DE102013217279A1 - Selbstreinigender Partikelfilter in einer Schnüffelsonde - Google Patents

Selbstreinigender Partikelfilter in einer Schnüffelsonde Download PDF

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Publication number
DE102013217279A1
DE102013217279A1 DE201310217279 DE102013217279A DE102013217279A1 DE 102013217279 A1 DE102013217279 A1 DE 102013217279A1 DE 201310217279 DE201310217279 DE 201310217279 DE 102013217279 A DE102013217279 A DE 102013217279A DE 102013217279 A1 DE102013217279 A1 DE 102013217279A1
Authority
DE
Germany
Prior art keywords
gas
suction
filter
sniffer probe
sample gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE201310217279
Other languages
German (de)
English (en)
Inventor
Daniel Wetzig
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inficon GmbH Deutschland
Original Assignee
Inficon GmbH Deutschland
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inficon GmbH Deutschland filed Critical Inficon GmbH Deutschland
Priority to DE201310217279 priority Critical patent/DE102013217279A1/de
Priority to PCT/EP2014/067584 priority patent/WO2015028336A1/de
Priority to US14/912,526 priority patent/US20160202138A1/en
Priority to CN201480046484.1A priority patent/CN105556271A/zh
Priority to EP14753063.8A priority patent/EP3039395B1/de
Priority to JP2016537222A priority patent/JP6389524B2/ja
Publication of DE102013217279A1 publication Critical patent/DE102013217279A1/de
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G01M3/202—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material using mass spectrometer detection systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
    • G01N1/2205—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling with filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/24—Suction devices

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Measuring Volume Flow (AREA)
  • Sampling And Sample Adjustment (AREA)
DE201310217279 2013-08-29 2013-08-29 Selbstreinigender Partikelfilter in einer Schnüffelsonde Withdrawn DE102013217279A1 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
DE201310217279 DE102013217279A1 (de) 2013-08-29 2013-08-29 Selbstreinigender Partikelfilter in einer Schnüffelsonde
PCT/EP2014/067584 WO2015028336A1 (de) 2013-08-29 2014-08-18 Selbstreinigender partikelfilter in einer schnüffelsonde
US14/912,526 US20160202138A1 (en) 2013-08-29 2014-08-18 Self-Cleaning Particle Filter in a Sniffer Probe
CN201480046484.1A CN105556271A (zh) 2013-08-29 2014-08-18 吸气探针内的自洁性颗粒物过滤器
EP14753063.8A EP3039395B1 (de) 2013-08-29 2014-08-18 Selbstreinigender partikelfilter in einer schnüffelsonde
JP2016537222A JP6389524B2 (ja) 2013-08-29 2014-08-18 嗅気型プローブ内の自己浄化型粒子フィルタ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE201310217279 DE102013217279A1 (de) 2013-08-29 2013-08-29 Selbstreinigender Partikelfilter in einer Schnüffelsonde

Publications (1)

Publication Number Publication Date
DE102013217279A1 true DE102013217279A1 (de) 2015-03-05

Family

ID=51383719

Family Applications (1)

Application Number Title Priority Date Filing Date
DE201310217279 Withdrawn DE102013217279A1 (de) 2013-08-29 2013-08-29 Selbstreinigender Partikelfilter in einer Schnüffelsonde

Country Status (6)

Country Link
US (1) US20160202138A1 (https=)
EP (1) EP3039395B1 (https=)
JP (1) JP6389524B2 (https=)
CN (1) CN105556271A (https=)
DE (1) DE102013217279A1 (https=)
WO (1) WO2015028336A1 (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109974946A (zh) * 2019-03-12 2019-07-05 安徽信息工程学院 汽车过滤器检测装置及其检测方法
DE102020100671A1 (de) * 2020-01-14 2021-07-15 Inficon Gmbh Schnüffelsonde mit Ansaugkragen
DE102020210442A1 (de) 2020-08-17 2022-02-17 Inficon Gmbh Schnüffelsonde mit Bypass-Öffnung für einen Gaslecksucher

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106017818B (zh) * 2016-06-01 2018-12-04 天津博益气动股份有限公司 一种吸入式氮氢检漏仪的吸枪探头
DE102016217891A1 (de) * 2016-09-19 2018-03-22 Inficon Gmbh Füllsondenaufsatz mit langgestrecktem gasleitendem Element
FR3092913B1 (fr) 2019-02-14 2021-04-30 Pfeiffer Vacuum Sonde de reniflage et détecteur de fuites
FR3101145B1 (fr) * 2019-09-20 2021-09-17 Pfeiffer Vacuum Sonde de reniflage et détecteur de fuites
CN110672281A (zh) * 2019-09-26 2020-01-10 大族激光科技产业集团股份有限公司 一种气体泄露检测探针及气密性检测装置
DK180705B1 (en) 2019-12-20 2021-12-07 Agramkow Fluid Systems As Leak detector
DE102020102630A1 (de) * 2020-02-03 2020-07-23 Inficon Gmbh Schnüffelsonde mit Abschirmung

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4326264A1 (de) * 1993-08-05 1995-02-09 Leybold Ag Testgasdetektor mit Vakuumpumpe sowie Verfahren zum Betrieb eines Testgasdetektors dieser Art
US5728929A (en) * 1995-05-24 1998-03-17 Alcatel Cit Installation for detecting the presence of helium in a fluid circuit
WO2009033978A1 (de) 2007-09-12 2009-03-19 Inficon Gmbh Schnüffellecksucher
DE102009004363A1 (de) * 2009-01-08 2010-07-15 Inficon Gmbh Leckdetektionsverfahren
US20110290006A1 (en) * 2010-05-28 2011-12-01 Charles Perkins Leak test probe for use in industrial facilities

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1246278B (de) * 1961-01-12 1967-08-03 Kernforschung Gmbh Ges Fuer Verfahren und Vorrichtung zur Auffindung von Leckstellen in mit Fluessigkeit gefuellten Anlagen und Rohrleitungen
US4319891A (en) * 1980-11-13 1982-03-16 Gas Research Institute Combined sonic agglomerator/cross flow gas filtration system and method
JPH08243330A (ja) * 1995-03-13 1996-09-24 Toyota Autom Loom Works Ltd ろ過装置
CN1301403C (zh) * 2004-08-02 2007-02-21 天津港保税区鑫利达石油技术发展有限公司 探头构造及多点气体检测装置
DE102006056215A1 (de) * 2006-11-29 2008-06-05 Inficon Gmbh Schnüffellecksuchgerät
CN101034030A (zh) * 2007-03-04 2007-09-12 淄博思科电子技术开发有限公司 探头内置式氢气检漏仪

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4326264A1 (de) * 1993-08-05 1995-02-09 Leybold Ag Testgasdetektor mit Vakuumpumpe sowie Verfahren zum Betrieb eines Testgasdetektors dieser Art
US5728929A (en) * 1995-05-24 1998-03-17 Alcatel Cit Installation for detecting the presence of helium in a fluid circuit
WO2009033978A1 (de) 2007-09-12 2009-03-19 Inficon Gmbh Schnüffellecksucher
DE102009004363A1 (de) * 2009-01-08 2010-07-15 Inficon Gmbh Leckdetektionsverfahren
US20110290006A1 (en) * 2010-05-28 2011-12-01 Charles Perkins Leak test probe for use in industrial facilities

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109974946A (zh) * 2019-03-12 2019-07-05 安徽信息工程学院 汽车过滤器检测装置及其检测方法
DE102020100671A1 (de) * 2020-01-14 2021-07-15 Inficon Gmbh Schnüffelsonde mit Ansaugkragen
DE102020210442A1 (de) 2020-08-17 2022-02-17 Inficon Gmbh Schnüffelsonde mit Bypass-Öffnung für einen Gaslecksucher
US12540874B2 (en) 2020-08-17 2026-02-03 Inficon Gmbh Sniffer probe having a bypass opening, for a gas leak detector

Also Published As

Publication number Publication date
EP3039395A1 (de) 2016-07-06
CN105556271A (zh) 2016-05-04
WO2015028336A1 (de) 2015-03-05
US20160202138A1 (en) 2016-07-14
JP2016529502A (ja) 2016-09-23
JP6389524B2 (ja) 2018-09-12
EP3039395B1 (de) 2019-12-18

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R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee