit

Country Status (6)

Country Link
US (1) US11022893B2 (https=)
EP (1) EP3368948B1 (https=)
JP (1) JP6805248B2 (https=)
DE (1) DE102015221209A1 (https=)
TW (1) TWI745312B (https=)
WO (1) WO2017072195A1 (https=)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022121000A1 (de) 2021-08-23 2023-02-23 Carl Zeiss Smt Gmbh Spiegelanordnung für eine EUV Projektionsbelichtungsanlage mit einer Schutzvorrichtung zum Schutz der optischen Wirkfläche und EUV-Projektionsbelichtungsanlage
WO2023061713A1 (de) 2021-10-14 2023-04-20 Carl Zeiss Smt Gmbh Mehrfachspiegelanordnung
WO2024052172A1 (de) * 2022-09-09 2024-03-14 Robert Bosch Gmbh Mikrospiegelanordnung mit federnd gelagerten einzelspiegelelementen
WO2026061652A1 (de) 2024-09-19 2026-03-26 Carl Zeiss Smt Gmbh Optisches system mit mehrfachspiegelanordnung und betriebssteuerungsverfahren

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11272606B2 (en) 2017-06-27 2022-03-08 Taiwan Semiconductor Manufacturing Co., Ltd. EUV light source and apparatus for lithography
DE102017211443A1 (de) * 2017-07-05 2019-01-10 Carl Zeiss Smt Gmbh Metrologiesystem mit einer EUV-Optik
DE102018110251B4 (de) * 2018-04-27 2021-03-25 Friedrich-Schiller-Universität Jena Kontaminationsabweisender Spiegel und Verfahren zu dessen Herstellung
DE102019117964A1 (de) 2019-07-03 2020-07-23 Asml Netherlands B.V. Lithographieanlage mit einer Überwachungseinrichtung für ein Pellikel
CA3299707A1 (en) * 2019-07-26 2026-03-02 Deka Products Limited Partnership System and method for free space estimation
DE102019213349A1 (de) * 2019-09-03 2021-03-04 Carl Zeiss Smt Gmbh Spiegelanordnung mit Wasserstoff-Barriere und optische Anordnung
DE102019214269A1 (de) * 2019-09-19 2021-03-25 Carl Zeiss Smt Gmbh Facettenspiegel für eine Beleuchtungsoptik einer Projektionsbelichtungsanlage
DE102024206218A1 (de) * 2024-07-02 2026-01-08 Carl Zeiss Smt Gmbh Element zur Verwendung in einem mikro-elektro-mechanischen System und mikro-elektro-mechanisches System

Citations (4)

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Publication number Priority date Publication date Assignee Title
US6445844B1 (en) * 1999-09-15 2002-09-03 Xros, Inc. Flexible, modular, compact fiber optic switch
EP1791027A1 (en) 2005-11-23 2007-05-30 ASML Netherlands BV Lithographic apparatus and device manufacturing method
US20100195076A1 (en) 2007-10-02 2010-08-05 Carl Zeiss Smt Ag Optical membrane element
US7829248B2 (en) 2007-07-24 2010-11-09 Taiwan Semiconductor Manufacturing Company, Ltd. Pellicle stress relief

