CN2788201Y - Electromagnetic compatible pre-scanning analyzer - Google Patents

Electromagnetic compatible pre-scanning analyzer Download PDF

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Publication number
CN2788201Y
CN2788201Y CN 200420105590 CN200420105590U CN2788201Y CN 2788201 Y CN2788201 Y CN 2788201Y CN 200420105590 CN200420105590 CN 200420105590 CN 200420105590 U CN200420105590 U CN 200420105590U CN 2788201 Y CN2788201 Y CN 2788201Y
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CN
China
Prior art keywords
mechanical scanning
pxi
test
pxi data
analysis
Prior art date
Application number
CN 200420105590
Other languages
Chinese (zh)
Inventor
罗如忠
严岳清
黄云杰
林钥
Original Assignee
比亚迪股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 比亚迪股份有限公司 filed Critical 比亚迪股份有限公司
Priority to CN 200420105590 priority Critical patent/CN2788201Y/en
Application granted granted Critical
Publication of CN2788201Y publication Critical patent/CN2788201Y/en

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Abstract

The utility model discloses an electromagnetic compatible pre-scanning analyzer, which comprises a mechanical scanning stage (1), a near-field probe (4) and a PXI data acquiring apparatus (5), wherein the near-field probe is installed on the mechanical scanning stage and is connected with the PXI data acquiring apparatus; the mechanical scanning stage is connected with the PXI data acquiring apparatus; various functions of spectral analysis and EMC analysis are directly completed by the PXI data acquiring apparatus which integrates control analysis software. The utility model has the advantages of simple operation, direct viewing, no need of configuration of a spectrum analyzer and a computer and cost reduction of hardware.

Description

Electromagnetic compatibility prescan analyser
[technical field]:
The utility model relates to a kind of instrument and equipment that is used for electromagnetic radiation is carried out scanning analysis.
[background technology]:
Along with dwindling of the increase of the raising of contemporary electronic systems dominant frequency, integrated level, small product size, the electromagnetic radiation that the internal system signal produces also increases thereupon, thereby produces the electromagnetic interference (EMI) between signal and signal.This electromagnetic interference (EMI) greatly can influence the stable of system even cause disabler to a certain degree the time.Equally, because the increase of the electromagnetic radiation of system can cause producing electromagnetic interference (EMI) between system and system.When this electromagnetic interference (EMI) arrives to a certain degree greatly, can influence the job stability of another system, even cause systemic breakdown.For this reason, the Electromagnetic Compatibility index of product has become the key that can product move towards market.
As far back as the beginning of the forties, the notion of Electro Magnetic Compatibility just has been suggested, nineteen forty-four, Germany The Institution of Electrical Engineers formulated first Electro Magnetic Compatibility standard VDE0878 in the world, then the U.S. issued army specifications JAN-I-225 in 1945, to the eighties, developed countries such as the U.S., Germany, Japan, USSR (Union of Soviet Socialist Republics), France have reached very high level in electromagnetic compatibility research and application facet.Main research and the content of using comprise the formulation of electromagnetic compatibility standard and standard, the research of EMC analysis, design and the theory of testing and method, exploration, and EMC analyzes and measures with the development of instrument, system and numerous Material Useds and application etc.Electro Magnetic Compatibility has become the important component part in the product reliability assurance.
China starts late to the research of electromagnetic compatibility theory and technology, just studies and formulate to organization system the Electro Magnetic Compatibility standards and norms of country and industry-level up to the beginning of the eighties.Issued the comparatively complete standard that first Ministry of Aeronautics Industry formulates in 1981, HB5662-81 " the airplane equipment Electro Magnetic Compatibility requires and method of testing ".More than 80 national standard and GJB have been formulated up till now.And requiring growing field for example automobile, household electrical appliance or the like, its electronic product must be by just putting goods on the market after the EMC test authentication.
At the scanning analysis instrument of EMC, as shown in Figure 2, a whole set of instrument comprises mechanical scanning platform 1, spectrum analyzer 3, PC 2 etc. in the prior art.By the band near field probes 4 spectrum analyzer record the spectrum information of pcb board after, deliver in the PC again and handle.Because spectrum analyzer has resolution, the isoparametric requirement of bandwidth, test process can be subjected to the restriction of spectrum analyzer usually.As adopting spectrum analyzer cheap, low side, its resolution, the isoparametric precision of bandwidth are not high; As adopting high-precision spectrum analyzer, price is very expensive.And use the spectrum analyzer of different model, different accuracy that same test board is tested, can cause the inconsistent of test result.Thereby equipment set uses inconvenience, cost height.
[summary of the invention]:
At weak point of the prior art, the technical problems to be solved in the utility model provides a kind of high precision, easy to use and electromagnetic compatibility pre-scan systems that price is lower.
The utility model proposes a kind of electromagnetic compatibility prescan analyser for this reason, comprise near field probes 4, PXI data acquisition equipment 5, described near field probes signal output part is connected with described PXI data acquisition equipment.
Above-mentioned electromagnetic compatibility prescan analyser comprises that also mechanical scanning platform 1, described near field probes are installed on the described mechanical scanning platform, and described mechanical scanning platform is electrically connected with described PXI data acquisition equipment.Described mechanical scanning platform comprises communication interface circuit, and described communication interface circuit is connected with described PXI data acquisition equipment.Described communication interface circuit adopts serial ports.
Owing to adopt above technical scheme, brought following beneficial effect:
Directly finish and comprise spectrum analysis, the various functions of electromagnetic compatibility analysis by the PXI data acquisition equipment of integrated control analysis software, simple to operate, directly perceived, need not configuring spectrum analyser and computing machine, hardware cost reduces greatly.
Owing to the restriction of the precision that is not subjected to spectrum analyzer, range etc., measuring accuracy, bandwidth etc. can be improved.
[description of drawings]:
Fig. 1 is the utility model structural representation.
Fig. 2 is the electromagnetic compatibility prescan analyser structural representation of prior art.
Fig. 3 is the process flow diagram of control analysis software.
[embodiment]:
Also in conjunction with the accompanying drawings the utility model is described in further detail below by specific embodiment.
As shown in Figure 1, the utility model comprises mechanical scanning platform 1, near field probes 4, PXI data acquisition equipment 5, near field probes be one group available, be arranged on the anchor clamps of mechanical scanning platform, signal output part is connected with the input end of PXI, the mechanical scanning platform is provided with serial communication circuit, is connected with PXI data acquisition equipment control end.Integrated EMC data processing, analysis software in the PXI data acquisition equipment, and scan table Control Software are located in the scanning to detected PCB of the near field probes on the scan table by control, gather the EMC signal, and it is handled, analyzes, exports the result.The collecting work of data is handled by concrete mathematical analysis by the signal of control analysis software control PXI equipment collection near field probes signal output part, draws the spectrum information on the test board.This control analysis software is that independent development is come out on the LABVIEW platform that American National instrument (NI) company provides.It mainly comprises following several functions:
1. to the file of test event and the automatic management of data;
2. control PXI equipment carries out data collection task, handles by concrete mathematical analysis, realizes most of function of spectrum analyzer;
3, test data is carried out concrete mathematical analysis, draw the result that EMC analyzes.
The PXI data acquisition equipment provides friendly man-machine dialog interface simultaneously, and is directly perceived, convenient, simply native system is operated.
Its course of work is:
Select probe, model is: 3cmH-Field, it is installed on the anchor clamps of scan table, and open operating switch, start EMCSCAN software and enter into system master interface.
The pcb board that needs are measured places on the scan table table top, and pcb board is of a size of: 208 * 131cm 2, need its size is input in the new project panel of testing software, select the bmp figure of test pcb board simultaneously.It is just effective to import above parameter when new project, does not need to carry out the parameter setting if the project that selection has existed is then directly selected.
Click " test " button in the main interface, system enters into the autoscan panel, adjusts the summit of test board and aligns with the center of circle of probe, and various parameters are set then:
Mobile step pitch: 10mm pops one's head in;
Scan type: face scanning;
Start-stop frequency: 10MHZ-200MHZ;
Click " beginning " after setting, system begins to carry out face scanning.If ended scanning in scanning process, the PCB figure replacement button that then needs to click on the autoscan panel returns to initial show state with figure, otherwise can have a strong impact on the accuracy of probe location when measuring next time.
To generate the radio-frequency radiation distribution design sketch of whole sweep frequencies behind the face end of scan automatically.
Close 3 d effect graph, click " analytical test result ", system enters the data analysis panel.In the test setting of been scanned is tabulated, double-click to determine to analyze the data which time tested by mouse, after choosing, in spectrum curve display box and radiation profiles composite diagram display box, the frequency spectrum resultant curve and the synthetic two-dimensional effects figure of radiation profiles of this time face scanning full range will be shown respectively.
Suppose to find that by the frequency spectrum resultant curve test board has produced multiple harmonic when the 27MHZ, and the radiation of the red area build-in test plate on the radiation profiles design sketch is the strongest.Select in this zone more arbitrarily, system is added to the Data Filename of this time scanning in the data file information tabulation, and the scope that when double-clicking this data file curve of demonstration this time scanning is covered is carried out mark with white wire frame in radiation profiles composite diagram display box.
At frequency input frame input 27000000HZ, can check the radiation profiles of this frequency.
After determining to need the approximate location of check point, withdraw from the data analysis panel, and turn back to automatic measurement panel by " EXIT " on the data analysis panel.Change test-types on the automatic test panel and be " Point Scan ". in PCB figure display box, select the point that will test, click then " beginning ", carry out the spot scan of specified point with mouse.
Spot scan enters the data analysis panel after finishing once more, in the test setting of been scanned is tabulated, chooses once the test data of face scanning, compares with the spectrum curve of the point that scans as a setting with its frequency spectrum resultant curve.
Spectrum curve by scanning is got rid of test board in conjunction with layout, the wiring of the schematic diagram of test board, pcb board and is produced the reason disturbed and it is made amendment, carry out face scanning with the sweep test setting before revising again after the modification, carry out data analysis after the end again and see whether improved pcb board, and can the frequency spectrum resultant curve before and after revising be compared.

