CO6990673A2 - Método de imagen doble y sistema para generar una imagen multidimensional de una muestra - Google Patents
Método de imagen doble y sistema para generar una imagen multidimensional de una muestraInfo
- Publication number
- CO6990673A2 CO6990673A2 CO14080252A CO14080252A CO6990673A2 CO 6990673 A2 CO6990673 A2 CO 6990673A2 CO 14080252 A CO14080252 A CO 14080252A CO 14080252 A CO14080252 A CO 14080252A CO 6990673 A2 CO6990673 A2 CO 6990673A2
- Authority
- CO
- Colombia
- Prior art keywords
- image
- sample
- generate
- multidimensional
- double
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/30—Determination of transform parameters for the alignment of images, i.e. image registration
- G06T7/38—Registration of image sequences
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical or photographic arrangements associated with the tube
- H01J37/222—Image processing arrangements associated with the tube
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10056—Microscopic image
- G06T2207/10061—Microscopic image from scanning electron microscope
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20212—Image combination
- G06T2207/20221—Image fusion; Image merging
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/22—Treatment of data
- H01J2237/226—Image reconstruction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/28—Scanning microscopes
- H01J2237/2809—Scanning microscopes characterised by the imaging problems involved
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161547090P | 2011-10-14 | 2011-10-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
CO6990673A2 true CO6990673A2 (es) | 2014-07-10 |
Family
ID=47146687
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CO14080252A CO6990673A2 (es) | 2011-10-14 | 2014-04-14 | Método de imagen doble y sistema para generar una imagen multidimensional de una muestra |
Country Status (12)
Country | Link |
---|---|
US (1) | US9064328B2 (es) |
EP (1) | EP2748793B1 (es) |
CN (1) | CN103946889A (es) |
AU (1) | AU2012322799B2 (es) |
BR (1) | BR112014009093B1 (es) |
CA (1) | CA2850799C (es) |
CO (1) | CO6990673A2 (es) |
ES (1) | ES2655667T3 (es) |
MX (1) | MX2014003968A (es) |
NO (1) | NO2730510T3 (es) |
RU (1) | RU2610216C2 (es) |
WO (1) | WO2013055876A1 (es) |
Families Citing this family (40)
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JP5622779B2 (ja) * | 2012-03-26 | 2014-11-12 | 株式会社東芝 | 試料分析装置および試料分析方法 |
US9201026B2 (en) * | 2012-03-29 | 2015-12-01 | Ingrain, Inc. | Method and system for estimating properties of porous media such as fine pore or tight rocks |
US9746431B2 (en) * | 2012-05-11 | 2017-08-29 | Ingrain, Inc. | Method and system for multi-energy computer tomographic cuttings analysis |
WO2014025970A1 (en) | 2012-08-10 | 2014-02-13 | Ingrain, Inc. | Method for improving the accuracy of rock property values derived from digital images |
JP5798099B2 (ja) * | 2012-09-05 | 2015-10-21 | 株式会社東芝 | 画質調整方法、プログラムおよび電子顕微鏡 |
EP2708874A1 (en) * | 2012-09-12 | 2014-03-19 | Fei Company | Method of performing tomographic imaging of a sample in a charged-particle microscope |
AU2013323422B2 (en) | 2012-09-27 | 2018-07-05 | Ingrain, Inc. | Computed tomography (CT) systems and methods analyzing rock property changes resulting from a treatment |
DE102012217761B4 (de) * | 2012-09-28 | 2020-02-06 | Carl Zeiss Microscopy Gmbh | Verfahren zur Vermeidung von Artefakten beim Serial Block Face Imaging |
WO2014070564A1 (en) | 2012-11-01 | 2014-05-08 | Ingrain Inc. | Characterization of rock and other samples by means of a process and system for the preparation of samples using castable mounting materials |
US9183656B2 (en) | 2014-03-11 | 2015-11-10 | Fei Company | Blend modes for mineralogy images |
TWI518583B (zh) * | 2014-04-18 | 2016-01-21 | 三緯國際立體列印科技股份有限公司 | 立體列印裝置及其列印異常偵測方法 |
CN104574420A (zh) * | 2015-01-29 | 2015-04-29 | 中国石油大学(华东) | 一种纳米级泥页岩数字岩心构建方法 |
EP3250973B1 (en) * | 2015-01-30 | 2020-07-15 | Hewlett-Packard Development Company, L.P. | Control data for generation of 3d objects |
CN107206691B (zh) * | 2015-04-24 | 2020-10-27 | 惠普发展公司有限责任合伙企业 | 用于设置增材制造工艺的三维物体的打印属性的方法 |
US10055884B2 (en) * | 2015-04-30 | 2018-08-21 | Saudi Arabian Oil Company | Three-dimensional fluid micromodels |
CN105092621B (zh) * | 2015-07-28 | 2018-03-06 | 中国科学院自动化研究所 | 显著化生物组织切片膜结构的刻蚀工艺及图像合成方法 |
US20180217059A1 (en) * | 2015-07-31 | 2018-08-02 | Fei Company | Segmented detector for a charged particle beam device |
BR112018003885B1 (pt) | 2015-09-16 | 2022-08-09 | Ingrain, Inc | Método e sistema para estimar a porosidade associada à matéria orgânica, método para avaliar o potencial de produção de um poço ou formação, e, meio de armazenamento legível por computador não transitório |
TWI703313B (zh) * | 2015-12-09 | 2020-09-01 | 台灣超微光學股份有限公司 | 光譜儀的量測方法、光譜儀及其電子電路 |
CN105424607A (zh) * | 2015-12-25 | 2016-03-23 | 中国石油大学(北京) | 基于斜入射光反射差方法的ct装置和方法 |
US10107769B2 (en) | 2016-01-11 | 2018-10-23 | Carl Zeiss X-Ray Microscopy Inc. | Multimodality mineralogy segmentation system and method |
JP6704052B2 (ja) * | 2016-01-11 | 2020-06-03 | カール・ツァイス・エックス−レイ・マイクロスコピー・インコーポレイテッドCarl Zeiss X−Ray Microscopy, Inc. | マルチモダリティ鉱物質セグメント化システムおよび方法 |
CN107481914B (zh) * | 2016-06-08 | 2023-06-06 | 清华大学 | 一种透射型低能量电子显微系统 |
US10324049B2 (en) | 2017-02-15 | 2019-06-18 | Saudi Arabian Oil Company | Rock sample preparation method by using focused ion beam for minimizing curtain effect |
US9905394B1 (en) * | 2017-02-16 | 2018-02-27 | Carl Zeiss Microscopy Gmbh | Method for analyzing an object and a charged particle beam device for carrying out this method |
JP6949535B2 (ja) * | 2017-04-13 | 2021-10-13 | キヤノン株式会社 | 情報処理装置、情報処理システム、情報処理方法及びプログラム |
JP7039179B2 (ja) | 2017-04-13 | 2022-03-22 | キヤノン株式会社 | 情報処理装置、情報処理システム、情報処理方法及びプログラム |
CN110413805B (zh) * | 2018-04-25 | 2022-02-01 | 杭州海康威视数字技术股份有限公司 | 一种图像存储方法、装置、电子设备及存储介质 |
US10677586B2 (en) * | 2018-07-27 | 2020-06-09 | Kla-Tencor Corporation | Phase revealing optical and X-ray semiconductor metrology |
CN109269953B (zh) * | 2018-08-21 | 2019-11-26 | 中国科学院地质与地球物理研究所 | 岩石无机矿物孔隙分类表征的方法 |
JP7062563B2 (ja) * | 2018-09-07 | 2022-05-06 | キオクシア株式会社 | 輪郭抽出方法、輪郭抽出装置、及びプログラム |
CN110376229B (zh) * | 2019-06-12 | 2020-09-04 | 聚束科技(北京)有限公司 | 具备复合式探测系统的扫描电子显微镜和样品探测方法 |
JP7008669B2 (ja) * | 2019-09-09 | 2022-01-25 | 日本電子株式会社 | 3次元積層造形装置及び3次元積層造形方法 |
CN111766407B (zh) * | 2020-06-30 | 2021-05-25 | 中国矿业大学 | 基于afm的页岩孔隙度计算及组分孔隙贡献评价方法 |
RU2743231C1 (ru) * | 2020-08-17 | 2021-02-16 | Шлюмберже Текнолоджи Б.В. | Способ и система выравнивания изображений слоёв образца, полученных с помощью растрового электронного микроскопа с фокусированным ионным пучком |
WO2022096144A1 (en) * | 2020-11-04 | 2022-05-12 | Carl Zeiss Smt Gmbh | Transferring alignment information in 3d tomography from a first set of images to a second set of images |
US20220207256A1 (en) * | 2020-12-30 | 2022-06-30 | Fei Company | Charged particle microscope systems and clustering processes for high dynamic range sample analysis |
US11728126B2 (en) * | 2021-06-24 | 2023-08-15 | Applied Materials Israel Ltd. | 3D metrology from 3D datacube created from stack of registered images obtained during delayering of the sample |
CN114523203B (zh) * | 2022-03-13 | 2022-11-29 | 扬州沃盛车业制造有限公司 | 一种激光智能焊接方法及系统 |
WO2023205246A1 (en) * | 2022-04-19 | 2023-10-26 | Rj Lee Group, Inc. | Characterization of inclusions using electron microscopy and x-ray spectrometry |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
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US4868883A (en) * | 1985-12-30 | 1989-09-19 | Exxon Production Research Company | Analysis of thin section images |
US7652259B2 (en) * | 2000-08-21 | 2010-01-26 | Spectrum Dynamics Llc | Apparatus and methods for imaging and attenuation correction |
US7088852B1 (en) * | 2001-04-11 | 2006-08-08 | Advanced Micro Devices, Inc. | Three-dimensional tomography |
JP3610348B2 (ja) | 2001-08-27 | 2005-01-12 | キヤノン株式会社 | カセッテ型撮像装置及び放射線撮影装置 |
WO2005088520A1 (en) * | 2004-03-11 | 2005-09-22 | University Of Cincinnati | Automated spine survey iterative scan technique (assist) |
WO2006017172A1 (en) * | 2004-07-09 | 2006-02-16 | Fischer Imaging Corporation | Diagnostic system for multimodality mammography |
US7312448B2 (en) | 2005-04-06 | 2007-12-25 | Carl Zeiss Nts Gmbh | Method and apparatus for quantitative three-dimensional reconstruction in scanning electron microscopy |
US7770293B2 (en) | 2005-10-17 | 2010-08-10 | Victor Amend | Method for manufacturing composite building panels |
RU2418158C2 (ru) | 2006-02-16 | 2011-05-10 | ШЕВРОН Ю. Эс. Эй. ИНК. | Способ извлечения керобитумов из подземной сланцевой формации и способ разрыва подземной сланцевой формации |
US8295568B2 (en) * | 2006-06-30 | 2012-10-23 | Fujifilm Corporation | Medical image display processing apparatus and medical image display processing program |
US8131476B2 (en) * | 2006-08-07 | 2012-03-06 | General Electric Company | System and method for co-registering multi-channel images of a tissue micro array |
BRPI0908632A2 (pt) * | 2008-05-23 | 2017-09-19 | Univ Australian National | Processamento de dados de imagem |
US8058601B2 (en) * | 2008-07-16 | 2011-11-15 | Siemens Medical Solutions Usa, Inc. | Determining a multimodal pixon map for tomographic-image reconstruction |
CA2655001C (en) * | 2009-02-20 | 2015-11-24 | Queen's University At Kingston | Marker localization using intensity-based registration of imaging modalities |
DE102009027940A1 (de) * | 2009-07-22 | 2011-03-03 | Bruker Nano Gmbh | Verfahren und Anordnung zur Generierung von Darstellungen anisotroper Eigenschaften sowie ein entsprechendes Computerprogramm und ein entsprechendes computerlesbares Speichermedium |
DE102009036701A1 (de) * | 2009-08-07 | 2011-03-03 | Carl Zeiss Nts Gmbh | Teilchenstrahlsystem und Untersuchungsverfahren hierzu |
-
2012
- 2012-10-11 EP EP12783745.8A patent/EP2748793B1/en not_active Not-in-force
- 2012-10-11 ES ES12783745.8T patent/ES2655667T3/es active Active
- 2012-10-11 CA CA2850799A patent/CA2850799C/en not_active Expired - Fee Related
- 2012-10-11 BR BR112014009093-9A patent/BR112014009093B1/pt active IP Right Grant
- 2012-10-11 AU AU2012322799A patent/AU2012322799B2/en not_active Ceased
- 2012-10-11 CN CN201280052321.5A patent/CN103946889A/zh active Pending
- 2012-10-11 RU RU2014119260A patent/RU2610216C2/ru not_active IP Right Cessation
- 2012-10-11 WO PCT/US2012/059689 patent/WO2013055876A1/en active Application Filing
- 2012-10-11 MX MX2014003968A patent/MX2014003968A/es unknown
- 2012-10-11 US US13/649,409 patent/US9064328B2/en active Active
-
2013
- 2013-10-28 NO NO13190464A patent/NO2730510T3/no unknown
-
2014
- 2014-04-14 CO CO14080252A patent/CO6990673A2/es unknown
Also Published As
Publication number | Publication date |
---|---|
WO2013055876A1 (en) | 2013-04-18 |
US9064328B2 (en) | 2015-06-23 |
CA2850799A1 (en) | 2013-04-18 |
BR112014009093B1 (pt) | 2021-08-17 |
CA2850799C (en) | 2016-11-15 |
EP2748793B1 (en) | 2017-10-11 |
ES2655667T3 (es) | 2018-02-21 |
BR112014009093A2 (pt) | 2017-04-18 |
NO2730510T3 (es) | 2018-01-27 |
US20130094716A1 (en) | 2013-04-18 |
CN103946889A (zh) | 2014-07-23 |
MX2014003968A (es) | 2014-08-27 |
AU2012322799A1 (en) | 2014-05-01 |
RU2610216C2 (ru) | 2017-02-08 |
AU2012322799B2 (en) | 2015-07-23 |
EP2748793A1 (en) | 2014-07-02 |
RU2014119260A (ru) | 2015-11-20 |
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