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US6701512B2 (en) * 2001-01-24 2004-03-02 Kabushiki Kaisha Toshiba Focus monitoring method, exposure apparatus, and exposure mask
US6594073B2 (en) * 2001-05-30 2003-07-15 Micro Lithography, Inc. Antistatic optical pellicle
DE602004003015T2 (de) * 2003-10-06 2007-02-08 Asml Netherlands B.V. Verfahren und Gerät zur Herstellung einer Schutzschicht auf einem Spiegel
JP2008153396A (ja) * 2006-12-15 2008-07-03 Nikon Corp 照度均一化装置、露光装置、露光方法および半導体デバイスの製造方法
US20080259298A1 (en) 2007-04-19 2008-10-23 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
DE102008028868A1 (de) * 2008-06-19 2009-12-24 Carl Zeiss Smt Ag Optische Baugruppe
NL2005724A (en) * 2009-12-23 2011-06-27 Asml Netherlands Bv Lithographic apparatus and device manufacturing method.
JP2012216743A (ja) * 2010-06-16 2012-11-08 Gigaphoton Inc スペクトル純度フィルタ及びそれを備える極端紫外光生成装置
KR101846336B1 (ko) * 2010-06-25 2018-04-06 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치 및 방법
DE102012202057B4 (de) 2012-02-10 2021-07-08 Carl Zeiss Smt Gmbh Projektionsobjektiv für EUV-Mikrolithographie, Folienelement und Verfahren zur Herstellung eines Projektionsobjektivs mit Folienelement
DE102012204295A1 (de) * 2012-03-19 2013-03-28 Carl Zeiss Smt Gmbh Filterelement
JP6253641B2 (ja) * 2012-05-21 2017-12-27 エーエスエムエル ネザーランズ ビー．ブイ． リフレクタ、ペリクル、リソグラフィマスク、膜、スペクトル純度フィルタ、および、装置
JP5711703B2 (ja) 2012-09-03 2015-05-07 信越化学工業株式会社 Ｅｕｖ用ペリクル
US20150234281A1 (en) * 2012-10-05 2015-08-20 Rudolph Technologies, Inc. Blade for Substrate Edge Protection During Photolithography
JP6382298B2 (ja) * 2013-03-27 2018-08-29 エーエスエムエル ネザーランズ ビー．ブイ． リソグラフィ装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6445844B1 (en) * 1999-09-15 2002-09-03 Xros, Inc. Flexible, modular, compact fiber optic switch
EP1791027A1 (en) 2005-11-23 2007-05-30 ASML Netherlands BV Lithographic apparatus and device manufacturing method
US7829248B2 (en) 2007-07-24 2010-11-09 Taiwan Semiconductor Manufacturing Company, Ltd. Pellicle stress relief
US20100195076A1 (en) 2007-10-02 2010-08-05 Carl Zeiss Smt Ag Optical membrane element

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022121000A1 (de) 2021-08-23 2023-02-23 Carl Zeiss Smt Gmbh Spiegelanordnung für eine EUV Projektionsbelichtungsanlage mit einer Schutzvorrichtung zum Schutz der optischen Wirkfläche und EUV-Projektionsbelichtungsanlage
DE102022121000B4 (de) 2021-08-23 2024-03-07 Carl Zeiss Smt Gmbh Spiegelanordnung für eine EUV-Projektionsbelichtungsanlage mit einer Schutzvorrichtung zum Schutz der optischen Wirkfläche und EUV-Projektionsbelichtungsanlage
WO2023061713A1 (de) 2021-10-14 2023-04-20 Carl Zeiss Smt Gmbh Mehrfachspiegelanordnung
DE102021211619A1 (de) 2021-10-14 2023-04-20 Carl Zeiss Smt Gmbh EUV- Mehrfachspiegelanordnung
WO2024052172A1 (de) * 2022-09-09 2024-03-14 Robert Bosch Gmbh Mikrospiegelanordnung mit federnd gelagerten einzelspiegelelementen
WO2026061652A1 (de) 2024-09-19 2026-03-26 Carl Zeiss Smt Gmbh Optisches system mit mehrfachspiegelanordnung und betriebssteuerungsverfahren

Also Published As

Publication number Publication date
EP3368948A1 (en) 2018-09-05
TWI745312B (zh) 2021-11-11
TW201727277A (zh) 2017-08-01
US11022893B2 (en) 2021-06-01
JP6805248B2 (ja) 2020-12-23
JP2018533770A (ja) 2018-11-15
US20180246413A1 (en) 2018-08-30
EP3368948B1 (en) 2019-09-18
WO2017072195A1 (en) 2017-05-04

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