DE102006001476A1 - System und Verfahren zum Verbessern einer Genauigkeit einer elektrischen Ausrüstung durch eine Umweltbedingungskompensation - Google Patents

System und Verfahren zum Verbessern einer Genauigkeit einer elektrischen Ausrüstung durch eine Umweltbedingungskompensation Download PDF

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Publication number
DE102006001476A1
DE102006001476A1 DE102006001476A DE102006001476A DE102006001476A1 DE 102006001476 A1 DE102006001476 A1 DE 102006001476A1 DE 102006001476 A DE102006001476 A DE 102006001476A DE 102006001476 A DE102006001476 A DE 102006001476A DE 102006001476 A1 DE102006001476 A1 DE 102006001476A1
Authority
DE
Germany
Prior art keywords
signal
test
circuit
substrate
path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102006001476A
Other languages
German (de)
English (en)
Inventor
Fred H. Santa Clara Ives
James B. Santa Clara Summers
Brad E. Santa Clara Andersen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE102006001476A1 publication Critical patent/DE102006001476A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0201—Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0213—Electrical arrangements not otherwise provided for
    • H05K1/0237—High frequency adaptations
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistors, capacitors or inductors
    • H05K1/162—Printed circuits incorporating printed electric components, e.g. printed resistors, capacitors or inductors incorporating printed capacitors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007—Types of components
    • H05K2201/10151—Sensor
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/163—Monitoring a manufacturing process
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/165—Stabilizing, e.g. temperature stabilization

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
DE102006001476A 2005-04-04 2006-01-11 System und Verfahren zum Verbessern einer Genauigkeit einer elektrischen Ausrüstung durch eine Umweltbedingungskompensation Withdrawn DE102006001476A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/098,695 US20060224345A1 (en) 2005-04-04 2005-04-04 System and method for improving electrical equipment accuracy by environmental condition compensation
US11/098,695 2005-04-04

Publications (1)

Publication Number Publication Date
DE102006001476A1 true DE102006001476A1 (de) 2006-10-05

Family

ID=36999078

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102006001476A Withdrawn DE102006001476A1 (de) 2005-04-04 2006-01-11 System und Verfahren zum Verbessern einer Genauigkeit einer elektrischen Ausrüstung durch eine Umweltbedingungskompensation

Country Status (4)

Country Link
US (1) US20060224345A1 (https=)
JP (1) JP2006284591A (https=)
CN (1) CN1849055A (https=)
DE (1) DE102006001476A1 (https=)

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ATE498136T1 (de) * 2006-12-19 2011-02-15 Abb Technology Ag Vorrichtung und verfahren zur präzisionserhöhung bei messwandlern
TW200929680A (en) * 2007-12-19 2009-07-01 Wistron Neweb Corp An antenna module and a positioning device thereof
CN102096057B (zh) * 2010-11-16 2013-10-02 北京航天测控技术有限公司 一种电容测量电路的校准方法及装置
US8803505B2 (en) * 2011-09-29 2014-08-12 Imagine Communications Corp. Transmitter calibration system
CN105487023A (zh) * 2016-01-21 2016-04-13 晋江知保企业管理咨询有限公司 工频磁场检测装置
CN105629083A (zh) * 2016-01-21 2016-06-01 晋江知保企业管理咨询有限公司 工频电场检测装置
CN106153173B (zh) * 2016-06-16 2020-01-17 北京海卓同创科技有限公司 一种水中声速测量方法及装置
CN106546901A (zh) * 2016-09-23 2017-03-29 上海为准电子科技有限公司 一种针对射频电路湿度性能的功率校准的方法与装置
CN106772187B (zh) * 2017-03-13 2019-05-14 郑州云海信息技术有限公司 一种用于传输线损耗测试正确性的确定方法
US11209377B2 (en) * 2019-03-05 2021-12-28 Andrew Wireless Systems Gmbh Methods and apparatuses for compensating for moisture absorption
CN110427631B (zh) * 2019-03-27 2023-03-10 贵州电网有限责任公司 理论线损计算所需主网线路与变压器参数双重校核方法
CN110261697B (zh) * 2019-06-20 2022-04-15 中国电力科学研究院有限公司 处于实际运行工况的架空输电线路的线损计算方法及系统
CN113741582B (zh) * 2021-08-27 2022-07-15 安徽创谱仪器科技有限公司 一种电容温度补偿方法及装置
CN119827818B (zh) * 2024-12-31 2025-11-18 科大智能电气技术有限公司 一种湿度补偿的交流高压及超高压线路电压在线测量方法
CN120610149B (zh) * 2025-08-12 2025-12-05 浪潮计算机科技有限公司 一种测试方法、装置、存储介质及电子设备

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FI74549C (fi) * 1986-02-13 1988-02-08 Vaisala Oy Maetningsfoerfarande foer impedanser, saerskilt smao kapacitanser.
JPH02205373A (ja) * 1989-02-03 1990-08-15 Masatoshi Utaka ホール素子のオフセット電圧を自己補償する方法
JPH03277961A (ja) * 1990-03-27 1991-12-09 Matsushita Electric Works Ltd 電気化学式ガスセンサ
US5059892A (en) * 1990-10-15 1991-10-22 Hewlett-Packard Company Radio frequency signal interface
JP3502423B2 (ja) * 1993-10-08 2004-03-02 リーダー電子株式会社 信号処理回路補正装置
US5566088A (en) * 1994-06-13 1996-10-15 Motorola, Inc. Modular radio test system and method
US5572160A (en) * 1994-12-01 1996-11-05 Teradyne, Inc. Architecture for RF signal automatic test equipment
FR2742232B1 (fr) * 1995-12-08 1998-02-06 Sextant Avionique Procede et dispositif pour le test d'instruments de radio-navigation utilisant des appareils de mesure et de generation de signaux standards
US6396287B1 (en) * 1998-09-02 2002-05-28 Anritsu Company Process for measuring output harmonic relative to output fundamental with enhanced accuracy
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JP2000171504A (ja) * 1998-12-04 2000-06-23 Nec Corp 半導体評価装置
FR2790097B1 (fr) * 1999-02-18 2001-04-27 St Microelectronics Sa Procede d'etalonnage d'une sonde de circuit integre rf
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US6903542B2 (en) * 2003-08-29 2005-06-07 Agilent Technologies, Inc. Systems and method for performing RF power measurements

Also Published As

Publication number Publication date
CN1849055A (zh) 2006-10-18
US20060224345A1 (en) 2006-10-05
JP2006284591A (ja) 2006-10-19

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8127 New person/name/address of the applicant

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8139 Disposal/non-payment of the annual fee