DE102008057028A1 - Vorrichtung zum Kontaktieren von Schaltungen - Google Patents

Vorrichtung zum Kontaktieren von Schaltungen Download PDF

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Publication number
DE102008057028A1
DE102008057028A1 DE102008057028A DE102008057028A DE102008057028A1 DE 102008057028 A1 DE102008057028 A1 DE 102008057028A1 DE 102008057028 A DE102008057028 A DE 102008057028A DE 102008057028 A DE102008057028 A DE 102008057028A DE 102008057028 A1 DE102008057028 A1 DE 102008057028A1
Authority
DE
Germany
Prior art keywords
circuit
plate
contact means
needle carrier
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102008057028A
Other languages
German (de)
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE102008057028A priority Critical patent/DE102008057028A1/de
Publication of DE102008057028A1 publication Critical patent/DE102008057028A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Tests Of Electronic Circuits (AREA)
DE102008057028A 2007-11-12 2008-11-12 Vorrichtung zum Kontaktieren von Schaltungen Withdrawn DE102008057028A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE102008057028A DE102008057028A1 (de) 2007-11-12 2008-11-12 Vorrichtung zum Kontaktieren von Schaltungen

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102007054168.8 2007-11-12
DE102007054168 2007-11-12
DE102008057028A DE102008057028A1 (de) 2007-11-12 2008-11-12 Vorrichtung zum Kontaktieren von Schaltungen

Publications (1)

Publication Number Publication Date
DE102008057028A1 true DE102008057028A1 (de) 2009-09-03

Family

ID=40639228

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102008057028A Withdrawn DE102008057028A1 (de) 2007-11-12 2008-11-12 Vorrichtung zum Kontaktieren von Schaltungen

Country Status (2)

Country Link
DE (1) DE102008057028A1 (fr)
WO (1) WO2009062696A2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010026894A1 (de) 2010-07-12 2012-01-12 Christian Ratzky Vorrichtung zur Ermittlung einer Position

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3639361A1 (de) * 1986-11-18 1988-05-19 Luther Erich Geraet zum pruefen von leiterplatten
US5500606A (en) * 1993-09-16 1996-03-19 Compaq Computer Corporation Completely wireless dual-access test fixture
US6005405A (en) * 1997-06-30 1999-12-21 Hewlett Packard Company Probe plate assembly for high-node-count circuit board test fixtures
DE10219619A1 (de) * 2002-05-02 2003-11-27 Scorpion Technologies Ag Testvorrichtung für Leiterplatten
US7616019B2 (en) * 2006-05-08 2009-11-10 Aspen Test Engineering, Inc. Low profile electronic assembly test fixtures

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010026894A1 (de) 2010-07-12 2012-01-12 Christian Ratzky Vorrichtung zur Ermittlung einer Position

Also Published As

Publication number Publication date
WO2009062696A3 (fr) 2009-09-11
WO2009062696A2 (fr) 2009-05-22

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Legal Events

Date Code Title Description
8181 Inventor (new situation)

Inventor name: RATZKY, BRUNO, 78628 ROTTWEIL, DE

R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee