CN112051428A - Automatic marking oscilloscope, automatic marking system and method for testing signal marking - Google Patents

Abstract

The application discloses an automatic marking oscilloscope, an automatic marking system and a method for testing signal marking, wherein the method for testing signal marking comprises the steps of obtaining a signal to be tested, wherein the signal to be tested is a signal generated by equipment to be tested; acquiring a marking signal, wherein the marking signal is used for marking a central frequency point and upper and lower frequency deviation points of a detected signal; and synthesizing the detected signal and the marked signal to obtain a synthesized signal, wherein the synthesized signal is a signal with a central frequency point and upper and lower frequency offset point display. The method and the device simplify the signal testing process of the oscilloscope, reduce the labor working cost and improve the testing and adjusting accuracy.

Description

Automatic marking oscilloscope, automatic marking system and method for testing signal marking

Technical Field

The application relates to the technical field of equipment detection, in particular to an automatic marking oscilloscope, an automatic marking system and a method for testing signal marking.

Background

Existing conventional oscilloscopes are often used in radar-equipped chambers for visually observing and studying periodic and disposable electrical signals, ranging in frequency from dc to 100 mhz. Measuring the amplitude of the signal to be studied within the range of 0.008-40 volts; two channels, i.e. one scan, measure two investigated signals simultaneously. The horizontal axis of the screen of the general oscilloscope represents time, the vertical axis represents the voltage of the measured signal, and the waveform on the oscilloscope reflects the track of the voltage of the measured signal changing along with the time.

The existing general oscilloscope is an analog oscilloscope, and the functional circuit comprises an electronic ray tube display, a vertical deflection system, a horizontal deflection system, a calibrator, a power supply component and the like. The working principle is as follows: the core part of the analog oscilloscope is an electron ray display tube which consists of an electron gun, a deflection system and a fluorescent screen. The electron gun emits high-speed electron current, and the high-speed electron current is deflected by a vertical deflection system and a horizontal deflection system which are composed of two pairs of metal plates and then is applied to a fluorescent screen to enable fluorescent materials to emit light, so that a specific image is displayed. By applying a specific voltage to the control deflection plate, the voltage change signal can be displayed in the form of an image, which is the basic working principle of the analog oscilloscope.

The most frequently used analog oscilloscopes by professionals is to test the amplitude-frequency characteristic curve of a specific signal and detect the central frequency point f of the curve for a long time₀Upper frequency deviation point f_HLower frequency deviation point f_L. The main purpose is to maintain the stability of the passband of the signal when the center frequency f of the signal is₀Upper frequency deviation point f_HLower frequency deviation point f_LWhen the deviation exists, some parameters of the equipment need to be manually fine-tuned, so that the amplitude-frequency characteristic curve of the passband meets the requirement of the performance index of the equipment. However, when an operator tests the amplitude-frequency characteristic curve of a certain signal using an analog oscilloscope, the analog oscilloscope cannot accurately display the central frequency point f of the signal in real time₀Upper frequency deviation point f_HLower frequency deviation point f_L. When the signal is detected each time, the horizontal mark point X1 of the oscilloscope needs to be manually adjusted to read out the specific values Fx of the three frequency points respectively, if the value Fx is not within the technical index range, manual calculation is needed, and after the result is calculated, adjustment is carried out. It can be seen that this is a complex and time-consuming operation process, and unknown factors such as calculation errors may be generated in the middle, which seriously affects the efficiency of test adjustment.

Disclosure of Invention

The present application is directed to an automatic marking oscilloscope, an automatic marking system, and a method for testing signal marking, so as to improve the efficiency of test adjustment.

In order to achieve the above object, a first aspect of the present application provides an automatic marking oscilloscope, comprising: the oscilloscope further comprises a signal synthesizer, and the output of the signal synthesizer is connected with the test channel;

the signal synthesizer receives the tested signal and the marking signal, outputs a synthesized signal, and inputs the synthesized signal to the test channel;

the marking signal is used for marking a central frequency point and upper and lower frequency deviation points of the detected signal.

Optionally, the signal synthesizer includes: the device comprises a voltage comparison circuit, a marking signal processing circuit, a highlighting control circuit, a pull-down control circuit and a signal synthesis circuit;

the marking signal processing circuit is respectively connected with the voltage comparison circuit, the highlighting control circuit and the pull-down control circuit, and the signal synthesis circuit is respectively connected with the pull-down control circuit and the highlighting control circuit;

the marking signal is input into the voltage comparison circuit, the voltage comparison circuit outputs two paths of signals which are respectively input into the marking signal processing circuit, the marking signal processing circuit outputs two paths of signals, one path of signal and the frequency source are both input into the highlighting control circuit, the other path of signal and the detected signal are both input into the pull-down control circuit, the output signals of the highlighting control circuit and the pull-down control circuit are both input into the signal synthesis circuit, and the synthesized signal is output.

Optionally, the oscilloscope further comprises a synchronization signal generator for generating the marking signal and synchronizing the marking signal and the time of the signal to be tested, and the synchronization signal generator is connected with the signal synthesizer through the device to be tested for generating the signal to be tested.

Optionally, the flag signal processing circuit is a monostable flip-flop circuit.

Optionally, the signal synthesizing circuit is an adding circuit of an operational amplifier.

Optionally, the monostable flip-flop circuit includes a CD4098B monostable flip-flop and a CD4093B flip-flop.

Optionally, the signal synthesis circuit includes an MC1496 chip.

Optionally, the frequency of the signal output by the synchronization signal generator is 12.8HZ, the duty ratio of the signal is 2.5%, and the signal amplitude is greater than or equal to 10 Vpp.

Optionally, the synchronization signal generator includes a pulse generator circuit, and the pulse generator circuit employs an NE555 chip.

In order to achieve the above object, a second aspect of the present application provides an automatic marking system, which includes a device under test, the automatic marking oscilloscope of any one of the above first aspects.

In order to achieve the above object, a third aspect of the present application provides a method of testing a signal mark, the method comprising:

acquiring a signal to be detected, wherein the signal to be detected is a signal generated by equipment to be detected;

acquiring a marking signal, wherein the marking signal is used for marking a central frequency point and upper and lower frequency deviation points of a detected signal;

and synthesizing the detected signal and the marked signal to obtain a synthesized signal, wherein the synthesized signal is a signal with a central frequency point and upper and lower frequency offset point display.

Optionally, the acquiring the mark signal includes:

acquiring a periodic signal formed by positive and negative narrow pulses through a pulse generator;

the positive pulse is used for marking an upper frequency deviation point and a lower frequency deviation point, and the negative pulse is used for marking a central frequency point.

Optionally, the synthesizing the detected signal and the labeled signal includes:

separating the upper frequency deviation point, the lower frequency deviation point and the middle frequency deviation point of the marking signal through a voltage comparison circuit to form a pull-down marking signal and a highlighted marking signal;

processing the signal output by the voltage comparison circuit through a mark signal processing circuit to generate a single-pulse highlight mark signal and a single-pulse pull-down mark signal;

the highlight control circuit is used for carrying out highlight point processing on the highlight mark signal and the frequency source of the single pulse to obtain a frequency signal with a highlight effect;

the pull-down display processing is carried out on the pull-down marking signal of the single pulse and the tested signal through the pull-down control circuit to obtain the tested signal after the pull-down processing;

and the frequency signal with the highlighting effect output by the highlighting control circuit and the pull-down control circuit and the tested signal after the pull-down processing are operated and synthesized by a signal synthesis circuit.

Optionally, the frequency signal for obtaining the highlighting effect by performing the highlighting dot processing on the highlighting mark signal of the single pulse and the frequency source through the highlighting control circuit includes:

at the time point of the pulse of the highlight mark signal, a high-frequency small-amplitude oscillation frequency source is synthesized on the highlight mark signal to obtain a frequency signal with a highlight effect.

Optionally, the step of performing pull-down display processing on the pull-down marking signal of the single pulse and the detected signal through the pull-down control circuit to obtain the detected signal after the pull-down processing includes:

at the time of the pull-down flag signal pulse, the input signal under test is set to 0.

Optionally, the performing, by the signal synthesizing circuit, the operation and synthesis of the frequency signal with the highlighting effect output by the highlighting control circuit and the pull-down control circuit and the signal to be tested after the pull-down processing includes:

the frequency signal with the highlighting effect and the signal to be measured after the pull-down processing are added by an adding circuit of an operational amplifier.

Compared with the prior art, this application can bring following technological effect:

1. based on the automatic marking of the signal passband of the oscilloscope, the required central frequency point and upper and lower frequency deviation points can be directly marked, so that the marking of the frequency points by manually adjusting an X horizontal position knob of the oscilloscope as in the conventional oscilloscope is avoided, the operation is automated, and the labor working cost is reduced;

2. a plurality of frequency points can be marked simultaneously and displayed on the measured signal curve simultaneously, so that the operation process is simplified, and the time cost is reduced;

3. the central frequency point and the upper and lower frequency deviation points are accurately displayed in real time, so that the accuracy of signal detection is improved;

4. the marking mode includes two types: one is to highlight at a certain frequency point; and the other is to pull down the display of the waveform at a certain frequency point. The two kinds of display are clearly displayed on an oscilloscope, and the marked frequency points can be highlighted; and different marking frequency points can be distinguished in different display modes, namely the waveform highlights the central frequency point, the waveform pulls down the central frequency point to represent the upper frequency deviation point and the lower frequency deviation point, and vice versa, so that the signal detection is more accurate.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this application, serve to provide a further understanding of the application and to enable other features, objects, and advantages of the application to be more apparent. The drawings and their description illustrate the embodiments of the invention and do not limit it. In the drawings:

FIG. 1 is a schematic diagram of a mark signal and a test signal combined to output a combined signal according to an embodiment of the present application;

FIG. 2 is a schematic diagram of an amplitude-frequency characteristic curve obtained by a conventional oscilloscope;

FIG. 3 is a schematic diagram of an amplitude-frequency characteristic curve obtained by an automatic marking oscilloscope according to an embodiment of the present application;

fig. 4 is a schematic diagram of a center frequency point, an upper frequency offset point and a lower frequency offset point according to an embodiment of the present application;

FIG. 5 is a schematic diagram of a signal synthesizer according to an embodiment of the present application;

FIG. 6 is a schematic diagram of a tag signal processing circuit according to an embodiment of the present disclosure;

fig. 7 is a schematic circuit diagram of a signal synthesizing circuit according to an embodiment of the present application;

FIG. 8 is a circuit diagram of a pulse generator provided in an embodiment of the present application;

FIG. 9 is a schematic block diagram of an automated oscilloscope according to an embodiment of the present application;

FIG. 10 is a schematic diagram of a component structure of an automatic marking system according to an embodiment of the present disclosure;

fig. 11 is a flowchart of a method for testing signal marks according to an embodiment of the present application.

Detailed Description

In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It should be understood that the data so used may be interchanged under appropriate circumstances such that embodiments of the application described herein may be used. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.

Embodiment one, as shown in FIGS. 1 to 9

The embodiment of the application provides an automatic mark oscilloscope, and the automatic mark oscilloscope includes: the automatic marking oscilloscope also comprises a signal synthesizer, and the output of the signal synthesizer is connected with the test channel; the signal synthesizer receives the tested signal and the marking signal, outputs a synthesized signal, and inputs the synthesized signal to the test channel; the marking signal is used for marking a central frequency point and upper and lower frequency deviation points of the detected signal.

It should be noted that the automatic marking oscilloscope further includes other necessary components or modules, for example, a power supply component, and the test channel is a test channel of a general oscilloscope, and includes an oscillograph tube, a Y-axis deflection system, an X-axis deflection system, a scan generator, and the like. The embodiment of the application mainly improves the existing general oscilloscope, and before the test signal is input into the general oscilloscope, the test signal is processed to obtain the synthesized signal and then input into the general oscilloscope for signal test.

The embodiment of the present application is creatively added with a signal synthesizer, which can synthesize the marking signal and the signal to be tested, as shown in fig. 1, the signal synthesizer receives the marking signal and the testing signal, and outputs the synthesized signal after synthesis. The marking of the central frequency point and the upper and lower frequency deviation points of the test signal is realized through the marking signal. As shown in fig. 2 and 3, the effects of the embodiments of the present application are explained: fig. 2 and 3 are amplitude-frequency characteristic curves obtained by signal testing of the same equipment, wherein fig. 2 is the amplitude-frequency characteristic curve obtained by a conventional oscilloscope, and fig. 3 is the amplitude-frequency characteristic curve obtained by the embodiment of the present application. In fig. 3, the center frequency point, the upper frequency deviation point, and the lower frequency deviation point have been marked, in the actual display, the signal at the center frequency point may be highlighted by highlighting, and the signal at the upper frequency deviation point and the lower frequency deviation point may be displayed by breaking or pulling down, so that the technician may determine the center frequency point, the upper frequency deviation point, and the lower frequency deviation point on the amplitude-frequency characteristic curve under the condition of the known display rule. Compared with the existing oscilloscope display, if the amplitude-frequency characteristic of the curve is changed, an operator is required to adjust the curve, and when the automatic marking oscilloscope is used for testing and adjusting, only the amplitude-frequency characteristic curve of the special oscilloscope (automatic marking oscilloscope) needs to be observed, so that the three frequency points meet the requirements. Manual measurement and calculation are not required as in the existing general-purpose oscilloscopes. In addition, in practical applications, the signals at the upper frequency offset point and the lower frequency offset point may be highlighted, and the signals at the center frequency point may be displayed as a breakpoint or a pull-down, which is not limited in the embodiments.

Wherein the detected signal is from the detection signal of the equipment, and the detected signal can be named AUX. The mark signal is a narrow pulse signal, and can be named mark to mark a central frequency point, an upper frequency offset point and a lower frequency offset point of the detected signal. Further, as shown in fig. 4, the mark signal is a periodic signal formed by positive and negative narrow pulses, where the positive pulse is used to mark an upper and lower frequency offset point for performing pull-down marking on an amplitude-frequency characteristic curve of the detected signal; the negative pulse is used for marking a central frequency point and highlighting and marking on the amplitude-frequency characteristic curve of the measured signal. The tag signal requires:

1) the amplitude of the positive pulse is more than or equal to +5V,

2) the amplitude of the negative pulse is less than or equal to-5V,

3) the width of the positive and negative pulses is more than or equal to 20us,

4) the center frequency point, the upper and lower frequency deviation points can be set by the user.

Further, as shown in fig. 5, the signal synthesizer includes: the device comprises a voltage comparison circuit, a marking signal processing circuit, a highlighting control circuit, a pull-down control circuit and a signal synthesis circuit;

the marking signal processing circuit is respectively connected with the voltage comparison circuit, the highlighting control circuit and the pull-down control circuit, and the signal synthesis circuit is respectively connected with the pull-down control circuit and the highlighting control circuit;

the marking signal is input into the voltage comparison circuit, the voltage comparison circuit outputs two paths of signals which are respectively input into the marking signal processing circuit, the marking signal processing circuit outputs two paths of signals, one path of signal and the frequency source are both input into the highlighting control circuit, the other path of signal and the detected signal are both input into the pull-down control circuit, the output signals of the highlighting control circuit and the pull-down control circuit are both input into the signal synthesis circuit, and the synthesized signal is output.

Specifically, the method comprises the following steps:

(1) the voltage comparison circuit is used for separating upper and lower frequency deviation points and middle frequency deviation points of the mark signal to form a pull-down mark signal mark _ down and a highlight mark signal mark _ up;

(2) a Mark signal processing circuit (Mark signal processing circuit) which is mainly a monostable trigger circuit and is used for processing the signal output by the voltage comparison circuit to generate a single-pulse highlight Mark signal Mark _ up and a pull-down Mark signal Mark _ down; the single pulse signal is stable, and the pulse width is adjustable. The circuit schematic diagram is as shown in fig. 6:

the monostable flip-flop circuit comprises a CD4098B monostable flip-flop and a CD4093B flip-flop.

(3) And the highlight control circuit is used for carrying out highlight point processing on the highlight mark signal of the single pulse and the frequency source to obtain a frequency signal with a highlight effect. Because the digital oscilloscope cannot singly highlight and display signals at a certain specific time point (such as highlighting and marking signal pulse time points) like an analog oscilloscope, the highlight point is processed by synthesizing a high-frequency small-amplitude oscillation frequency source on the signals at the specific time point so as to achieve the effect of highlighting and displaying the signals and mark central frequency points.

(4) And the pull-down control circuit is used for carrying out pull-down display processing on the pull-down marking signal of the single pulse and the tested signal to obtain the tested signal after the pull-down processing. The specific processing method is to make the input AUX signal be 0 at the time of the pull-down marking signal pulse, so as to achieve the effect of pull-down display.

(5) And the signal synthesis circuit is used for carrying out operation synthesis on the frequency signal with the highlighting effect output by the highlighting control circuit and the pull-down control circuit and the tested signal after the pull-down processing. Specifically, the frequency signal with the highlighting effect and the AUX signal after the pull-down processing are added by an adding circuit of the operational amplifier to form a combined signal AUX-out after the pull-down and marking processing. The schematic circuit diagram is shown in fig. 7.

The signal synthesis circuit comprises an MC1496 chip.

Furthermore, the automatic marking oscilloscope also comprises a synchronous signal generator which is used for generating the marking signal and enabling the marking signal and the tested signal to be time-synchronized, and the synchronous signal generator is connected with the signal synthesizer through the tested equipment which is used for generating the tested signal.

The synchronization signal may be named CN. The required frequency of the signal is 12.8HZ, the duty ratio is 2.5%, and the signal amplitude is larger than or equal to 10 Vpp. The synchronizing signal generator is used for generating a marking signal and enabling the marking signal Mark and the signal AUX to be detected to be synchronized in time. The circuit takes an NE555 chip as a core pulse generator circuit and outputs a synchronous signal CN meeting the index requirement. A specific circuit diagram of the pulse generator is shown in fig. 8.

Further, in practical application, the synthesis function and the synchronization signal generator function are designed to be 2 independent PCB boards, the synchronization signal generation function board corresponds to the synchronization signal generator, and the signal synthesis function board corresponds to the signal synthesizer. And the signal synthesis function board card, the synchronous signal generation function board card and the general oscilloscope test channel are integrated in the case to obtain the automatic marking oscilloscope. The design of a heat dissipation air duct is considered, the design of the storage function of a power line, a test cable and a test meter pen is considered, and the case is portable and firm. Fig. 9 is a schematic physical diagram of an oscilloscope.

Example two

The present embodiment provides an automatic marking system, as shown in fig. 10, which includes a device under test and the automatic marking oscilloscope of the first embodiment.

The synchronous signal CN enables a tested signal and a marking signal output by the tested device to be synchronous through the tested device, then the tested signal and the marking signal are synthesized through a signal synthesis function board card to obtain a synthesized signal, and finally the synthesized signal is input into a test channel.

EXAMPLE III

According to an embodiment of the present application, a method for marking a test signal is provided, where the method is a method for automatically identifying an oscilloscope to implement marking a test signal, as shown in fig. 11, and the method includes the following steps:

s101, obtaining a tested signal, wherein the tested signal is a signal generated by tested equipment.

And acquiring a tested signal through accessing of a signal generated by the tested device.

S102, obtaining a marking signal, wherein the marking signal is used for marking a central frequency point and an upper frequency offset point and a lower frequency offset point of a detected signal.

Specifically, a pulse generator is used for obtaining a periodic signal formed by positive and negative narrow pulses, wherein positive pulses can be used for marking upper and lower frequency deviation points, and negative pulses can be used for marking central frequency points. For highlighting marks on the amplitude-frequency characteristic curve of the measured signal. The tag signal requires: 1) the amplitude of the positive pulse is more than or equal to +5V, 2) the amplitude of the negative pulse is less than or equal to-5V, 3) the width of the positive pulse and the negative pulse is more than or equal to 20us, 4) a central frequency point, and an upper frequency offset point and a lower frequency offset point can be set by a user.

In addition, during actual test, in order to ensure the synchronization between the test signal and the mark signal, a pulse generator is required to generate a synchronization signal, the frequency of the signal is required to be 12.8HZ, the duty ratio is required to be 2.5%, and the signal amplitude is larger than or equal to 10 Vpp. The specific circuit of the pulse generator is a circuit with an NE555 chip as a core, and a specific circuit diagram is shown in fig. 8.

And S103, synthesizing the detected signal and the marked signal to obtain a synthesized signal, wherein the synthesized signal is a signal with a central frequency point and upper and lower frequency offset point display.

Specifically, the signal synthesis is performed by a signal synthesizer including a voltage comparison circuit, a flag signal processing circuit, a highlight control circuit, a pull-down control circuit, and a signal synthesis circuit.

The flow for realizing signal synthesis according to the circuit comprises the following steps: separating the upper frequency deviation point, the lower frequency deviation point and the middle frequency deviation point of the marking signal through a voltage comparison circuit to form a pull-down marking signal and a highlighted marking signal; processing the signal output by the voltage comparison circuit through a mark signal processing circuit to generate a single-pulse highlight mark signal and a single-pulse pull-down mark signal; the highlight control circuit is used for carrying out highlight point processing on the highlight mark signal and the frequency source of the single pulse to obtain a frequency signal with a highlight effect; the pull-down display processing is carried out on the pull-down marking signal of the single pulse and the tested signal through the pull-down control circuit to obtain the tested signal after the pull-down processing; and the frequency signal with the highlighting effect output by the highlighting control circuit and the pull-down control circuit and the tested signal after the pull-down processing are operated and synthesized by a signal synthesis circuit.

The "frequency signal with the highlight effect obtained by performing the highlight processing on the highlight mark signal and the frequency source of the single pulse by the highlight control circuit" is specifically: at the time point of the pulse of the highlight mark signal, a high-frequency small-amplitude oscillation frequency source is synthesized on the highlight mark signal to obtain a frequency signal with a highlight effect.

The "obtaining the measured signal after the pull-down processing by performing the pull-down display processing on the pull-down marking signal of the single pulse and the measured signal through the pull-down control circuit" specifically includes: at the time of the pull-down flag signal pulse, the input signal under test is set to 0.

The "performing, by the signal synthesis circuit, the operation and synthesis of the frequency signal with the highlighting effect output by the highlighting control circuit and the pull-down control circuit and the signal to be measured after the pull-down processing" specifically includes: adding the highlight frequency signal and the pull-down signal to be measured by an adding circuit of an operational amplifier

It should be noted that other detailed descriptions of the voltage comparison circuit, the mark signal processing circuit, the highlight control circuit, the pull-down control circuit, and the signal synthesis circuit in this embodiment may refer to the related descriptions in the first embodiment, and are not described herein again.

After the synthesized signal is obtained, the synthesized signal (the signal of marking the central frequency point and the upper and lower frequency deviation points of the test signal by the marking signal) is input into a test channel (the test channel of a general oscilloscope) for signal testing, and finally, the signal of which the central frequency point and the upper and lower frequency deviation points are marked is displayed in an amplitude-frequency characteristic curve in the oscilloscope.

In the foregoing description, in the method for marking a test signal according to the embodiment of the present application, a signal to be tested is first obtained, where the signal to be tested is a signal generated by a device under test; obtaining a marking signal, wherein the marking signal is used for marking a central frequency point and upper and lower frequency deviation points of a detected signal; and then, synthesizing the detected signal and the marked signal to obtain a synthesized signal, wherein the synthesized signal is a signal with a central frequency point and upper and lower frequency offset point display. It can be seen that, when the method for marking a test signal is applied to oscilloscope testing, the marking of the central frequency point and the upper and lower frequency deviation points of the tested signal of the tested device can be realized, so that an operation technician only needs to observe the amplitude-frequency characteristic curve of the oscilloscope when the operation technician needs to adjust if the amplitude-frequency characteristic of the curve is changed during testing, and the three frequency points can meet the requirements. The method does not need to carry out manual measurement and calculation like the conventional general oscilloscope, simplifies the signal testing process of the oscilloscope, reduces the labor working cost and improves the efficiency of testing and adjusting.

It should be noted that the steps illustrated in the flowcharts of the figures may be performed in a computer system such as a set of computer-executable instructions and that, although a logical order is illustrated in the flowcharts, in some cases, the steps illustrated or described may be performed in an order different than presented herein.

It will be apparent to those skilled in the art that the modules or steps of the present application described above may be implemented by a general purpose computing device, they may be centralized on a single computing device or distributed across a network of multiple computing devices, and they may alternatively be implemented by program code executable by a computing device, such that they may be stored in a storage device and executed by a computing device, or fabricated separately as individual integrated circuit modules, or fabricated as a single integrated circuit module from multiple modules or steps. Thus, the present application is not limited to any specific combination of hardware and software.

The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims (10)

1. An automatic labeling oscilloscope, comprising: the test channel is characterized in that the automatic marking oscilloscope further comprises a signal synthesizer, and the output of the signal synthesizer is connected with the test channel;

the signal synthesizer receives the tested signal and the marking signal, outputs a synthesized signal, and inputs the synthesized signal to the test channel;

the marking signal is used for marking a central frequency point and upper and lower frequency deviation points of the detected signal.

2. The automated labeling oscilloscope of claim 1, wherein said signal synthesizer comprises: the device comprises a voltage comparison circuit, a marking signal processing circuit, a highlighting control circuit, a pull-down control circuit and a signal synthesis circuit;

the marking signal processing circuit is respectively connected with the voltage comparison circuit, the highlighting control circuit and the pull-down control circuit, and the signal synthesis circuit is respectively connected with the pull-down control circuit and the highlighting control circuit;

the marking signal is input into the voltage comparison circuit, the voltage comparison circuit outputs two paths of signals which are respectively input into the marking signal processing circuit, the marking signal processing circuit outputs two paths of signals, one path of signal and the frequency source are both input into the highlighting control circuit, the other path of signal and the detected signal are both input into the pull-down control circuit, the output signals of the highlighting control circuit and the pull-down control circuit are both input into the signal synthesis circuit, and the synthesized signal is output.

3. The automatic labeling oscilloscope of claim 1, further comprising a synchronization signal generator for generating the label signal and time synchronizing the label signal with the signal under test, said synchronization signal generator being connected to the signal synthesizer through the device under test for generating the signal under test.

4. An automatic labeling system, characterized in that the system comprises a device under test, an automatic labeling oscilloscope of any of the preceding claims 1-3.

5. A method of testing a signal mark, the method comprising:

acquiring a signal to be detected, wherein the signal to be detected is a signal generated by equipment to be detected;

acquiring a marking signal, wherein the marking signal is used for marking a central frequency point and upper and lower frequency deviation points of a detected signal;

and synthesizing the detected signal and the marked signal to obtain a synthesized signal, wherein the synthesized signal is a signal with a central frequency point and upper and lower frequency offset point display.

6. The method of testing signal indicia according to claim 5, wherein said obtaining indicia signals comprises:

acquiring a periodic signal formed by positive and negative narrow pulses through a pulse generator;

the positive pulse is used for marking an upper frequency deviation point and a lower frequency deviation point, and the negative pulse is used for marking a central frequency point.

7. The method of claim 5, wherein the combining the signal under test and the label signal comprises:

separating the upper frequency deviation point, the lower frequency deviation point and the middle frequency deviation point of the marking signal through a voltage comparison circuit to form a pull-down marking signal and a highlighted marking signal;

processing the signal output by the voltage comparison circuit through a mark signal processing circuit to generate a single-pulse highlight mark signal and a single-pulse pull-down mark signal;

the highlight control circuit is used for carrying out highlight point processing on the highlight mark signal and the frequency source of the single pulse to obtain a frequency signal with a highlight effect;

the pull-down display processing is carried out on the pull-down marking signal of the single pulse and the tested signal through the pull-down control circuit to obtain the tested signal after the pull-down processing;

and the frequency signal with the highlighting effect output by the highlighting control circuit and the pull-down control circuit and the tested signal after the pull-down processing are operated and synthesized by a signal synthesis circuit.

8. The method of testing signal marks according to claim 7, wherein the frequency signal for highlighting effect by the highlight control circuit highlighting the mark signal for highlighting one pulse and the frequency source comprises:

at the time point of the pulse of the highlight mark signal, a high-frequency small-amplitude oscillation frequency source is synthesized on the highlight mark signal to obtain a frequency signal with a highlight effect.

9. The method of claim 7, wherein the step of performing a pull-down display process on the pull-down flag signal of the single pulse and the signal under test by the pull-down control circuit to obtain the signal under test after the pull-down process comprises:

at the time of the pull-down flag signal pulse, the input signal under test is set to 0.

10. The method of claim 7, wherein the operational combination of the highlight effect frequency signal output by the highlight control circuit and the pull-down processed signal under test by the signal combination circuit comprises:

the frequency signal with the highlighting effect and the signal to be measured after the pull-down processing are added by an adding circuit of an operational amplifier.

Images