CN214409191U - IGBT dynamic testing device with voltage and current phase calibration function - Google Patents
IGBT dynamic testing device with voltage and current phase calibration function Download PDFInfo
- Publication number
- CN214409191U CN214409191U CN202022720856.XU CN202022720856U CN214409191U CN 214409191 U CN214409191 U CN 214409191U CN 202022720856 U CN202022720856 U CN 202022720856U CN 214409191 U CN214409191 U CN 214409191U
- Authority
- CN
- China
- Prior art keywords
- voltage
- igbt
- module
- phase
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a IGBT dynamic testing arrangement with voltage current phase calibration function, include control module, accompany survey IGBT, pulse generation module, pure resistive module and measuring instrument module, wherein measuring instrument is used for measuring the voltage at pure resistive module both ends and the electric current between pure resistive module and the control module, adjusts the voltage waveform and the current waveform that record, shows voltage waveform and the current waveform through adjusting. The utility model discloses use the less pure resistive module of stray parameter, can reduce the influence of the stray parameter of hardware component, delay the calibration through set up the probe on the oscilloscope, can obtain the ripples nature after the calibration to reduce because of the phase difference that testing arrangement self performance arouses to the interference of electric current waveform and voltage waveform measurement result, improve the precision of testing result. The utility model discloses the wide application is in electronic circuit technical field.
Description
Technical Field
The utility model belongs to the technical field of the electronic circuit technique and specifically relates to a IGBT dynamic testing arrangement with voltage current phase calibration function.
Background
When the performance of the IGBT is dynamically tested, the current waveform and the voltage waveform of the IGBT to be tested need to be collected for analysis. However, due to the influence of stray parameters of hardware components in the test device or calculation errors of a software algorithm, the measured current waveform and voltage waveform are not synchronous on a time axis, that is, a phase difference exists between the current waveform and the voltage waveform, which is caused by the performance of the test device itself, and the phase difference is mixed with the phase difference between the voltage waveform and the current waveform, which is caused by the performance of the IGBT to be tested when the IGBT to be tested is tested, so that the phase difference between the voltage waveform and the current waveform in the final measurement result does not reflect the performance of the IGBT to be tested, and the precision of the test result is influenced.
Disclosure of Invention
To above-mentioned at least one technical problem, the utility model aims to provide an IGBT dynamic testing arrangement with voltage electric current phase calibration function.
The embodiment of the utility model provides a IGBT dynamic testing arrangement with voltage electric current phase calibration function includes:
the control module is used for generating a control signal;
carrying out accompany measurement on the IGBT; the collector of the accompanied IGBT is connected with one output end of the control module;
a pulse generation module; the output end of the pulse generation module is connected with the gate of the accompanied IGBT;
a purely resistive module; one end of the pure resistive module is connected with the emitter of the accompanied IGBT, and the other end of the pure resistive module is connected with the other output end of the control module;
a measurement instrument module; the measuring instrument includes voltage measurement unit, current measurement unit, phase place regulating unit and oscillography unit, voltage measurement unit is used for measuring the voltage at pure resistive module both ends, current measurement unit is used for measuring pure resistive module with electric current between the control module, the phase place regulating unit is used for adjusting voltage waveform that voltage measurement unit surveyed with the electric current waveform that current measurement unit surveyed, the oscillography unit is used for showing through the regulation voltage waveform with the electric current waveform.
Further, the phase adjusting unit is configured to adjust the voltage waveform measured by the voltage measuring unit and the current waveform measured by the current measuring unit such that the phase of the voltage waveform is the same as the phase of the current waveform.
Further, the phase adjusting unit is configured to adjust the voltage waveform measured by the voltage measuring unit and the current waveform measured by the current measuring unit such that the phase of the voltage waveform and the phase of the current waveform are both the same as the phase of the control signal.
Further, the phase adjusting unit is used for adjusting the voltage waveform measured by the voltage measuring unit and the current waveform measured by the current measuring unit, so that the phase difference between the voltage waveform and the current waveform is smaller than a phase threshold value.
Further, the control module includes:
a power supply unit; the power supply unit is used for supplying power;
a first switch; one end of the first switch is connected with one end of the power supply unit, and the other end of the first switch is used as one output end of the control module;
a capacitor; one end of the capacitor is connected with the other end of the first switch, the other end of the capacitor is connected with the other end of the power supply unit, and the other end of the capacitor is used as the other output end of the control module;
a second switch; one end of the second switch is connected with one end of the capacitor;
a resistor; one end of the resistor is connected to the other end of the second switch, and the other end of the resistor is connected to the other end of the capacitor.
Further, the power supply unit is used for providing direct current power supply.
Further, the pure resistive module is a non-inductive resistor.
Further, the phase of the output signal of the pulse generation module is the same as the phase of the control signal.
Furthermore, one end of the pure resistive module is used for connecting a collector of the IGBT to be tested, and the other end of the pure resistive module is used for connecting an emitter of the IGBT to be tested.
The utility model has the advantages that: according to the IGBT dynamic testing device with the voltage and current phase calibration function, the pure resistive module with few stray parameters can reduce the influence of the stray parameters of hardware parts, can eliminate the measurement phase difference caused by stray inductance inside an IGBT device, eliminates the packaging difference of each IGBT device, and can obtain the measurement result deviation caused by inconsistent measurement point positions.
Drawings
FIG. 1 is a schematic structural diagram of an IGBT dynamic test device with a voltage-current phase calibration function in an embodiment;
FIG. 2 is a schematic structural diagram of an IGBT dynamic test device with a voltage-current phase calibration function in an embodiment;
FIG. 3 is a schematic diagram of voltage waveforms and current waveforms before calibration in the embodiment;
FIG. 4 is a diagram illustrating the voltage waveform and the current waveform after calibration in the embodiment;
fig. 5 is a schematic connection diagram of the IGBT dynamic test apparatus and the IGBT to be tested in the embodiment.
Detailed Description
In this embodiment, the structure of the IGBT dynamic test apparatus with the voltage and current phase calibration function is shown in fig. 1, and the IGBT dynamic test apparatus includes a control module 1, an accompanied IGBT2, a pulse generation module 3, a pure resistive module 4, and a measurement instrument module 5.
In the present embodiment, referring to fig. 2, the control module 1 includes a power supply unit 101, a first switch 102, a capacitor 103, a second switch 104, and a resistor 105. The power supply unit 101 is configured to provide a direct current power supply, one end of the first switch 102 is connected to one end of the power supply unit 101, the other end of the first switch 102 is used as an output end of the control module 1, one end of the capacitor 103 is connected to the other end of the first switch 102, the other end of the capacitor 103 is connected to the other end of the power supply unit 101, the other end of the capacitor 103 is used as another output end of the control module 1, one end of the second switch 104 is connected to one end of the capacitor 103, one end of the resistor 105 is connected to the other end of the second switch 104, and the other end of the resistor 105 is connected to the other end of the capacitor 103.
In the present embodiment, the first switch 102 is used to turn on or off the power supply of the power supply unit 101. With the first switch 102 closed, the second switch 104 in the control module 1 is turned on and off twice in succession, so that a double-pulse control signal can be generated, and a double-pulse test can be performed on the IGBT under test connected to the IGBT dynamic test device.
In this embodiment, referring to fig. 1 and fig. 2, the collector of the auxiliary IGBT2 is connected to one output end of the control module 1, the output end of the pulse generation module 3 is connected to the gate of the auxiliary IGBT2, one end of the pure resistive module 4 is connected to the emitter of the auxiliary IGBT2, and the other end of the pure resistive module 4 is connected to the other output end of the control module 1.
In the present embodiment, referring to fig. 2, the measurement instrument module 5 includes a voltage measurement unit 501, a current measurement unit 502, a phase adjustment unit 503, and an oscillometric unit 504. The voltage measuring unit 501 is provided with a voltage probe, the voltage probe is connected to two ends of the pure resistive module 4, and the voltage measuring unit 501 measures voltages at two ends of the pure resistive module 4 through the voltage probe so as to obtain a voltage waveform; the current measuring unit 502 is provided with a current probe, the current probe is connected between the pure resistive module 4 and the other output end of the control module 1, and the current measuring unit 502 measures the current flowing through the pure resistive module 4 through the current probe, so as to obtain a current waveform. In this embodiment, the phase adjusting unit 503 may be a phase shifting circuit in the measurement instrument module 5, which is operated by a user through a human-computer interaction device such as a knob, and can shift the phase of the measured voltage waveform and current waveform. In this embodiment, the oscillographic unit 504 may be a cathode ray tube in the measurement instrument module 5, and the adjusted voltage waveform and current waveform are displayed on the display screen.
In this embodiment, the user can operate the phase adjusting unit 503 while observing the display of the oscillograph unit 504, and adjust the phases of the voltage waveform and the current waveform so that the phases of the voltage waveform and the current waveform displayed by the oscillograph unit 504 are exactly the same; when the phase of the voltage waveform and the phase of the current waveform displayed by the scope unit 504 are difficult to be exactly the same, the phase difference between the voltage waveform and the current waveform displayed by the scope unit 504 may be made smaller than a phase threshold, and the phase threshold may be set to 5 °, for example. In this embodiment, the phase reference of the voltage waveform and the current waveform displayed by the oscillographic unit 504 can be the phase of the control signal, that is, the phase of the voltage waveform and the phase of the current waveform displayed by the oscillographic unit 504 are both the same as the phase of the control signal.
In this embodiment, a non-inductive resistor with less stray parameters is used as the pure resistive module 4, the non-inductive resistor can reduce the influence of the stray parameters of hardware components, the measurement phase difference caused by the stray inductance inside the IGBT device can be eliminated, the packaging difference of each IGBT device is eliminated, the measurement result deviation caused by the inconsistency of the measurement points can be obtained, the phase difference between the voltage probe and the current probe can be obtained according to the measurement of the phase difference, the probe delay calibration is set on the oscilloscope, and the waveness after calibration can be obtained. The voltage waveform and the current waveform before calibration are shown in fig. 3, and the voltage waveform and the current waveform after calibration are shown in fig. 4.
In this embodiment, after the voltage waveform and the current waveform phase of the IGBT dynamic test apparatus shown in fig. 1 and 2 are calibrated, the IGBT dynamic test apparatus may be used to perform a parameter test on the IGBT to be tested. When the IGBT dynamic test device is used to perform the parametric test on the IGBT to be tested, referring to fig. 5, the collector of the IGBT6 to be tested is connected to one end of the pure resistive module 4, and the emitter of the IGBT6 to be tested is connected to the other end of the pure resistive module 4. Using the circuit shown in fig. 5, a double pulse test can be performed on the IGBT6 under test.
It should be noted that, unless otherwise specified, when a feature is referred to as being "fixed" or "connected" to another feature, it may be directly fixed or connected to the other feature or indirectly fixed or connected to the other feature. Furthermore, the descriptions of upper, lower, left, right, etc. used in the present disclosure are only relative to the mutual positional relationship of the constituent parts of the present disclosure in the drawings. As used in this disclosure, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. In addition, unless defined otherwise, all technical and scientific terms used in this example have the same meaning as commonly understood by one of ordinary skill in the art. The terminology used in the description of the embodiments herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used in this embodiment, the term "and/or" includes any combination of one or more of the associated listed items.
It will be understood that, although the terms first, second, third, etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element of the same type from another. For example, a first element could be termed a second element, and, similarly, a second element could be termed a first element, without departing from the scope of the present disclosure. The use of any and all examples, or exemplary language ("e.g.," such as, "etc.), provided with the present embodiments is intended merely to better illuminate embodiments of the invention and does not pose a limitation on the scope of the invention unless otherwise claimed.
It should be recognized that embodiments of the present invention can be realized and implemented by computer hardware, a combination of hardware and software, or by computer instructions stored in a non-transitory computer readable memory. The methods may be implemented in a computer program using standard programming techniques, including a non-transitory computer-readable storage medium configured with the computer program, where the storage medium so configured causes a computer to operate in a specific and predefined manner, according to the methods and figures described in the detailed description. Each program may be implemented in a high level procedural or object oriented programming language to communicate with a computer system. However, the program(s) can be implemented in assembly or machine language, if desired. In any case, the language may be a compiled or interpreted language. Furthermore, the program can be run on a programmed application specific integrated circuit for this purpose.
Further, operations of processes described in this embodiment can be performed in any suitable order unless otherwise indicated herein or otherwise clearly contradicted by context. The processes described in this embodiment (or variations and/or combinations thereof) may be performed under the control of one or more computer systems configured with executable instructions, and may be implemented as code (e.g., executable instructions, one or more computer programs, or one or more applications) collectively executed on one or more processors, by hardware, or combinations thereof. The computer program includes a plurality of instructions executable by one or more processors.
Further, the method may be implemented in any type of computing platform operatively connected to a suitable interface, including but not limited to a personal computer, mini computer, mainframe, workstation, networked or distributed computing environment, separate or integrated computer platform, or in communication with a charged particle tool or other imaging device, and the like. Aspects of the invention may be embodied in machine-readable code stored on a non-transitory storage medium or device, whether removable or integrated into a computing platform, such as a hard disk, optically read and/or write storage medium, RAM, ROM, or the like, such that it may be read by a programmable computer, which when read by the computer may be used to configure and operate the computer to perform the procedures described herein. Further, the machine-readable code, or portions thereof, may be transmitted over a wired or wireless network. The utility model described in this embodiment includes these and other different types of non-transitory computer-readable storage media when such media include instructions or programs that implement the steps described above in conjunction with a microprocessor or other data processor. When programmed according to the methods and techniques of the present invention, the present invention also includes the computer itself.
A computer program can be applied to input data to perform the functions described in the present embodiment to convert the input data to generate output data that is stored to a non-volatile memory. The output information may also be applied to one or more output devices, such as a display. In a preferred embodiment of the invention, the transformed data represents physical and tangible objects, including particular visual depictions of physical and tangible objects produced on the display.
The above description is only a preferred embodiment of the present invention, and the present invention is not limited to the above embodiment, as long as it achieves the technical effects of the present invention by the same means, and any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included within the scope of the present invention. The technical solution and/or the embodiments of the invention may be subject to various modifications and variations within the scope of the invention.
Claims (9)
1. An IGBT dynamic test device with voltage and current phase calibration function is characterized by comprising:
the control module is used for generating a control signal;
carrying out accompany measurement on the IGBT; the collector of the accompanied IGBT is connected with one output end of the control module;
a pulse generation module; the output end of the pulse generation module is connected with the gate of the accompanied IGBT;
a purely resistive module; one end of the pure resistive module is connected with the emitter of the accompanied IGBT, and the other end of the pure resistive module is connected with the other output end of the control module;
a measurement instrument module; the measuring instrument includes voltage measurement unit, current measurement unit, phase place regulating unit and oscillography unit, voltage measurement unit is used for measuring the voltage at pure resistive module both ends, current measurement unit is used for measuring pure resistive module with electric current between the control module, the phase place regulating unit is used for adjusting voltage waveform that voltage measurement unit surveyed with the electric current waveform that current measurement unit surveyed, the oscillography unit is used for showing through the regulation voltage waveform with the electric current waveform.
2. The IGBT dynamic test device of claim 1, wherein the phase adjustment unit is configured to adjust the voltage waveform measured by the voltage measurement unit and the current waveform measured by the current measurement unit such that the voltage waveform has the same phase as the current waveform.
3. The IGBT dynamic test device of claim 2, wherein the phase adjustment unit is configured to adjust the voltage waveform measured by the voltage measurement unit and the current waveform measured by the current measurement unit such that the voltage waveform and the current waveform are both in phase with the control signal.
4. The IGBT dynamic test device of claim 1, wherein the phase adjustment unit is configured to adjust the voltage waveform measured by the voltage measurement unit and the current waveform measured by the current measurement unit such that a phase difference between the voltage waveform and the current waveform is less than a phase threshold.
5. The IGBT dynamic testing device of claim 1, wherein the control module comprises:
a power supply unit; the power supply unit is used for supplying power;
a first switch; one end of the first switch is connected with one end of the power supply unit, and the other end of the first switch is used as one output end of the control module;
a capacitor; one end of the capacitor is connected with the other end of the first switch, the other end of the capacitor is connected with the other end of the power supply unit, and the other end of the capacitor is used as the other output end of the control module;
a second switch; one end of the second switch is connected with one end of the capacitor;
a resistor; one end of the resistor is connected to the other end of the second switch, and the other end of the resistor is connected to the other end of the capacitor.
6. The IGBT dynamic test device of claim 5, wherein the power supply unit is configured to provide a DC power supply.
7. The IGBT dynamic test device of any one of claims 1-6, wherein the purely resistive module is a non-inductive resistor.
8. The IGBT dynamic test device of any one of claims 1-6, characterized in that the phase of the output signal of the pulse generation module is the same as the phase of the control signal.
9. The IGBT dynamic test device according to any one of claims 1-6, characterized in that one end of the pure resistive module is used for connecting the collector of the IGBT to be tested, and the other end of the pure resistive module is used for connecting the emitter of the IGBT to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022720856.XU CN214409191U (en) | 2020-11-20 | 2020-11-20 | IGBT dynamic testing device with voltage and current phase calibration function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022720856.XU CN214409191U (en) | 2020-11-20 | 2020-11-20 | IGBT dynamic testing device with voltage and current phase calibration function |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214409191U true CN214409191U (en) | 2021-10-15 |
Family
ID=78034985
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202022720856.XU Active CN214409191U (en) | 2020-11-20 | 2020-11-20 | IGBT dynamic testing device with voltage and current phase calibration function |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214409191U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117250386A (en) * | 2023-11-17 | 2023-12-19 | 深圳青铜剑技术有限公司 | Method and device for correcting delay of voltage and current probe of oscilloscope |
-
2020
- 2020-11-20 CN CN202022720856.XU patent/CN214409191U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117250386A (en) * | 2023-11-17 | 2023-12-19 | 深圳青铜剑技术有限公司 | Method and device for correcting delay of voltage and current probe of oscilloscope |
| CN117250386B (en) * | 2023-11-17 | 2024-01-09 | 深圳青铜剑技术有限公司 | Method and device for correcting delay of voltage and current probe of oscilloscope |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8674713B2 (en) | Zero ampere level current data correction for a power device under test | |
| US10436874B2 (en) | Self-calibration of source-measure unit via capacitor | |
| US9135131B2 (en) | Customizing operation of a test instrument based on information from a system under test | |
| CN107783069A (en) | The on-line calibration system and method for DC measurement in integrated circuit test system | |
| CN214409191U (en) | IGBT dynamic testing device with voltage and current phase calibration function | |
| CN102854485A (en) | Automated adjustment system for comprehensive multi-parameter electrical measuring instrument and adjustment method | |
| CN101413967B (en) | Method for controlling automatic measurement of oscilloscope | |
| CN104345193B (en) | Switching loss measurement and drawing in test and sensing device | |
| CN107966643B (en) | Interactive visualization device for real-time test data and implementation method thereof | |
| CN113468835B (en) | BUCK chopper electromagnetic interference prediction software | |
| US6876936B2 (en) | Measurement of inductance using a digital storage oscilloscope under real-time operating environments | |
| US8089296B2 (en) | On-chip measurement of signals | |
| CN109591658B (en) | Battery management device, method and chip | |
| Shmakov et al. | Automated data processing system for oscilloscope measurements during an environmental test | |
| US20120166112A1 (en) | Electronic device and vibration testing method thereof | |
| US20240146387A1 (en) | Computer implemented method, measurement application device, and non-transitory computer readable medium | |
| US20240036101A1 (en) | Correcting for load resistance when making i-v measurements with constant drain voltage on power mosfets | |
| CN110888045B (en) | Jitter determination method and apparatus, storage medium, and electronic device | |
| US10768211B2 (en) | System and method for current sense resistor compensation | |
| CN106841855B (en) | Threshold parameter testing method of high-power three-phase bridge driver | |
| Hulme | Measurement In IEEE 1641 and its application in a CASS TSF Library | |
| Dang et al. | PCB noise visualization system | |
| JPH04363675A (en) | Ic tester | |
| CN117471262A (en) | Correcting load resistance in I-V measurements on power MOSFETs using constant drain voltage | |
| CN116068352A (en) | Reverse recovery measurement and graph |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |