CN108169701A - Radio-frequency power ime-domain measuring method and calibration method - Google Patents
Radio-frequency power ime-domain measuring method and calibration method Download PDFInfo
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- CN108169701A CN108169701A CN201711489749.7A CN201711489749A CN108169701A CN 108169701 A CN108169701 A CN 108169701A CN 201711489749 A CN201711489749 A CN 201711489749A CN 108169701 A CN108169701 A CN 108169701A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
Abstract
The embodiment of the present invention provides a kind of radio-frequency power ime-domain measuring method and calibration method, above-mentioned radio-frequency power ime-domain measuring method include：Power probe and board under test microstrip line is staggered relatively, power probe is made to be located above board under test microstrip line and perpendicular to board under test microstrip line, and power probe hub of a spool is projected on board under test microstrip line；And power probe is connect with the first passage of oscillograph and second channel respectively with oscillograph by meeting the transmission line of test request；When meeting the measuring signal of test request to the input of board under test microstrip line, oscillograph acquires the power output signal of power probe；Computer obtains the radio-frequency power of board under test according to the power output signal of power probe.This contactless measurement can carry out the time domain measurement to radio-frequency power under conditions of system or halt system is not changed, facilitate test.
Description
Technical field
The present invention relates to radio-frequency power frequency domain measurement technical field, more particularly to a kind of radio-frequency power ime-domain measuring method
And calibration method.
Background technology
Power time domain measurement refers to and measures power parameter and change with time data.At present, mostly using contact type measurement system
Power time domain measurement is carried out, but inventor has found that at least there are following defects for traditional technology during realization：Traditional test
System is because that need to be in direct contact measured point, so to fully consider nonintervention system under test (SUT), need modification system or halt system more
Power waving map is carried out, test is inconvenient.With the increasingly complexity of test object, it is desirable to not change system or stop system
The time domain measurement to radio-frequency power is carried out under conditions of system.
Invention content
Based on this, it is necessary to which, for testing the problem of inconvenient, on the one hand the embodiment of the present invention, provides a kind of radio-frequency power
Ime-domain measuring method, including：
Power probe and board under test microstrip line is staggered relatively, it is located at power probe above board under test microstrip line and vertical
In board under test microstrip line, and power probe hub of a spool is projected on board under test microstrip line；
Power probe is connected respectively by meeting the transmission line of test request and is led to the first passage of oscillograph and second
Road；
When meeting the measuring signal of test request to the input of board under test microstrip line, oscillograph acquires the power of power probe
Output signal；
Computer obtains the radio-frequency power of board under test according to the power output signal of power probe.
The power output signal of power probe includes the first output voltage and the second output electricity in one of the embodiments,
Pressure；
The process of the power output signal of oscillograph acquisition power probe includes step：
By the voltage probe of the current probe of power probe and power probe respectively by meeting the transmission line of test request
Connect the first passage and second channel of oscillograph；
Oscillograph acquires the first output voltage by first passage, and oscillograph passes through second channel acquisition the second output electricity
Pressure；
The process that computer obtains the radio-frequency power of board under test according to power output signal includes step：
Computer obtains the radio-frequency power of board under test according to the first output voltage and the second output voltage.
Power probe and board under test microstrip line process staggered relatively are included into step in one of the embodiments,：
Power probe is fixed on fixture, and the fixture for being mounted with power probe is fixed on stent, visits power
Head is perpendicular to sample stage；
Board under test microstrip line is fixed on sample stage.
It is in one of the embodiments, that power probe and board under test microstrip line is staggered relatively, it is located at power probe and treats
Above drafting board microstrip line and perpendicular to board under test microstrip line, and power probe hub of a spool is projected in the mistake on board under test microstrip line
Journey includes step：
Power probe hub of a spool is projected at the center of board under test microstrip line.
It is a kind of to radio-frequency power time domain measurement calibration method, including：
Power probe and calibration microstrip line is staggered relatively, power probe is made to be located above calibration microstrip line and perpendicular to school
Quasi- microstrip line, and power probe hub of a spool is projected on calibration microstrip line；Calibration microstrip line connection is loaded, the resistance value of load
It is matched with calibration microstrip line characteristic impedance；
Calibrating measuring device is believed to calibration microstrip line input measurement signal, the output of power probe acquisition calibration microstrip line
Number；
Calibrating measuring device obtains the output signal of power probe acquisition and is sent to computer；
The output signal that computer is sent according to calibrating measuring device obtains calibration parameter, wherein, calibration parameter for pair
The radio-frequency power to be measured of board under test measures calibration.
Calibrating measuring device includes Network Analyzer in one of the embodiments, and calibration parameter includes calibration factor；
Calibrating measuring device calibrates the output signal of microstrip line to calibration microstrip line input measurement signal, power probe acquisition
Process include step：
Port one to the port four of Network Analyzer is connected to the voltage probe of power probe respectively, calibrates the two of microstrip line
End and the current probe of power probe；
Network Analyzer to calibration microstrip line input measurement signal；
Calibrating measuring device obtain power probe acquisition output signal and be sent to computer process include step：
Network Analyzer obtains network transmission parameter and is sent to computer；
The process that computer obtains calibration parameter according to the output signal that calibrating measuring device is sent includes step：
Computer obtains the calibration of power factor according to the network transmission parameter that Network Analyzer is sent.
Calibrated tester further includes signal generator in one of the embodiments, and calibration parameter further includes test frequency
Rate；
Calibrating measuring device calibrates the output signal of microstrip line to calibration microstrip line input measurement signal, power probe acquisition
Process include step：
Signal generator is connect to one end of calibration microstrip line, and another terminating load that will calibrate microstrip line；
Signal generator to calibration microstrip line input measurement signal；
Calibrating measuring device obtain power probe acquisition output signal and be sent to computer process include step：
Oscillograph acquires the first output voltage by second channel, and the second output voltage is acquired by third channel；
First output voltage and the second output voltage are sent to computer by oscillograph；
The process that computer obtains calibration parameter according to output signal includes step：
Computer obtains the waveform delay time according to the first output voltage and the second output voltage, if the waveform delay time exists
Then it is the test frequency for meeting test request by the frequency record of measuring signal in the range of preset delay time.
Calibration parameter further includes linear electrical parameter in one of the embodiments,；
The process of signal generator to calibration microstrip line input measurement signal includes step：
Signal generator meets the measuring signal of test frequency to calibration microstrip line input；
The process that computer obtains calibration parameter according to output signal includes step：
Computer obtains the waveform delay time according to the first output voltage and the second output voltage, if the waveform delay time exists
Then it is to meet the linear electrical parameter of test request by the reference record of transmission line in the range of preset delay time.
Calibrating measuring device further includes arbitrary waveform generator in one of the embodiments,；
The output signal sent in computer according to calibrating measuring device further includes step after obtaining calibration parameter step：
By the first port of arbitrary waveform generator and second port respectively with calibrating one end and the oscillograph of microstrip line
First passage connects, and the other end for calibrating microstrip line is connected load；
The output terminal of power probe is connect respectively with the second channel of oscillograph and third channel；
Arbitrary waveform generator inputs random waveform by first port to calibration microstrip line；
Oscillograph acquires the first of the calibration microstrip line of the second port output of arbitrary waveform generator by first passage
Calibration verification electric signal；
Oscillograph acquires the second calibration verification electric signal of calibration microstrip line by power probe；
Computer verifies calibration parameter according to the first calibration verification electric signal and the second calibration verification electric signal.
The second calibration verification electric signal includes the first output voltage and the second output voltage in one of the embodiments,；
The process of second calibration verification electric signal of oscillograph acquisition calibration microstrip line includes step：
Oscillograph acquires the first output voltage, and acquire the second output voltage by third channel by third channel；
Computer verifies calibration parameter according to the first calibration verification electric signal and the second calibration verification electric signal
Process includes step：
Computer compares the first calibration verification electric signal with the first output voltage, the second output voltage respectively, with
Calibration parameter is verified.
The embodiment of the present invention at least has the advantages that：Power probe and board under test microstrip line is staggered relatively, make
Power probe is located above board under test microstrip line and perpendicular to board under test microstrip line, and power probe hub of a spool be projected in it is to be measured
On plate microstrip line；And by power probe and oscillograph by meet the transmission line of test request respectively with the first passage of oscillograph
It is connected with second channel；When meeting the measuring signal of test request to the input of board under test microstrip line, oscillograph acquisition power is visited
The power output signal of head；Computer obtains the radio-frequency power of board under test according to the power output signal of power probe.It is this non-
Contact measurement method can carry out the time domain measurement to radio-frequency power under conditions of system or halt system is not changed,
Facilitate test.
Description of the drawings
Fig. 1 is the first structure schematic diagram of radio-frequency power time domain measurement system embodiment of the present invention；
Fig. 2 is the board under test microstrip line schematic diagram of radio-frequency power time domain measurement system embodiment of the present invention；
Fig. 3 is the second structure diagram of radio-frequency power time domain measurement system embodiment of the present invention；
Fig. 4 is the first pass schematic diagram of radio-frequency power ime-domain measuring method embodiment of the present invention；
Fig. 5 is the second procedure schematic diagram of radio-frequency power ime-domain measuring method embodiment of the present invention；
Fig. 6 is the first structure schematic diagram of radio-frequency power time domain measurement calibration system embodiment of the present invention；
Fig. 7 is the second structure diagram of radio-frequency power time domain measurement calibration system embodiment of the present invention；
Fig. 8 is the third structure diagram of radio-frequency power time domain measurement calibration system embodiment of the present invention；
Fig. 9 is the first pass schematic diagram of radio-frequency power time domain measurement calibration method embodiment of the present invention；
Figure 10 is the second procedure schematic diagram of radio-frequency power time domain measurement calibration method embodiment of the present invention；
Figure 11 is the third flow diagram of radio-frequency power time domain measurement calibration method embodiment of the present invention；
Figure 12 is the structure diagram of calibration verification system embodiment of the present invention；
Figure 13 is the 4th flow diagram of radio-frequency power time domain measurement calibration method embodiment of the present invention.
Specific embodiment
For the ease of understanding the present invention, the present invention is described more fully below with reference to relevant drawings.In attached drawing
Give the preferred embodiment of the present invention.But the present invention can realize in many different forms, however it is not limited to this paper institutes
The embodiment of description.On the contrary, the purpose for providing these embodiments is made to the disclosure more thorough and comprehensive.
It should be noted that when an element is considered as " connection " another element, it can be directly to separately
One element simultaneously in combination is integrated or may be simultaneously present centering elements.Term as used herein " installation ", " one
End ", " other end " and similar statement are for illustrative purposes only.
Unless otherwise defined, all of technologies and scientific terms used here by the article is with belonging to technical field of the invention
The normally understood meaning of technical staff is identical.Term used in the description of the invention herein is intended merely to description tool
The purpose of the embodiment of body, it is not intended that in the limitation present invention.Term as used herein " and/or " including one or more phases
The arbitrary and all combination of the Listed Items of pass.
As shown in Figure 1, the embodiment of the present invention provides a kind of radio-frequency power time domain measurement system, including：
Oscillograph 10, computer, board under test microstrip line 31 and power probe 20；
Power probe 20 and board under test microstrip line 31 are staggered relatively, and power probe 20 is located at 31 top of board under test microstrip line simultaneously
Perpendicular to board under test microstrip line 31, and 20 hub of a spool of power probe is projected on board under test microstrip line 31；
Power probe 20 is logical with the first passage of oscillograph 10 11 and second respectively by the transmission line for meeting test request
Road 12 connects；Oscillograph 10 is used to acquire work(when inputting the measuring signal for meeting test frequency requirement to board under test microstrip line 31
The power output signal of rate probe 20；
Computer is connected with the output terminal of oscillograph 10, and computer is used to obtain board under test 30 according to power output signal
Radio-frequency power.
Wherein, the magnetic field and utilize electricity that power probe 20 detects radio-frequency current generation using Faraday's electromagnetic induction law
Field couples the electric field to detect radio-frequency voltage generation；The first passage 11 and second channel 12 of oscillograph 10 are visited for connecting power
First 20, and the collected output waveform of probe institute is read, optionally, the terminal impedance of oscillograph 10 can be set as 50 Europe；It calculates
Machine is used to implement between the master control of radio-frequency power time domain measurement system and data processing, with oscillograph 10 and connects, optionally, even
The mode of connecing can be connected by modes such as LAN or GPIB or between computer and oscillograph 10 by long-range nothing
Line connects.Meet the transmission line of test request, refer to the wave of the power output signal of the power probe 20 acquired to oscillograph 10
The transmission line of the no-delay influence of shape；The measuring signal for meeting test frequency requirement refers to power output signal to power probe 20
The no-delay influence of waveform certain frequency in the range of measuring signal.Optionally, 31 1 terminating load 50 of board under test microstrip line,
Load 50 can be 50 Europe.
Specifically, power probe 20 and board under test microstrip line 31 it is staggered relatively it is good after so that coil plane is micro- with board under test
Band line 31 is parallel, and coil is projected on board under test microstrip line 31, and power probe 20 is located above board under test microstrip line 31 and vertical
In board under test microstrip line 31.At this point, the magnetic field of electric current generation, electric field are most strong in board under test microstrip line 31, it is suitble to power probe 20
Acquire the power output signal of board under test microstrip line 31.Oscillograph 10 passes through first passage 11 and second channel 12 and power probe
20 connections, obtain the power output signal that power probe 20 acquires, and radio frequency work(is calculated according to power output signal in computer
Rate.
Radio-frequency power time domain measurement system in one of the embodiments, further includes fixture, stent and sample stage；
Board under test microstrip line 31 is fixed on sample stage；
Fixture is rack-mount, and for constant power probe 20, makes power probe 20 perpendicular to board under test microstrip line
31, and 20 coil of power probe is made to be projected on board under test microstrip line 31.
Wherein, sample stage refers to the testing stand for placing board under test 30, specifically, after securing board under test microstrip line 31,
Power probe 20 is fixed on fixture, and the fixture for being mounted with power probe 20 is fixed on stent, fixture is fixed on branch
After on frame can random rotational angle, to adjust the position of fixture so that power probe 20 is located on board under test microstrip line 31
Just and perpendicular to board under test microstrip line 31, and 20 hub of a spool of power probe is projected on board under test microstrip line 31, so as to
Preferably measure the radio-frequency power of board under test 30.Optionally, fixture can be connected on stent or fixture is socketed in stent
On.
Radio-frequency power time domain measurement system further includes mobile station in one of the embodiments, and the mobile station is used to put
Put board under test microstrip line 31 and microstrip line.Wherein it is possible to the coordinate of X, Y, Z, R axis four dimensions by adjusting mobile station, real
Now to the adjustment of 30 position of board under test.R axis is the shaft centered on Z axis.
20 coil plane of power probe is parallel with board under test microstrip line 31 in one of the embodiments, power probe 20
Hub of a spool is projected at the center of board under test microstrip line 31.Optionally, 20 hub of a spool of power probe and board under test microstrip line
The distance on 31 surfaces can be 1mm.
In one of the embodiments, as shown in Fig. 2, 31 both ends of board under test microstrip line are welded on board under test by SMA32
On 30；
31 one end of board under test microstrip line connection load 50, the other end meet the measurement letter of test frequency requirement for receiving
Number.
In one of the embodiments, as shown in figure 3, power probe 20 includes voltage probe 22 and current probe 21；Electricity
Stream probe 21 and voltage probe 22 are respectively by meeting the transmission line of test request and the first passage 11 and second of oscillograph 10
Channel 12 connects.
Current probe 21 includes sampling coil and the first SMA radio frequency connectors in one of the embodiments, samples line
Circle is connect by the first SMA radio frequency connectors with the first passage 11 of oscillograph 10, and sampling coil is micro- for acquiring board under test
The first output voltage with line 31；
Voltage probe 22 includes monopole detecting structure and the 2nd SMA radio frequency connectors, monopole detecting structure pass through
2nd SMA radio frequency connectors are connect with the second channel 12 of oscillograph 10, and monopole detecting structure is micro- for acquiring board under test
The second output voltage with line 31.
21 measuring principle of current probe is that the magnetic field B of radio-frequency current generation is detected using Faraday's electromagnetic induction law.
Radio-frequency current I generates magnetic flux in coil, which is alternation, so as to induce the first output electricity in sampling coil
It presses, the sampling coil on probe is connect with SMA radio frequency connectors, and the first output voltage that sampling coil senses formation passes through
SMA are transmitted toward oscillographs 10, normally, there are the first output voltage is directly proportional to magnetic field intensity, and magnetic field intensity and
Radio-frequency current is directly proportional, therefore the signal by acquiring the first output voltage can deduce radio-frequency current.
22 measuring principle of voltage probe is to detect radio-frequency voltage on tested board under test microstrip line 31 by field coupling to produce
Raw electric field, tested radio-frequency voltage generate alternating electric field in space, and voltage probe 22 is induced using field coupling by this friendship
The electromotive force that changed electric field generates, the inner wire of voltage probe 22 are connect with SMA, are sensed the second induced electromotive force formed and are led to
The monopole detecting structure of overvoltage probe 22 and SMA are transmitted toward oscillographs 10, normally, the second induced electromotive force and
Electric field strength is directly proportional, and electric field strength absolute value is directly proportional to radio-frequency voltage.Therefore by acquiring the second induced electromotive force
Signal can deduce tested voltage.
Wherein, the first passage 11 of oscillograph 10 connects current probe 21, and the second channel 12 of oscillograph 10 connects voltage probe
22, when inputting the measuring signal for meeting test frequency requirement to board under test microstrip line 31,10 first passage 11 of oscillograph exports
First output voltage, 10 second channel 12 of oscillograph export the second output voltage, wherein, the first output voltage refers to current probe
21 acquisition output voltage signals, the second output voltage refer to voltage probe 22 acquire output voltage signal, computer according to
The first output voltage and the second output voltage that oscillograph 10 exports obtain radio-frequency power.
As shown in figure 4, the embodiment of the present invention also provides a kind of radio-frequency power ime-domain measuring method, including：
S110：Power probe 20 and board under test microstrip line 31 is staggered relatively, power probe 20 is made to be located at board under test micro-strip
Above line 31 and perpendicular to board under test microstrip line 31, and 20 hub of a spool of power probe is projected on board under test microstrip line 31；
S120：Power probe 20 is connected into first passage with oscillograph 10 respectively by meeting the transmission line of test request
11 and second channel 12；
S130：When meeting the measuring signal of test request to the input of board under test microstrip line 31, oscillograph 10 acquires power
The power output signal of probe 20；
S140：Computer obtains the radio-frequency power of board under test 30 according to the power output signal of power probe 20.
Wherein, radio-frequency power time domain measurement system is with consistent in above-mentioned radio-frequency power time domain measurement system embodiment, herein
It does not repeat.
Specifically, power probe 20 and board under test microstrip line 31 is staggered relatively, power probe 20 is made to be located at board under test micro-
Above band line 31 and perpendicular to board under test microstrip line 31, and 20 hub of a spool of power probe is projected on board under test microstrip line 31,
The electric field strength for the board under test microstrip line 31 that power probe 20 acquires is most strong at this time, conducive to the radio-frequency power realized to board under test 30
Time domain measurement.The measuring signal for meeting test request is inputted to board under test microstrip line 31, microstrip line is powered at this time, flows through electric current,
Power probe 20 acquires electric field strength and magnetic field intensity in board under test microstrip line 31, power probe according to electromagnetic induction principle
20 output signal to oscillograph 10, and computer obtains the radio-frequency power of board under test 30 according to the output signal of oscillograph 10.It is optional
, 31 1 terminating load 50 of board under test microstrip line, load 50 can be 50 Europe.
Such as Fig. 5 in one of the embodiments, by power probe 20 and board under test microstrip line 31 process packet staggered relatively
Include step：
S111：Power probe 20 is fixed on fixture, and the fixture for being mounted with power probe 20 is fixed on stent,
Make power probe 20 perpendicular to sample stage.
S112：Board under test microstrip line 31 is fixed on sample stage.
In order to ensure in measurement process, power probe 20 is fixed on fixture by the stability of probe, which fixes
On stent, board under test microstrip line 31 is fixed on sample stage, wherein, the connection between fixture and stent can be that buckle connects
It connects or fixture includes an annulus, stent includes pillar, and the annulus matching of fixture is socketed on the pillar of stent, presss from both sides
After tool is fixed on stent, can random rotational angle, but want the power probe 20 on holding jig perpendicular to sample stage.
It is in one of the embodiments, as shown in figure 5, power probe 20 and board under test microstrip line 31 is staggered relatively, make
Power probe 20 is located at 31 top of board under test microstrip line and perpendicular to board under test microstrip line 31, and 20 hub of a spool of power probe is thrown
Process of the shadow on board under test microstrip line 31 includes step：
S113：20 hub of a spool of power probe is projected at the center of board under test microstrip line 31, and makes power probe 20
The distance on hub of a spool and 31 surface of board under test microstrip line is 1mm.Specifically, power probe 20 and 31 surface of board under test microstrip line
1mm distances are kept, at this time the electric field conducive to the acquisition board under test of power probe 20 microstrip line 31, magnetic field, the line in power probe 20
The magnetic field mutual inductance that circle generates after being powered with board under test microstrip line 31, the field coupling with generation obtain board under test microstrip line 31
Electromotive force is exported, the radio-frequency power of board under test 30 is calculated according to electromotive force and voltage, current relationship in computer.
In one of the embodiments, as shown in figure 5, the power output signal of power probe 20 includes the first output voltage
With the second output voltage；
The process that oscillograph 10 acquires the power output signal of power probe 20 includes step：
S131：By the voltage probe 22 of the current probe 21 of power probe 20 and power probe 20 respectively by meeting test
It is required that the transmission line connection first passage 11 of oscillograph 10 and second channel 12；
S132:Oscillograph 10 acquires the first output voltage by first passage 11, and oscillograph 10 passes through second channel 12
Acquire the second output voltage；
The process that computer obtains the radio-frequency power of board under test 30 according to power output signal includes step：
S141：Computer obtains the radio-frequency power of board under test 30 according to the first output voltage and the second output voltage.
Optionally, computer obtains radio-frequency power and can be calculated by following：
Calculating current 21 output currents of probe：
IMK(t)=IFFT [FMK(ω)]
Wherein,
FM(ω)=FFT [vM(t)]
Wherein, IMK(t) it is the radio-frequency current of board under test 30, FFT represents Fourier transformation, and IFFT represents that anti-Fourier becomes
It changes, vM(t) electricity of the first output voltage for the output of the first passage 11 of oscillograph 10, the i.e. acquisition of current probe 21 output
Pressure；KI(ω) is the correcting current factor.
Then, 22 output voltage of voltage probe is calculated：
vPK(t)=IFFT [FPK(ω)]
Wherein,
FP(ω)=FFT [vP(t)]
Wherein, vPK(t) it is the radio-frequency voltage of board under test 30, FFT represents Fourier transformation, and IFFT represents that anti-Fourier becomes
It changes, KV(ω) be voltage calibration factor, vP(t) the second output voltage for the output of the second channel 12 of oscillograph 10, i.e. voltage
The voltage of 22 acquisition output of probe.
The realization of specific power time domain waveform needs to consider the phase problem of two probe measurements, and only phase corresponds to consistent
When, gained power waveform is just correct.Time domain time delay or the factor of frequency domain phase problem can be generated in entire experimental system
Mainly have：Connect the parameter of two transmission lines of 20 output terminal of oscillograph 10 and power probe, such as material and length difference etc.；
The influence of measuring signal frequency.When being calibrated to radio-frequency power time domain measurement system, find to board under test microstrip line 31
When inputting the measuring signal in certain frequency band, the time domain delay of 20 output terminal waveform of basic negligible power probe, by calibrating,
It was found that meet the transmission line of test request and meet the measuring signal of test frequency requirement.It is micro- to board under test in the present embodiment
The measuring signal for meeting test request is inputted with line 31, and connects oscillograph 10 with the transmission line for meeting test request and is visited with power
First 20, time domain delay can be ignored at this time, radio-frequency power is as follows：
Prec(t)=vPK(t)·IMK(t)
Wherein, Prec(t) it is 31 radio-frequency power of board under test microstrip line.
As shown in fig. 6, on the other hand the embodiment of the present invention additionally provides a kind of radio-frequency power time domain measurement calibration system, wrap
It includes：
Calibrating measuring device 40 and above-mentioned radio-frequency power time domain measurement system；
Calibrating measuring device 40 connects power probe 20 and calibration microstrip line 71 respectively, and calibrating measuring device 40 is used for as calibration
Microstrip line 71 provides measuring signal and obtains the calibration parameter of calibration microstrip line 71, wherein, calibration parameter is used for board under test 30
Radio-frequency power to be measured measure calibration.
Specifically, calibrating measuring device 40 connects power probe 20 and calibration microstrip line 71, survey is passed through to calibration microstrip line 71
Signal is measured, then acquires the output of calibration microstrip line 71, the calibration parameter of calibration microstrip line 71 is obtained according to output, with realization pair
The calibration of radio-frequency power time domain measurement system.Optionally, 20 hub of a spool of power probe of radio-frequency power time domain measurement system is thrown
Shadow is at the center of tested calibration microstrip line 71, at this point, the magnetic field of electric current generation, electric field are most strong in calibration microstrip line 71, is suitble to use
Probe in calibration electric current, voltage detection part.Wherein, calibration microstrip line 71 be located on calibration plate 70, calibrate microstrip line 71 and
Connection relation and connection mode between calibration plate 70 are the same as in above-described embodiment between board under test microstrip line 31 and board under test 30
Connection relation is identical with connection mode, and this will not be repeated here.
The connector (such as SMA32) of microstrip line both ends connection standard in one of the embodiments, one end are used to input
Measuring signal.Wherein, calibration microstrip line 71 can be prepared by various ways such as PCB technology, LTCC techniques.
In one of the embodiments, as shown in fig. 7, calibrated tester includes signal generator 41, power probe 20
Including voltage probe 22 and current probe 21；
Signal generator 41 connects one end of calibration microstrip line 71, calibrates another terminating load 50 of microstrip line 71；Signal is sent out
Raw device 41 is used for calibration 71 input measurement signal of microstrip line；
Oscillograph 10 by transmission line respectively with the output terminal of current probe 21, the output terminal of voltage probe 22 and calibration
The both ends connection of microstrip line 71.
Wherein, the impedance matching of calibration microstrip line 71 and oscillograph 10, for example, the impedance design of calibration microstrip line 71 is 50
Europe, 10 impedance of oscillograph are also 50 Europe, and impedance matching is formed with oscillograph 10, ensure signal in transmission process not by anti-
It penetrates, so as to ensure the accuracy of calibration.
In one of the embodiments, as shown in figure 8, calibrated tester includes Network Analyzer 42, power probe 20
Including voltage probe 22 and current probe 21；
The Network Analyzer 42 connects the voltage probe 22, the current probe 21 and the calibration microstrip line 71 respectively
Both ends；
The computer connects the Network Analyzer 42.
Specifically, Network Analyzer 42 by current probe 21, voltage probe 22 and calibrates 71 groups of microstrip line for measurement
Into network system transmission characteristic, so as to obtain calibration factor.To calibrate microstrip line 71 as input terminal (port 1), electricity
Stream probe 21 and voltage probe 22 are output terminal (port 2 422 and port 3 423), calibrate another terminal network of microstrip line 71
The port 4 424 of analyzer 42 utilizes the amplitude attenuation situation and phase change feelings of the transmission of 42 measuring signal of Network Analyzer
Condition, the pattern of measurement is frequency scanning, i.e., by the frequency for the measuring signal for changing input terminal, and detects the same frequency of output terminal
Rate signal strength and phase change.
As shown in figure 9, the embodiment of the present invention provides a kind of radio-frequency power time domain measurement calibration method, including：
S210：The power probe 20 and the calibration microstrip line 71 is staggered relatively, it is located at the power probe 20
Simultaneously microstrip line 71 is calibrated, and 20 hub of a spool of the power probe is projected in institute perpendicular to described in 71 top of calibration microstrip line
It states on calibration microstrip line 71, the calibration microstrip line 71 is connected into load 50, the resistance value and the calibration micro-strip of the load 50
71 characteristic impedance of line matches.
S220：Calibrating measuring device 40 calibrates micro-strip to calibration 71 input measurement signal of microstrip line, the acquisition of power probe 20
The output signal of line 71；
S230：Calibrating measuring device 40 obtains the output signal that power probe 20 acquires and is sent to computer；
S240：Computer obtains calibration parameter according to the output signal that calibrating measuring device 40 is sent, wherein, calibration parameter
Calibration is measured for the radio-frequency power to be measured to board under test 30.
It should be noted that the realization of radio-frequency power time domain measurement calibration method is calibrated with above-mentioned radio-frequency power time domain measurement
Realization in system embodiment is consistent, and the radio-frequency power time domain measurement system of required dependence is also penetrated with above-mentioned in calibration process
It is consistent in frequency power time domain measurement system embodiment, suitable for the present embodiment.
In one of the embodiments, as shown in Figure 10, calibrating measuring device 40 includes Network Analyzer 42, calibration parameter
Including calibration factor；
Calibrating measuring device 40 calibrates microstrip line 71 to calibration 71 input measurement signal of microstrip line, the acquisition of power probe 20
The process of output signal includes step：
S221：Port 1 to the port 4 424 of Network Analyzer 42 is connected to the voltage probe of power probe 20 respectively
22nd, the current probe 21 of the both ends of calibration microstrip line 71 and power probe 20；
S222：Network Analyzer 42 to calibration 71 input measurement signal of microstrip line；
Calibrating measuring device 40 obtains the output signal that power probe 20 acquires and is sent to the process of computer including walking
Suddenly：
S231：Network Analyzer 42 obtains network transmission parameter and is sent to computer；
The process that computer obtains calibration parameter according to the output signal that calibrating measuring device 40 is sent includes step：
S241：Computer obtains the calibration of power factor according to the network transmission parameter that Network Analyzer 42 is sent.
