CN108169701B - Radio frequency power time domain measuring method and calibration method - Google Patents
Radio frequency power time domain measuring method and calibration method Download PDFInfo
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- CN108169701B CN108169701B CN201711489749.7A CN201711489749A CN108169701B CN 108169701 B CN108169701 B CN 108169701B CN 201711489749 A CN201711489749 A CN 201711489749A CN 108169701 B CN108169701 B CN 108169701B
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- G—PHYSICS
- G01—MEASURING; TESTING
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The embodiment of the invention provides a radio frequency power time domain measuring method and a calibration method, wherein the radio frequency power time domain measuring method comprises the following steps: the power probe and the microstrip line of the board to be detected are oppositely placed, the power probe is positioned above the microstrip line of the board to be detected and is vertical to the microstrip line of the board to be detected, and the center of a coil of the power probe is projected on the microstrip line of the board to be detected; the power probe and the oscilloscope are respectively connected with a first channel and a second channel of the oscilloscope through transmission lines which meet the test requirements; when a measuring signal meeting the test requirement is input to the microstrip line of the board to be tested, the oscilloscope collects a power output signal of the power probe; and the computer obtains the radio frequency power of the board to be detected according to the power output signal of the power probe. The non-contact measurement method can perform time domain measurement on the radio frequency power under the condition of not modifying the system or stopping the system, and is convenient for testing.
Description
Technical Field
The invention relates to the technical field of radio frequency power frequency domain measurement, in particular to a radio frequency power time domain measurement method and a calibration method.
Background
And the power time domain measurement refers to measuring the change data of the power parameter along with time. At present, a contact measurement system is mostly adopted to perform power time domain measurement, but in the implementation process, the inventor finds that the traditional technology has at least the following defects: the traditional test system needs to be in direct contact with a tested point, so that the power time domain test is inconvenient because the system is required to be modified or stopped without intervening the tested system. With the increasing complexity of test objects, it is desirable to make time-domain measurements of radio frequency power without modifying or stopping the system.
Disclosure of Invention
Based on this, it is necessary to solve the problem of inconvenient testing, and in one aspect, an embodiment of the present invention provides a radio frequency power time domain measurement method, including:
the power probe and the microstrip line of the board to be detected are oppositely placed, the power probe is positioned above the microstrip line of the board to be detected and is vertical to the microstrip line of the board to be detected, and the center of a coil of the power probe is projected on the microstrip line of the board to be detected;
respectively connecting a power probe with a first channel and a second channel of an oscilloscope through a transmission line meeting the test requirement;
when a measuring signal meeting the test requirement is input to the microstrip line of the board to be tested, the oscilloscope collects a power output signal of the power probe;
and the computer obtains the radio frequency power of the board to be detected according to the power output signal of the power probe.
In one embodiment, the power output signal of the power probe comprises a first output voltage and a second output voltage;
the process of acquiring the power output signal of the power probe by the oscilloscope comprises the following steps:
connecting a current probe of the power probe and a voltage probe of the power probe to a first channel and a second channel of the oscilloscope through transmission lines meeting test requirements respectively;
the oscilloscope collects a first output voltage through the first channel, and the oscilloscope collects a second output voltage through the second channel;
the process of obtaining the radio frequency power of the board to be tested according to the power output signal by the computer comprises the following steps:
and the computer obtains the radio frequency power of the board to be tested according to the first output voltage and the second output voltage.
In one embodiment, the process of oppositely placing the power probe and the microstrip line of the board to be tested comprises the following steps:
fixing the power probe on a clamp, and fixing the clamp provided with the power probe on a bracket to enable the power probe to be vertical to the sample table;
and fixing the microstrip line of the board to be tested on the sample platform.
In one embodiment, the process of oppositely placing the power probe and the microstrip line of the board to be tested to enable the power probe to be positioned above the microstrip line of the board to be tested and to be vertical to the microstrip line of the board to be tested, and projecting the center of the coil of the power probe on the microstrip line of the board to be tested comprises the following steps:
and projecting the center of the power probe coil to the center of the microstrip line of the board to be detected.
A method of calibrating a time-domain measurement of radio frequency power, comprising:
the power probe and the calibration microstrip line are oppositely placed, the power probe is positioned above the calibration microstrip line and is vertical to the calibration microstrip line, and the center of the coil of the power probe is projected on the calibration microstrip line; connecting the calibration microstrip line with a load, wherein the resistance value of the load is matched with the characteristic impedance of the calibration microstrip line;
the calibration measuring device inputs a measuring signal to the calibration microstrip line, and the power probe acquires an output signal of the calibration microstrip line;
the calibration measuring device acquires an output signal acquired by the power probe and sends the output signal to the computer;
and the computer obtains calibration parameters according to the output signals sent by the calibration measuring device, wherein the calibration parameters are used for measuring and calibrating the radio frequency power to be measured of the board to be measured.
In one embodiment, the calibration measurement device comprises a network analyzer, and the calibration parameters comprise calibration factors;
the calibration measuring device inputs a measuring signal to the calibration microstrip line, and the process of acquiring the output signal of the calibration microstrip line by the power probe comprises the following steps:
respectively connecting a port I to a port IV of the network analyzer with a voltage probe of a power probe, two ends of a calibration microstrip line and a current probe of the power probe;
the network analyzer inputs a measurement signal to the calibration microstrip line;
the process of acquiring the output signal acquired by the power probe and sending the output signal to the computer by the calibration measuring device comprises the following steps:
the network analyzer acquires network transmission parameters and sends the network transmission parameters to the computer;
the process of obtaining calibration parameters by the computer according to the output signals sent by the calibration measurement device comprises the following steps:
and the computer obtains the power calibration factor according to the network transmission parameters sent by the network analyzer.
In one embodiment, the calibration test apparatus further comprises a signal generator, and the calibration parameters further comprise a test frequency;
the calibration measuring device inputs a measuring signal to the calibration microstrip line, and the process of acquiring the output signal of the calibration microstrip line by the power probe comprises the following steps:
connecting a signal generator to one end of the calibration microstrip line, and connecting the other end of the calibration microstrip line to a load;
the signal generator inputs a measuring signal to the calibration microstrip line;
the process of acquiring the output signal acquired by the power probe and sending the output signal to the computer by the calibration measuring device comprises the following steps:
the oscilloscope collects a first output voltage through the second channel and collects a second output voltage through the third channel;
the oscilloscope sends the first output voltage and the second output voltage to the computer;
the process of obtaining the calibration parameters from the output signal by the computer comprises the following steps:
and the computer obtains waveform delay time according to the first output voltage and the second output voltage, and if the waveform delay time is within a preset delay time range, recording the frequency of the measurement signal as a test frequency meeting the test requirement.
In one embodiment, the calibration parameters further include transmission line parameters;
the process that the signal generator inputs the measuring signal to the calibration microstrip line comprises the following steps:
the signal generator inputs a measuring signal which accords with the test frequency to the calibration microstrip line;
the process of obtaining the calibration parameters from the output signal by the computer comprises the following steps:
and the computer obtains the waveform delay time according to the first output voltage and the second output voltage, and if the waveform delay time is within a preset delay time range, the parameters of the transmission line are recorded as the transmission line parameters meeting the test requirements.
In one embodiment, the calibration measurement device further comprises an arbitrary waveform generator;
the method also comprises the following steps after the step of obtaining the calibration parameters by the computer according to the output signals sent by the calibration measurement device:
respectively connecting a first port and a second port of the arbitrary waveform generator with one end of a calibration microstrip line and a first channel of the oscilloscope, and connecting the other end of the calibration microstrip line with a load;
connecting the output end of the power probe with a second channel and a third channel of the oscilloscope respectively;
the arbitrary waveform generator inputs an arbitrary waveform to the calibration microstrip line through the first port;
the oscilloscope collects a first calibration verification electrical signal of the calibration microstrip line output by a second port of the arbitrary waveform generator through a first channel;
the oscilloscope collects a second calibration verification electrical signal of the calibration microstrip line through the power probe;
the computer verifies the calibration parameter according to the first calibration verification electrical signal and the second calibration verification electrical signal.
In one embodiment, the second calibration verification electrical signal comprises a first output voltage and a second output voltage;
the process of acquiring a second calibration verification electrical signal of the calibration microstrip line by the oscilloscope comprises the following steps:
the oscilloscope collects a first output voltage through the second channel and collects a second output voltage through the third channel;
the process that the computer verifies the calibration parameters according to the first calibration verification electrical signal and the second calibration verification electrical signal comprises the following steps:
and the computer compares the first calibration verification electric signal with the first output voltage and the second output voltage respectively to verify the calibration parameters.
The embodiment of the invention at least has the following beneficial effects: the power probe and the microstrip line of the board to be detected are oppositely placed, the power probe is positioned above the microstrip line of the board to be detected and is vertical to the microstrip line of the board to be detected, and the center of a coil of the power probe is projected on the microstrip line of the board to be detected; the power probe and the oscilloscope are respectively connected with a first channel and a second channel of the oscilloscope through transmission lines which meet the test requirements; when a measuring signal meeting the test requirement is input to the microstrip line of the board to be tested, the oscilloscope collects a power output signal of the power probe; and the computer obtains the radio frequency power of the board to be detected according to the power output signal of the power probe. The non-contact measurement method can perform time domain measurement on the radio frequency power under the condition of not modifying the system or stopping the system, and is convenient for testing.
Drawings
FIG. 1 is a schematic diagram of a first structure of a radio frequency power time domain measurement system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a microstrip line of a board to be tested according to an embodiment of the radio frequency power time domain measurement system of the present invention;
FIG. 3 is a diagram illustrating a second structure of an RF power time domain measurement system according to an embodiment of the present invention;
FIG. 4 is a first flowchart illustrating an embodiment of a method for time-domain measurement of RF power according to the present invention;
FIG. 5 is a second flowchart of an embodiment of a method for time-domain measurement of RF power according to the present invention;
FIG. 6 is a schematic diagram of a first structure of an embodiment of a calibration system for time domain measurement of RF power according to the invention;
FIG. 7 is a diagram illustrating a second configuration of an RF power time domain measurement calibration system according to an embodiment of the present invention;
FIG. 8 is a third structural diagram of an embodiment of a calibration system for time domain measurement of RF power according to the invention;
FIG. 9 is a first flowchart illustrating an embodiment of a calibration method for time domain measurement of RF power according to the present invention;
FIG. 10 is a second flowchart of an embodiment of a calibration method for time domain measurement of RF power according to the invention;
FIG. 11 is a third flowchart of an embodiment of a calibration method for time domain measurement of RF power according to the present invention;
FIG. 12 is a schematic diagram of an embodiment of a calibration verification system according to the present invention;
fig. 13 is a fourth flowchart illustrating an embodiment of a calibration method for time domain measurement of radio frequency power according to the present invention.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element and be integral therewith, or intervening elements may also be present. The terms "mounted," "one end," "the other end," and the like are used herein for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
As shown in fig. 1, an embodiment of the present invention provides a radio frequency power time domain measurement system, including:
the device comprises an oscilloscope 10, a computer, a microstrip line 31 of a board to be tested and a power probe 20;
the power probe 20 and the to-be-tested plate microstrip line 31 are oppositely arranged, the power probe 20 is positioned above the to-be-tested plate microstrip line 31 and is vertical to the to-be-tested plate microstrip line 31, and the coil center of the power probe 20 is projected on the to-be-tested plate microstrip line 31;
the power probe 20 is respectively connected with a first channel 11 and a second channel 12 of the oscilloscope 10 through transmission lines meeting the test requirements; the oscilloscope 10 is used for collecting the power output signal of the power probe 20 when inputting the measurement signal meeting the test frequency requirement to the microstrip line 31 of the board to be tested;
the computer is connected to the output end of the oscilloscope 10, and the computer is used for obtaining the radio frequency power of the board to be tested 30 according to the power output signal.
Wherein, the power probe 20 utilizes faraday's law of electromagnetic induction to detect the magnetic field generated by the radio frequency current and utilizes electric field coupling to detect the electric field generated by the radio frequency voltage; the first channel 11 and the second channel 12 of the oscilloscope 10 are used for connecting the power probe 20 and reading an output waveform acquired by the probe, and optionally, the termination impedance of the oscilloscope 10 can be set to 50 ohms; the computer is used for realizing the master control and data processing of the radio frequency power time domain measurement system and is connected with the oscilloscope 10, optionally, the connection mode can be a connection mode through LAN or GPIB and the like, and also can be a remote wireless connection mode between the computer and the oscilloscope 10. The transmission line meeting the test requirements refers to a transmission line which has no delay influence on the waveform of the power output signal of the power probe 20 acquired by the oscilloscope 10; a measurement signal that meets the test frequency requirements is a measurement signal within a certain frequency range that has no delay effect on the waveform of the power output signal of the power probe 20. Optionally, one end of the microstrip line 31 of the board to be tested is connected to the load 50, and the load 50 may be 50 ohms.
Specifically, after the power probe 20 and the microstrip line 31 to be tested are placed relatively, the coil plane is parallel to the microstrip line 31 to be tested, the coil is projected on the microstrip line 31 to be tested, and the power probe 20 is located above the microstrip line 31 to be tested and perpendicular to the microstrip line 31 to be tested. At this time, the magnetic field and the electric field generated by the current in the microstrip line 31 of the board to be detected are strongest, and the power probe 20 is suitable for collecting the power output signal of the microstrip line 31 of the board to be detected. The oscilloscope 10 is connected with the power probe 20 through the first channel 11 and the second channel 12 to obtain a power output signal collected by the power probe 20, and the computer calculates the radio frequency power according to the power output signal.
In one embodiment, the radio frequency power time domain measurement system further comprises a clamp, a bracket and a sample stage;
the microstrip line 31 of the board to be tested is fixed on the sample platform;
the fixture is installed on the bracket and used for fixing the power probe 20, so that the power probe 20 is perpendicular to the microstrip line 31 of the board to be detected, and the coil of the power probe 20 is projected on the microstrip line 31 of the board to be detected.
The sample platform is a test platform for placing the board to be tested 30, specifically, after the microstrip line 31 of the board to be tested is fixed, the power probe 20 is fixed on the fixture, the fixture provided with the power probe 20 is fixed on the bracket, the fixture can be rotated at will after being fixed on the bracket so as to adjust the position of the fixture, so that the power probe 20 is positioned above the microstrip line 31 of the board to be tested and is perpendicular to the microstrip line 31 of the board to be tested, and the center of the coil of the power probe 20 is projected on the microstrip line 31 of the board to be tested, so that the radio frequency power of the board to be tested 30 can be better measured. Optionally, the clamp may be clamped on the bracket, or the clamp is sleeved on the bracket.
In one embodiment, the radio frequency power time domain measurement system further includes a mobile station, and the mobile station is used for placing the microstrip line 31 and the microstrip line of the board to be measured. The position of the board 30 to be measured can be adjusted by adjusting the coordinates of the X, Y, Z, R axes of the mobile station in four dimensions. The R axis is a rotation axis centered on the Z axis.
In one embodiment, the plane of the coil of the power probe 20 is parallel to the microstrip line 31 of the board to be tested, and the center of the coil of the power probe 20 is projected at the center of the microstrip line 31 of the board to be tested. Optionally, the distance between the coil center of the power probe 20 and the surface of the microstrip line 31 of the board to be tested may be 1 mm.
In one embodiment, as shown in fig. 2, two ends of the microstrip line 31 of the board to be tested are welded on the board to be tested 30 through SMA 32;
one end of the microstrip line 31 of the board to be tested is connected with the load 50, and the other end is used for receiving the measurement signal meeting the requirement of the test frequency.
In one embodiment, as shown in FIG. 3, power probe 20 includes a voltage probe 22 and a current probe 21; the current probe 21 and the voltage probe 22 are respectively connected with the first channel 11 and the second channel 12 of the oscilloscope 10 through transmission lines meeting the test requirements.
In one embodiment, the current probe 21 includes a sampling coil and a first SMA head radio frequency connector, the sampling coil is connected to the first channel 11 of the oscilloscope 10 through the first SMA head radio frequency connector, and the sampling coil is used to collect a first output voltage of the microstrip line 31 of the board to be tested;
the voltage probe 22 includes a monopole detection structure and a second SMA head radio frequency connector, the monopole detection structure is connected to the second channel 12 of the oscilloscope 10 through the second SMA head radio frequency connector, and the monopole detection structure is configured to collect a second output voltage of the microstrip line 31 of the board to be detected.
The current probe 21 measures the magnetic field B generated by the radio frequency current by using faraday's law of electromagnetic induction. The radio frequency current I generates magnetic flux in the coil, the magnetic flux is alternating, so that a first output voltage is induced in the sampling coil, the sampling coil on the probe is connected with the SMA head radio frequency connector, the first output voltage induced by the sampling coil is transmitted to the oscilloscope 10 through the SMA head, normally, the first output voltage is in direct proportion to the magnetic field intensity, and the magnetic field intensity is in direct proportion to the radio frequency current, so that the radio frequency current can be deduced by collecting a signal of the first output voltage.
The voltage probe 22 detects an electric field generated by a radio frequency voltage on the microstrip line 31 of the board to be detected through electric field coupling, the radio frequency voltage to be detected generates an alternating electric field in a space, the voltage probe 22 induces an electromotive force generated by the alternating electric field through electric field coupling, an inner conductor of the voltage probe 22 is connected with the SMA head, a second induced electromotive force formed through induction is transmitted to the oscilloscope 10 through a monopole detection structure of the voltage probe 22 and the SMA head, generally, the second induced electromotive force is in direct proportion to the electric field intensity, and the absolute value of the electric field intensity is in direct proportion to the radio frequency voltage. Therefore, the measured voltage can be deduced by collecting the signal of the second induced electromotive force.
When a measurement signal meeting the requirement of the test frequency is input to the microstrip line 31 of the board to be tested, the first channel 11 of the oscilloscope 10 outputs a first output voltage, the second channel 12 of the oscilloscope 10 outputs a second output voltage, wherein the first output voltage refers to an output voltage signal acquired by the current probe 21, the second output voltage refers to an output voltage signal acquired by the voltage probe 22, and the computer acquires the radio frequency power according to the first output voltage and the second output voltage output by the oscilloscope 10.
As shown in fig. 4, an embodiment of the present invention further provides a radio frequency power time domain measuring method, including:
s110: the power probe 20 and the to-be-tested plate microstrip line 31 are oppositely arranged, so that the power probe 20 is positioned above the to-be-tested plate microstrip line 31 and is vertical to the to-be-tested plate microstrip line 31, and the coil center of the power probe 20 is projected on the to-be-tested plate microstrip line 31;
s120: respectively connecting a power probe 20 with a first channel 11 and a second channel 12 of an oscilloscope 10 through transmission lines meeting test requirements;
s130: when a measurement signal meeting the test requirement is input to the microstrip line 31 of the board to be tested, the oscilloscope 10 collects a power output signal of the power probe 20;
s140: the computer obtains the radio frequency power of the board 30 to be tested according to the power output signal of the power probe 20.
The rf power time domain measurement system is consistent with the above-mentioned embodiment of the rf power time domain measurement system, and is not described herein again.
Specifically, the power probe 20 and the board to be tested microstrip line 31 are oppositely arranged, so that the power probe 20 is located above the board to be tested microstrip line 31 and perpendicular to the board to be tested microstrip line 31, and the coil center of the power probe 20 is projected on the board to be tested microstrip line 31, at this time, the electric field intensity of the board to be tested microstrip line 31 acquired by the power probe 20 is strongest, which is beneficial to realizing the radio frequency power time domain measurement of the board to be tested 30. Inputting a measuring signal meeting the test requirement to the microstrip line 31 of the board to be tested, electrifying the microstrip line at the moment, flowing current, acquiring the electric field intensity and the magnetic field intensity in the microstrip line 31 of the board to be tested by the power probe 20 according to the electromagnetic induction principle, outputting a signal to the oscilloscope 10 by the power probe 20, and obtaining the radio frequency power of the board to be tested 30 by the computer according to the output signal of the oscilloscope 10. Optionally, one end of the microstrip line 31 of the board to be tested is connected to the load 50, and the load 50 may be 50 ohms.
In one embodiment, as shown in fig. 5, the process of placing the power probe 20 and the microstrip line 31 to be tested relatively includes the following steps:
s111: the power probe 20 is fixed to the jig, and the jig with the power probe 20 mounted thereon is fixed to the holder so that the power probe 20 is perpendicular to the sample stage.
S112: the microstrip line 31 of the board to be tested is fixed on the sample stage.
In order to ensure the stability of the probe in the measurement process, the power probe 20 is fixed on a fixture, the fixture is fixed on a support, and the microstrip line 31 of the board to be measured is fixed on the sample stage, wherein the connection between the fixture and the support can be a snap connection, or the fixture can comprise a ring, the support comprises a pillar, the ring of the fixture is sleeved on the pillar of the support in a matching manner, and after the fixture is fixed on the support, the power probe 20 on the fixture can be rotated at will, but the power probe 20 on the fixture is perpendicular to the sample stage.
In one embodiment, as shown in fig. 5, the process of placing the power probe 20 and the board-to-be-tested microstrip line 31 oppositely, so that the power probe 20 is located above the board-to-be-tested microstrip line 31 and perpendicular to the board-to-be-tested microstrip line 31, and the coil center of the power probe 20 is projected on the board-to-be-tested microstrip line 31 includes the steps of:
s113: the coil center of the power probe 20 is projected at the center of the microstrip line 31 of the board to be detected, and the distance between the coil center of the power probe 20 and the surface of the microstrip line 31 of the board to be detected is 1 mm. Specifically, the distance between the power probe 20 and the surface of the microstrip line 31 to be tested is kept to be 1mm, at this time, the power probe 20 is facilitated to collect an electric field and a magnetic field of the microstrip line 31 to be tested, the magnetic field generated after the coil in the power probe 20 and the microstrip line 31 to be tested are electrified is mutually induced and coupled with the generated electric field to obtain the output electromotive force of the microstrip line 31 to be tested, and the computer calculates the radio frequency power of the board 30 to be tested according to the relationship between the electromotive force and the voltage and current.
In one embodiment, as shown in FIG. 5, the power output signal of power probe 20 includes a first output voltage and a second output voltage;
the process of acquiring a power output signal of the power probe 20 by the oscilloscope 10 comprises the steps of:
s131: connecting a current probe 21 of a power probe 20 and a voltage probe 22 of the power probe 20 with a first channel 11 and a second channel 12 of an oscilloscope 10 through transmission lines meeting test requirements respectively;
s132, the oscilloscope 10 collects a first output voltage through the first channel 11, and the oscilloscope 10 collects a second output voltage through the second channel 12;
the process of obtaining the radio frequency power of the board 30 to be tested according to the power output signal by the computer includes the steps of:
s141: the computer obtains the radio frequency power of the board to be tested 30 according to the first output voltage and the second output voltage.
Optionally, the radio frequency power obtained by the computer may be obtained by the following calculation:
calculating the output current of the current probe 21:
IMK(t)＝IFFT[FMK(ω)]
wherein the content of the first and second substances,
FM(ω)＝FFT[vM(t)]
wherein, IMK(t) is the RF current of the board 30 to be tested, FFT represents the Fourier transform, IFFT represents the inverse Fourier transform, vM(t) is a first output voltage of the output of the first channel 11 of the oscilloscope 10, namely the voltage collected and output by the current probe 21; kIAnd (omega) is a current calibration factor.
Then, the voltage probe 22 output voltage is calculated:
vPK(t)＝IFFT[FPK(ω)]
wherein the content of the first and second substances,
FP(ω)＝FFT[vP(t)]
wherein v isPK(t) is the radio frequency voltage of the board 30 to be measured, FFT represents Fourier transform, IFFT represents inverse Fourier transform, KV(ω) is the voltage calibration factor, vP(t) is the second output voltage of the output of the second channel 12 of the oscilloscope 10, i.e., the voltage probe 22 collects the output voltage.
The realization of specific power time domain waveform needs to consider the phase problem measured by the two probes, and the obtained power waveform is correct only when the phases are correspondingly consistent. The time-domain time delay or frequency-domain phase problem in the whole experimental system is mainly caused by the following factors: parameters, such as material and length difference, of two transmission lines connecting the output ends of the oscilloscope 10 and the power probe 20; the effect of the signal frequency is measured. When the radio frequency power time domain measurement system is calibrated, the time domain delay of the waveform at the output end of the power probe 20 can be basically ignored when the measurement signal in a certain frequency band is input to the microstrip line 31 to be tested, and the transmission line meeting the test requirement and the measurement signal meeting the test frequency requirement are found through calibration. In this embodiment, a measurement signal meeting the test requirement is input to the microstrip line 31 of the board to be tested, and the oscilloscope 10 and the power probe 20 are connected by a transmission line meeting the test requirement, at this time, the time domain delay can be ignored, and the radio frequency power is as follows:
Prec(t)＝vPK(t)·IMK(t)
wherein, PrecAnd (t) is the radio frequency power of the microstrip line 31 of the board to be tested.
As shown in fig. 6, another aspect of the embodiments of the present invention further provides a calibration system for time domain measurement of radio frequency power, including:
calibrating the measuring device 40 and the radio frequency power time domain measuring system;
the calibration measurement device 40 is respectively connected to the power probe 20 and the calibration microstrip line 71, and the calibration measurement device 40 is configured to provide a measurement signal for the calibration microstrip line 71 and obtain a calibration parameter of the calibration microstrip line 71, where the calibration parameter is used to measure and calibrate the rf power to be measured of the board 30 to be measured.
Specifically, the calibration measurement device 40 is connected to the power probe 20 and the calibration microstrip line 71, and introduces a measurement signal to the calibration microstrip line 71, then collects the output of the calibration microstrip line 71, and obtains the calibration parameter of the calibration microstrip line 71 according to the output, so as to calibrate the radio frequency power time domain measurement system. Optionally, the coil center of the power probe 20 of the radio frequency power time domain measurement system is projected at the center of the measured calibration microstrip line 71, and at this time, the magnetic field and the electric field generated by the current in the calibration microstrip line 71 are strongest, so that the power probe is suitable for calibrating the probe of the current and voltage detection part. The calibration microstrip line 71 is located on the calibration board 70, and the connection relationship and the connection manner between the calibration microstrip line 71 and the calibration board 70 are the same as those between the microstrip line 31 and the board 30 in the above embodiment, which is not described herein again.
In one embodiment, the two ends of the microstrip line are connected with standardized connectors (such as SMA32), and one end of the microstrip line is used for inputting measurement signals. The calibration microstrip line 71 may be prepared by various methods such as a PCB process and an LTCC process.
In one embodiment, as shown in FIG. 7, the calibration test equipment includes a signal generator 41, the power probe 20 includes a voltage probe 22 and a current probe 21;
the signal generator 41 is connected with one end of the calibration microstrip line 71, and the other end of the calibration microstrip line 71 is connected with the load 50; the signal generator 41 is used for inputting a measurement signal to the calibration microstrip line 71;
the oscilloscope 10 is connected to the output end of the current probe 21, the output end of the voltage probe 22, and both ends of the calibration microstrip line 71 through transmission lines.
The impedance of the calibration microstrip line 71 is matched with the impedance of the oscilloscope 10, for example, the impedance of the calibration microstrip line 71 is designed to be 50 ohms, the impedance of the oscilloscope 10 is also 50 ohms, and the impedance matching is formed with the oscilloscope 10, so that the signal is not reflected in the transmission process, and the calibration accuracy is ensured.
In one embodiment, as shown in FIG. 8, the calibration test equipment includes a network analyzer 42, the power probe 20 includes a voltage probe 22 and a current probe 21;
the network analyzer 42 is respectively connected with the voltage probe 22, the current probe 21 and two ends of the calibration microstrip line 71;
the computer is connected to the network analyzer 42.
Specifically, the network analyzer 42 is configured to measure a transmission characteristic of a network system composed of the current probe 21, the voltage probe 22, and the calibration microstrip line 71, so as to obtain a calibration factor. The calibration microstrip line 71 is taken as an input end (port one 421), the current probe 21 and the voltage probe 22 are taken as output ends (port two 422 and port three 423), the other end of the calibration microstrip line 71 is connected with a port four 424 of the network analyzer 42, the network analyzer 42 is used for measuring the amplitude attenuation condition and the phase change condition of signal transmission, and the measuring mode is frequency scanning, namely, the frequency of the measuring signal at the input end is changed, and the signal intensity and the phase change of the same frequency at the output end are detected.
As shown in fig. 9, an embodiment of the present invention provides a calibration method for time domain measurement of radio frequency power, including:
s210: the power probe 20 and the calibration microstrip line 71 are oppositely arranged, the power probe 20 is positioned above the calibration microstrip line 71 and is perpendicular to the calibration microstrip line 71, the coil center of the power probe 20 is projected on the calibration microstrip line 71, the calibration microstrip line 71 is connected with a load 50, and the resistance value of the load 50 is matched with the characteristic impedance of the calibration microstrip line 71.
S220: the calibration measurement device 40 inputs a measurement signal to the calibration microstrip line 71, and the power probe 20 collects an output signal of the calibration microstrip line 71;
s230: the calibration measurement device 40 acquires an output signal acquired by the power probe 20 and sends the output signal to the computer;
s240: the computer obtains calibration parameters according to the output signals sent by the calibration measurement device 40, wherein the calibration parameters are used for measuring and calibrating the radio frequency power to be measured of the board 30 to be measured.
It should be noted that, the implementation of the radio frequency power time domain measurement calibration method is the same as that in the above-mentioned radio frequency power time domain measurement calibration system embodiment, and the radio frequency power time domain measurement system that needs to be relied on in the calibration process is also the same as that in the above-mentioned radio frequency power time domain measurement system embodiment, and both are applicable to this embodiment.
In one embodiment, as shown in FIG. 10, the calibration measurement device 40 includes a network analyzer 42, and the calibration parameters include calibration factors;
the process that the calibration measuring device 40 inputs the measuring signal to the calibration microstrip line 71 and the power probe 20 acquires the output signal of the calibration microstrip line 71 comprises the following steps:
s221: connecting a first port 421 to a fourth port 424 of the network analyzer 42 with the voltage probe 22 of the power probe 20, two ends of the calibration microstrip line 71 and the current probe 21 of the power probe 20 respectively;
s222: the network analyzer 42 inputs a measurement signal to the calibration microstrip line 71;
the process of acquiring the output signal collected by the power probe 20 and sending the output signal to the computer by the calibration measurement device 40 comprises the following steps:
s231: the network analyzer 42 acquires network transmission parameters and sends the network transmission parameters to the computer;
the process of the computer obtaining calibration parameters from the output signal sent by the calibration measurement device 40 includes the steps of:
s241: the computer obtains the power calibration factor from the network transmission parameters sent by the network analyzer 42.
Specifically, the first port 421 to the fourth port 424 of the network analyzer 42 are respectively connected to the voltage probe 22 of the power probe 20, the two ends of the calibration microstrip line 71, and the current probe 21 of the power probe 20, the network analyzer 42 inputs a measurement signal to the calibration microstrip line 71, the network analyzer 42 outputs a network transmission parameter to the computer, and the computer obtains a calibration factor according to the network transmission parameter.
Optionally, the calibration factor includes a voltage calibration factor and a current calibration factor, and the computer obtains the voltage calibration factor and the current calibration factor according to the voltage network transmission parameter and the current network transmission parameter output by the network analyzer 42. Optionally, the computer obtaining the calibration factor process may be: calibration factor K for the voltage probe 22 sectionV(ω)＝S13Calibration factor K for the current probe 21 sectionI(ω)＝S12Z0Wherein S is13Is a voltageNetwork transmission parameter (transmission coefficient between port one 421 and port three 423 of network analyzer 42), S12As a current network transmission parameter (transmission coefficient between port one 421 and port two 422 of the network analyzer 42), Z0Is the calibrated microstrip line 71 impedance value.
In one embodiment, as shown in fig. 11, the calibration test apparatus further includes a signal generator 41, and the calibration parameters further include a test frequency;
the process that the calibration measuring device 40 inputs the measuring signal to the calibration microstrip line 71 and the power probe 20 acquires the output signal of the calibration microstrip line 71 comprises the following steps:
s223: connecting the signal generator 41 with one end of the calibration microstrip line 71, and connecting the other end of the calibration microstrip line 71 with the load 50;
s224: the signal generator 41 inputs a measurement signal to the calibration microstrip line 71;
the process of acquiring the output signal collected by the power probe 20 and sending the output signal to the computer by the calibration measurement device 40 comprises the following steps:
s232: the oscilloscope 10 collects a first output voltage through the second channel 12 and a second output voltage through the third channel 13;
s233: the oscilloscope 10 sends the first output voltage and the second output voltage to the computer;
the process of obtaining the calibration parameter from the power output signal by the computer includes the steps of:
s242: and the computer obtains waveform delay time according to the first output voltage and the second output voltage, and if the waveform delay time is within a preset delay time range, recording the frequency of the measurement signal as a test frequency meeting the test requirement.
Wherein the preset delay time is a delay time with negligible influence on the radio frequency power measurement. For example, when the measurement signal is a pulse signal, the width is W, and when Δ t is smaller than W/20, the delay time is considered negligible; if the period is T when the measuring signal is a periodic signal, when the delta T is less than T/20, the delay time is considered to be negligible; when the delay time is within the preset delay time, the radio frequency power time domain measurement can be obtained by multiplying the radio frequency current and the radio frequency voltage after the radio frequency current and the radio frequency voltage are respectively obtained. Specifically, the signal generator 41 inputs a measurement signal to an input end of the calibration microstrip line 71, at this time, the calibration microstrip line 71 is energized, the power probe 20 acquires a first output voltage and a second output voltage of the calibration microstrip line 71 and transmits the first output voltage and the second output voltage to the computer through the oscilloscope 10, the computer obtains a delay time of a waveform according to the first output voltage and the second output voltage, and judges whether the delay time is within a preset delay time range, if so, the influence of the time delay on the radio frequency power time domain measurement at this time is considered to be negligible, and the test frequency corresponding to the test signal at this time is considered to meet the test requirement.
Optionally, the step of obtaining the waveform delay time according to the first output voltage and the second output voltage by the computer may include:
establishing a phase difference calculation model:
in the above formula, phi is a phase difference, wherein
Solving for
According to
Solving for delay time Δ t:
in one embodiment, the calibration parameters further include transmission line parameters;
the process of inputting the measurement signal to the calibration microstrip line 71 by the signal generator 41 includes the steps of:
the signal generator 41 inputs a measurement signal conforming to the test frequency to the calibration microstrip line 71;
the process of obtaining the calibration parameters from the output signal by the computer comprises the following steps:
and the computer obtains the waveform delay time according to the first output voltage and the second output voltage, and if the waveform delay time is within a preset delay time range, the parameters of the transmission line are recorded as the transmission line parameters meeting the test requirements.
Specifically, as in the above embodiment, a measurement signal is input into the calibration microstrip line 71 through the signal generator 41, the computer obtains a first output voltage and a second output voltage through the oscilloscope 10, then obtains a delay time according to a waveform of the output voltage, if the waveform delay time is within a preset delay time range, it is considered that a parameter of the current transmission line meets the measurement requirement, if the waveform delay time is not within the preset delay time range, it is considered that the parameter of the current transmission line does not meet the measurement requirement, the waveform delay time is obtained after the parameter of the transmission line is adjusted, until the waveform delay time is within the preset delay time range, the parameter of the transmission line meeting the measurement requirement is recorded, so as to be used for reference when performing radio frequency power time domain measurement.
In one embodiment, the calibration measuring apparatus 40 further includes a power amplifier, the power amplifier is connected to the signal generator 41, and the power amplifier is configured to amplify the measurement signal sent by the signal generator 41 and input the amplified measurement signal to the calibration microstrip line 71. When the signal generated by the signal generator 41 is too small, the power probe 20 cannot detect the signal, and the power amplifier is adjusted to amplify the measurement signal output by the signal generator 41, so that the power probe 20 can be ensured to well acquire the radio frequency power of the calibration microstrip line 71.
As shown in fig. 12, an embodiment of the present invention further provides a calibration verification system for the above radio frequency power time domain measurement calibration system, including:
an arbitrary waveform generator 60 and the above-described radio frequency power time domain measurement system;
a first port 61 and a second port 62 of the arbitrary waveform generator 60 are respectively connected with one end of a calibration microstrip line 71 and a first channel 11 of the oscilloscope 10, and the other end of the calibration microstrip line 71 is connected with a load 50; the arbitrary waveform generator 60 is configured to input an arbitrary waveform to the calibration microstrip line 71;
the output of the power probe 20 is connected to the second channel 12 and the third channel 13 of the oscilloscope 10, respectively.
The arbitrary waveform generator 60 may output waveforms such as a square wave, a triangular wave, or a sawtooth wave, and input arbitrary waveforms to the calibration microstrip line 71, obtain output signals from the first channel 11 to the third channel 13 of the oscilloscope 10, and the computer verifies calibration parameters according to the output signals from the first channel 11 to the third channel 13 of the oscilloscope 10. Alternatively, the outputs of the first port 61 and the second port 62 of the arbitrary waveform generator 60 may be synchronized.
In one embodiment, as shown in fig. 12, the first channel 11 and the second channel 12 of the oscilloscope 10 are used for connecting the current probe 21 and the voltage probe 22, respectively, and reading the voltage waveforms collected by the current probe 21 and the voltage probe 22. Optionally, the termination impedance of the first channel 11 and the second channel 12 of the oscilloscope 10 may be 50 ohms, the first channel 11 or the second channel 12 of the oscilloscope 10 is connected to the load 50, the voltage of the load 50 is monitored, the corresponding amplitude of the voltage waveform at each time is divided by the resistance, the current waveform of the signal on the calibration microstrip line 71 may be obtained, and the voltage waveform and the current waveform may be used to verify the correctness of the calibration factor. One end of the calibration microstrip line 71 is connected to a 50 ohm load 50 to ensure impedance matching with the oscilloscope 10.
As shown in fig. 13, in one embodiment of the rf power time domain measurement calibration method, the calibration measurement device 40 further includes an arbitrary waveform generator 60;
after the step of obtaining the calibration parameters by the computer according to the output signal sent by the calibration measurement device 40, the method further comprises the following steps:
s250: respectively connecting a first port and a second port of the arbitrary waveform generator with one end of a calibration microstrip line and a first channel of the oscilloscope, and connecting the other end of the calibration microstrip line with a load;
s260: connecting the output end of the power probe with a second channel and a third channel of the oscilloscope respectively;
s270: the arbitrary waveform generator 60 inputs an arbitrary waveform to the calibration microstrip line 71 through the first port 61;
s280: the oscilloscope 10 collects a first calibration verification electrical signal of the calibration microstrip line 71 output by the second port 62 of the arbitrary waveform generator through the first channel 11;
s290: the oscilloscope 10 acquires a second calibration verification electrical signal of the calibration microstrip line 71 through the power probe 20;
s291: the computer verifies the calibration parameter according to the first calibration verification electrical signal and the second calibration verification electrical signal.
It should be noted that the embodiments of the calibration method herein correspond to a calibration verification system of a radio frequency power time domain measurement calibration system.
In one embodiment, the second calibration verification electrical signal comprises a first output voltage and a second output voltage;
the process of acquiring the second calibration verification electrical signal of the calibration microstrip line 71 by the oscilloscope 10 includes the steps of:
the oscilloscope 10 collects a first output voltage through the second channel 12 and a second output voltage through the third channel 13;
the process that the computer verifies the calibration parameters according to the first calibration verification electrical signal and the second calibration verification electrical signal comprises the following steps:
and the computer compares the first calibration verification electric signal with the first output voltage and the second output voltage respectively to verify the calibration parameters.
Optionally, the calibration factor includes a current calibration factor and a voltage calibration factor, and the step of verifying the current calibration factor and the voltage calibration factor by the computer may be:
acquiring oscilloscope 10Output signal v of first channel 11L(t)：
Obtaining a first output voltage v of a second channel 12 of an oscilloscope 10PI(t), i.e. the signal collected by the current probe 21;
calculating the current I to be measured collected by the current probe 21 according to the first output voltagePIK(t)：
FPI(ω)＝FFT[vPI(t)]
IPIK(t)＝IFFT[FPIK(ω)]
Obtaining a second output voltage v of a third channel 13 of the oscilloscope 10PV(t), i.e., the signal collected by the voltage probe 22;
calculating the voltage v to be measured collected by the voltage probe 22 according to the second output voltagePVK(t)：
FPV(ω)＝FFT[vPV(t)]
vPVK(t)＝IFFT[FPVK(ω)]
Here, FFT represents fourier transform, and IFFT represents inverse fourier transform.
Will IPIK(t) and IL(t) comparing, and when the two are substantially identical, considering that the calibration factor K is verifiedI(ω) is correct; at the same time vPVK(t) and VL(t) comparing, and when the two are substantially identical, considering that the calibration factor K is verifiedV(ω) is correct. It should be noted that, the radio frequency power time domain measurement system fixes the positions of the power probe 20 and the microstrip line 31 of the board to be measured, and the positions should be consistent with those in the calibration system, and the consistency is goodThe better, the more accurate the verification.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (9)
1. A method for calibrating time-domain measurement of radio frequency power, comprising:
the method comprises the following steps of oppositely placing a power probe and a calibration microstrip line, enabling the power probe to be located above the calibration microstrip line and perpendicular to the calibration microstrip line, and enabling the center of a coil of the power probe to be projected on the calibration microstrip line; the power probe is used for detecting a magnetic field generated by radio frequency current by utilizing a Faraday electromagnetic induction law and detecting an electric field generated by radio frequency voltage by utilizing electric field coupling;
a calibration measuring device inputs a measuring signal to the calibration microstrip line, and the power probe acquires an output signal of the calibration microstrip line;
the calibration measuring device acquires an output signal acquired by the power probe and sends the output signal to a computer;
the computer obtains calibration parameters according to the output signals sent by the calibration measuring device, wherein the calibration parameters are used for measuring and calibrating the radio frequency power to be measured of the board to be measured;
the calibration test device further comprises a signal generator, and the calibration parameters further comprise test frequency;
the calibration measuring device inputs a measuring signal to the calibration microstrip line, and the process of acquiring the output signal of the calibration microstrip line by the power probe comprises the following steps:
connecting the signal generator with one end of a calibration microstrip line, and connecting the other end of the calibration microstrip line with a load;
the signal generator inputs a measuring signal to the calibration microstrip line;
the process that the calibration measuring device acquires the output signal acquired by the power probe and sends the output signal to the computer comprises the following steps:
the oscilloscope collects a first output voltage through the second channel and collects a second output voltage through the third channel;
the oscilloscope sends the first output voltage and the second output voltage to the computer;
the process of the computer obtaining the calibration parameters from the output signals comprises the steps of:
and the computer obtains waveform delay time according to the first output voltage and the second output voltage, and if the waveform delay time is within a preset delay time range, the frequency of the measurement signal is recorded as a test frequency meeting the test requirement.
2. The method of calibrating a radio frequency power time domain measurement according to claim 1, wherein the calibration measurement device comprises a network analyzer, the calibration parameter comprises a calibration factor;
the calibration measuring device inputs a measuring signal to the calibration microstrip line, and the process of acquiring the output signal of the calibration microstrip line by the power probe comprises the following steps:
connecting one port to four ports of the network analyzer with a voltage probe of the power probe, two ends of the calibration microstrip line and a current probe of the power probe respectively;
the network analyzer inputs a measurement signal to the calibration microstrip line;
the process that the calibration measuring device acquires the output signal acquired by the power probe and sends the output signal to the computer comprises the following steps:
the network analyzer acquires network transmission parameters and sends the network transmission parameters to the computer;
the process of the computer obtaining the calibration parameters according to the output signals sent by the calibration measurement device comprises the following steps:
and the computer obtains a power calibration factor according to the network transmission parameter sent by the network analyzer.
3. The method of calibrating a radio frequency power time domain measurement according to claim 1, wherein said calibration parameters further comprise transmission line parameters;
the process that the signal generator inputs the measurement signal to the calibration microstrip line comprises the following steps:
the signal generator inputs a measuring signal which accords with the test frequency to the calibration microstrip line;
the process of the computer obtaining the calibration parameters from the output signals comprises the steps of:
and the computer obtains waveform delay time according to the first output voltage and the second output voltage, and if the waveform delay time is within a preset delay time range, the parameters of the transmission line are recorded as transmission line parameters meeting the test requirements.
4. The method of calibrating a radio frequency power time domain measurement according to claim 1, wherein said calibration measuring device further comprises an arbitrary waveform generator;
after the step of obtaining the calibration parameters by the computer according to the output signals sent by the calibration measurement device, the method further comprises the following steps:
connecting a first port and a second port of the arbitrary waveform generator with one end of the calibration microstrip line and a first channel of the oscilloscope respectively, and connecting the other end of the calibration microstrip line with a load;
connecting the output end of the power probe with a second channel and a third channel of the oscilloscope respectively;
the arbitrary waveform generator inputs an arbitrary waveform to the calibration microstrip line through a first port;
the oscilloscope collects a first calibration verification electric signal of the calibration microstrip line output by a second port of the arbitrary waveform generator through a first channel;
the oscilloscope collects a second calibration verification electrical signal of the calibration microstrip line through the power probe;
the computer verifies the calibration parameter based on the first calibration verification electrical signal and the second calibration verification electrical signal.
5. The method of calibrating a radio frequency power time domain measurement of claim 4, wherein the second calibration verification electrical signal comprises a first output voltage and a second output voltage;
the process that the oscilloscope collects the second calibration verification electric signal of the calibration microstrip line comprises the following steps:
the oscilloscope collects a first output voltage through the second channel and collects a second output voltage through the third channel;
the process of the computer verifying the calibration parameters according to the first calibration verification electrical signal and the second calibration verification electrical signal comprises the following steps:
and the computer compares the first calibration verification electric signal with the first output voltage and the second output voltage respectively to verify the calibration parameters.
6. A method for time domain measurement of radio frequency power, comprising the steps of the method for calibrating time domain measurement of radio frequency power according to any of claims 1 to 5, and further comprising:
the method comprises the following steps of oppositely placing a power probe and a microstrip line of a board to be tested, enabling the power probe to be positioned above the microstrip line of the board to be tested and perpendicular to the microstrip line of the board to be tested, and projecting the center of a coil of the power probe on the microstrip line of the board to be tested; the power probe is used for detecting a magnetic field generated by radio frequency current by utilizing a Faraday electromagnetic induction law and detecting an electric field generated by radio frequency voltage by utilizing electric field coupling; the microstrip line of the board to be tested is the calibration microstrip line;
respectively connecting the power probe with a first channel and a second channel of an oscilloscope through transmission lines meeting test requirements;
when a measuring signal meeting the test requirement is input to the microstrip line of the board to be tested, the oscilloscope collects a power output signal of the power probe; the transmission line meeting the test requirement is a transmission line which has no delay influence on the waveform of a power output signal of the power probe acquired by the oscilloscope; the measurement signal meeting the test requirement is a measurement signal which has no delay influence on the waveform of the power output signal of the power probe;
and the computer obtains the radio frequency power of the board to be detected according to the power output signal of the power probe.
7. The radio frequency power time domain measurement method of claim 6, wherein the power output signal of the power probe comprises a first output voltage and a second output voltage;
the process of acquiring the power output signal of the power probe by the oscilloscope comprises the following steps:
connecting a current probe of the power probe and a voltage probe of the power probe to a first channel and a second channel of the oscilloscope through transmission lines meeting test requirements respectively;
the oscilloscope collects a first output voltage through the first channel, and collects a second output voltage through the second channel;
the process of obtaining the radio frequency power of the board to be tested according to the power output signal by the computer comprises the following steps:
and the computer obtains the radio frequency power of the board to be tested according to the first output voltage and the second output voltage.
8. The radio frequency power time domain measuring method according to claim 7, wherein the process of relatively placing the power probe and the microstrip line of the board to be measured includes the steps of:
fixing the power probe on a clamp, and fixing the clamp provided with the power probe on a bracket to enable the power probe to be vertical to a sample table;
and fixing the microstrip line of the board to be tested on the sample stage.
9. The time-domain radio frequency power measuring method according to claim 8, wherein the process of placing the power probe and the microstrip line to be tested in a manner of being opposite to each other, so that the power probe is located above the microstrip line to be tested and perpendicular to the microstrip line to be tested, and the center of the coil of the power probe is projected on the microstrip line to be tested comprises the steps of:
and projecting the center of the power probe coil at the center of the microstrip line of the board to be detected.
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| CN111948445B (en) * | 2020-08-26 | 2022-10-04 | 南方电网数字电网研究院有限公司 | Power measurement circuit, method and device |
| CN112702127B (en) * | 2020-12-07 | 2022-10-25 | 北京无线电计量测试研究所 | T-type network measuring method and system |
| CN113900058B (en) * | 2021-09-14 | 2024-06-18 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Near field probe calibration method, device, system, equipment and storage medium |
| CN114935686B (en) * | 2022-05-28 | 2024-06-18 | 上海柯渡医学科技股份有限公司 | Power detection tool and power detection method of magnetic resonance radio frequency system |
| CN117250386B (en) * | 2023-11-17 | 2024-01-09 | 深圳青铜剑技术有限公司 | Method and device for correcting delay of voltage and current probe of oscilloscope |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN201811992U (en) * | 2010-09-02 | 2011-04-27 | 武汉滨湖电子有限责任公司 | Radio frequency power tester |
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| CN103454489B (en) * | 2013-09-12 | 2016-09-21 | 清华大学 | The loss power scaling method of matching network and system |
| CN105093148B (en) * | 2014-05-20 | 2018-08-21 | 中国人民解放军63973部队 | A kind of Pulse Magnetic probe Time Domain Calibration method |
| CN104459395B (en) * | 2014-12-04 | 2017-06-20 | 中国电子科技集团公司第四十一研究所 | A kind of calibration frequency mixer calibrating method based on time-frequency dual domain |
| CN104569888B (en) * | 2014-12-24 | 2017-06-06 | 北京无线电计量测试研究所 | A kind of utilization micro-strip collimation method calibrates the system and method for near field probes modifying factor |
| CN105372475A (en) * | 2015-11-30 | 2016-03-02 | 工业和信息化部电子第五研究所 | Time domain measurement method, time domain measurement calibration method and time domain measurement calibration validation method of board-level radio-frequency current |
| CN106361333B (en) * | 2016-08-30 | 2019-06-28 | 苏州涵轩信息科技有限公司 | A kind of voltage waveform processing equipment, method and system |
| CN106453170B (en) * | 2016-09-27 | 2019-05-17 | 工业和信息化部电信研究院 | The measurement of signal nonlinear time-domain and analogy method and application |
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| CN106885935A (en) * | 2017-04-19 | 2017-06-23 | 中国电子产品可靠性与环境试验研究所 | Time domain voltage measuring method, measurement calibration method and measurement calibration verification method |
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