Claims (4)

1, a kind of electromagnetic compatibility prescan analyser is characterized in that: comprise near field probes (4), PXI data acquisition equipment (5), described near field probes signal output part is connected with described PXI data acquisition equipment.
2, electromagnetic compatibility prescan analyser as claimed in claim 1 is characterized in that: comprise that also mechanical scanning platform (1), described near field probes are installed on the described mechanical scanning platform, described mechanical scanning platform is electrically connected with described PXI data acquisition equipment.
3, electromagnetic compatibility prescan analyser as claimed in claim 2, it is characterized in that: described mechanical scanning platform comprises communication interface circuit, described communication interface circuit is connected with described PXI data acquisition equipment.
4, electromagnetic compatibility prescan analyser as claimed in claim 3, it is characterized in that: described communication interface circuit is a serial ports.
CN 200420105590 2004-12-08 2004-12-08 Electromagnetic compatible pre-scanning analyzer CN2788201Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200420105590 CN2788201Y (en) 2004-12-08 2004-12-08 Electromagnetic compatible pre-scanning analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 200420105590 CN2788201Y (en) 2004-12-08 2004-12-08 Electromagnetic compatible pre-scanning analyzer

Publications (1)

Publication Number Publication Date
CN2788201Y true CN2788201Y (en) 2006-06-14

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Application Number Title Priority Date Filing Date
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102279331A (en) * 2011-06-30 2011-12-14 重庆大学 Method for detecting and analyzing radiated electromagnetic interference of wiring harnesses of power conversion system of automobile
CN107271881A (en) * 2017-06-07 2017-10-20 北京交通大学 A kind of EMC two-dimensional scan imaging systems for printed circuit board (PCB)
CN109839553A (en) * 2017-11-26 2019-06-04 长沙闽壹湖电子科技有限责任公司 A kind of EMC Design of Automatic Test System based on virtual instrument

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102279331A (en) * 2011-06-30 2011-12-14 重庆大学 Method for detecting and analyzing radiated electromagnetic interference of wiring harnesses of power conversion system of automobile
CN102279331B (en) * 2011-06-30 2013-05-08 重庆大学 Method for detecting and analyzing radiated electromagnetic interference of wiring harnesses of power conversion system of automobile
CN107271881A (en) * 2017-06-07 2017-10-20 北京交通大学 A kind of EMC two-dimensional scan imaging systems for printed circuit board (PCB)
CN109839553A (en) * 2017-11-26 2019-06-04 长沙闽壹湖电子科技有限责任公司 A kind of EMC Design of Automatic Test System based on virtual instrument

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CX01 Expiry of patent term

Expiration termination date: 20141208

Granted publication date: 20060614

C17 Cessation of patent right