DE102006048240A1 - Flüssigkeitsküvette - Google Patents
Flüssigkeitsküvette Download PDFInfo
- Publication number
- DE102006048240A1 DE102006048240A1 DE102006048240A DE102006048240A DE102006048240A1 DE 102006048240 A1 DE102006048240 A1 DE 102006048240A1 DE 102006048240 A DE102006048240 A DE 102006048240A DE 102006048240 A DE102006048240 A DE 102006048240A DE 102006048240 A1 DE102006048240 A1 DE 102006048240A1
- Authority
- DE
- Germany
- Prior art keywords
- probe
- manufacture
- holder surface
- printed products
- object consists
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/08—Means for establishing or regulating a desired environmental condition within a sample chamber
- G01Q30/12—Fluid environment
- G01Q30/14—Liquid environment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
Landscapes
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Health & Medical Sciences (AREA)
- Nanotechnology (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analytical Chemistry (AREA)
- Sampling And Sample Adjustment (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005316287A JP4660782B2 (ja) | 2005-10-31 | 2005-10-31 | 液中セル |
JP2005-316287 | 2005-10-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE102006048240A1 true DE102006048240A1 (de) | 2007-05-16 |
DE102006048240B4 DE102006048240B4 (de) | 2017-11-09 |
Family
ID=37982820
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102006048240.9A Expired - Fee Related DE102006048240B4 (de) | 2005-10-31 | 2006-10-11 | Flüssigkeitsküvette |
Country Status (3)
Country | Link |
---|---|
US (1) | US7580125B2 (de) |
JP (1) | JP4660782B2 (de) |
DE (1) | DE102006048240B4 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101866804B (zh) * | 2010-04-14 | 2012-05-16 | 北京富纳特创新科技有限公司 | 透射电镜微栅 |
EP2821796B1 (de) * | 2013-07-05 | 2024-09-04 | Universität Basel | Probenhalter für ein Rasterkraftmikroskop |
US20150231630A1 (en) * | 2014-02-19 | 2015-08-20 | Rarecyte, Inc. | Tube for processing or storing a sample |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3998592A (en) * | 1975-12-24 | 1976-12-21 | Ford Motor Company | Thermoelectric heat pump for chemiluminescence detectors |
US4566791A (en) * | 1983-10-31 | 1986-01-28 | Pacific Scientific Company | Fluid sample cell comprising Fresnel sectors |
US4756883A (en) * | 1986-09-16 | 1988-07-12 | E. I. Du Pont De Nemours And Company | Analysis device |
US4935634A (en) * | 1989-03-13 | 1990-06-19 | The Regents Of The University Of California | Atomic force microscope with optional replaceable fluid cell |
US5170286A (en) * | 1991-02-19 | 1992-12-08 | The United States Of America As Represented By The Secretary Of The Department Of Health And Human Services | Rapid exchange imaging chamber for stop-flow microscopy |
US5140169A (en) * | 1991-04-25 | 1992-08-18 | Conoco Inc. | Long path flow cell resistant to corrosive environments for fiber optic spectroscopy |
US5291775A (en) * | 1992-03-04 | 1994-03-08 | Topometrix | Scanning force microscope with integrated optics and cantilever mount |
US5621210A (en) * | 1995-02-10 | 1997-04-15 | Molecular Imaging Corporation | Microscope for force and tunneling microscopy in liquids |
JPH0954098A (ja) * | 1995-08-14 | 1997-02-25 | Nikon Corp | 走査型プローブ顕微鏡 |
JP3280205B2 (ja) * | 1995-09-20 | 2002-04-30 | 日本電子株式会社 | ホルダ受および試料ホルダ |
JP3480546B2 (ja) * | 1997-02-26 | 2003-12-22 | セイコーインスツルメンツ株式会社 | 走査型プローブ顕微鏡 |
DE19808164A1 (de) * | 1998-02-27 | 1999-09-16 | Bran & Luebbe | Flüssigkeitsmeßzelle |
JP2001242050A (ja) * | 2000-03-01 | 2001-09-07 | Mitsubishi Electric Corp | 平板状試料の表面不純物分析の前処理装置およびこれを用いた平板状試料の表面不純物分析の前処理方法 |
JP2002355799A (ja) * | 2001-03-30 | 2002-12-10 | Hokkaido Technology Licence Office Co Ltd | 微細加工方法及び情報記録方法 |
JP2003121335A (ja) * | 2001-10-10 | 2003-04-23 | Jeol Ltd | カンチレバ保持機構および走査形プローブ顕微鏡 |
JP2003329565A (ja) * | 2002-05-08 | 2003-11-19 | Jeol Ltd | 走査プローブ顕微鏡 |
JP2005163312A (ja) * | 2003-12-01 | 2005-06-23 | Yagikuma:Kk | 組立式標識コーン |
JP2005241281A (ja) * | 2004-02-24 | 2005-09-08 | Jeol Ltd | 走査形プローブ顕微鏡 |
JP5111102B2 (ja) * | 2005-02-24 | 2012-12-26 | エスアイアイ・ナノテクノロジー株式会社 | 走査型プローブ顕微鏡用微動機構およびこれを用いた走査型プローブ顕微鏡 |
-
2005
- 2005-10-31 JP JP2005316287A patent/JP4660782B2/ja not_active Expired - Fee Related
-
2006
- 2006-10-11 DE DE102006048240.9A patent/DE102006048240B4/de not_active Expired - Fee Related
- 2006-10-25 US US11/586,401 patent/US7580125B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20070145290A1 (en) | 2007-06-28 |
US7580125B2 (en) | 2009-08-25 |
DE102006048240B4 (de) | 2017-11-09 |
JP4660782B2 (ja) | 2011-03-30 |
JP2007121191A (ja) | 2007-05-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R082 | Change of representative |
Representative=s name: MEISSNER, BOLTE & PARTNER GBR, DE |
|
R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: G01N0013100000 Ipc: G01Q0030140000 |
|
R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: G01N0013100000 Ipc: G01Q0030140000 Effective date: 20130910 |
|
R081 | Change of applicant/patentee |
Owner name: HITACHI HIGH-TECH SCIENCE CORPORATION, JP Free format text: FORMER OWNER: SEIKO INSTRUMENTS INC., CHIBA-SHI, JP Effective date: 20130903 |
|
R082 | Change of representative |
Representative=s name: MEISSNER, BOLTE & PARTNER GBR, DE Effective date: 20130903 Representative=s name: MEISSNER BOLTE PATENTANWAELTE RECHTSANWAELTE P, DE Effective date: 20130903 |
|
R012 | Request for examination validly filed |
Effective date: 20130925 |
|
R016 | Response to examination communication | ||
R016 | Response to examination communication | ||
R018 | Grant decision by examination section/examining division | ||
R020 | Patent grant now final | ||
R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |