DE102004048756A1 - Halbleiter-Strahlungsbildwandler mit rückwärtiger Einstrahlung - Google Patents

Halbleiter-Strahlungsbildwandler mit rückwärtiger Einstrahlung Download PDF

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Publication number
DE102004048756A1
DE102004048756A1 DE102004048756A DE102004048756A DE102004048756A1 DE 102004048756 A1 DE102004048756 A1 DE 102004048756A1 DE 102004048756 A DE102004048756 A DE 102004048756A DE 102004048756 A DE102004048756 A DE 102004048756A DE 102004048756 A1 DE102004048756 A1 DE 102004048756A1
Authority
DE
Germany
Prior art keywords
radiation
photosensitive elements
image converter
scintillator material
absorbs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102004048756A
Other languages
German (de)
English (en)
Inventor
Douglas Albagli
Joseph John Shiang
George Edward Possin
William Andrew Hennesy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of DE102004048756A1 publication Critical patent/DE102004048756A1/de
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/2019—Shielding against direct hits

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Light Receiving Elements (AREA)
DE102004048756A 2003-10-06 2004-10-05 Halbleiter-Strahlungsbildwandler mit rückwärtiger Einstrahlung Withdrawn DE102004048756A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/681,767 US7019304B2 (en) 2003-10-06 2003-10-06 Solid-state radiation imager with back-side irradiation

Publications (1)

Publication Number Publication Date
DE102004048756A1 true DE102004048756A1 (de) 2005-04-21

Family

ID=34377590

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102004048756A Withdrawn DE102004048756A1 (de) 2003-10-06 2004-10-05 Halbleiter-Strahlungsbildwandler mit rückwärtiger Einstrahlung

Country Status (3)

Country Link
US (1) US7019304B2 (enExample)
JP (1) JP2005114731A (enExample)
DE (1) DE102004048756A1 (enExample)

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JP4220819B2 (ja) * 2003-03-27 2009-02-04 浜松ホトニクス株式会社 放射線検出器
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US7412024B1 (en) 2004-04-09 2008-08-12 Xradia, Inc. X-ray mammography
US8067094B2 (en) * 2005-12-23 2011-11-29 3M Innovative Properties Company Films including thermoplastic silicone block copolymers
EP1963897B1 (en) * 2005-12-23 2015-01-21 3M Innovative Properties Company Multilayer films including thermoplastic silicone block copolymers
US7772558B1 (en) * 2006-03-29 2010-08-10 Radiation Monitoring Devices, Inc. Multi-layer radiation detector and related methods
DE102006038969B4 (de) * 2006-08-21 2013-02-28 Siemens Aktiengesellschaft Röntgenkonverterelement und Verfahren zu dessen Herstellung
JP4894453B2 (ja) * 2006-10-25 2012-03-14 コニカミノルタエムジー株式会社 放射線画像検出器
JP2008139064A (ja) * 2006-11-30 2008-06-19 Konica Minolta Medical & Graphic Inc シンチレータパネルの製造方法、シンチレータパネル及び真空蒸着装置
US7687790B2 (en) * 2007-06-07 2010-03-30 General Electric Company EMI shielding of digital x-ray detectors with non-metallic enclosures
US7723687B2 (en) * 2007-07-03 2010-05-25 Radiation Monitoring Devices, Inc. Lanthanide halide microcolumnar scintillators
JP5091066B2 (ja) * 2008-09-11 2012-12-05 富士フイルム株式会社 固体撮像装置の製造方法
JP5197468B2 (ja) * 2009-03-31 2013-05-15 富士フイルム株式会社 放射線検出装置
DE102009024225A1 (de) * 2009-06-08 2010-12-16 Siemens Aktiengesellschaft Röntgendetektor
JP2011017683A (ja) 2009-07-10 2011-01-27 Fujifilm Corp 放射線画像検出器及びその製造方法
FR2948379B1 (fr) 2009-07-21 2011-08-19 Saint Gobain Cristaux Et Detecteurs Scintillateur en halogenure de terre rare revetu d'un absorbeur ou reflecteur de lumiere
JP5535670B2 (ja) * 2010-01-28 2014-07-02 富士フイルム株式会社 放射線画像検出器の製造方法
US8710853B2 (en) * 2010-08-31 2014-04-29 Infineon Technologies Ag Capacitance sensing
JP5485860B2 (ja) * 2010-11-18 2014-05-07 富士フイルム株式会社 放射線画像撮影装置
KR101195415B1 (ko) * 2010-12-29 2012-10-29 포항공과대학교 산학협력단 원자층 증착을 이용한 엑스선（Ｘ­ｒａｙ）／감마선（γ­ｒａｙ）집속 광학계의 제조방법
JP5792472B2 (ja) 2011-01-25 2015-10-14 浜松ホトニクス株式会社 放射線画像取得装置
RU2595795C2 (ru) 2011-03-24 2016-08-27 Конинклейке Филипс Н.В. Спектральный детектор изображения
JP5944254B2 (ja) 2012-07-20 2016-07-05 浜松ホトニクス株式会社 放射線画像取得装置
CN104781691A (zh) * 2012-11-01 2015-07-15 东丽株式会社 放射线检测装置以及其制造方法
EP3004930B1 (en) * 2013-05-24 2019-07-10 Teledyne Dalsa B.V. A moisture protection structure for a device and a fabrication method thereof
EP3358375B1 (en) 2015-09-30 2023-09-13 Hamamatsu Photonics K.K. Radiographic image acquisition system and radiographic image acquisition method
JP2018009803A (ja) * 2016-07-11 2018-01-18 コニカミノルタ株式会社 シンチレータパネル
WO2019226859A1 (en) 2018-05-23 2019-11-28 The Research Foundation For The State University Of New York Flat panel x-ray imager with scintillating glass substrate
JP7325295B2 (ja) * 2019-10-24 2023-08-14 浜松ホトニクス株式会社 シンチレータパネル、放射線検出器、シンチレータパネルの製造方法、及び、放射線検出器の製造方法
CN212696098U (zh) * 2020-06-22 2021-03-12 上海耕岩智能科技有限公司 图像传感器及电子设备
US20230400421A1 (en) * 2020-11-25 2023-12-14 Hamamatsu Photonics K.K. Imaging unit and imaging system

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US5083031A (en) * 1986-08-19 1992-01-21 International Sensor Technology, Inc. Radiation dosimeters
EP0562143B1 (en) * 1992-03-27 1997-06-25 Nichia Kagaku Kogyo K.K. Solid-state image converting device
US5686733A (en) * 1996-03-29 1997-11-11 Mcgill University Megavoltage imaging method using a combination of a photoreceptor with a high energy photon converter and intensifier
CA2184667C (en) * 1996-09-03 2000-06-20 Bradley Trent Polischuk Multilayer plate for x-ray imaging and method of producing same
US6031234A (en) * 1997-12-08 2000-02-29 General Electric Company High resolution radiation imager
US6060714A (en) * 1998-01-23 2000-05-09 Ois Optical Imaging Systems, Inc. Large area imager with photo-imageable interface barrier layer
US6541774B1 (en) * 2000-11-03 2003-04-01 General Electric Company Radiation imager cover
US6784433B2 (en) * 2001-07-16 2004-08-31 Edge Medical Devices Ltd. High resolution detector for X-ray imaging
US6895077B2 (en) * 2001-11-21 2005-05-17 University Of Massachusetts Medical Center System and method for x-ray fluoroscopic imaging
US7122804B2 (en) 2002-02-15 2006-10-17 Varian Medical Systems Technologies, Inc. X-ray imaging device

Also Published As

Publication number Publication date
US20050072931A1 (en) 2005-04-07
US7019304B2 (en) 2006-03-28
JP2005114731A (ja) 2005-04-28

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R012 Request for examination validly filed

Effective date: 20110915

R016 Response to examination communication
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee