CN213337776U

CN213337776U - Signal switching oscilloscope and signal switching system

Info

Publication number: CN213337776U
Application number: CN202021937343.8U
Authority: CN
Inventors: 耿健; 王洪磊; 李满
Original assignee: Beijing Shijichen Data Technology Co ltd
Current assignee: Beijing Shijichen Data Technology Co ltd
Priority date: 2020-09-07
Filing date: 2020-09-07
Publication date: 2021-06-01
Anticipated expiration: 2030-09-07

Abstract

The application discloses signal switching oscilloscope and signal switching system, wherein signal switching oscilloscope includes test channel, its characterized in that, signal switching oscilloscope still includes signal synthesizer, signal switching circuit: the output of the signal switching circuit is connected with the test channel; the signal synthesizer receives a tested signal and a marking signal, outputs a synthesized signal, and inputs the synthesized signal to the signal switching circuit, wherein the marking signal is used for marking a central frequency point and upper and lower frequency deviation points of the tested signal; the signal to be tested can also be directly input into the signal switching circuit. The application provides a multifunctional oscilloscope and improves the efficiency of test adjustment.

Description

Signal switching oscilloscope and signal switching system

Technical Field

The application relates to the technical field of equipment detection, in particular to a signal switching oscilloscope and a signal switching system.

Background

Existing conventional oscilloscopes are often used in radar-equipped chambers for visually observing and studying periodic and disposable electrical signals, ranging in frequency from dc to 100 mhz. Measuring the amplitude of the signal to be studied within the range of 0.008-40 volts; two channels, i.e. one scan, measure two investigated signals simultaneously. The horizontal axis of the screen of the general oscilloscope represents time, the vertical axis represents the voltage of the measured signal, and the waveform on the oscilloscope reflects the track of the voltage of the measured signal changing along with the time.

The existing general oscilloscope is an analog oscilloscope, and the functional circuit comprises an electronic ray tube display, a vertical deflection system, a horizontal deflection system, a calibrator, a power supply component and the like. The working principle is as follows: the core part of the analog oscilloscope is an electron ray display tube which consists of an electron gun, a deflection system and a fluorescent screen. The electron gun emits high-speed electron current, and the high-speed electron current is deflected by a vertical deflection system and a horizontal deflection system which are composed of two pairs of metal plates and then is applied to a fluorescent screen to enable fluorescent materials to emit light, so that a specific image is displayed. By applying a specific voltage to the control deflection plate, the voltage change signal can be displayed in the form of an image, which is the basic working principle of the analog oscilloscope.

The most frequently used analog oscilloscopes by professionals is to test the amplitude-frequency characteristic curve of a specific signal and detect the central frequency point f of the curve for a long time₀Upper frequency deviation point f_HLower frequency deviation point f_L. The main purpose is to maintain the stability of the passband of the signal when the center frequency f of the signal is₀Upper frequency deviation point f_HLower frequency deviation point f_LWhen the deviation exists, some parameters of the equipment need to be manually fine-tuned, so that the amplitude-frequency characteristic curve of the passband meets the requirement of the performance index of the equipment. However, when an operator tests the amplitude-frequency characteristic curve of a certain signal using an analog oscilloscope, the analog oscilloscope cannot accurately display the central frequency point f of the signal in real time₀Upper frequency deviation point f_HLower frequency deviation point f_L. When the signal is detected each time, the horizontal mark point X1 of the oscilloscope needs to be manually adjusted to read out the specific values Fx of the three frequency points respectively, if the value Fx is not within the technical index range, manual calculation is needed, and after the result is calculated, adjustment is carried out. It can be seen that this is a complex and time-consuming operation, with intermediate possible calculationsErrors and other unknown factors seriously affect the efficiency of test adjustment.

SUMMERY OF THE UTILITY MODEL

The present application provides a signal switching oscilloscope and a signal switching system, so as to provide a multifunctional oscilloscope and improve the efficiency of test adjustment.

In order to achieve the above object, a first aspect of the present application provides a signal switching oscilloscope, comprising: the signal switching oscilloscope also comprises a signal synthesizer and a signal switching circuit:

the output of the signal switching circuit is connected with the test channel;

the signal synthesizer receives a tested signal and a marking signal, outputs a synthesized signal, and inputs the synthesized signal to the signal switching circuit, wherein the marking signal is used for marking a central frequency point and upper and lower frequency deviation points of the tested signal;

the signal to be tested can also be directly input into the signal switching circuit.

