CN109900983B - Measuring device for parasitic parameters of high-frequency transformer - Google Patents
Measuring device for parasitic parameters of high-frequency transformer Download PDFInfo
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Abstract
The invention discloses a device for measuring parasitic parameters of a high-frequency transformer, which comprises: the device comprises a power supply module, a signal generation module, a signal acquisition module, a signal analysis module and a signal regulation module; the excitation signal sent by the signal generation module to the high-frequency transformer to be measured is a square wave signal, frequency sweep measurement of the high-frequency transformer to be measured is not needed, and the method belongs to time domain measurement, so that the measurement frequency is greatly reduced, the requirements on a measurement device and actual operation are reduced, in addition, the analog signal output by the high-frequency transformer to be measured to the signal acquisition module is adjusted through the signal adjustment module, different digital signals which can be received by the signal analysis module are analyzed according to the different digital signals to obtain parasitic parameters of the high-frequency transformer to be measured, the analysis process has no vector fitting, and compared with the existing measurement mode that the measurement result depends on the vector fitting, the precision of the measurement result is greatly improved.
Description
Technical Field
The invention relates to the technical field of electromagnetic emission characteristics, in particular to a device for measuring parasitic parameters of a high-frequency transformer.
Background
The high-frequency transformer is one of the components which have the most parasitic parameters and have the greatest influence on an electromagnetic emission model in the switching power supply, and is a key research object for modeling and predicting the electromagnetic emission characteristic of the switching power supply.
As the operating frequency increases, the leakage inductance and the parasitic capacitance closely related to the structure and size of the transformer have a significant influence on the operation of the high-frequency transformer, and therefore, the measurement of the parasitic parameters has become a key issue in the research of the high-frequency transformer.
At present, the measurement of the parasitic parameters of the high-frequency transformer generally includes measuring the amplitude and phase of an S parameter by using a vector network analyzer, and then performing circuit structure modeling by using vector fitting, so as to calculate the parasitic parameters of the high-frequency transformer. The measurement of parasitic parameters of the existing high-frequency transformer needs to be carried out on the high-frequency transformer by means of a precision instrument such as a vector network analyzer, belongs to a frequency domain measurement mode, is high in measurement frequency, has high requirements on a measurement device and actual operation, and is low in measurement result precision due to the fact that the precision of a measurement result highly depends on vector fitting.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a device for measuring parasitic parameters of a high-frequency transformer, which is used for simplifying the measurement process of the parasitic parameters and improving the measurement precision of the parasitic parameters.
According to an aspect of the present invention, there is provided a device for measuring parasitic parameters of a high-frequency transformer, comprising: the device comprises a power supply module, a signal generation module, a signal acquisition module, a signal analysis module and a signal regulation module; wherein the content of the first and second substances,
the power supply module is electrically connected with the signal generation module, the signal acquisition module and the signal analysis module respectively and is used for supplying power to the signal generation module, the signal acquisition module and the signal analysis module;
the signal generation module is electrically connected with the high-frequency transformer to be tested through the signal regulation module and is used for sending a square wave signal to the high-frequency transformer to be tested;
the signal acquisition module is electrically connected with the high-frequency transformer to be tested through a signal regulation module, and the signal acquisition module is electrically connected with the signal analysis module and used for receiving an analog signal responded by the high-frequency transformer to be tested, converting the analog signal into a digital signal and then sending the digital signal to the signal analysis module;
the signal adjusting module is used for adjusting the analog signal output by the high-frequency transformer to be tested to the signal acquiring module;
and the signal analysis module is used for receiving the digital signal sent by the signal acquisition module and analyzing the digital signal to obtain the parasitic parameters of the high-frequency transformer to be tested.
In a possible implementation manner, in the above measurement apparatus provided in an embodiment of the present invention, the signal conditioning module specifically includes: the device comprises a substrate, a copper-clad layer positioned on the substrate, a first port and a second port which are respectively electrically connected with the copper-clad layer, a third port and a fourth port which are mutually insulated with the copper-clad layer, a first connector, a second connector and a variable resistor; wherein the content of the first and second substances,
the variable resistor is connected between the third port and the first connector, and the first connector is electrically connected with the signal generation module;
the fourth port is electrically connected with the signal acquisition module through the second connector;
the first port, the second port, the third port and the fourth port are electrically connected with the port of the high-frequency transformer to be tested respectively.
In a possible implementation manner, in the above measurement apparatus provided in an embodiment of the present invention, the signal generation module specifically includes: a signal generator;
the signal generator is electrically connected with the first connector.
In a possible implementation manner, in the above measurement apparatus provided in an embodiment of the present invention, the signal obtaining module specifically includes: an oscilloscope;
the input end of the oscilloscope is electrically connected with the second connector, and the output end of the oscilloscope is electrically connected with the signal analysis module.
In a possible implementation manner, in the above measurement apparatus provided in an embodiment of the present invention, the signal analysis module specifically includes: a processor;
the processor is electrically connected with the output end of the oscilloscope.
In a possible implementation manner, in the above measurement apparatus provided in an embodiment of the present invention, the power module specifically includes: a power converter;
the power converter is electrically connected with the signal generator, the oscilloscope and the processor respectively.
In a possible implementation manner, in the measurement apparatus provided in an embodiment of the present invention, the measurement apparatus further includes: a display module;
the display module is electrically connected with the signal generation module and used for displaying and setting the control parameters of the square wave signals sent by the signal generation module.
In a possible implementation manner, in the measurement device provided in an embodiment of the present invention, the display module is electrically connected to the signal obtaining module, and is configured to receive and display the analog signal received by the signal obtaining module, and display and set a control parameter of the analog signal.
In a possible implementation manner, in the measurement device provided in an embodiment of the present invention, the display module is electrically connected to the signal analysis module, and is configured to receive and display the parasitic parameter of the high-frequency transformer to be measured, which is analyzed by the signal analysis module.
In a possible implementation manner, in the measurement apparatus provided in an embodiment of the present invention, the measurement apparatus further includes: a signal storage module;
the signal storage module is electrically connected with the signal analysis module and used for receiving and storing the parasitic parameters of the high-frequency transformer to be tested, which are analyzed by the signal analysis module.
The above-mentioned measuring apparatus provided in the embodiment of the present invention includes: the device comprises a power supply module, a signal generation module, a signal acquisition module, a signal analysis module and a signal regulation module; the signal generating module sends a square wave signal to the high-frequency transformer to be tested, the signal acquiring module receives an analog signal responded by the high-frequency transformer to be tested, the analog signal is converted into a digital signal and then sent to the signal analyzing module, the signal adjusting module adjusts the analog signal output by the high-frequency transformer to be tested to the signal acquiring module, and the signal analyzing module analyzes the received digital signal to obtain parasitic parameters of the high-frequency transformer to be tested; the excitation signal sent by the signal generation module to the high-frequency transformer to be measured is a square wave signal, frequency sweep measurement of the high-frequency transformer to be measured is not needed, and the method belongs to time domain measurement, so that the measurement frequency is greatly reduced, the requirements on a measurement device and actual operation are reduced, in addition, the analog signal output by the high-frequency transformer to be measured to the signal acquisition module is adjusted through the signal adjustment module, different digital signals which can be received by the signal analysis module are analyzed according to the different digital signals to obtain parasitic parameters of the high-frequency transformer to be measured, the analysis process has no vector fitting, and compared with the existing measurement mode that the measurement result depends on the vector fitting, the precision of the measurement result is greatly improved.
Drawings
Fig. 1 is a schematic structural diagram of a measurement apparatus according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a signal conditioning module in the measurement apparatus according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a measuring apparatus according to an embodiment of the present invention;
fig. 4 is a second schematic structural diagram of a measuring apparatus according to an embodiment of the present invention;
fig. 5 is a third schematic structural diagram of a measuring apparatus according to an embodiment of the present invention;
fig. 6 is a second schematic structural diagram of a measuring apparatus according to an embodiment of the present invention;
fig. 7 is an interface diagram displayed by a display module in the measurement apparatus according to the embodiment of the present invention;
FIG. 8 is a third schematic structural diagram of a measuring apparatus according to an embodiment of the present invention;
fig. 9 is a fourth schematic structural diagram of a measurement apparatus according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only illustrative and are not intended to limit the present application.
