CN117250386A - Method and device for correcting delay of voltage and current probe of oscilloscope - Google Patents
Method and device for correcting delay of voltage and current probe of oscilloscope Download PDFInfo
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Abstract
The application provides a method and a device for correcting delay of an oscilloscope voltage and current probe, wherein the method comprises the following steps: acquiring voltage detection data and current detection data of an oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0; acquiring a voltage waveform between the first time point and the second time point and generating a voltage integral value according to the voltage waveform; determining a current difference value according to the voltage integral value and preset data of the power inductor; determining a third time point according to the current difference value; and determining voltage and current probe delay according to the third time point and the first time point, and performing delay correction on the voltage and current probe of the oscilloscope according to the voltage and current probe delay. By combining an integral algorithm with a typical delay correction circuit, the accuracy can be within 1nS, and the influence caused by inconsistent probe delay is greatly reduced.
Description
Technical Field
The application relates to the field of electronic equipment testing, in particular to a method and a device for correcting delay of an oscilloscope voltage and current probe.
Background
The scope of application of oscilloscopes is very wide, and along with the development of semiconductor technology, the requirements on oscilloscopes and probes thereof are higher and higher, for example, in the application scenes of testing high-speed voltage and current signals, power semiconductor device loss, loop parasitic parameters and the like, the accuracy of a calculation result can be seriously affected by inconsistent delay of the voltage and current signals to be tested transmitted from the probes to the oscilloscopes. The delay of the current general correction probe is mainly compensated by writing delay parameters calibrated by a probe provider on an oscilloscope or calculated by an ideal simple physical model. The precision is generally within +/-2 nS by a supplier delay parameter compensation method; the accuracy of the simple physical model calculation method is much worse than that of the provider delay parameter compensation method, and is generally within +/-5 nS.
Disclosure of Invention
In view of the foregoing, the present application has been developed to provide a method and apparatus for oscilloscope voltage-current probe delay correction that overcomes, or at least partially solves, the problems, including:
a method of oscilloscope voltage-current probe delay correction, the method involving a delay correction circuit comprising a power inductance and a charging loop and a freewheel loop in communication with the power inductance, comprising the steps of:
acquiring voltage detection data and current detection data of an oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0;
acquiring a voltage waveform between the first time point and the second time point and generating a voltage integral value according to the voltage waveform;
determining a current difference value according to the voltage integral value and preset data of the power inductor;
determining a third time point according to the current difference value;
and determining voltage and current probe delay according to the third time point and the first time point, and performing delay correction on the voltage and current probe of the oscilloscope according to the voltage and current probe delay.
Further, the method further comprises the following steps:
charging the power inductor through a charging loop;
when the power inductance reaches a preset value, the energy charging loop is disconnected to enable the power inductance to supply power to the follow current loop.
Further, the step of acquiring voltage detection data and current detection data of the oscilloscope, determining a first time point according to a falling interval of the current detection data, and determining a second time point according to an interval of 0 of the current detection data comprises the following steps:
acquiring target voltage detection data and target current detection data from when the charging loop is disconnected to when the current detection data is 0;
and determining the first time point and the second time point through the target current detection data.
Further, the step of generating a current difference value according to the voltage integral value and preset data of the power inductor includes:
determining a total inductance between the first point in time and the second point in time from the voltage integral value;
and determining a current difference value through the total inductance and the preset data.
Further, the step of generating a current difference value by the total inductance and the preset data includes:
and passing a formula according to the voltage integral value and the preset data
Determining a current difference value; wherein,for total inductance->For the voltage integral value>Is the current difference.
Further, determining a voltage-current probe delay according to the third time point and the first time point and performing delay correction on the voltage-current probe of the oscilloscope according to the voltage-current probe delay, including:
generating a voltage probe delay and a current probe delay according to the first time point and the third time point;
and correcting the probe delay according to the voltage probe delay and the current probe delay.
Further, the method further comprises the following steps:
and determining the inductance value of the power inductor according to preset conditions.
An apparatus for delay correction of an oscilloscope voltage and current probe, the apparatus implementing the steps of the method for delay correction of an oscilloscope voltage and current probe according to any one of the above claims, comprising:
the acquisition module is used for acquiring voltage detection data and current detection data of the oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0;
a voltage integral value generation module, configured to acquire a voltage waveform between the first time point and the second time point and generate a voltage integral value according to the voltage waveform;
the current difference value determining module is used for determining a current difference value according to the voltage integral value and preset data of the power inductor;
a third time point determining module for determining a third time point according to the current difference value;
and the delay correction module is used for determining the delay of the voltage and current probe according to the third time point and the first time point and performing delay correction on the voltage and current probe of the oscilloscope according to the delay of the voltage and current probe.
An electronic device comprising a processor, a memory, and a computer program stored on the memory and executable on the processor, the computer program when executed by the processor performing the steps of the method of oscilloscope voltage current probe delay correction of any one of the preceding claims.
A computer readable storage medium having stored thereon a computer program which, when executed by a processor, causes the steps of the method of oscilloscope voltage current probe delay correction of any one of the preceding claims.
The application has the following advantages:
in an embodiment of the present application, compared to the problem of a relatively low accuracy and a relatively large error in the delay test of probe parameters of an oscilloscope in the prior art, the present application provides a method for delay correction of a voltage and current probe of an oscilloscope, where the method relates to a delay correction circuit, and the delay correction circuit includes a power inductor, and an energy charging loop and a flywheel loop which are connected with the power inductor, and includes the steps of: acquiring voltage detection data and current detection data of an oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0; acquiring a voltage waveform between the first time point and the second time point and generating a voltage integral value according to the voltage waveform; determining a current difference value according to the voltage integral value and preset data of the power inductor; determining a third time point according to the current difference value; and determining voltage and current probe delay according to the third time point and the first time point, and performing delay correction on the voltage and current probe of the oscilloscope according to the voltage and current probe delay. By using an integral algorithm, the influence caused by probe distortion and measurement errors can be greatly reduced, and the accuracy can be within 1nS by combining a typical delay correction circuit. The influence caused by inconsistent probe delay is greatly reduced for testing high-speed voltage and current signals, power semiconductor device loss, loop parasitic parameters and the like.
Drawings
In order to more clearly illustrate the technical solutions of the present application, the drawings that are needed in the description of the present application will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort to a person skilled in the art.
FIG. 1 is a flow chart of steps of a method for delay correction of an oscilloscope voltage-current probe according to one embodiment of the present application;
FIG. 2 is a circuit diagram of a correction circuit involved in a method for delay correction of an oscilloscope voltage-current probe according to one embodiment of the present application;
FIG. 3 is a waveform diagram of voltage V (OUT) and current I (L1) of an oscilloscope voltage/current probe delay correction method according to an embodiment of the present invention;
fig. 4 is a schematic block diagram of an apparatus for delay correction of an oscilloscope voltage-current probe according to an embodiment of the invention;
fig. 5 is a schematic structural diagram of a computer device according to an embodiment of the present invention.
Detailed Description
In order to make the objects, features and advantages of the present application more comprehensible, the present application is described in further detail below with reference to the accompanying drawings and detailed description. It will be apparent that the embodiments described are some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, are intended to be within the scope of the present application.
The inventors found by analyzing the prior art that: in the prior art, a power device double-pulse test platform is generally used, a maximum point of a current slope passing through a switching tube and a maximum point of a voltage of a switching tube are searched, the time difference between the two points is the delay of a voltage probe and a current probe, but the forward conduction voltage drop of a freewheeling diode and the impedance change of the switching tube are ignored in the evaluation of using a double-pulse turn-off process; the voltage peak value and the current differential trough are used, the clamping point error of the oscilloscope is larger, and the deviation of 1-5nS can be generated according to the switching tubes with different specifications. Or the current and the voltage of the switching tube are subjected to frequency domain and time domain analysis, the resonant frequency of the power loop is found, the time domain phase difference of the current and the voltage on the resonant point is clamped on an oscilloscope, the time sum of the phase difference is the delay of the current and the voltage probe, but the delay of the probe is estimated by using the oscillation waveform of the double-pulse platform switching tube, the model of the method is too ideal, the voltage signal and the current signal are ignored under the influence of parasitic parameters, the LC oscillation causes the voltage and the current signal to generate phase offset, and the influence of the phase shift on the delay correction of the probe is ignored; the method can only be used when the waveform generates oscillation, and has larger limitation.
Referring to fig. 1, a method for correcting delay of an oscilloscope voltage and current probe is shown, wherein the method relates to a delay correction circuit, and the delay correction circuit comprises a power inductor, an energy charging loop and a freewheel loop, wherein the energy charging loop and the freewheel loop are communicated with the power inductor;
the method comprises the following steps:
s110, acquiring voltage detection data and current detection data of an oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0;
s120, acquiring a voltage waveform between the first time point and the second time point and generating a voltage integral value according to the voltage waveform;
s130, determining a current difference value according to the voltage integral value and preset data of the power inductor;
s140, determining a third time point according to the current difference value;
and S150, determining voltage and current probe delay according to the third time point and the first time point, and performing delay correction on the voltage and current probe of the oscilloscope according to the voltage and current probe delay.
In an embodiment of the present application, compared to the problem of a relatively low accuracy and a relatively large error in the delay test of probe parameters of an oscilloscope in the prior art, the present application provides a method for delay correction of a voltage and current probe of an oscilloscope, where the method relates to a delay correction circuit, and the delay correction circuit includes a power inductor, and an energy charging loop and a flywheel loop which are connected with the power inductor, and includes the steps of: acquiring voltage detection data and current detection data of an oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0; acquiring a voltage waveform between the first time point and the second time point and generating a voltage integral value according to the voltage waveform; determining a current difference value according to the voltage integral value and preset data of the power inductor; determining a third time point according to the current difference value; and determining voltage and current probe delay according to the third time point and the first time point, and performing delay correction on the voltage and current probe of the oscilloscope according to the voltage and current probe delay. By using an integral algorithm, the influence caused by probe distortion and measurement errors can be greatly reduced, and the accuracy can be within 1nS by combining a typical delay correction circuit. The influence caused by inconsistent probe delay is greatly reduced for testing high-speed voltage and current signals, power semiconductor device loss, loop parasitic parameters and the like.
Next, a method of delay correction of an oscilloscope voltage-current probe in the present exemplary embodiment will be further described.
Acquiring voltage detection data and current detection data of an oscilloscope as described in the step S110; and determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0.
It should be noted that, referring to fig. 2, the oscilloscope measures voltage detection data and current detection data of the delay correction circuit, and is a circuit diagram of a delay correction circuit structure connected to the oscilloscope, where the power supply V1 and the capacitor cell C1 are used to charge the power inductor L1 so that the inductor current reaches a certain value; the fast switch M1 and a driving circuit thereof (consisting of R1 and V2) are used for controlling the on or off of the correction circuit loop and the inductance current of the correction circuit loop; a power inductor L1 for generating two signals of an output voltage V (OUT) and a current I (L1) to the oscilloscope when the fast switch M1 is turned off; and the freewheel resistor R3 is used for providing a freewheel discharge loop for the L1 when the switching tube M1 is turned off. The waveforms of the voltage V (OUT) and the current I (L1) are shown in fig. 3. The power supply V1 may select a power supply that satisfies the parameters according to the application requirements. Such as: output voltage, voltage output accuracy, etc.; the capacitor cell C1 can calculate corresponding capacity according to the voltage drop rate of the bus, and the low-parasitic capacitance pair is better to apply; the fast switch M1 may be a power switch tube or a mechanical switch tube. Such as: IGBT, relay; r1 and V2 can form a driving circuit of M1, and can also be in other forms; l1 may be a hollow inductor or a non-hollow inductor.
In an embodiment of the present application, further includes: charging the power inductor through a charging loop;
when the power inductance reaches a preset value, the energy charging loop is disconnected to enable the power inductance to supply power to the follow current loop.
It should be noted that, the circuit timing sequence, the process is divided into three stages: the first stage is that the bus capacitor cell C1 is charged, and the capacity of the C1 is enough to maintain the bus voltage in the second stage; the second stage is that the inductor L1 charges energy, the switching tube M1 is conducted, the bus capacitor C1 charges energy for the inductor L1, and the current of the inductor L1 climbs to reach the target current (namely, the inductor stores energy to the target value); the third stage is to turn off the switching tube M1, so that the inductor L1 freewheels through the resistor R3, the current through the switching tube M1 decreases rapidly, the current of the inductor L1 decreases until the current of the inductor L1 is 0, and the third stage ends. And in the third stage, optionally selecting a period of time, integrating the waveform of the voltage V (OUT), dividing the obtained integration result by the current difference value in the period of time, taking the absolute value, obtaining an inductor L1 as the result, and if the inductance L1 is optionally selected and calculated for a period of time, obtaining the inductor L1 which is basically equal, wherein the delay of the oscilloscope current and the voltage probe is within 1 nS.
Since the inductance L1 varies very little during the third phase, then during the third phase, the inductance is calculated by the formulaIt can be seen that the results of L are consistent during any of the different time periods。
In one implementation, the voltage across L1 and the current waveform through L1 are obtained separately. Calculating the total inductance l= 4.98327e-007 (498.3 nH) of the loop over a time of 330nS to 370 nS; the total inductance of the loop, l= 4.97348e-007 (497.3 nH), was calculated over the time 340nS to 380 nS. The total inductance L of the loop is substantially unchanged during two different time periods. From this, it can be seen that the principle of the method holds.
In one embodiment of the present invention, the step S110 of "obtaining voltage detection data and current detection data of an oscilloscope" may be further described in conjunction with the following description; and determining a first time point according to the falling interval of the current detection data, and determining a second time point' according to the interval of the current detection data being 0.
Obtaining target voltage detection data and target current detection data from when the charging loop is disconnected to when the current detection data is 0, as described in the following steps;
the first time point and the second time point are determined by the target current detection data as described in the following steps.
It should be noted that, in the third stage, one time point is arbitrarily selected as the first time point, and after the third stage is ended, one point is arbitrarily selected as the second time point,
as described in the step S120, a voltage waveform between the first time point and the second time point is acquired and a voltage integrated value is generated according to the voltage waveform.
It should be noted that, the calculation condition of the inductance can be obtained by integrating the voltage waveform between the first time point and the second time point.
As described in the step S130, a current difference is determined according to the voltage integral value and the preset data of the power inductor.
In an embodiment of the present invention, the specific process of "determining the current difference value according to the voltage integrated value and the preset data of the power inductor" in step S130 may be further described in conjunction with the following description.
Determining a total inductance between the first point in time and the second point in time from the voltage integral value as follows;
it should be noted that the total inductance can be obtained by calculation according to the oscilloscope area measurement function.
The current difference is determined from the total inductance and the preset data, as described in the following steps.
In one embodiment of the present invention, the specific process of "determining the current difference value through the total inductance and the preset data" may be further described in conjunction with the following description;
and passing a formula according to the voltage integral value and the preset data
Determining a current difference value; wherein,for total inductance->For the voltage integral value>Is the current difference.
In a specific implementation, two time points are first found, namely, a time point t1 (350 nS) is arbitrarily found in the third stage time, and a time point t2 (650 nS) is also arbitrarily found after the third stage; the voltage V (OUT) at this point in time is then integrated, i.e., using the oscilloscope area measurement function, to obtain A1 (-1.413 e-006), again because the inductance L1 in the circuit is already calibrated using external equipment, known as L1 (500 nH), then using the formulaThe current difference i1 can be obtained by back-stepping.
A third point in time is determined from the current difference, as described in step S140.
The same time point as the current difference is found in the current waveform diagram, and the time point is determined as the third time point. Because the current at the second time point is 0, the time point with the same current amplitude as the current difference value in the third stage is found, and the delay of the voltage probe and the current probe can be obtained.
And step S150, determining a voltage-current probe delay according to the third time point and the first time point, and performing delay correction on the voltage-current probe of the oscilloscope according to the voltage-current probe delay.
In an embodiment of the present invention, the specific process of "determining the delay of the voltage-current probe according to the third time point and the first time point and correcting the delay of the voltage-current probe of the oscilloscope according to the delay of the voltage-current probe" in step S150 may be further described in conjunction with the following description.
Generating a voltage probe delay and a current probe delay according to the first time point and the third time point as follows;
and as described in the following steps, probe delay correction is performed according to the voltage probe delay and the current probe delay.
Since the current at the second time point is 0, the time point where the current amplitude is the same as the current difference in the third stage is found, and thus the delay between the voltage probe and the current probe can be obtained as the interval time between the third time point and the first time point. And correcting the voltage probe delay and the current probe delay according to the interval time.
In an embodiment of the present invention, further includes:
and determining the inductance value of the power inductor according to preset conditions.
It should be noted that, the calculating process needs to accurately determine the inductance value of the power inductor, so that before testing and correcting, the inductance value of the power inductor needs to be calibrated through external equipment, and a proper power inductor is selected according to the model of the oscilloscope.
For the device embodiments, since they are substantially similar to the method embodiments, the description is relatively simple, and reference is made to the description of the method embodiments for relevant points.
Referring to fig. 4, an apparatus for delay correction of an oscilloscope voltage-current probe according to an embodiment of the present application is shown;
the method specifically comprises the following steps:
an acquisition module 410, configured to acquire voltage detection data and current detection data of an oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0;
a voltage integral value generating module 420, configured to obtain a voltage waveform between the first time point and the second time point and generate a voltage integral value according to the voltage waveform;
a current difference determining module 430, configured to determine a current difference according to the voltage integral value and preset data of the power inductor;
a third time point determining module 440 for determining a third time point according to the current difference value;
and the delay correction module 450 is configured to determine a voltage-current probe delay according to the third time point and the first time point and correct the delay of the voltage-current probe of the oscilloscope according to the voltage-current probe delay.
In an embodiment of the present invention, further includes:
the energy charging module is used for charging the power inductor through an energy charging loop;
and the cutting-off module is used for cutting off the energy charging loop when the power inductance reaches a preset value so that the power inductance supplies power to the follow current loop.
In one embodiment of the present invention, the obtaining module 410 includes:
the data acquisition sub-module is used for acquiring target voltage detection data and target current detection data from when the charging loop is disconnected to when the current detection data is 0;
and the time interval determining submodule is used for determining the first time point and the second time point through the target current detection data.
In one embodiment of the present invention, the current difference determining module 430 includes:
an inductance determination sub-module for determining a total inductance between the first point in time and the second point in time from the voltage integration value;
and the current difference calculation sub-module is used for determining a current difference through the total inductance and the preset data.
In an embodiment of the present invention, the current difference calculation submodule includes:
a formula calculation sub-module for passing a formula according to the voltage integral value and the preset data
Determining a current difference value; wherein,for total inductance->For the voltage integral value>Is the current difference.
In an embodiment of the present invention, further includes:
and the power inductor calibration module is used for determining the inductance value of the power inductor according to preset conditions.
Referring to fig. 5, a computer device of a method for correcting delay of an oscilloscope voltage and current probe according to the present invention may specifically include the following:
the computer device 12 described above is embodied in the form of a general purpose computing device, and the components of the computer device 12 may include, but are not limited to: one or more processors or processing units 16, a memory 28, and a bus 18 that connects the various system components, including the memory 28 and the processing unit 16.
Bus 18 represents one or more of several types of bus 18 structures, including a memory bus 18 or memory controller, a peripheral bus 18, an accelerated graphics port, a processor, or a local bus 18 using any of a variety of bus 18 architectures. By way of example, and not limitation, such architectures include Industry Standard Architecture (ISA) bus 18, micro channel architecture (MAC) bus 18, enhanced ISA bus 18, video Electronics Standards Association (VESA) local bus 18, and Peripheral Component Interconnect (PCI) bus 18.
Computer device 12 typically includes a variety of computer system readable media. Such media can be any available media that is accessible by computer device 12 and includes both volatile and nonvolatile media, removable and non-removable media.
Memory 28 may include computer system readable media in the form of volatile memory, such as Random Access Memory (RAM) 30 and/or cache memory 32. The computer device 12 may further include other removable/non-removable, volatile/nonvolatile computer storage media. By way of example only, storage system 34 may be used to read from or write to non-removable, nonvolatile magnetic media (commonly referred to as a "hard disk drive"). Although not shown in fig. 5, a magnetic disk drive for reading from and writing to a removable non-volatile magnetic disk (e.g., a "floppy disk"), and an optical disk drive for reading from or writing to a removable non-volatile optical disk such as a CD-ROM, DVD-ROM, or other optical media may be provided. In such cases, each drive may be coupled to bus 18 through one or more data medium interfaces. The memory may include at least one program product having a set (e.g., at least one) of program modules 42, the program modules 42 being configured to carry out the functions of embodiments of the invention.
A program/utility 40 having a set (at least one) of program modules 42 may be stored in, for example, a memory, such program modules 42 including, but not limited to, an operating system, one or more application programs, other program modules 42, and program data, each or some combination of which may include an implementation of a network environment. Program modules 42 generally perform the functions and/or methods of the embodiments described herein.
The computer device 12 may also communicate with one or more external devices 14 (e.g., keyboard, pointing device, display 24, camera, etc.), one or more devices that enable a healthcare worker to interact with the computer device 12, and/or any devices (e.g., network card, modem, etc.) that enable the computer device 12 to communicate with one or more other computing devices. Such communication may occur through an input/output (I/O) interface 22. Moreover, computer device 12 may also communicate with one or more networks such as a Local Area Network (LAN), a Wide Area Network (WAN), and/or a public network such as the Internet, through network adapter 20. As shown, network adapter 20 communicates with other modules of computer device 12 via bus 18. It should be appreciated that although not shown in fig. 5, other hardware and/or software modules may be used in connection with computer device 12, including, but not limited to: microcode, device drivers, redundant processing units 16, external disk drive arrays, RAID systems, tape drives, data backup storage systems 34, and the like.
The processing unit 16 executes programs stored in the memory 28 to perform various functional applications and data processing, for example, to implement a method for correcting delay of an oscilloscope voltage and current probe according to an embodiment of the present invention.
That is, the processing unit 16 realizes when executing the program: acquiring voltage detection data and current detection data of an oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0; acquiring a voltage waveform between the first time point and the second time point and generating a voltage integral value according to the voltage waveform; determining a current difference value according to the voltage integral value and preset data of the power inductor; determining a third time point according to the current difference value; and determining voltage and current probe delay according to the third time point and the first time point, and performing delay correction on the voltage and current probe of the oscilloscope according to the voltage and current probe delay.
In an embodiment of the present invention, the present invention further provides a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements a method for correcting delay of an oscilloscope voltage-current probe as provided in all embodiments of the present application:
that is, the program is implemented when executed by a processor: acquiring voltage detection data and current detection data of an oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0; acquiring a voltage waveform between the first time point and the second time point and generating a voltage integral value according to the voltage waveform; determining a current difference value according to the voltage integral value and preset data of the power inductor; determining a third time point according to the current difference value; and determining voltage and current probe delay according to the third time point and the first time point, and performing delay correction on the voltage and current probe of the oscilloscope according to the voltage and current probe delay.
Any combination of one or more computer readable media may be employed. The computer readable medium may be a computer-readable signal medium or a computer-readable storage medium. The computer readable storage medium can be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the computer-readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPOM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In this document, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
The computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, either in baseband or as part of a carrier wave. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Computer program code for carrying out operations of the present invention may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, smalltalk, C ++ and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the healthcare worker computer, partly on the healthcare worker computer, as a stand-alone software package, partly on the healthcare worker computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the healthcare worker computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computer (e.g., connected via the internet using an internet service provider). In this specification, each embodiment is described in a progressive manner, and each embodiment is mainly described by differences from other embodiments, and identical and similar parts between the embodiments are all enough to be referred to each other.
While preferred embodiments of the present embodiments have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the embodiments of the present application.
Finally, it is further noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or terminal that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or terminal. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article or terminal device comprising the element.
The foregoing has described in detail the method and apparatus for delay correction of an oscilloscope voltage-current probe provided by the present application, and specific examples have been applied herein to illustrate the principles and embodiments of the present application, the above examples being only for aiding in understanding the method and core ideas of the present application; meanwhile, as those skilled in the art will have modifications in the specific embodiments and application scope in accordance with the ideas of the present application, the present description should not be construed as limiting the present application in view of the above.
Claims (10)
1. A method for delay correction of an oscilloscope voltage-current probe, the method involving a delay correction circuit comprising a power inductor and an energy charging circuit and a freewheel circuit in communication with the power inductor, comprising the steps of:
acquiring voltage detection data and current detection data of an oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0;
acquiring a voltage waveform between the first time point and the second time point and generating a voltage integral value according to the voltage waveform;
determining a current difference value according to the voltage integral value and preset data of the power inductor;
determining a third time point according to the current difference value;
and determining voltage and current probe delay according to the third time point and the first time point, and performing delay correction on the voltage and current probe of the oscilloscope according to the voltage and current probe delay.
2. The method as recited in claim 1, further comprising:
charging the power inductor through a charging loop;
when the power inductance reaches a preset value, the energy charging loop is disconnected to enable the power inductance to supply power to the follow current loop.
3. The method of claim 1, wherein the step of obtaining voltage detection data and current detection data of the oscilloscope, determining a first time point according to a falling interval of the current detection data, and determining a second time point according to an interval in which the current detection data is 0, comprises:
acquiring target voltage detection data and target current detection data from when the charging loop is disconnected to when the current detection data is 0;
and determining the first time point and the second time point through the target current detection data.
4. The method of claim 1, wherein the step of generating a current difference value from the voltage integrated value and preset data of the power inductor comprises:
determining a total inductance between the first point in time and the second point in time from the voltage integral value;
and determining a current difference value through the total inductance and the preset data.
5. The method of claim 4, wherein the step of generating a current difference from the preset data by the total inductance comprises:
and passing a formula according to the voltage integral value and the preset data
Determining a current difference value; wherein,for total inductance->For the voltage integral value>Is the current difference.
6. The method of claim 1, wherein determining a voltage-current probe delay based on the third point in time and the first point in time and performing delay correction on the voltage-current probe of the oscilloscope based on the voltage-current probe delay comprises:
generating a voltage probe delay and a current probe delay according to the first time point and the third time point;
and correcting the probe delay according to the voltage probe delay and the current probe delay.
7. The method as recited in claim 1, further comprising:
and determining the inductance value of the power inductor according to preset conditions.
8. An apparatus for delay correction of an oscilloscope voltage and current probe, characterized in that the apparatus implements the steps of the method for delay correction of an oscilloscope voltage and current probe according to any one of claims 1 to 7, comprising:
the acquisition module is used for acquiring voltage detection data and current detection data of the oscilloscope; determining a first time point according to the falling interval of the current detection data, and determining a second time point according to the interval of the current detection data being 0;
a voltage integral value generation module, configured to acquire a voltage waveform between the first time point and the second time point and generate a voltage integral value according to the voltage waveform;
the current difference value determining module is used for determining a current difference value according to the voltage integral value and preset data of the power inductor;
a third time point determining module for determining a third time point according to the current difference value;
and the delay correction module is used for determining the delay of the voltage and current probe according to the third time point and the first time point and performing delay correction on the voltage and current probe of the oscilloscope according to the delay of the voltage and current probe.
9. An electronic device comprising a processor, a memory, and a computer program stored on the memory and executable on the processor, the computer program when executed by the processor implementing the steps of the method of oscilloscope voltage current probe delay correction of any one of claims 1-7.
10. A computer readable storage medium, characterized in that it has stored thereon a computer program which, when executed by a processor, implements the steps of the method for oscilloscope voltage current probe delay correction according to any of claims 1 to 7.
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