Optionally, the signal switching circuit comprises a voltage regulator, a MONO1, and a JPT.

Optionally, the signal synthesizer includes: the device comprises a voltage comparison circuit, a marking signal processing circuit, a highlighting control circuit, a pull-down control circuit and a signal synthesis circuit;

the marking signal processing circuit is respectively connected with the voltage comparison circuit, the highlighting control circuit and the pull-down control circuit, and the signal synthesis circuit is respectively connected with the pull-down control circuit and the highlighting control circuit;

the marking signal is input into the voltage comparison circuit, the voltage comparison circuit outputs two paths of signals which are respectively input into the marking signal processing circuit, the marking signal processing circuit outputs two paths of signals, one path of signal and the frequency source are both input into the highlighting control circuit, the other path of signal and the detected signal are both input into the pull-down control circuit, the output signals of the highlighting control circuit and the pull-down control circuit are both input into the signal synthesis circuit, and the synthesized signal is output.

Optionally, the oscilloscope further comprises a synchronization signal generator for generating the marking signal and synchronizing the marking signal and the time of the signal to be tested, and the synchronization signal generator is connected with the signal synthesizer through the device to be tested for generating the signal to be tested.

Optionally, the flag signal processing circuit is a monostable flip-flop circuit.

Optionally, the signal synthesizing circuit is an adding circuit of an operational amplifier.

Optionally, the monostable flip-flop circuit includes a CD4098B monostable flip-flop and a CD4093B flip-flop.

Optionally, the signal synthesis circuit includes an MC1496 chip.

Optionally, the frequency of the signal output by the synchronization signal generator is 12.8HZ, the duty ratio of the signal is 2.5%, and the signal amplitude is greater than or equal to 10 Vpp.

Optionally, the synchronization signal generator includes a pulse generator circuit, and the pulse generator circuit employs an NE555 chip.

In order to achieve the above object, a second aspect of the present application provides a signal switching system including a device under test, the signal switching oscilloscope of any one of the above first aspects.

Compared with the prior art, this application can bring following technological effect:

1. the signal switching oscilloscope measures the signal passband based on the application, can directly mark a required central frequency point and an upper frequency deviation point and a lower frequency deviation point, and further avoids marking the frequency point by manually adjusting an X horizontal position knob of the oscilloscope as the conventional oscilloscope, so that the operation is automatic, and the labor working cost is reduced;

2. a plurality of frequency points can be marked simultaneously and displayed on the measured signal curve simultaneously, so that the operation process is simplified, and the time cost is reduced;

3. the central frequency point and the upper and lower frequency deviation points are accurately displayed in real time, so that the accuracy of signal detection is improved;

4. the marking mode includes two types: one is to highlight at a certain frequency point; and the other is to pull down the display of the waveform at a certain frequency point. The two kinds of display are clearly displayed on an oscilloscope, and the marked frequency points can be highlighted; and different marking frequency points can be distinguished in different display modes, namely the waveform highlights the central frequency point, the waveform pulls down the central frequency point to represent the upper frequency deviation point and the lower frequency deviation point, and vice versa, so that the signal detection is more accurate.

5. The functional oscilloscope is provided, and can be compatible with all the test functions of a common oscilloscope and realize a signal marking function.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this application, serve to provide a further understanding of the application and to enable other features, objects, and advantages of the application to be more apparent. The drawings and their description illustrate the embodiments of the invention and do not limit it. In the drawings:

fig. 1 is a schematic circuit diagram of a signal switching circuit provided by the present invention;

FIG. 2 is a schematic diagram of the output of the synthesized signal after synthesis of the marker signal and the test signal of the present invention;

FIG. 3 is a schematic diagram of an amplitude-frequency characteristic curve obtained by a conventional oscilloscope;

fig. 4 is a schematic view of an amplitude-frequency characteristic curve obtained by the signal switching oscilloscope of the present invention;

fig. 5 is a schematic diagram of a center frequency point, an upper frequency deviation point and a lower frequency deviation point provided by the present invention;

fig. 6 is a schematic diagram of the structure of the signal synthesizer according to the present invention;

fig. 7 is a schematic diagram of a tag signal processing circuit according to the present invention;

fig. 8 is a schematic circuit diagram of a signal synthesizing circuit according to the present invention;

fig. 9 is a circuit diagram of a pulse generator provided by the present invention;

fig. 10 is a schematic physical diagram of an automatic oscilloscope according to the present invention;

fig. 11 is a schematic structural diagram of a signal switching system according to the present invention.

Detailed Description

In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It should be understood that the data so used may be interchanged under appropriate circumstances such that embodiments of the application described herein may be used. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

In this application, the terms "upper", "lower", "left", "right", "front", "rear", "top", "bottom", "inner", "outer", "middle", "vertical", "horizontal", "lateral", "longitudinal", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings. These terms are used primarily to better describe the present application and its embodiments, and are not used to limit the indicated devices, elements or components to a particular orientation or to be constructed and operated in a particular orientation.

Moreover, some of the above terms may be used to indicate other meanings besides the orientation or positional relationship, for example, the term "on" may also be used to indicate some kind of attachment or connection relationship in some cases. The specific meaning of these terms in this application will be understood by those of ordinary skill in the art as appropriate.

In addition, the term "plurality" shall mean two as well as more than two.

It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.

Embodiment one, as shown in FIGS. 1 to 10

The embodiment of the application provides a signal switching oscilloscope, which further comprises a signal synthesizer and a signal switching circuit: the output of the signal switching circuit is connected with the test channel; the signal synthesizer receives a detected signal and a marking signal, outputs a synthesized signal, and inputs the synthesized signal to the signal switching circuit, wherein the marking signal is used for marking a central frequency point and upper and lower frequency deviation points of the detected signal; the tested signal can also be directly input into the signal switching circuit.

The signal switching oscilloscope has two test modes, wherein the first mode is that a tested signal is input into a test channel through a signal switching circuit for testing, and the test channel is a test channel of a general oscilloscope and comprises an oscillograph tube, a Y-axis deflection system, an X-axis deflection system, a scanning generator and the like. This mode is the same as the prior art test mode; in the second mode, after the tested signal and the marking signal are synthesized, the synthesized signal obtained by synthesis is input into the test channel through the signal switching circuit for testing. In this mode, the signal switching circuit starts to operate, and the tested curve generates a mark point. When the marking signal amplitude is negative, the marking point is highlighted; when the amplitude of the marking signal is positive, the marking point is displayed in a pull-down mode, a circuit diagram of a specific signal switching circuit is shown in fig. 1, and the circuit principle is simply described below by comprising a voltage stabilizing circuit, an input detection circuit and the signal switching circuit:

the voltage stabilizing circuit is mainly realized by an integrated chip LT1764, and the LT1764 chip is a low-dropout linear voltage stabilizing chip and completes the voltage conversion from +15V input to +13V output. The auxiliary voltage is +5V, and the conversion is completed by a resistor R9 and a voltage stabilizing diode DZ 2. The capacitors C3, C4 and C6 are output end filter capacitors.

The detection circuit is realized by an integrated chip MONO1, the chip MONO1 is an integrated monostable trigger, an input marking signal Mark is detected, when the marking signal exists, the MONO1 generates a control signal to drive a relay JPT to work, and an oscilloscope tests a waveform with a highlight Mark and a pull-down Mark; otherwise, no marking signal exists, the relay JPT does not work, and the oscilloscope detects a general signal. The principle is that the Mark signal is a marking signal, when the marking signal is detected in the circuit, a 4 pin + TR1 of the MONO1 chip inputs high level, a monostable trigger works, a trigger pulse is generated at the output end of the MONO1 chip, the pulse signal is kept for a certain time, and the keeping time is determined by a resistor R6 and a capacitor C2. The output of the MONO1 chip is the excitation signal that controls the operation of the relay.

The signal switching circuit is mainly completed by a relay JPT and a driving tube Q1, wherein the JPT is a high-frequency relay. The circuit principle is that when an excitation signal is provided at the base level of a driving tube Q1, the driving tube Q1 is conducted, a relay JPT acts, the signal starts to be switched, a pin 2 at the common end of the relay JPT is connected with a pin 8 at a normally open point, namely a signal AUX-M, and the oscilloscope tests waveforms with a highlight mark and a pull-down mark. On the contrary, the driving tube Q1 is cut off, the relay JPT does not work, the common end 2 pin of the relay is connected with the normally closed store 4 pin, and the oscilloscope tests general signals.

