CN101413967B - Method for controlling automatic measurement of oscilloscope - Google Patents
Method for controlling automatic measurement of oscilloscope Download PDFInfo
- Publication number
- CN101413967B CN101413967B CN2007101636508A CN200710163650A CN101413967B CN 101413967 B CN101413967 B CN 101413967B CN 2007101636508 A CN2007101636508 A CN 2007101636508A CN 200710163650 A CN200710163650 A CN 200710163650A CN 101413967 B CN101413967 B CN 101413967B
- Authority
- CN
- China
- Prior art keywords
- measured signal
- oscillograph
- signal
- measurement
- sets
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to a method for controlling the automatic measurement of an oscilloscope, and the method comprises: an automation signal is transmitted to the oscilloscope to control the oscilloscope; measurement parameters of the oscilloscope are set according to the automation signal; a signal to be measured is measured according to the measurement parameters which are set by the oscilloscope; and a measurement result of the signal to be measured is captured and displayed. The application of the method for controlling the automatic measurement of the oscilloscope according to the technical content can save the time which needs to be consumed to set the oscilloscope for a measuring person, accelerate the measurement process, automatically capture the measured data and lead the measurement data to be more accurate.
Description
Technical field
The present invention relates to a kind of method of controlling automatic measurement of oscilloscope, and be particularly related to a kind of method that it is measured automatically by program software control oscillograph.
Background technology
Carry out in the process of circuit measurement at general use oscillograph; in order to obtain complete measurement signal and it to be analyzed; usually can measure the ripple (ripple) and the noise (noise) of power supply supply voltage, record power supply supply voltage suffered interference or noise size in special frequency band for this reason.
The existing practice is after probe connects tested point, suitably adjusts earlier voltage and the measuring range of time (scale) on the oscillograph, then sets skew (offset) voltage again, makes the voltage potential that shows on the oscillograph be positioned at the zero potential part.After determining to measure the current potential of waveform, the measurement personnel must call out oscillographic measuring function, to set the data that desire measures, as: the peak is to peak value (Peak-Peak), noble potential value (High-Level) or electronegative potential value (Low-Level) etc., and then the frequency range size of selecting to measure measures.In addition, measure after the end, the measurement personnel also must call out cursor (cursor) function, and in manual mode cursor is adjusted to and measures the position that the measurement personnel wish in the picture of back, measuring value is noted, then again picture displayed is stored, to finish the measurement step of single tested point.
Yet, because the measurement personnel must do different settings at each different tested point on oscillograph, and setting each time all needs to expend many times and carries out, in case the measuring range on the oscillograph is inappropriate, or measuring waveform exceeds oscillographic picture scope, or when the voltage potential that shows on oscillograph skew or the like situation took place, the measurement personnel just must reset oscillograph, therefore will certainly waste many unnecessary times.In addition, adjust the ripple that cursor and can't grasping really occurs in the continuous pictures or the data of noise, and this also makes result of measuring and accurate inadequately in manual mode.
Summary of the invention
Therefore the objective of the invention is a kind of method of controlling automatic measurement of oscilloscope is being provided, measure the required time, increase the degree of accuracy of measurement to save.
According to one embodiment of the invention, a kind of method of controlling automatic measurement of oscilloscope is proposed.The method comprises transmission one automation signal to an oscillograph with the control oscillograph; Set oscillographic offset voltage according to automation signal; The offset voltage that sets according to oscillograph measures a measured signal; And the measurement of acquisition and demonstration measured signal.
According to technology contents of the present invention, the method for application of aforementioned control automatic measurement of oscilloscope can be saved and be measured the required consumed time of personnel setting oscillograph, quickens the flow process that measures, and the data that record of automatic pick-up, makes metric data more accurate.
Describe the present invention below in conjunction with the drawings and specific embodiments, but not as a limitation of the invention.