Specifically, the voltage that port 1 to the port 4 424 of Network Analyzer 42 is connected to power probe 20 respectively is visited
First 22, the current probe 21 of the both ends of calibration microstrip line 71 and power probe 20, Network Analyzer 42 are defeated to calibration microstrip line 71
Enter measuring signal, Network Analyzer 42 exports network transmission parameter to computer, and computer obtains school according to network transmission parameter
Quasi-divisor.
Optionally, calibration factor includes voltage calibration factor and the correcting current factor, and computer is according to Network Analyzer 42
The voltage network configured transmission of output and current network configured transmission obtain voltage calibration factor and the correcting current factor.It is optional
, computer, which obtains calibration factor process, to be：The calibration factor K of 22 part of voltage probeV(ω)=S13, current probe 21
Partial calibration factor KI(ω)=S12Z0, wherein, S13For voltage network configured transmission (42 port of Network Analyzer, one 421 He
Transmission coefficient between port 3 423), S12For current network configured transmission (42 port 1 of Network Analyzer and port two
Transmission coefficient between 422), Z0It is calibration 71 impedance value of microstrip line.
In one of the embodiments, as shown in figure 11, calibrated tester further includes signal generator 41, calibration parameter
Further include test frequency；
Calibrating measuring device 40 calibrates microstrip line 71 to calibration 71 input measurement signal of microstrip line, the acquisition of power probe 20
The process of output signal includes step：
S223：Signal generator 41 is connect to one end of calibration microstrip line 71, and another termination for calibrating microstrip line 71 is born
Carry 50；
S224：Signal generator 41 to calibration 71 input measurement signal of microstrip line；
Calibrating measuring device 40 obtains the output signal that power probe 20 acquires and is sent to the process of computer including walking
Suddenly：
S232：Oscillograph 10 acquires the first output voltage by second channel 12, defeated by the acquisition second of third channel 13
Go out voltage；
S233：First output voltage and the second output voltage are sent to computer by oscillograph 10；
The process that computer obtains calibration parameter according to power output signal includes step：
S242：Computer obtains the waveform delay time according to the first output voltage and the second output voltage, if waveform delay
The frequency record of measuring signal is the test frequency for meeting test request in the range of preset delay time, then by the time.
Wherein, preset delay time is to influence negligible delay time to rf power measurement.For example, when measuring
When signal is pulse signal, width W, then when Δ t is less than W/20, it is believed that the delay time can be ignored；If measure letter
When number being cyclical signal, period T, then when Δ t is less than T/20, it is believed that the delay time can be ignored；Delay time exists
When in preset delay time, radio-frequency power time domain measurement can be by respectively obtaining radio-frequency current and radio-frequency voltage
Afterwards, multiplication is calculated.Specifically, signal generator 41 is calibrated at this time to calibration 71 input terminal input measurement signal of microstrip line
Microstrip line 71 is powered, and the first output voltage and the second output voltage of the acquisition calibration microstrip line 71 of power probe 20 simultaneously pass through oscillography
Device 10 is transmitted to computer, and computer obtains the delay time of waveform according to the first output voltage and the second output voltage, judges
Whether delay time is in the range of preset delay time, if thinking that time delay is to radio-frequency power time domain measurement at this time
Influence can ignore, then it is assumed that meet test request during the corresponding test frequency of test signal at this time.
Optionally, the step of computer obtains the waveform delay time according to the first output voltage and the second output voltage can be with
Including：
Establish phase difference calculating model：
φ is phase difference in above formula, wherein
AndU1 (k), u2 (k) are respectively oscillograph 10 first
Channel 11 and second channel 12 are exported to the trigonometric function waveform of computer.
It solves
According toSolve delay time Δ t：
Calibration parameter further includes linear electrical parameter in one of the embodiments,；
The process of signal generator 41 to calibration 71 input measurement signal of microstrip line includes step：
Signal generator 41 inputs the measuring signal for meeting test frequency to calibration microstrip line 71；
The process that computer obtains calibration parameter according to output signal includes step：
Computer obtains the waveform delay time according to the first output voltage and the second output voltage, if the waveform delay time exists
Then it is to meet the linear electrical parameter of test request by the reference record of transmission line in the range of preset delay time.
Specifically, in above-described embodiment, by signal generator 41 to calibration microstrip line 71 in input measurement believe
Number, computer obtains the first output voltage and the second output voltage by oscillograph 10, is then obtained according to the waveform of output voltage
Delay time is obtained, if the waveform delay time is in the range of preset delay time, then it is assumed that the parameter of current transmission line is to meet
Measurement request, if the waveform delay time is not in the range of preset delay time, then it is assumed that the parameter of current transmission line is not inconsistent
Measurement request is closed, the waveform delay time is obtained again after adjusting the parameter of transmission line, until the waveform delay time is in preset delay
In time range, the parameter of the transmission line of record coincidence measurement requirement, in case with reference to use when carrying out radio-frequency power time domain measurement.
Calibrating measuring device 40 further includes power amplifier in one of the embodiments, and power amplifier is sent out with signal
Raw device 41 connects, and power amplifier is used to input to calibration micro-strip after being amplified the measuring signal that signal generator 41 is sent out
Line 71.When the signal that signal generator 41 generates is too small, power probe 20 is insufficient to allow to detect signal, by adjusting power
The measuring signal that signal generator 41 exports is amplified by amplifier, it can be ensured that power probe 20 can be very good acquisition school
The radio-frequency power of quasi- microstrip line 71.
As shown in figure 12, the embodiment of the present invention also provides a kind of calibration to above-mentioned radio-frequency power time domain measurement calibration system
Verification system, including：
Arbitrary waveform generator 60 and above-mentioned radio-frequency power time domain measurement system；
The first port 61 and second port 62 of arbitrary waveform generator 60 are respectively with calibrating one end of microstrip line 71 and showing
The first passage 11 of wave device 10 connects, and calibrates the other end connection load 50 of microstrip line 71；Wherein, arbitrary waveform generator 60
For inputting random waveform to calibration microstrip line 71；
The output terminal of power probe 20 is connect respectively with the second channel of oscillograph 10 12 and third channel 13.
Wherein, arbitrary waveform generator 60 can export such as square wave, triangular wave or sawtooth wave waveform, to calibrate micro-strip
Line 71 inputs random waveform, obtains 10 first passage 11 of oscillograph to the output signal of third channel 13, computer is according to oscillography
The output signal of device 10 first passage 11 to third channel 13 verifies calibration parameter.It optionally, can be by random waveform
The output of the first port 61 and second port 62 of generator 60 synchronizes.
In one of the embodiments, as shown in figure 12, the first passage 11 and second channel 12 of oscillograph 10 are used respectively
In connection current probe 21 and voltage probe 22, and read the 22 collected voltage waveform of institute of current probe 21 and voltage probe.
Optionally, the first passage 11 of oscillograph 10 and the terminal impedance of second channel 12 can be 50 Europe, and the first of oscillograph 10 is logical
Road 11 or the connection of second channel 12 load 50, monitoring load 50 sections of voltage, each moment of the voltage waveform correspond to amplitude divided by
Resistance, can obtain the current waveform of signal on calibration microstrip line 71, and the voltage waveform and current waveform can be used for verification to calibrate
The correctness of the factor.The load 50 in 50 Europe of termination of microstrip line 71 is calibrated, to ensure and 10 impedance matching of oscillograph.
As shown in figure 13, in radio-frequency power time domain measurement calibration method in one embodiment, calibrating measuring device
40 further include arbitrary waveform generator 60；
The output signal sent in computer according to calibrating measuring device 40 further includes step after obtaining calibration parameter step
Suddenly：
S250：By the first port of arbitrary waveform generator and second port respectively with calibrate microstrip line one end and oscillography
The first passage connection of device, and the other end for calibrating microstrip line is connected into load；
S260：The output terminal of power probe is connect respectively with the second channel of oscillograph and third channel；
S270：Arbitrary waveform generator 60 inputs random waveform by first port 61 to calibration microstrip line 71；
S280：Oscillograph 10 acquires the school of the output of second port 62 of the arbitrary waveform generator by first passage 11
First calibration verification electric signal of quasi- microstrip line 71；
S290：Oscillograph 10 acquires the second calibration verification electric signal of calibration microstrip line 71 by power probe 20；
S291：Computer tests calibration parameter according to the first calibration verification electric signal and the second calibration verification electric signal
Card.
It should be noted that the embodiment of calibration method herein corresponds to the calibration of radio-frequency power time domain measurement calibration system
Verification system.
The second calibration verification electric signal includes the first output voltage and the second output voltage in one of the embodiments,；
The process of second calibration verification electric signal of the acquisition calibration microstrip line 71 of oscillograph 10 includes step：
Oscillograph 10 acquires the first output voltage by third channel 13, and passes through the acquisition of third channel 13 second output electricity
Pressure；
Computer verifies calibration parameter according to the first calibration verification electric signal and the second calibration verification electric signal
Process includes step：
Computer compares the first calibration verification electric signal with the first output voltage, the second output voltage respectively, with
Calibration parameter is verified.
Optionally, calibration factor includes the correcting current factor and voltage calibration factor, computer to the correcting current factor and
The step of voltage calibration factor is verified can be：
Obtain the output signal v of 10 first passage 11 of oscillographL(t)：
Obtain the first output voltage v of 10 second channel 12 of oscillographPI(t), i.e., the signal that current probe 21 acquires；
According to the electric current I to be measured of 21 acquisition of the first output voltage calculating current probePIK(t)：
FPI(ω)=FFT [vPI(t)]
IPIK(t)=IFFT [FPIK(ω)]
Obtain the second output voltage v of 10 third channel 13 of oscillographPV(t), i.e., the signal that voltage probe 22 acquires；
The voltage v to be measured of the acquisition of voltage probe 22 is calculated according to the second output voltagePVK(t)：
FPV(ω)=FFT [vPV(t)]
vPVK(t)=IFFT [FPVK(ω)]
Wherein, FFT represents Fourier transform, and IFFT represents inverse-Fourier transform.
By IPIK(t) and IL(t) it is compared, when the two is basically identical, it is believed that verification calibration factor KI(ω) is correct
's；Simultaneously by vPVK(t) and VL(t) it is compared, when the two is basically identical, it is believed that verification calibration factor KV(ω) is correct
's.It should be noted that radio-frequency power time domain measurement system fixes the position of power probe 20 and board under test microstrip line 31, it should
Position should be with consistent in calibration system, and consistency is better, and verification is more accurate.
Embodiment described above only expresses the several embodiments of the present invention, and description is more specific and detailed, but simultaneously
Cannot the limitation to the scope of the claims of the present invention therefore be interpreted as.It should be pointed out that for those of ordinary skill in the art
For, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the guarantor of the present invention
Protect range.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (10)
1. a kind of radio-frequency power ime-domain measuring method, which is characterized in that including：
The power probe and the board under test microstrip line is staggered relatively, the power probe is made to be located at the board under test micro-strip
Above line and perpendicular to the board under test microstrip line, and the power probe hub of a spool is projected in the board under test microstrip line
On；
The power probe is connected and the first passage of the oscillograph and respectively by meeting the transmission line of test request
Two channels；
When meeting the measuring signal of test request to board under test microstrip line input, the oscillograph acquires the power and visits
The power output signal of head；
The computer obtains the radio-frequency power of the board under test according to the power output signal of the power probe.
2. radio-frequency power ime-domain measuring method according to claim 1, which is characterized in that the power of the power probe is defeated
Go out signal and include the first output voltage and the second output voltage；
The process that the oscillograph acquires the power output signal of the power probe includes step：
By the voltage probe of the current probe of the power probe and the power probe respectively by meeting the biography of test request
Defeated line connects the first passage and second channel of the oscillograph；
The oscillograph acquires the first output voltage by first passage, and the oscillograph is defeated by second channel acquisition second
Go out voltage；
The process that the computer obtains the radio-frequency power of the board under test according to power output signal includes step：
The computer obtains the radio-frequency power of the board under test according to the first output voltage and the second output voltage.
3. radio-frequency power time domain measurement system according to claim 2, which is characterized in that described by power probe and to be measured
Plate microstrip line process staggered relatively includes step：
The power probe is fixed on fixture, and the fixture for being mounted with the power probe is fixed on stent,
Make the power probe perpendicular to sample stage；
The board under test microstrip line is fixed on the sample stage.
4. the radio-frequency power ime-domain measuring method according to any one in claim 3, which is characterized in that described by described in
Power probe and the board under test microstrip line are staggered relatively, and the power probe is made to be located above the board under test microstrip line and is hung down
Directly in the board under test microstrip line, and the process that the power probe hub of a spool is projected on the board under test microstrip line includes
Step：
The power probe hub of a spool is projected at the center of the board under test microstrip line.
It is 5. a kind of to radio-frequency power time domain measurement calibration method, which is characterized in that including：
The power probe and the calibration microstrip line is staggered relatively, the power probe is made to be located on the calibration microstrip line
Just and perpendicular to the calibration microstrip line, and the power probe hub of a spool is projected on the calibration microstrip line；
For calibrating measuring device to the calibration microstrip line input measurement signal, the power probe acquires the calibration microstrip line
Output signal；
The calibrating measuring device obtains the output signal of the power probe acquisition and is sent to the computer；
The computer obtains calibration parameter according to the output signal that the calibrating measuring device is sent, wherein, the school
Quasi- parameter is used to measure calibration to the radio-frequency power to be measured of the board under test.
It is 6. according to claim 5 to radio-frequency power time domain measurement calibration method, which is characterized in that the calibration measurement dress
It puts including Network Analyzer, the calibration parameter includes calibration factor；
The calibrating measuring device acquires the calibration micro-strip to the calibration microstrip line input measurement signal, the power probe
The process of the output signal of line includes step：
By port one to the port four of the Network Analyzer connect respectively the power probe voltage probe, it is described calibration it is micro-
Both ends with line and the current probe of the power probe；
The Network Analyzer calibrates microstrip line input measurement signal to described；
The calibrating measuring device obtains the output signal of the power probe acquisition and is sent to the process packet of the computer
Include step：
The Network Analyzer obtains network transmission parameter and is sent to the computer；
The process that the computer obtains calibration parameter according to the output signal that the calibrating measuring device is sent includes step：
The computer obtains the calibration of power factor according to the network transmission parameter that the Network Analyzer is sent.
It is 7. according to claim 6 to radio-frequency power time domain measurement calibration method, which is characterized in that the calibration test dress
It puts and further includes signal generator, the calibration parameter further includes test frequency；
Calibrating measuring device calibrates the mistake of the output signal of microstrip line to calibration microstrip line input measurement signal, power probe acquisition
Journey includes step：
Signal generator is connect to one end of calibration microstrip line, and another terminating load that will calibrate microstrip line；
Signal generator to calibration microstrip line input measurement signal；
Calibrating measuring device obtain power probe acquisition output signal and be sent to computer process include step：
Oscillograph acquires the first output voltage by second channel, and the second output voltage is acquired by third channel；
First output voltage and the second output voltage are sent to computer by oscillograph；
The process that computer obtains calibration parameter according to output signal includes step：
Computer obtains the waveform delay time according to the first output voltage and the second output voltage, if the waveform delay time is default
Delay time in the range of, then be the test frequency for meeting test request by the frequency record of measuring signal.
It is 8. according to claim 7 to radio-frequency power time domain measurement calibration method, which is characterized in that the calibration parameter is also
Including linear electrical parameter；
The process of the signal generator to the calibration microstrip line input measurement signal includes step：
The signal generator meets the measuring signal of test frequency to the calibration microstrip line input；
The process that the computer obtains calibration parameter according to output signal includes step：
The computer obtains the waveform delay time according to the first output voltage and the second output voltage, if the waveform delay time exists
Then it is to meet the linear electrical parameter of test request by the reference record of the transmission line in the range of preset delay time.
It is 9. according to claim 5 to radio-frequency power time domain measurement calibration method, which is characterized in that the calibration measurement dress
It puts and further includes arbitrary waveform generator；
The output signal sent in the computer according to the calibrating measuring device further includes after obtaining calibration parameter step
Step：
By the first port of the arbitrary waveform generator and second port respectively with described calibration one end of microstrip line and described
The first passage connection of oscillograph, and the other end of the calibration microstrip line is connected into load；
The output terminal of the power probe is connect respectively with the second channel of the oscillograph and third channel；
The arbitrary waveform generator inputs random waveform by first port to the calibration microstrip line；
The oscillograph acquires the calibration micro-strip of the second port output of the arbitrary waveform generator by first passage
First calibration verification electric signal of line；
The oscillograph acquires the second calibration verification electric signal of the calibration microstrip line by the power probe；
The computer verifies calibration parameter according to the first calibration verification electric signal and the second calibration verification electric signal.
It is 10. according to claim 9 to radio-frequency power time domain measurement calibration method, which is characterized in that second calibration
Verify that electric signal includes the first output voltage and the second output voltage；
The process of second calibration verification electric signal of the oscillograph acquisition calibration microstrip line includes step：
The oscillograph acquires the first output voltage, and acquire the second output voltage by third channel by third channel；
The computer verifies calibration parameter according to the first calibration verification electric signal and the second calibration verification electric signal
Process includes step：
The computer compares the first calibration verification electric signal with the first output voltage, the second output voltage respectively, with
Calibration parameter is verified.
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| CN117250386A (en) * | 2023-11-17 | 2023-12-19 | 深圳青铜剑技术有限公司 | Method and device for correcting delay of voltage and current probe of oscilloscope |
| CN117250386B (en) * | 2023-11-17 | 2024-01-09 | 深圳青铜剑技术有限公司 | Method and device for correcting delay of voltage and current probe of oscilloscope |
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