It should be noted that the signal switching oscilloscope further includes other necessary components or modules, for example, a power supply component, and the test channel is a test channel of a general oscilloscope, and includes an oscillographic tube, a Y-axis deflection system, an X-axis deflection system, a scan generator, and the like. The embodiment of the application mainly improves the existing general oscilloscope, not only can the original test mode be kept, but also the test signal can be processed before the test signal is input into the general oscilloscope, and the test signal is input into the general oscilloscope for signal test after the synthesized signal is obtained. The test device can be compatible with all test functions of a common oscilloscope, and can also realize a signal marking function. In practical application, the switching of the marking function is realized according to the existence of the input of the marking signal. When no marking signal exists, the oscilloscope is used as a general oscilloscope, and the tested curve has no marking point. When the marking signal is detected, the signal switching circuit works, and the tested curve generates a marking point.

The signal tagging function, which is mainly implemented by the signal synthesizer, is explained in detail below.

The signal synthesizer according to the embodiment of the present application may synthesize the mark signal and the signal to be tested, as shown in fig. 2, the signal synthesizer receives the mark signal and the test signal, and outputs a synthesized signal after the synthesis. The marking of the central frequency point and the upper and lower frequency deviation points of the test signal is realized through the marking signal. As shown in fig. 3 and 4, the effects of the embodiments of the present application are explained: fig. 3 and 4 are amplitude-frequency characteristic curves obtained by signal testing of the same equipment, wherein fig. 3 is the amplitude-frequency characteristic curve obtained by a conventional oscilloscope, and fig. 4 is the amplitude-frequency characteristic curve obtained by the embodiment of the present application. In fig. 4, the center frequency point, the upper frequency deviation point, and the lower frequency deviation point have been marked, in the actual display, the signal at the center frequency point may be highlighted by highlighting, and the signal at the upper frequency deviation point and the lower frequency deviation point may be displayed by breaking or pulling down, so that the technician may determine the center frequency point, the upper frequency deviation point, and the lower frequency deviation point on the amplitude-frequency characteristic curve under the condition of the known display rule. Compared with the existing oscilloscope display, if the amplitude-frequency characteristic of the curve is changed, an operator is required to adjust the curve, and when the signal switching oscilloscope is used for testing and adjusting, only the amplitude-frequency characteristic curve of the special oscilloscope (signal switching oscilloscope) needs to be observed, so that the three frequency points meet the requirements. Manual measurement and calculation are not required as in the existing general-purpose oscilloscopes. In addition, in practical applications, the signals at the upper frequency offset point and the lower frequency offset point may be highlighted, and the signals at the center frequency point may be displayed as a breakpoint or a pull-down, which is not limited in the embodiments.

Wherein the detected signal is from the detection signal of the equipment, and the detected signal can be named AUX. The mark signal is a narrow pulse signal, and can be named mark to mark a central frequency point, an upper frequency offset point and a lower frequency offset point of the detected signal. Further, as shown in fig. 5, the mark signal is a periodic signal formed by positive and negative narrow pulses, where the positive pulse is used to mark an upper and lower frequency offset point for performing pull-down marking on an amplitude-frequency characteristic curve of the detected signal; the negative pulse is used for marking a central frequency point and highlighting and marking on the amplitude-frequency characteristic curve of the measured signal. The tag signal requires:

1) the amplitude of the positive pulse is more than or equal to +5V,

2) the amplitude of the negative pulse is less than or equal to-5V,

3) the width of the positive and negative pulses is more than or equal to 20us,

4) the center frequency point, the upper and lower frequency deviation points can be set by the user.

Further, as shown in fig. 6, the signal synthesizer includes: the device comprises a voltage comparison circuit, a marking signal processing circuit, a highlighting control circuit, a pull-down control circuit and a signal synthesis circuit;

Specifically, the method comprises the following steps:

(1) the voltage comparison circuit is used for separating upper and lower frequency deviation points and middle frequency deviation points of the mark signal to form a pull-down mark signal mark _ down and a highlight mark signal mark _ up;

(2) a Mark signal processing circuit (Mark signal processing circuit) which is mainly a monostable trigger circuit and is used for processing the signal output by the voltage comparison circuit to generate a single-pulse highlight Mark signal Mark _ up and a pull-down Mark signal Mark _ down; the single pulse signal is stable, and the pulse width is adjustable. The circuit schematic diagram is shown in fig. 7:

the monostable flip-flop circuit comprises a CD4098B monostable flip-flop and a CD4093B flip-flop.

(3) And the highlight control circuit is used for carrying out highlight point processing on the highlight mark signal of the single pulse and the frequency source to obtain a frequency signal with a highlight effect. Because the digital oscilloscope cannot singly highlight and display signals at a certain specific time point (such as highlighting and marking signal pulse time points) like an analog oscilloscope, the highlight point is processed by synthesizing a high-frequency small-amplitude oscillation frequency source on the signals at the specific time point so as to achieve the effect of highlighting and displaying the signals and mark central frequency points.

(4) And the pull-down control circuit is used for carrying out pull-down display processing on the pull-down marking signal of the single pulse and the tested signal to obtain the tested signal after the pull-down processing. The specific processing method is to make the input AUX signal be 0 at the time of the pull-down marking signal pulse, so as to achieve the effect of pull-down display.

(5) And the signal synthesis circuit is used for carrying out operation synthesis on the frequency signal with the highlighting effect output by the highlighting control circuit and the pull-down control circuit and the tested signal after the pull-down processing. Specifically, the frequency signal with the highlighting effect and the AUX signal after the pull-down processing are added by an adding circuit of the operational amplifier to form a combined signal AUX-out after the pull-down and marking processing. The schematic circuit diagram is shown in fig. 8.

The signal synthesis circuit comprises an MC1496 chip.

Further, the signal switching oscilloscope further comprises a synchronous signal generator for generating a marking signal and enabling the marking signal and the tested signal to be time-synchronized, and the synchronous signal generator is connected with the signal synthesizer through the tested equipment for generating the tested signal.

The synchronization signal may be named CN. The required frequency of the signal is 12.8HZ, the duty ratio is 2.5%, and the signal amplitude is larger than or equal to 10 Vpp. The synchronizing signal generator is used for generating a marking signal and enabling the marking signal Mark and the signal AUX to be detected to be synchronized in time. The circuit takes an NE555 chip as a core pulse generator circuit and outputs a synchronous signal CN meeting the index requirement. A specific circuit diagram of the pulse generator is shown in fig. 9.

Further, in practical application, the synthesis function, the synchronization signal generator function and the signal switching function are designed to be 3 independent PCB boards, the synchronization signal generation function board corresponds to the synchronization signal generator, the signal synthesis function board corresponds to the signal synthesizer, and the signal switching function board corresponds to the signal switching circuit. And the signal synthesis function board card, the synchronous signal generation function board card, the signal switching function board card and the universal oscilloscope test channel are integrated in the case to obtain the signal switching oscilloscope. The design of a heat dissipation air duct is considered, the design of the storage function of a power line, a test cable and a test meter pen is considered, and the case is portable and firm. Fig. 10 is a schematic physical diagram of an oscilloscope.

Example two

The present embodiment provides a signal switching system, as shown in fig. 11, the system includes a device under test and the signal switching oscilloscope of the first embodiment.

The synchronous signal CN enables a tested signal and a marking signal output by the tested device to be synchronous through the tested device, then the tested signal and the marking signal are synthesized through a signal synthesis function board card to obtain a synthesized signal, and the synthesized signal is finally input into a test channel after passing through a signal switching function board card.

Or the universal test signal is input into the test channel after passing through the signal switching function board card. Wherein the generic test signal is the signal under test.

The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A signal switching oscilloscope, comprising: the test channel is characterized in that the signal switching oscilloscope further comprises a signal synthesizer and a signal switching circuit:

the output of the signal switching circuit is connected with the test channel;

2. The signal switching oscilloscope of claim 1, wherein the signal switching circuitry comprises a voltage regulator, MONO1, JPT.

3. The signal switching oscilloscope of claim 1, wherein the signal synthesizer comprises: the device comprises a voltage comparison circuit, a marking signal processing circuit, a highlighting control circuit, a pull-down control circuit and a signal synthesis circuit;

4. The signal switching oscilloscope of claim 1, further comprising a synchronization signal generator for generating the marker signal and time synchronizing the marker signal with the signal under test, the synchronization signal generator being connected to the signal synthesizer through the device under test for generating the signal under test.

5. The signal switching oscilloscope of claim 3, wherein the marker signal processing circuit is a monostable flip-flop circuit.

6. The signal switching oscilloscope of claim 3, wherein the signal synthesis circuit is a summing circuit of an operational amplifier.

7. The signal switching oscilloscope of claim 5, wherein the monostable flip-flop circuit comprises a CD4098B monostable flip-flop and a CD4093B flip-flop.

8. The signal switching oscilloscope of claim 3, wherein the signal synthesis circuit comprises an MC1496 chip.

9. The signal switching oscilloscope of claim 4, wherein the synchronization signal generator comprises a pulse generator circuit, the pulse generator circuit employing an NE555 chip.

10. A signal switching system, characterized in that the system comprises a device under test, a signal switching oscilloscope according to any of the preceding claims 1-9.