DE102010006368A1 - Method for measurement of thickness of stack of leaf-shaped material i.e. paper sheet, for shredding in shredder, involves performing thickness measurement away from channel and by device for measurement of thickness of stack - Google Patents

Abstract

The method involves carrying out measurement of thickness of a stack of leaf-shaped material i.e. paper sheet, outside of a material feed channel (5) provided in a housing (2) of a shredder (1). The measurement of the thickness of the stack is performed away from the channel in a region close to an upper edge of the housing and by a device for measurement of the thickness of the stack. The device is arranged at or in an upper part (4) of the housing. The upper edge of the housing is turned toward an operator. The measurement of the thickness of the stack is linear over whole stack width. Independent claims are also included for the following: (1) a shredder comprising a cutting platform (2) a device for measurement of thickness of material stacks.

Description

The invention relates to a document shredder with a device for measuring the thickness of the supplied material stack.

From the prior art for shredders various devices for the measurement of the thickness of the supplied stack of sheet material known.

So is out of the DE 40 25 631 A1 a file folder is known which has a funnel-shaped paper feed. On the cutting side, this paper feed is designed as a channel-like slot. This channel-like slot also forms a Blattzahlbegrenzer.

Even with a document shredder according to the DE 41 24 669 A1 a paper feeder is provided which extends in a funnel shape from the outside of the housing inwards towards the cutting unit. The end portion of this funnel-shaped paper feed is also designed as Dickenbegrenzer for the supplied paper stack as in the aforementioned technical solution.

From the EP 0 855 221 B1 For example, a device is known for measuring the thickness of a multilayer sheet for processing. This device is arranged on a document shredder. The device for measuring the thickness is arranged sideways of the intake nip / material stack feed in a housing cut. A gap-like device for measuring the thickness of the intended for insertion into the nip of the shredder material stack is also in a shredder after WO 2007/109753 A2 (≈ US 2007/0221767 A1 ) intended. Here, the V-shaped measuring device is arranged immediately in front of the material feed-in gap and reaches up to its edge, which faces the operator.

A disadvantage of these mentioned known devices for measuring the thickness of the material stack provided for processing on the one hand - in the two first-mentioned devices - that a too thick stack of material is detected only after insertion into the paper feeder. In general, however, it is then too late, the material stack is jammed in the paper feeder in the range of Dickenbegrenzers. Disruptions in the workflow are the result. Often, a rigid object (a pair of scissors, letter openers, or the like) must be used to remove the jammed paper scraps from the paper tray. Such problems arise especially when sheets of paper stack are connected to each other with paper clips and / or staples. In the material stack then thick areas are available in the area of paper clips or staples. Because the supplied material stack is already covered by the cutting salts, the following thicker area of the material stack is pulled with force into the open gap of the thickness limiter and thus only correctly clamped.

On the other hand, it is disadvantageous in the case of the two last-mentioned devices, in which the thickness of the material stack to be fed outside the paper feed, the Einzugsgaltes takes place, that the measurement of the material stack provided for processing does not take place until no stack of material has been introduced into the draw-in gap or if material still in it is completely retracted. The still protruding from the nip portion of the supplied material stack is hindering or falsifying the measurement result in the measurement of a new, intended for processing paper stack.

Therefore, the object of the invention is to find a shredder with a device / device for measuring the thickness of a material stack provided for processing, which does not have the disadvantages mentioned.

The object is achieved by a method for measuring the thickness of a sheet material consisting of material stack with the features of claim 1; Claims 2 to 4 disclose alternative embodiments and further developments of the invention. as well as through a shredder

The novel method according to the invention for measuring the thickness of a material stack of sheet material intended for shredding in a document shredder, in which the measurement of the thickness takes place outside a material supply channel provided in the shredder's housing, provides that the measurement of the thickness at a substantial distance away from Material supply channel is made in a region near the operator facing upper edge of the housing and by means of a on the housing or in the housing, preferably on / in the upper part of the housing, arranged device for measuring the thickness. With this new way of measuring the thickness of a material stack, it is possible to measure the thickness of a further material stack, even though a material stack is drawn in in the material supply channel or sections of the same still protrude from the material supply channel. Unproductive time intervals during the shredder operating time are avoided. This has an advantageous effect on the energy consumption and the life of the cutting unit.

According to one embodiment of the invention, the measurement of the thickness over the entire width of the material stack provided for shredding in the document shredder takes place. This measurement can be linear or, which is particularly advantageous, over a surface portion of the material stack. This type of measurement brings particular advantage if held together in the respective material stack with paper clips or staples sheet material, eg. As paper sheets, are present. By measuring over a surface portion of the material stack incorrect determination of the thickness can be avoided.

By measuring the thickness over the entire width of the material stack can also be detected during the measurement whether the material stack z. For example, if the width of an A4 or A3 size or smaller format is wider, the wider the stack of material supplied, the more power is required on the cutterbar. Conversely, this means at the same maximum power that with a relatively narrow width of the supplied material stack, the number of sheets in the material stack can be larger. In conjunction with appropriate software for the measuring arrangement / circuit arrangement of the device for measuring the thickness, the maximum power designed for the respective document shredder can be used optimally for the comminution of a fed material stack.

Advantageous embodiments of the invention are also that the measurement of the thickness with a capacitive measuring method or the measurement with an optical measurement method or the measurement is carried out with a pneumatic measurement method or the measurement with a measuring method in which mechanical sensors are used. Which measuring method is used is determined by the respective overall concept of the document shredder type in question.

For carrying out the method according to the invention, a document shredder is provided, which has at least one housing, a cutting mechanism arranged in the housing and a material supply channel leading from a housing outer surface to the cutting unit and also an apparatus arranged outside the material supply channel for measuring the thickness of the material stack to be supplied. Advantageously, the housing of the shredder consists of a lower part and a top, wherein the cutting mechanism is arranged substantially in the upper part of the housing and the lower part is generally used to hold a collecting container for the reduced material. In a novel design according to the invention, the device for measuring the thickness of this document shredder is far away from the material supply channel and in a region of the housing, which is close to the operator facing upper edge of the housing.

According to an advantageous embodiment, the device for measuring the thickness of a control tunnel whose cross-section is made wide and flat. Preferably, this control tunnel is provided in the operator-near edge region on the housing on a storage surface which extends from the inlet opening of the material supply channel to the edge of the housing facing the operator. This storage surface is preferably arranged lowered in the surface of the upper part of the housing. In a further embodiment of the invention, a surface portion of the shelf is a part of the control tunnel.

Preferably, means for capacitive measurement of the thickness of the material stack are arranged in or on the control tunnel, which means may also be integral with parts of the control tunnel. Alternatively, means for pneumatically measuring the thickness of the material stack or means for optically measuring the thickness of the material stack or means for mechanically grooving measurement of the thickness of the material stack may be arranged in the control tunnel as measuring arrangement. Depending on the design and application of the shredder, a combination of the aforementioned means for measuring the thickness can be applied.

According to a further basic embodiment, the device for measuring the thickness (the control tunnel) is a gap-like control pocket, the opening of which is arranged in the front of the upper part of the housing and which itself projects into the housing. The variant embodiments of a measuring arrangement according to the invention for measuring the thickness are also used in this embodiment variant.

The invention will be described below with reference to embodiments schematically illustrated in drawings and in details. Show it:

1 a shredder with a first embodiment of the new device for measuring the thickness of the material stack;

2 a further view of the device for measuring the thickness according to 1 ;

3 a second embodiment of a device for measuring the thickness of the material stack on a document shredder and

4 another view of the device after 3 ,

1 shows a shredder 1 according to the invention. This has a housing 2 with a lower part 3 and a top 4 , In the case 2 is a cutting unit - not shown - arranged. In an upper surface of the upper part 4 is the opening of a material supply channel 5 intended. This material supply channel 5 is guided to the cutting unit, not shown here. Through this material supply channel 5 For example, the material intended for comminution, the material stack consisting of sheet material, is fed to the cutting unit.

In this embodiment, before the opening of the material supply channel 5 a shelf 6 provided, which up to the front, the operator-facing edge of the housing 2 . 4 sufficient. The front surface of the upper part 4 has the reference number 4a , In one area of the storage area 6 , in the front surface area of the storage area facing the operator 6 is the novel, inventive control tunnel 8th for measuring the thickness of the material stack provided for feeding. This control tunnel 8th consists of a bar-shaped bracket 7 that forms a gap over a surface area 6a , please refer 2 , the storage area 6 is arranged, via its 6a entire width. In the exemplary embodiment shown, a capacitive measuring method / arrangement is used to measure the thickness. This is the web-like part, the temple 7 a plate of a capacitor of said measurement / circuitry and the underlying surface area 6a the second plate of the capacitor. The material stack introduced for thickness control is the dielectric for this capacitor arrangement. Depending on the thickness of the introduced material stack, different measured values result, which are evaluated in an evaluation unit (not shown here) of the document shredder. The measurement result is preferably displayed optically; advantageous in a conventional manner with a plurality of light-emitting diodes in a light strip, depending on the thickness of the tested material stack in the colors green, yellow, red light. The meaning of these control colors is known per se. In the case of green, there will be no problems with the shredding of the paper stack, with the color yellow a border area is reached and with the color red the tested material stack should not be introduced into the material supply channel, since a shutdown of the cutting plant due to overload must be expected.

In this exemplary embodiment, it is also preferably provided in an inventive design that the area belonging to the capacitive measuring arrangement 6a the shelf 6 is covered with a thin, electrically conductive film or provided with an electrically conductive paint.

According to what has been said earlier, the one in the control tunnel 8th applied measuring method for measuring the thickness of the intended material stack of a different kind, as already mentioned above.

In the 3 is a second embodiment of the inventive device for measuring the thickness of a shredder 1 shown. The device for measuring the thickness (the control tunnel) is here as a control bag 9 executed. The opening of this gap-like control bag 9 is in the front area 4a of the upper part 4 arranged and same 9 extends into the housing 2 into it. This check bag 9 can as well as the previously described control tunnel 8th metrologically optionally be equipped with one or the other measurement method / measurement arrangement mentioned.

This embodiment of the invention is preferably used when in the shredder 1 in addition to the blade for the sheet material another cutter with an associated second material supply channel 10 for other material, such as floppy disks, CDs, DVDs and the like, which is usually in front of the material supply channel 5 is arranged for paper-like material.

Although the above drawing features show several preferred embodiments, other embodiments of the invention are also contemplated, as mentioned in the discussion. This disclosure provides illustrative embodiments of the invention by way of example and not limitation. Those skilled in the art can devise numerous other modifications and embodiments that fall within the spirit and scope of the inventive principles.

LIST OF REFERENCE NUMBERS

1

paper shredder

2

casing

3

Lower part of Pos. 2

4

Top of Pos. 2

4a

Front surface of pos. 4

5

Material supply channel

6

shelf

6a

Area of Pos. 6

7

bar-shaped bracket

8th

control tunnel

9

Control bag (slit-like)

10

second material supply channel

QUOTES INCLUDE IN THE DESCRIPTION

This list of the documents listed by the applicant has been generated automatically and is included solely for the better information of the reader. The list is not part of the German patent or utility model application. The DPMA assumes no liability for any errors or omissions.

Cited patent literature

• DE 4025631 A1 [0003]
• DE 4124669 A1 [0004]
• EP 0855221 B1 [0005]
• WO 2007/109753 A2 [0005]
• US 2007/0221767 A1 [0005]

Claims (19)

Method for measuring the thickness of a shredder in a shredder ( 1 ) provided material sheet of sheet-like material, wherein the measurement of the thickness outside of a housing ( 2 ) of the shredder ( 1 ) provided material supply channel ( 5 ), characterized in that the measurement of the thickness removed from the material supply channel ( 5 ) in an area near the operator facing upper edge of the housing ( 2 ) and by means of a on the housing ( 2 ) or in the housing ( 2 ), preferably on / in the upper part ( 4 ) of the housing ( 2 ), arranged device for measuring the thickness is made. A method according to claim 1, characterized in that the measurement of the thickness over the entire width of the intended material stack takes place. A method according to claim 1 or 2, characterized in that the measurement of the thickness is effected by a capacitive measuring method. A method according to claim 1 or 2, characterized in that the measurement is carried out with an optical measurement method. A method according to claim 1 or 2, characterized in that the measurement is carried out with a pneumatic measuring method. A method according to claim 1 or 2, characterized in that the measurement is carried out with a measuring method in which mechanical sensors are used. A method according to claim 2, 3, 4, 5 or 6, characterized in that the measurement of the thickness over the entire width of the intended material stack is linear. A method according to claim 2, 3, 4, 5 or 6, characterized in that the measurement of the thickness over the entire width of the intended material stack over a surface portion of the material stack takes place. Shredder, at least comprising a housing ( 2 ), one in the housing ( 2 ) arranged cutting unit, one of a housing outer surface leading to the cutting unit material supply channel ( 5 ) and one outside the material supply channel ( 5 ) arranged device for measuring the thickness of the material stack to be supplied, characterized in that the device for measuring the thickness far away from the material supply channel ( 5 ) and in an area of the housing ( 2 ), which is close to the operator facing upper edge of the housing ( 2 ) lies. Shredder according to claim 9, characterized in that the device for measuring the thickness of a control tunnel ( 8th ) is, whose cross-section is made wide and flat. Shredder according to claim 9, characterized in that the device for measuring the thickness of a gap-like control pocket ( 9 ) whose opening in the front ( 4a ) of the upper part ( 4 ) of the housing ( 2 ) is arranged and selbige ( 9 ) protrudes into the housing. Shredder according to claim 10, characterized in that the control tunnel ( 8th ) in the near-edge area above a shelf ( 6 ) of the upper part ( 4 ) on the housing ( 2 ) is arranged Shredder according to claim 12, characterized in that a surface section ( 6a ) of the storage area ( 6 ) Part of the control tunnel ( 8th ). Shredder according to claim 10, 11, 12 or 13, characterized in that in the control tunnel ( 8th ) or in the control bag ( 9 ) Means for capacitive measurement of the thickness of the material stack are arranged. Shredder according to claim 10, 11, 12 or 13, characterized in that in the control tunnel ( 8th ) or in the control bag ( 9 ) Means for pneumatic measurement of the thickness of the material stack are arranged. Shredder according to claim 10, 11, 12 or 13, characterized in that in the control tunnel ( 8th ) or in the control bag ( 9 ) Means for optically controlling the thickness of the material stack are arranged. Shredder according to claim 10, 11, 12 or 13, characterized in that in the control tunnel ( 8th ) or in the control bag ( 9 ) Means for mechanically groping the thickness of the material stack are arranged. Device for measuring the thickness of a material stack characterized according to at least one of the disclosed in the application features. Method for measuring the thickness of a material stack characterized according to at least one of the disclosed in the application features.

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