Description of drawings
Fig. 1 controls the synoptic diagram that oscillograph makes its automatic measurement for the embodiment of the invention a kind of;
Fig. 2 controls the process flow diagram that oscillograph makes its automatic measurement for the embodiment of the invention a kind of;
Fig. 3 controls the process flow diagram that oscillograph makes its automatic measurement for another embodiment of the present invention a kind of;
Fig. 4 is a kind of process flow diagram that stores metric data of the embodiment of the invention.
Wherein, Reference numeral
102: computing machine
104: oscillograph
106: circuit under test
200～208,300～326,400～416: step
Embodiment
Fig. 1 controls the synoptic diagram that oscillograph makes its automatic measurement for the embodiment of the invention a kind of.In the present embodiment, a computing machine 102 and an oscillograph 104 interconnect, and in order to control oscillograph 104, make oscillograph 104 to set voluntarily, to adjust by the control of computing machine 102, and by probe to operations such as a circuit under test 106 measure.In addition, in the present embodiment, computing machine 102 is by universal serial bus (Universal Serial Bus, USB) switching general purpose interface bus (General Purpose Interface Bus, GPIB) transmission interface is connected with oscillograph 104, for measurement personnel executive routine on computing machine 102, and the signal of robotization is sent in the oscillograph 104, and then the operation of control oscillograph 104.
In addition, tested point on circuit under test 106 does not connect probe as yet, and before computing machine 102 do not control oscillograph 104 as yet, the measurement personnel can use ammeter to measure the virtual voltage of tested point on the circuit under test 106 earlier, with skew (offset) voltage, make the measurement waveform that shows to be positioned at the zero potential part as required setting on the oscillograph 104.Then, the measurement personnel import frequency range size that the offset voltage that records, desire measure or measurement time etc. and measure parameter on computing machine 102, then the measuring program on the object computer 102 makes it carry out circuit automatically to circuit under test 106 and measures with control oscillograph 104 again.
Fig. 2 controls the process flow diagram that oscillograph makes its automatic measurement for the embodiment of the invention a kind of.Present embodiment is provided in to control the wherein a kind of embodiment in the method for automatic measurement of oscilloscope, be not in order to limit the present invention, have in the technical field under any and know the knowledgeable usually, without departing from the spirit and scope of the present invention, when being used for a variety of modifications and variations.At first, when importing frequency range size that the offset voltage that records, desire measure or measurement time etc. on computing machine 102, the measurement personnel measure parameter, and the tested point on the circuit under test 106 connected probe, and after the program on the object computer 102, computing machine 102 can transmit an automation signal (step 200) to the oscillograph 104, operations such as setting, adjustment, measurement and acquisition signal with control oscillograph 104, make and originally must all can finish on the oscillograph by the step of measurement personnel with manual mode of operation according to the indication of automation signal.Then, oscillograph 104 can be set measurement parameters (step 202) according to the automation signal that computing machine 102 is transmitted, and the measurement parameters that wherein sets comprises frequency range size, measurement time or channel of measurement (probe of promptly selecting for use) of offset voltage, measurement or the like.Moreover the measurement parameters that oscillograph 104 meeting bases set measures (step 204) to a measured signal of tested point, and then the measurement (step 206) after the acquisition measurement measured signal, and it is back to computing machine 102.At last, by computing machine 102 measurement is shown again, for measuring man analysis (step 208).
Fig. 3 controls the process flow diagram that oscillograph makes its automatic measurement for another embodiment of the present invention a kind of.Present embodiment is provided in to control the another kind of embodiment in the method for automatic measurement of oscilloscope.Embodiment in Fig. 2, present embodiment have more automatic error in judgement and signal magnitude and adjust functions such as measurement parameters, exceed measuring range (scale) and wait the situation that happens suddenly but avoid measured signal its signal magnitude may occur when measuring.At first, after the program on measuring personnel's object computer 102, computing machine 102 can transmit automation signal (step 300) to the oscillograph 104 equally, with the operations such as setting, adjustment, measurement and acquisition signal of control oscillograph 104.Then, oscillograph 104 can be set measurement parameters (step 302) according to the automation signal that computing machine 102 is transmitted, and the measurement parameters that wherein sets comprises frequency range size, measurement time or channel of measurement (probe of promptly selecting for use) of offset voltage, measurement or the like.
Moreover measurement parameters can compare with the measured signal of tested point (step 304), and whether the error of differentiating measurement parameters and measured signal then is greater than a predetermined value (step 306).When the error that measures parameter and measured signal during greater than predetermined value, then computing machine 102 can show a rub-out signal, to inform the measurement personnel, and after measurement personnel affirmation, again on computing machine 102, import definite measurement parameters, and then the program on the object computer 102, the automation signal that retransfers (step 300) to the oscillograph 104.In one embodiment, the offset voltage of setting can compare with the voltage to be measured of reality, and whether the voltage to be measured of the offset voltage of differentiation setting and reality differs above 3%.If the offset voltage of setting surpasses 3% with the voltage phase difference to be measured of reality, then must confirm whether the virtual voltage that is got by the ammeter amount is wrong by the measurement personnel, and then on computing machine 102, import certain offset voltage, follow again the program on the object computer 102.
On the other hand, when the error that measures parameter and measured signal during not greater than predetermined value, then then to measured signal signal magnitude is detected and is reached a schedule time (as: 10 seconds) (step 308), and then whether the signal magnitude of differentiating measured signal exceeds the measuring range (step 310) that oscillograph 104 sets; That is, the display frame whether signal of differentiation measured signal exceeds oscillograph 104.When the signal magnitude of measured signal exceeds the measuring range that oscillograph 104 sets, oscillograph 104 can be adjusted measuring range, and reset the current potential of measured signal, make it remain on zero potential part (step 312), and then to measured signal signal magnitude is detected (step 308) again.
On the other hand, when the signal magnitude of measured signal did not exceed the measuring range that oscillograph 104 sets, then oscillograph 104 can then measure according to the measurement parameters of setting to measured signal.Wherein, oscillograph 104 can capture the data (step 314) of measured signal, and the data that captured comprise that several peaks of measured signal are to peak value (peak-to-peak).Then, whether the signal magnitude of differentiating measured signal again exceeds the measuring range (step 316) that oscillograph 104 sets; That is, the display frame whether signal of differentiation measured signal exceeds oscillograph 104.When the signal magnitude of measured signal exceeded the measuring range that oscillograph 104 sets, oscillograph 104 can be adjusted measuring range equally, and resets the current potential of measured signal, makes it remain on zero potential part (step 318).Then, oscillograph 104 is understood data (step 320) that reset (reset) before captured, and captures the data (step 314) of measured signal again.
On the other hand, when the signal magnitude of measured signal did not exceed the measuring range that oscillograph 104 sets, 104 of oscillographs were the data that successfully capture measured signal, and can measurement to measured signal analyse and compare (step 322).Wherein, comprise more in the step of the measurement of analyses and comparison measured signal that all peaks to measured signal compare to peak value to a peak value and a smallest peaks to the maximum peak in the peak value.
Then, oscillograph 104 captures and shows (step 324) with the measurement of measured signal and the result after the analyses and comparison thereof again.Wherein, oscillograph 104 acquisition and showing more comprises in the step of measurement and being shown on the measurement of measured signal measuring cursor (cursor).Thus, the measurement personnel just do not need with manual mode adjustment amount photometry mark, but will be measured automatically on the signal after cursor is presented at measurement by oscillograph 104, increase the degree of accuracy of measurement for this reason.In addition, the measurement personnel more can transmit a storage assembly to oscillograph 104 by the program on the object computer 102, store the measurement (as: measurement oscillogram) of measured signal to inform oscillograph 104.At last, the result after result that oscillograph 104 will measure again and the analyses and comparison is back to computing machine 102, and shows that on computing machine 102 all metric data are for analyzing (step 326).Thus, the measurement personnel just can be easily single tested point be finished measurement institute in steps.
Fig. 4 is a kind of process flow diagram that stores metric data of the embodiment of the invention.Present embodiment is provided at and measures a kind of embodiment that the back that finishes stores metric data.At first, the measurement personnel can be prior to the outer information and the required information (step 400) of store files that will write down of the amount of imports on the computing machine 102, for example: tested point position, file store path or file name or the like.Then, the measurement personnel understand the memory function of executive routine, to carry out the storing step (step 402) of metric data.Moreover computing machine 102 can be differentiated information that the measurement personnel are imported whether wrong (step 404).When the information of being imported as the measurement personnel is wrong, can occurs error message on the computing machine 102 and re-enter information with notice measurement personnel.In one embodiment, whether the file name that computing machine 102 meeting differentiation measurement personnel are imported has existed, if file name exists, then error message can occur on the computing machine 102, changes the file name of input with notice measurement personnel.
On the other hand, when the information of being imported as the measurement personnel was errorless, computing machine 102 can transmit storage assemblies to oscillograph 104, informs that the data (as: measurement oscillogram) after 104 pairs of measurements of oscillograph store (step 406).Then, the data after computing machine 102 can acquisition measures also write it in default file layout (step 408).In one embodiment, the data after computing machine 102 will measure write the Excel file layout.Moreover computing machine 102 can differentiate whether the data that write are the data (step 410) of repetition.When the data that write were not the data that repeat, computing machine 102 can be finished the action (step 412) that writes; That is, finish the step of storage.On the other hand, when the data that write are the data that repeat, then understand display reminding window (step 414) on the computing machine 102, to inform the measurement personnel, and the measurement action whether personnel selection overrides is provided, and whether computing machine 102 can the differentiation data desire to override (step 416).When measuring the action that personnel's desire selects to override, then computing machine 102 can be finished the action (step 412) that writes.If during the action that the measurement personnel need not override, then can get back to step 400, on the program of computing machine 102, import new information by the measurement personnel again.
By the embodiment of the invention described above as can be known, the method for application of aforementioned control automatic measurement of oscilloscope can be saved and be measured the required consumed time of personnel setting oscillograph, quickens the flow process that measures, makes the measurement process efficient more.In addition, but, do not need to be undertaken, make that therefore the metric data that captures is more accurate yet by manual mode owing to oscillograph automatic pick-up metric data or data.
Certainly; the present invention also can have other various embodiments; under the situation that does not deviate from spirit of the present invention and essence thereof; those of ordinary skill in the art work as can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.
Claims (12)
1. a method of controlling automatic measurement of oscilloscope is characterized in that, comprises following steps:
Transmit automation signal to an oscillograph to control this oscillograph;
Set this oscillographic offset voltage according to this automation signal;
Compare this offset voltage and a measured signal;
Detect the signal magnitude of this measured signal;
This offset voltage that sets according to this oscillograph measures this measured signal;
The analyse and compare measurement of this measured signal; And
Capture and show the measurement of this measured signal.
2. the method for control automatic measurement of oscilloscope according to claim 1 is characterized in that, more comprises step:
Whether the error of differentiating this offset voltage and this measured signal is greater than a predetermined value; And
When the error of this offset voltage and this measured signal during greater than this predetermined value, another automation signal that retransfers is to set this oscillographic another offset voltage at least.
3. the method for control automatic measurement of oscilloscope according to claim 1 is characterized in that, more comprises step:
Whether the error of differentiating this offset voltage and this measured signal is greater than a predetermined value; And
When the error of this offset voltage and this measured signal during, detect the signal magnitude of this measured signal not greater than this predetermined value.
4. the method for control automatic measurement of oscilloscope according to claim 1 is characterized in that, the step of detecting the signal magnitude of this measured signal more comprises:
The signal magnitude of detecting this measured signal reaches a schedule time; And
Whether the signal magnitude of differentiating this measured signal exceeds the measuring range that this oscillograph sets.
5. the method for control automatic measurement of oscilloscope according to claim 4 is characterized in that, the step of detecting the signal magnitude of this measured signal more comprises:
When the signal magnitude of this measured signal exceeds this measuring range that this oscillograph sets, adjust this measuring range that this oscillograph sets; And
Again detect the signal magnitude of this measured signal.
6. the method for control automatic measurement of oscilloscope according to claim 4 is characterized in that, the step of detecting the signal magnitude of this measured signal more comprises:
When the signal magnitude of this measured signal did not exceed this measuring range that this oscillograph sets, this offset voltage that sets according to this oscillograph measured this measured signal.
7. the method for control automatic measurement of oscilloscope according to claim 1 is characterized in that, the step that this offset voltage that sets according to this oscillograph measures this measured signal more comprises:
Capture the data of this measured signal, wherein the data of this measured signal comprise several peaks of this measured signal to peak value.
8. the method for control automatic measurement of oscilloscope according to claim 7 is characterized in that, the step that this offset voltage that sets according to this oscillograph measures this measured signal more comprises:
Whether the signal magnitude of differentiating this measured signal exceeds the measuring range that this oscillograph sets; And
When the signal magnitude of this measured signal exceeds this measuring range that this oscillograph sets, adjust this measuring range that this oscillograph sets.
9. the method for control automatic measurement of oscilloscope according to claim 8 is characterized in that, the step that this offset voltage that sets according to this oscillograph measures this measured signal more comprises:
The data of this measured signal that replacement is captured; And
Again capture the data of this measured signal.
10. the method for control automatic measurement of oscilloscope according to claim 7 is characterized in that, the step that this offset voltage that sets according to this oscillograph measures this measured signal more comprises:
Whether the signal magnitude of differentiating this measured signal exceeds the measuring range that this oscillograph sets; And
When the size of this measured signal does not exceed this measuring range that this oscillograph sets, the measurement of this measured signal of analysing and comparing.
11. the method for control automatic measurement of oscilloscope according to claim 1 is characterized in that, the step of the measurement of this measured signal of analysing and comparing more comprises:
Compare several peaks in this measured signal to a maximum peak of peak value to peak value and a smallest peaks to peak value.
12. the method for control automatic measurement of oscilloscope according to claim 1 is characterized in that, captures and shows that the step of the measurement of this measured signal more comprises:
The measurement that shows this measured signal of at least one measurement cursor on this oscillograph.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101636508A CN101413967B (en) | 2007-10-15 | 2007-10-15 | Method for controlling automatic measurement of oscilloscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101636508A CN101413967B (en) | 2007-10-15 | 2007-10-15 | Method for controlling automatic measurement of oscilloscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101413967A CN101413967A (en) | 2009-04-22 |
| CN101413967B true CN101413967B (en) | 2011-06-15 |
Family
ID=40594600
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007101636508A Expired - Fee Related CN101413967B (en) | 2007-10-15 | 2007-10-15 | Method for controlling automatic measurement of oscilloscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101413967B (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103176013B (en) * | 2011-12-22 | 2017-12-22 | 北京普源精电科技有限公司 | A kind of oscillograph and its implementation that can customize measurement range |
| CN103176008B (en) * | 2011-12-22 | 2017-08-25 | 北京普源精电科技有限公司 | A kind of oscillograph and its implementation with controllable measurement function |
| CN103185820B (en) * | 2011-12-29 | 2016-08-10 | 北京普源精电科技有限公司 | A kind of oscillograph with automatic cursor tracking function |
| CN103760394B (en) * | 2014-01-15 | 2017-02-15 | 广东威创视讯科技股份有限公司 | Automatic processing method and device for measured data of oscilloscope |
| CN108267627B (en) * | 2016-12-30 | 2021-08-13 | 北京普源精电科技有限公司 | Waveform end value calculation method and device and digital oscilloscope |
| CN108303577B (en) * | 2018-01-03 | 2020-07-24 | 威创集团股份有限公司 | Oscilloscope test method and device and oscilloscope |
| CN108267629A (en) * | 2018-01-26 | 2018-07-10 | 上海剑桥科技股份有限公司 | Oscillograph control method, equipment and system |
| CN110780100B (en) * | 2019-09-24 | 2020-09-22 | 北京航空航天大学 | Oscilloscope automatic setting method based on frequency rapid measurement algorithm |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5005145A (en) * | 1989-06-19 | 1991-04-02 | Tektronix, Inc. | Method and apparatus for calibrating a scan convertor |
| CN2378737Y (en) * | 1999-04-05 | 2000-05-17 | 林燕庆 | Electric circuit board automatic testing and signal waveform contrast equipment |
| EP1209472A2 (en) * | 2000-11-22 | 2002-05-29 | Tektronix, Inc. | Smart probe apparatus and method for automatic self-adjustment of an oscilloscope's bandwidth |
-
2007
- 2007-10-15 CN CN2007101636508A patent/CN101413967B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5005145A (en) * | 1989-06-19 | 1991-04-02 | Tektronix, Inc. | Method and apparatus for calibrating a scan convertor |
| CN2378737Y (en) * | 1999-04-05 | 2000-05-17 | 林燕庆 | Electric circuit board automatic testing and signal waveform contrast equipment |
| EP1209472A2 (en) * | 2000-11-22 | 2002-05-29 | Tektronix, Inc. | Smart probe apparatus and method for automatic self-adjustment of an oscilloscope's bandwidth |
Non-Patent Citations (2)
| Title |
|---|
| JP特开2004-102757A 2004.04.02 |
| JP特开平11-175143A 1999.07.02 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101413967A (en) | 2009-04-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101413967B (en) | Method for controlling automatic measurement of oscilloscope | |
| CN101865975B (en) | Main board testing system and method | |
| CN101231310B (en) | Voltage measurement instrument and method having improved automatic mode operation | |
| US20070027675A1 (en) | Spectrum analyzer control in an oscilloscope | |
| CN102819477B (en) | A kind of fault testing method of board and fault test card | |
| CN101900787A (en) | Test system and method of circuit board | |
| CN111190089B (en) | Method and device for determining jitter time, storage medium and electronic equipment | |
| CN107783069A (en) | The on-line calibration system and method for DC measurement in integrated circuit test system | |
| CN107966643B (en) | Interactive visualization device for real-time test data and implementation method thereof | |
| CN112067165A (en) | Temperature sensor precision testing system, testing method, testing device and storage medium | |
| CN114047378B (en) | Signal voltage detection method, system, equipment and server | |
| US11181581B2 (en) | Switching loss measurement and plot in test and measurement instrument | |
| CN113933694A (en) | Method and device for detecting running state of optical coupling relay | |
| KR20090041212A (en) | Tester automatic all-purpose and measurement method it uses | |
| JP2005512094A (en) | Context-sensitive toolbar | |
| JPH1090333A (en) | Test equipment and test method of apparatus characteristics | |
| KR100307709B1 (en) | signal processing method in automatic inspection system | |
| JP4382702B2 (en) | Environmental measurement system and environmental measurement program | |
| CN108169544B (en) | Voltage sag display method and device | |
| JP6965123B2 (en) | Data processing equipment, measurement system and data processing program | |
| CN115077888B (en) | Automatic testing method and system for performance of pillar structure | |
| TWI835494B (en) | Automatic measurement method for signal jitter | |
| CN111141941B (en) | Dual-channel oscilloscope, control method thereof and storage medium | |
| JP6935271B2 (en) | Display processing equipment, display equipment, measuring equipment and display programs | |
| US20240146387A1 (en) | Computer implemented method, measurement application device, and non-transitory computer readable medium |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110615 Termination date: 20161015 |