The device for measuring the parasitic parameters of the high-frequency transformer, provided by the embodiment of the invention, as shown in fig. 1, comprises: the device comprises a power supply module 1, a signal generation module 2, a signal acquisition module 3, a signal analysis module 4 and a signal regulation module 5; wherein the content of the first and second substances,
the power supply module 1 is electrically connected with the signal generation module 2, the signal acquisition module 3 and the signal analysis module 4 respectively and is used for supplying power to the signal generation module 2, the signal acquisition module 3 and the signal analysis module 4;
the signal generating module 2 is electrically connected with the high-frequency transformer 6 to be tested through the signal adjusting module 5 and is used for sending a square wave signal to the high-frequency transformer 6 to be tested;
the signal acquisition module 3 is electrically connected with the high-frequency transformer 6 to be tested through the signal regulation module 5, and the signal acquisition module 3 is electrically connected with the signal analysis module 4 and is used for receiving an analog signal responded by the high-frequency transformer 6 to be tested, converting the analog signal into a digital signal and sending the digital signal to the signal analysis module 4;
the signal adjusting module 5 is used for adjusting the analog signal output to the signal acquiring module 3 by the high-frequency transformer 6 to be detected; as shown in fig. 1, the signal conditioning module 5 is electrically connected to the signal generating module 2, the signal acquiring module 3 and the high-frequency transformer 6 to be tested, respectively, and the signal conditioning module 5 electrically connects the high-frequency transformer 6 to be tested to the signal generating module 2 and the signal acquiring module 3, respectively;
and the signal analysis module 4 is used for receiving the digital signal sent by the signal acquisition module 3 and obtaining the parasitic parameters of the high-frequency transformer 6 to be tested according to the digital signal analysis.
The above-mentioned measuring apparatus provided in the embodiment of the present invention includes: the device comprises a power supply module, a signal generation module, a signal acquisition module, a signal analysis module and a signal regulation module; the signal generating module sends a square wave signal to the high-frequency transformer to be tested, the signal acquiring module receives an analog signal responded by the high-frequency transformer to be tested, the analog signal is converted into a digital signal and then sent to the signal analyzing module, the signal adjusting module adjusts the analog signal output by the high-frequency transformer to be tested to the signal acquiring module, and the signal analyzing module analyzes the received digital signal to obtain parasitic parameters of the high-frequency transformer to be tested; the excitation signal sent by the signal generation module to the high-frequency transformer to be measured is a square wave signal, frequency sweep measurement of the high-frequency transformer to be measured is not needed, and the method belongs to time domain measurement, so that the measurement frequency is greatly reduced, the requirements on a measurement device and actual operation are reduced, in addition, the analog signal output by the high-frequency transformer to be measured to the signal acquisition module is adjusted through the signal adjustment module, different digital signals which can be received by the signal analysis module are analyzed according to the different digital signals to obtain parasitic parameters of the high-frequency transformer to be measured, the analysis process has no vector fitting, and compared with the existing measurement mode that the measurement result depends on the vector fitting, the precision of the measurement result is greatly improved.
In a specific implementation, in the above measurement apparatus provided in the embodiment of the present invention, the signal conditioning module, as shown in fig. 2 and fig. 3, may specifically include: a substrate 50, a copper-clad layer 51 on the substrate 50, a first port 52 and a second port 53 electrically connected to the copper-clad layer 51, respectively, a third port 54 and a fourth port 55 insulated from the copper-clad layer 51, a first connector 56, a second connector 57, and a variable resistor 58; wherein, the variable resistor 58 is connected between the third port 54 and the first connector 56, as shown in fig. 3, the first connector 56 is electrically connected to the signal generating module 2; the fourth port 55 is electrically connected to the signal acquisition module 3 through the second connector 57; the first port 52, the second port 53, the third port 54 and the fourth port 55 are electrically connected to the ports of the high-frequency transformer 6 to be tested, respectively.
Specifically, in the measuring device provided in the embodiment of the present invention, as shown in fig. 2 and fig. 3, the third port 54 and the variable resistor 58, the variable resistor 58 and the first connector 56, and the fourth port 55 and the second connector 57 may be electrically connected through a microstrip line 59, and the resistance between the microstrip line 59 and the copper-clad layer 51 may be designed to be 50 Ω, and of course, the connection modes between the third port 54 and the variable resistor 58, between the variable resistor 58 and the first connector 56, and between the fourth port 55 and the second connector 57 are not limited thereto, and other modes capable of achieving connection may also be adopted, and are not limited thereto.
Specifically, in the above-mentioned measuring apparatus provided in the embodiment of the present invention, the first connector and the second connector may adopt sma (sub Miniature a) standard connectors with a resistance value of 50 Ω, and of course, other devices capable of achieving the connection function may also be adopted, which is not limited herein. Specifically, the variable resistor may be implemented by inserting 0805 package-type resistors with different resistance values into the 0805 package component slot, or may be implemented by sliding the varistor, or may be implemented by other types that can implement variable resistance values, which is not limited herein.
Specifically, in the above-mentioned measuring device provided by the embodiment of the present invention, a copper-clad epoxy glass fiber cloth substrate may be used as a material of the substrate, as shown in fig. 2, a length l of the substrate 50 may be designed to be 10.5cm, a width w of the substrate 50 may be designed to be 2.5cm, a thickness of the substrate 50 may be designed to be 0.8mm, a thickness of the copper clad layer 51 may be designed to be in a range of 0.018mm to 0.105mm, a distance a between the third port 54 and the fourth port 55 (or the first port 52 and the second port 53) may be designed to be 1.3cm, a distance b between the second port 53 and the fourth port 55 (or the first port 52 and the third port 54) may be designed to be 1.2cm, a distance c between the third port 54 and the fourth port 55 and an upper edge of the substrate 50 may be designed to be 0.8cm, and a distance d between the first port 52 and the third port 54 and a left edge of the substrate 50 may be designed to be 4.5 cm. Of course, the sizes of the substrate and the copper-clad layer are not limited to this, and the sizes of the substrate and the copper-clad layer may be adjusted according to actual conditions, and are not limited herein.
Specifically, in the above-described measurement device provided by the embodiment of the present invention, as shown in fig. 2, the first port 52, the second port 53, the third port 54, and the fourth port 55 may be specifically circular holes having a diameter of 2 mm. Of course, the shape of the four ports is not limited to a circular hole, but may be other shapes that can achieve the connection function, and the size of the four ports is not limited thereto, and is not limited thereto.
Preferably, in the measurement apparatus provided in the embodiment of the present invention, before the first port, the second port, the third port, and the fourth port are connected to the high-frequency transformer to be measured, the calibration component may be connected to the first port, the second port, the third port, and the fourth port, so that the signal conditioning module is calibrated by using the calibration component, the parasitic resistance and the parasitic capacitance of the signal conditioning module may be obtained, and the calibration data may be subsequently used in an analysis process of the signal analysis module, so that an analysis result is more accurate, and thus, the measurement accuracy of the parasitic parameter may be further improved.
In a specific implementation, in the measurement apparatus provided in the embodiment of the present invention, the signal generating module, as shown in fig. 4, may specifically include: a signal generator 20; the signal generator 20 is electrically connected to the first connector 56. Specifically, the signal generator 20 may sequentially pass through the first connector 56, the variable resistor 58 and the third port 54 to achieve connection with the high-frequency varistor 6 to be tested, so that the signal generator 20 may send the square wave signal to the high-frequency varistor 6 to be tested.
In a specific implementation, in the measurement apparatus provided in the embodiment of the present invention, the signal obtaining module, as shown in fig. 4, may specifically include: an oscilloscope 30; the input end 30a of the oscilloscope 30 is electrically connected to the second connector 57, and the output end 30b of the oscilloscope 30 is electrically connected to the signal analysis module 4. Specifically, the oscilloscope 30 may sequentially pass through the second connector 57 and the fourth port 55 to achieve connection with the high-frequency varistor 6 to be tested, so that the oscilloscope 30 may receive an analog signal responded by the high-frequency varistor 6 to be tested, and the oscilloscope 30 may further convert the received analog signal into a digital signal and send the digital signal to the signal analysis module 4.
In a specific implementation, in the above measurement apparatus provided in the embodiment of the present invention, the signal analysis module, as shown in fig. 5, may specifically include: a processor 40; the processor 40 is electrically connected to the output end 30b of the oscilloscope 30, so that the oscilloscope 30 can send the converted digital signal to the processor 40, and the processor 40 analyzes the received digital signal to obtain the parasitic parameter of the high-frequency transformer 6 to be measured.
In a specific implementation, in the measurement apparatus provided in the embodiment of the present invention, as shown in fig. 5, the power module may specifically include: a power converter 10; the power converter 10 is electrically connected to the signal generator 20, the oscilloscope 30 and the processor 40, respectively. Specifically, the power converter 10 can convert 220V ac power to 12V dc power to power the signal generator 20, the oscilloscope 30, and the processor 40.
In a specific implementation, as shown in fig. 6, the above measurement apparatus provided in the embodiment of the present invention may further include: a display module 7; the display module 7 may be electrically connected to the signal generating module 2, and is configured to display and set a control parameter of the square wave signal sent by the signal generating module 2. Specifically, parameters such as the period, the amplitude, the duty ratio, the rising edge and the falling edge of a square wave signal sent to the high-frequency transformer to be tested by the signal generation module can be displayed on the display module, and the parameters can be adjusted.
In a specific implementation, as shown in fig. 6, in the measuring apparatus provided in the embodiment of the present invention, the display module 7 may be electrically connected to the signal obtaining module 3, and is configured to receive and display the analog signal received by the signal obtaining module 3, and display and set a control parameter of the analog signal. Specifically, the analog signal received by the signal acquisition module may be sent to the display module and displayed on the display module, and the display module may further display control parameters of the analog signal, such as a horizontal axis, a vertical axis, time, amplitude, and trigger, by setting the control parameters, the display module may display a pulse waveform or a damped oscillation waveform, the signal analysis module may analyze the parasitic parameter of the high-frequency transformer to be measured by using the pulse waveform or the damped oscillation waveform, and may further obtain an optimal value of the parasitic parameter by adjusting the control parameter.
In a specific implementation, as shown in fig. 6, in the measuring device provided in the embodiment of the present invention, the display module 7 may be electrically connected to the signal analysis module 4, and is configured to receive and display the parasitic parameter of the high-frequency transformer 6 to be measured, which is analyzed by the signal analysis module 4. Specifically, the parasitic parameters of the high-frequency transformer to be tested analyzed by the signal analysis module can be sent to the display module and displayed on the display module, so that the tester can check the parameters conveniently.
In a specific implementation, in the measuring device provided in the embodiment of the present invention, as shown in fig. 6, the display module 7 may further be electrically connected to the power module 1, and the power module 1 may convert 220V ac power into 12V dc power, so as to supply power to the display module 7.
In a specific implementation, in the measurement apparatus provided in the embodiment of the present invention, the display module may specifically include: a display screen. Specifically, the interface displayed on the display screen, as shown in fig. 7, may include a main interface title bar 71, a main tool bar 72, a project display bar 73, a progress display bar 74, an incentive setting 75, a waveform setting 76, a waveform analysis 77, and an analysis result 78; wherein, the main interface title bar 71 displays "high frequency transformer parasitic parameter analysis"; the home bar 72 includes buttons for project 720, save 721, display 722, edit 723, help 724, and settings 725; the project display column 73 includes calibration setting, excitation setting, waveform analysis, analysis results, and other buttons, clicking the excitation setting button can set parameters of a square wave signal in the excitation setting 75, clicking the waveform setting button can set parameters of an analog signal received by the signal acquisition module in the waveform setting 76, the waveform analysis button corresponds to the waveform analysis 77, the analysis result button corresponds to the analysis result 78, clicking the calibration setting button can pop up a dialog box again, the dialog box can include a start button, a finish button, and a save button, clicking the start button can start calibration, clicking the finish button can end calibration after calibration is completed, clicking the save button can save calibration data, the saved calibration data (including parasitic resistance and parasitic capacitance of the signal conditioning module) can be subsequently used in the analysis of the signal analysis module, the measurement accuracy of the parasitic parameters can be further improved; the progress display section 74 includes buttons for stimulus setting, waveform analysis, and analysis results, etc., for displaying the progress of measurement of the parasitic parameters; the excitation setting 75 may be configured to set a period, an amplitude, a duty ratio, a rising edge, and a falling edge of a square wave signal sent by the signal generator to the high-frequency transformer, the waveform setting 76 may be configured to set a horizontal axis, a vertical axis, time, an amplitude, and a trigger of an analog signal received by the signal acquisition module, the set waveform may be displayed in the waveform analysis 77, the displayed waveform is a pulse waveform or a damped oscillation waveform (fig. 7 illustrates a damped oscillation waveform), an intermediate parameter (for example, a time constant, a damping factor, and an oscillation frequency) obtained in the analysis process may be displayed in an analysis result below the waveform in the waveform analysis 77, and a final analysis result, that is, a parasitic parameter of the high-frequency transformer, may be displayed in the analysis result 78.
In a specific implementation, as shown in fig. 8, the above measurement apparatus provided in the embodiment of the present invention may further include: a signal storage module 8; the signal storage module 8 is electrically connected to the signal analysis module 4, and is configured to receive and store the parasitic parameters of the high-frequency transformer 6 to be tested, which are analyzed by the signal analysis module 4. Different analysis results can be obtained by adjusting various parameters of the waveform setting in the display screen, and the signal storage module stores the analysis results one by one, so that a tester can conveniently search the optimal result.
In a specific implementation, in the measuring device provided in the embodiment of the present invention, as shown in fig. 8, the signal storage module 8 may further be electrically connected to the power module 1, and the power module 1 may convert 220V ac power into 12V dc power, so as to supply power to the signal storage module 8.
In a specific implementation, in the measurement apparatus provided in the embodiment of the present invention, the signal storage module may specifically include: a memory; of course, the present invention is not limited to this, and other devices having a memory function may be used, and the present invention is not limited thereto.
In specific implementation, in the measurement device provided in the embodiment of the present invention, the power converter, the signal generator, the oscilloscope, the processor, the memory, and the display screen may be integrated into a host, so that simplification of the measurement device may be achieved, the integrated measurement device may be illustrated in fig. 9, only the display screen 70 is shown in the host illustrated in fig. 9, none of the power converter, the signal generator, the oscilloscope, the processor, and the memory are shown, specifically, the length L of the host may be designed to be 48.26cm, the width W may be designed to be 45.2cm, and the height H may be designed to be 17.7cm, of course, the size of the host is not limited thereto, and the size of the host may be adjusted according to actual situations, and is not limited herein.
Preferably, in the measuring device provided in the embodiment of the present invention, as shown in fig. 9, a plurality of USB (universal serial bus) interfaces 90 may be further disposed on an outer surface (for example, a plane where the display screen is located) of the measuring device, and have a data transmission function, so as to facilitate access of a mouse and a keyboard, or an interface 91 meeting a PS/2 communication protocol and structure may be further disposed, and may also be connected to the mouse and the keyboard; in addition, a third connector 92 for connecting the first connector 56 in the signal conditioning module and a fourth connector 93 for connecting the second connector 57 in the signal conditioning module may be further disposed on an outer surface (for example, a plane where the display screen is located) of the measuring apparatus, the third connector 92 and the fourth connector 93 may specifically be N-type female video connectors, the third connector 92 is electrically connected to the signal generator and has a square wave excitation source signal output function, the fourth connector 93 is electrically connected to the oscilloscope and has a radio frequency signal input function, and the first connector 56 and the third connector 92 and the second connector 57 and the fourth connector 93 may be connected by a dedicated cable 94; in addition, a switch button 95 can be arranged on the outer surface of the measuring device (such as the plane of the display screen), and has the functions of starting and stopping the measuring device; further, two handles 96 may be provided on the outer surface of the measuring device (e.g., the plane of the display screen) to facilitate movement of the measuring device by the tester.
The following describes the measurement process of the above measurement device provided by the embodiment of the present invention in detail by using a specific example. Taking the measuring apparatus shown in fig. 9 as an example, the power module, the signal generating module, the signal acquiring module, the signal analyzing module, the signal storing module and the display module are integrated into a host. The measuring process of the measuring device provided by the embodiment of the invention is as follows:
1. connecting the third connector 92 of the host computer and the first connector 56 of the signal conditioning module and connecting the fourth connector 93 of the host computer and the second connector 57 of the signal conditioning module by using a dedicated cable 94, and inserting calibration pieces into the first port 52, the second port 53, the third port 54 and the fourth port 55 of the signal conditioning module for calibration;
2. pulling out the calibration piece from the first port 52, the second port 53, the third port 54 and the fourth port 55, and inserting the high-frequency transformer to be tested into the first port 52, the second port 53, the third port 54 and the fourth port 55;
3. a 0805 packaging type resistor with the resistance value of 5.1 omega is connected into a 0805 packaging element device groove of the signal regulating module to serve as a variable resistor 58;
4. parameters of the square wave signal are set to be 0.2V of peak-to-peak value, 0V of bias, 300Hz of frequency, 80% of duty ratio and 6.51 mus of rising edge/falling edge in the excitation setting 75 of the host; wherein the peak-to-peak value and the offset represent amplitudes;
5. the waveform is set in a waveform setting 76 of the host, and the set waveform is displayed in a waveform analysis 77 showing the pulse waveform, the analysis result, and the time constant tau1＝3.22×10-4；
6. A 0805 packaging type resistor with the resistance value of 20 omega is connected into a 0805 packaging element device groove of the signal regulating module to serve as a variable resistor 58;
7. repeating steps 4 and 5, namely, setting the parameter setting in the excitation setting 75 unchanged, setting the waveform in the waveform setting 76, displaying the waveform in the waveform analysis 77, displaying the pulse waveform, obtaining the analysis result, and obtaining the time constant tau2＝2.54×10-4The analysis result R is displayed in the analysis result 78p＝Rs＝0.55Ω,Lm17.94mH, wherein RpIs parasitic resistance of the primary winding, RsIs parasitic resistance of the secondary side winding, LmAn excitation inductance being a primary winding;
8. a 0805 packaging type resistor with the resistance value of 0 omega is connected into a 0805 packaging element device groove of the signal regulating module to serve as a variable resistor 58;
9. the parameters of the square wave signal are set in the excitation setting 75 of the host machine as peak-to-peak value 5V, bias 0V, frequency 50kHz, duty ratio 50%, rising edge/falling edge 39 ns; wherein the peak-to-peak value and the offset represent amplitudes;
10. the waveform is set in the waveform settings 76 of the mainframe and the set waveform is displayed in a waveform analysis 77 showing the damped oscillatory waveform, with the analysis results obtained，α1＝6.1×105，α2＝9.82×106，ω1＝4.07×107，ω2＝1.2×108Wherein, α1And α2As attenuation factor, ω1And ω2The analysis result is displayed in the analysis result 78 for the oscillation frequency, Lp＝0.62μH，Ls＝82.25μH，Cp＝Cs＝21.3pF，Cps9.31pF, wherein LpIs a mutual inductance of the primary winding, LsIs leakage inductance of the secondary side winding, CpIs parasitic capacitance of the primary winding, CsIs parasitic capacitance of the secondary side winding, CpsIs the parasitic capacitance between the primary winding and the secondary winding.
The above-mentioned measuring apparatus provided in the embodiment of the present invention includes: the device comprises a power supply module, a signal generation module, a signal acquisition module, a signal analysis module and a signal regulation module; the signal generating module sends a square wave signal to the high-frequency transformer to be tested, the signal acquiring module receives an analog signal responded by the high-frequency transformer to be tested, the analog signal is converted into a digital signal and then sent to the signal analyzing module, the signal adjusting module adjusts the analog signal output by the high-frequency transformer to be tested to the signal acquiring module, and the signal analyzing module analyzes the received digital signal to obtain parasitic parameters of the high-frequency transformer to be tested; the excitation signal sent by the signal generation module to the high-frequency transformer to be measured is a square wave signal, and the frequency sweep measurement of the high-frequency transformer to be measured is not needed, so the measurement times are greatly reduced, the requirements on a measurement device and actual operation are reduced, in addition, the analog signal output by the high-frequency transformer to be measured to the signal acquisition module is adjusted through the signal adjustment module, different digital signals which can be received by the signal analysis module are enabled to be analyzed according to the different digital signals, the parasitic parameters of the high-frequency transformer to be measured are obtained, the vector fitting is not needed in the analysis process, and compared with the existing measurement mode that the measurement result depends on the vector fitting, the precision of the measurement result is greatly improved.
It will be apparent to those skilled in the art that various modifications and improvements can be made to the embodiments of the present invention without departing from the inventive concept of the present application, which falls within the scope of the present application.
Claims (10)
1. A device for measuring parasitic parameters of a high-frequency transformer, comprising: the device comprises a power supply module, a signal generation module, a signal acquisition module, a signal analysis module and a signal regulation module; wherein the content of the first and second substances,
the power supply module is electrically connected with the signal generation module, the signal acquisition module and the signal analysis module respectively and is used for supplying power to the signal generation module, the signal acquisition module and the signal analysis module;
the signal generation module is electrically connected with the high-frequency transformer to be tested through the signal regulation module and is used for sending a square wave signal to the high-frequency transformer to be tested;
the signal acquisition module is electrically connected with the high-frequency transformer to be tested through the signal adjustment module, and the signal acquisition module is electrically connected with the signal analysis module and is used for receiving two pulse waveform analog signals and a damping oscillation waveform analog signal which are output by the high-frequency transformer to be tested in response to the excitation of the square wave signal, converting the two pulse waveform analog signals and the damping oscillation waveform analog signal into digital signals and sending the digital signals to the signal analysis module;
the signal adjusting module is used for adjusting two pulse waveform analog signals and a damping oscillation waveform analog signal which are output to the signal acquiring module by the high-frequency transformer to be detected;
and the signal analysis module is used for receiving the digital signal sent by the signal acquisition module and analyzing the digital signal to obtain the parasitic parameters of the high-frequency transformer to be tested.
2. The measurement device according to claim 1, wherein the signal conditioning module specifically comprises: the device comprises a substrate, a copper-clad layer positioned on the substrate, a first port and a second port which are respectively electrically connected with the copper-clad layer, a third port and a fourth port which are mutually insulated with the copper-clad layer, a first connector, a second connector and a variable resistor; wherein the content of the first and second substances,
the variable resistor is connected between the third port and the first connector, and the first connector is electrically connected with the signal generation module;
the fourth port is electrically connected with the signal acquisition module through the second connector;
the first port, the second port, the third port and the fourth port are electrically connected with the port of the high-frequency transformer to be tested respectively.
3. The measurement device according to claim 2, wherein the signal generation module specifically comprises: a signal generator;
the signal generator is electrically connected with the first connector.
4. The measurement device according to claim 3, wherein the signal acquisition module specifically comprises: an oscilloscope;
the input end of the oscilloscope is electrically connected with the second connector, and the output end of the oscilloscope is electrically connected with the signal analysis module.
5. The measurement device according to claim 4, wherein the signal analysis module specifically comprises: a processor;
the processor is electrically connected with the output end of the oscilloscope.
6. The measurement device according to claim 5, wherein the power module specifically comprises: a power converter;
the power converter is electrically connected with the signal generator, the oscilloscope and the processor respectively.
7. The measurement device of any one of claims 1-6, further comprising: a display module;
the display module is electrically connected with the signal generation module and used for displaying and setting the control parameters of the square wave signals sent by the signal generation module.
8. The measurement device according to claim 7, wherein the display module is electrically connected to the signal acquisition module, and is configured to receive and display the analog signal received by the signal acquisition module, and display and set a control parameter of the analog signal.
9. The measurement apparatus according to claim 7, wherein the display module is electrically connected to the signal analysis module, and configured to receive and display the parasitic parameter of the high-frequency transformer to be measured, which is analyzed by the signal analysis module.
10. The measurement device of any one of claims 1-6, further comprising: a signal storage module;
the signal storage module is electrically connected with the signal analysis module and used for receiving and storing the parasitic parameters of the high-frequency transformer to be tested, which are analyzed by the signal analysis module.
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