CN102819477B - A kind of fault testing method of board and fault test card - Google Patents

A kind of fault testing method of board and fault test card Download PDF

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Publication number
CN102819477B
CN102819477B CN201210311702.2A CN201210311702A CN102819477B CN 102819477 B CN102819477 B CN 102819477B CN 201210311702 A CN201210311702 A CN 201210311702A CN 102819477 B CN102819477 B CN 102819477B
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voltage
signal
module
board
main control
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CN201210311702.2A
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Chinese (zh)
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CN102819477A (en
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赵振伟
王卫钢
陈进
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曙光信息产业(北京)有限公司
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Abstract

Fault test card disclosed by the invention comprises: voltage acquisition module, for carrying out voltage acquisition to the voltage test points in InfiniBand board; Voltage comparison module, for receiving and judging the voltage data that collects whether in presetting voltage range, if not, then the bad instruction of output voltage; Clock signal acquisition module, for carrying out signals collecting to the clock test point of board, there is not instruction in main control module clock signal when not collecting clock signal; SPI signal acquisition module, for carrying out signals collecting to Flash SPI signal testing point, main control module exports SPI signal and there is not instruction when not collecting SPI signal; Reset signal acquisition module, for continuing to carry out signals collecting to reset signal test point in the signal acquisition periods preset, when main control module judging that the reset signal gathered has high level, exporting and resetting unsuccessful instruction.The invention also discloses a kind of fault test card.Adopt the present invention, InfiniBand board detection efficiency can be improved.

Description

A kind of fault testing method of board and fault test card

Technical field

The present invention relates to field of computer technology, more specifically, relate to a kind of fault testing method of the board based on infinite bandwidth InfiniBand technical design and a kind of fault test card.

Background technology

InfiniBand technology is a kind of high bandwidth, express network interconnection technique of open standard, be widely used in server and server (such as copies, distributed work etc.), server and memory device (such as storage area network SAN and direct storage attachments) and the communicating of (such as LAN, WAN and the Internet) between server and network.The data rate of current server field Infiniband technology has developed into QDR (Quad Data Rate, 4 haplotype data multiplying powers) and FDR (Fourteen Data Rate, 14 haplotype data speed), be respectively every port 40Gbps and 56Gbps.

But, for the Infiniband network interface card, switch etc. of these high speeds, be very easy to occur board hardware fault when manufacturing and producing, hardware analysis old process is only had to check failure cause for the method for this type of hardware maintenance at present, bothersome effort, and work efficiency is very low, the experienced fault analysis personnel of frequent needs spend a lot of time to judge, analysis of failure.

The method for maintaining of traditional Infiniband board needs according to step operation, and general measure, analysis one piece of plank at least need 30 minutes, and needs the very fast problem analysis of experienced personnel ability, and easily occurs problem of manually slipping.In server field, Infiniband network interface card and switch board etc. are substantially all scale of mass production, if continue to adopt manually in analysis and maintence board process, the time so expended and cost are huge.Therefore, be necessary to provide a kind of fault testing method that can reduce time and cost.

Summary of the invention

For solving prior art Problems existing, the invention provides a kind of fault testing method and fault test card of board, making it possible to fast testing plate card whether basic fault, thus the fault detection efficiency of board is provided.

According to an aspect of the present invention, provide a kind of fault testing method of board, described board is the board based on infinite bandwidth InfiniBand technical design, and described fault testing method comprises:

Voltage acquisition module carries out voltage acquisition to the predeterminated voltage test point in described board and sends the voltage data collected to voltage comparison module;

Described voltage comparison module judges the voltage data that collects whether in presetting voltage range, if not, then the bad instruction of output voltage;

The clock test point of clock signal acquisition module to described board carries out signals collecting, and main control module clock signal when described clock signal acquisition module does not collect clock signal does not exist instruction;

The SPI signal testing point of serial peripheral equipment interface SPI signal acquisition module to flash memory flash storage carries out signals collecting, and described main control module exports SPI signal and there is not instruction when described SPI signal acquisition module does not collect SPI signal;

Reset signal acquisition module continues to carry out signals collecting in the signal acquisition periods preset to the reset signal test point of described board, when described main control module judges that the reset signal gathered within the described information acquisition cycle has high level, export and reset unsuccessful instruction.

In an alternative embodiment, described fault testing method also comprises: four-way SFP QSFP interface loopback module receives data-signal from the QSFP interface transmitting terminal of described board, and described data-signal is sent to the QSFP interface iSCSI receiving end of described board; And

Described QSFP interface loopback module, when receiving described data-signal and the described data-signal of transmission is normal, exports and connects normal instruction, otherwise output malunion often indicates.

In an alternative embodiment, the voltage of described voltage acquisition module collection comprises 3.3V, 2.5V, 1.8V, 12V, 1.2V, 1.0V or 0.9V, or their combination in any.

According to the embodiment of the present invention, additionally provide a kind of fault test card, described fault test card comprises:

Voltage acquisition module, for carrying out voltage acquisition to the predeterminated voltage test point in the board based on infinite bandwidth InfiniBand technical design;

Voltage comparison module, for receiving the voltage data that described voltage acquisition module collects, and whether the voltage data that collects described in judging is in presetting voltage range, if not, then the bad instruction of output voltage;

Clock signal acquisition module, for carrying out signals collecting to the clock test point of described board, main control module is used for the clock signal when described clock signal acquisition module does not collect clock signal and there is not instruction;

Serial peripheral equipment interface SPI signal acquisition module, for carrying out signals collecting to the SPI signal testing point of the flash memory flash storage in described board, also there is not instruction for exporting SPI signal when described SPI signal acquisition module does not collect SPI signal in described main control module;

Reset signal acquisition module, for continuing to carry out signals collecting in the signal acquisition periods preset to the reset signal test point of described board, described main control module, also for when judging that the reset signal gathered in the described information acquisition cycle has low level, exporting and resetting unsuccessful instruction.

In an alternative embodiment, described fault test card also comprises:

Four-way SFP QSFP interface loopback module, receives data-signal for the QSFP interface transmitting terminal from described board, and described data-signal is sent to the QSFP interface iSCSI receiving end of described board; And when receiving described data-signal and the described data-signal of transmission is normal, exporting and connecting normal instruction, otherwise output malunion often indicates.

In an alternative embodiment, described fault test card also comprises power supply provides module, for providing electric energy for described voltage acquisition module, voltage comparison module and main control module; Or,

For described voltage acquisition module, voltage comparison module, main control module and QSFP interface loopback module provide electric energy.

In an alternative embodiment, described fault test card also comprises display module, for display section or all indicate.

In an alternative embodiment, the voltage of described voltage acquisition module collection comprises 3.3V, 2.5V, 1.8V, 12V, 1.2V, 1.0V or 0.9V, or their combination in any.

In an alternative embodiment, described fault test card comprises one of following or combination in any:

When described voltage comparison module judges that the voltage data that collects is in presetting voltage range, output voltage indicates well;

There is instruction in described main control module clock signal when described clock signal acquisition module collects clock signal;

Described main control module exports SPI signal and there is instruction when described SPI signal acquisition module collects SPI signal;

When described main control module judges that the reset signal that described reset signal acquisition module gathers within the described information acquisition cycle is all low level, output resets and successfully indicates.

In an alternative embodiment, described main control module, when receiving voltage that described voltage comparison module collects and indicating well and determine that clock signal exists, SPI signal exists and resets successfully, exports described board and tests by indicating.

Adopt fault testing method and the fault test card of the board of the embodiment of the present invention, conventional testing process can be substituted, and quick position goes out basic board faults, thus the labor capacity of tester can be greatly reduced.And, make do not have the tester of InfiniBand board knowledge also easily can judge the problem fault of board

Accompanying drawing explanation

Fig. 1 is the structural representation of the fault test card of test I nfiniBand board according to an embodiment of the invention.

Fig. 2 is the structural representation of the fault test card of test I nfiniBand board according to another embodiment of the present invention.

Fig. 3 is the method flow schematic diagram according to an embodiment of the invention InfiniBand board being carried out to fault test.

Embodiment

Below in conjunction with accompanying drawing, the present invention is described in detail.

Fig. 1 is the structural representation of the fault test card of test I nfiniBand board according to an embodiment of the invention.As shown in Figure 1, the fault test card of the embodiment of the present invention comprises voltage acquisition module 10, voltage comparison module 12, clock signal acquisition module 20, serial peripheral equipment interface SPI signal acquisition module 30, reset signal acquisition module 40 and main control module 50.

Voltage acquisition module 10, for carrying out voltage acquisition to the predeterminated voltage test point in the board based on infinite bandwidth InfiniBand technical design.

Wherein, voltage acquisition module can be analog/digital signal (A/D) modular converter.Particularly, for the voltage must measured in Infiniband board, the related circuit of Infiniband board arranges voltage test points, then A/D modular converter can gather the voltage of such voltage test points.

For existing Infiniband board, the main voltage gathered that needs can have 3.3V, 2.5V, 1.8V, 12V, 1.2V, 1.0V, 0.9V.

Voltage comparison module 12 is connected with voltage acquisition module 10 and main control module 50.Voltage comparison module can be comparer.The voltage data that voltage comparison module 12 collects for receiver voltage acquisition module 10, and judge the voltage data that collects whether in presetting voltage range, if not, then the bad instruction of output voltage; If so, then output voltage well indicates.

In an alternative embodiment, presetting voltage range be generally add on the voltage that each test point is corresponding 5% range, as the voltage for 3.3V, so presetting voltage range is between 3.315V-3.465V.If the voltage recorded from test point between, then can export the good signal of a 3.3V voltage to main control module 50; Otherwise then can export the bad signal of a 3.3V voltage.In an embodiment, corresponding instruction is passed to display module display by main control module 50.In another embodiment, main control module is sounded when receiving the bad instruction of voltage alerting signal.

In an alternative embodiment, being also can be that bad for voltage instruction or voltage bad instruction are directly passed to display module by voltage comparison module 12.

Clock signal acquisition module 20, for carrying out signals collecting to the clock test point of described board, there is not instruction in main control module 50 clock signal when described clock signal acquisition module does not collect clock signal.

Clock Clock signal acquisition module 20 is for by clock Clock signals collecting out.In one embodiment, Clock signal acquisition module 20 can be A/D modular converter, because the Clock signal frequency in Infiniband board is general very high, and such as 50MHz, 100MHz, 156.25MHz.Therefore A/D modular converter collection here can not be very accurate, can only verify whether Clock signal has output.Main control module 50 can send a Clock to display module and there is signal after demonstrating the existence of Clock signal; Otherwise send Clock and there is not signal.

Serial peripheral equipment interface SPI signal acquisition module 30, for carrying out signals collecting to the SPI signal testing point of the flash memory flash storage in described board, main control module 50 exports SPI signal and there is not instruction when described SPI signal acquisition module does not collect SPI signal.

SPI signals collecting is similar to Clock signals collecting, also can be completed by A/D modular converter.SPI signal generally board power on or lower electricity time exist, exist if capture SPI signal, main control module 50 can send SPI to display module exist signal, otherwise sends SPI and there is not signal.

Reset Reset signal acquisition module 40, for continuing to carry out signals collecting in the signal acquisition periods preset to the reset signal test point of described board, when main control module 50 judges that reset signal is all low level within the described information acquisition cycle, export and reset unsuccessful instruction.Wherein, signal acquisition periods can be greater than 100 milliseconds.

Similarly, Reset signal acquisition module also can be A/D modular converter.Due to the particular provisions of Infiniband board, therefore the Reset signal acquisition module collection Reset signal demand duration is greater than 100ms.And, Reset signal not only wants A/D modular converter to sample out Low level effective, also to ensure it is all low level within the time being greater than 100ms, same, send Reset pass signal to display module when the Reset signal that main control module 50 can record in signal acquisition periods is all low level; Otherwise send the unsuccessful signal of Reset.

In embodiments of the present invention, main control module 50 refers to the module for whole Data acquisition and issuance provides data-handling capacity and communicates with display module; In order to increase the ability of process data, main control module 50 can adopt the contour performance chip of ARM.

Fig. 2 is the structural representation of the fault test card of test I nfiniBand board according to another embodiment of the present invention.

In embodiments of the present invention, fault test card comprises the voltage acquisition module 10 shown in Fig. 1, voltage comparison module 12, clock signal acquisition module 20, serial peripheral equipment interface SPI signal acquisition module 30, reset signal acquisition module 40 and main control module 50.In addition, fault test card also comprises: four-way SFP QSFP interface loopback module 60, receives data-signal, and data-signal is sent to the QSFP interface iSCSI receiving end of described board for the QSFP interface transmitting terminal from board; And when receiving described data-signal and the described data-signal of transmission is normal, exporting and connecting normal instruction, otherwise output malunion often indicates.

Like this, when an interface of fault test card is connected with the QSFP interface transmitting terminal of board and another interface be connected with the QSFP interface iSCSI receiving end of board, the data-signal winding of board can be got up and tests.And in prior art, for testing this function, need tested board to be connected with another Infiniband board by Infiniband cable to test.Which further improves testing efficiency and decrease unnecessary cost.

In an alternative embodiment, fault test card also comprises power supply provides module 70, for providing electric energy for described voltage acquisition module, voltage comparison module and main control module and QSFP interface loopback module etc.

In an alternative embodiment, main control module receive voltage that described voltage comparison module collects good and determine that clock signal exists, SPI signal exists and resets successfully time, export described board and test by indicating.

Fig. 3 is the method flow schematic diagram according to an embodiment of the invention InfiniBand board being carried out to fault test.With reference to figure 3, the method for this fault test comprises:

S101, voltage acquisition module carries out voltage acquisition to the predeterminated voltage test point in described board and sends the voltage data collected to voltage comparison module.

S102, voltage comparison module judges the voltage data that collects whether in presetting voltage range, if not, then the bad instruction of output voltage.Alternatively or in addition, voltage comparison module can also when the voltage data judging to collect be in presetting voltage range, and output voltage indicates well.

S103, the clock test point of clock signal acquisition module to described board carries out signals collecting, and main control module clock signal when described clock signal acquisition module does not collect clock signal does not exist instruction.Alternatively or in addition, there is instruction in main control module clock signal when clock signal acquisition module collects clock signal.

S104, the SPI signal testing point of serial peripheral equipment interface SPI signal acquisition module to the flash memory flash storage in board carries out signals collecting, and described main control module exports SPI signal and there is not instruction when described SPI signal acquisition module does not collect SPI signal.Alternatively or in addition, main control module exports SPI signal and there is instruction when SPI signal acquisition module collects SPI signal.

S105, reset signal acquisition module continues to carry out signals collecting in the signal acquisition periods preset to the reset signal test point of described board, when main control module judges that the reset signal gathered within the information acquisition cycle has high level, export and reset unsuccessful instruction.Alternatively or in addition, when the reset signal that main control module is judged to gather within the information acquisition cycle is all low level, exports to reset and successfully indicate.

Above-mentioned each module and the specific works that the module related to is described below please refer to the part in this instructions, fault test being sticked into line description, do not repeat them here.

In an alternative embodiment, described fault testing method also comprises: four-way SFP QSFP interface loopback module receives data-signal from the QSFP interface transmitting terminal of described board, and described data-signal is sent to the QSFP interface iSCSI receiving end of described board; And described QSFP interface loopback module is when receiving described data-signal and the described data-signal of transmission is normal, exports and connecting normal instruction, otherwise output malunion often indicates.

In an alternative embodiment, the voltage of described voltage acquisition module collection comprises 3.3V, 2.5V, 1.8V, 12V, 1.2V, 1.0V or 0.9V, or their combination in any.

Adopt fault testing method and the fault test card of the board of the embodiment of the present invention, conventional testing process can be substituted, and quick position goes out basic board faults, and test result can be shown.This fault testing method and fault test card can greatly reduce the labor capacity of tester, and, can make do not have the tester of InfiniBand board knowledge also easily can judge the problem fault of board

The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention, within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.

Claims (8)

1. a fault testing method for board, described board is the board based on infinite bandwidth InfiniBand technical design, and described fault testing method comprises:
Voltage acquisition module carries out voltage acquisition to the predeterminated voltage test point in described board and sends the voltage data collected to voltage comparison module;
Described voltage comparison module judges the voltage data that collects whether in presetting voltage range, if not, then the bad instruction of output voltage;
The clock test point of clock signal acquisition module to described board carries out signals collecting, and main control module clock signal when described clock signal acquisition module does not collect clock signal does not exist instruction;
The SPI signal testing point of serial peripheral equipment interface SPI signal acquisition module to the flash memory flash storage in board carries out signals collecting, and described main control module exports SPI signal and there is not instruction when described SPI signal acquisition module does not collect SPI signal;
Reset signal acquisition module continues to carry out signals collecting in the signal acquisition periods preset to the reset signal test point of described board, when described main control module judges that the reset signal gathered in described signal acquisition periods has high level, export and reset unsuccessful instruction;
In addition, described fault testing method comprises one of following or combination in any further:
When described voltage comparison module judges that the voltage data that collects is in presetting voltage range, output voltage indicates well;
There is instruction in described main control module clock signal when described clock signal acquisition module collects clock signal;
Described main control module exports SPI signal and there is instruction when described SPI signal acquisition module collects SPI signal;
When described main control module judges that the reset signal that described reset signal acquisition module gathers in described signal acquisition periods is all low level, output resets and successfully indicates;
Described main control module, when receiving voltage that described voltage comparison module collects and indicating well and determine that clock signal exists, SPI signal exists and resets successfully, exports described board and tests by indicating.
2. fault testing method according to claim 1, is characterized in that, described fault testing method also comprises:
Four-way SFP QSFP interface loopback module receives data-signal from the QSFP interface transmitting terminal of described board, and described data-signal is sent to the QSFP interface iSCSI receiving end of described board;
Described QSFP interface loopback module, when receiving described data-signal and the described data-signal of transmission is normal, exports and connects normal instruction, otherwise output malunion often indicates.
3. fault testing method according to claim 1, is characterized in that, the voltage of described voltage acquisition module collection comprises 3.3V, 2.5V, 1.8V, 12V, 1.2V, 1.0V or 0.9V, or their combination in any.
4. a fault test card, described fault test card comprises:
Voltage acquisition module, for carrying out voltage acquisition to the predeterminated voltage test point in the board based on infinite bandwidth InfiniBand technical design;
Voltage comparison module, for receiving the voltage data collected that described voltage acquisition module sends, and whether the voltage data that collects described in judging is in presetting voltage range, if not, then the bad instruction of output voltage;
Clock signal acquisition module, for carrying out signals collecting to the clock test point of described board, main control module is used for the clock signal when described clock signal acquisition module does not collect clock signal and there is not instruction;
Serial peripheral equipment interface SPI signal acquisition module, for carrying out signals collecting to the SPI signal testing point of the flash memory flash storage in described board, also there is not instruction for exporting SPI signal when described SPI signal acquisition module does not collect SPI signal in described main control module;
Reset signal acquisition module, for continuing to carry out signals collecting in the signal acquisition periods preset to the reset signal test point of described board, described main control module, also for when judging that the reset signal gathered in described signal acquisition periods has high level, exporting and resetting unsuccessful instruction;
Wherein, described fault test card comprises one of following or combination in any:
When described voltage comparison module judges that the voltage data that collects is in presetting voltage range, output voltage indicates well;
There is instruction in described main control module clock signal when described clock signal acquisition module collects clock signal;
Described main control module exports SPI signal and there is instruction when described SPI signal acquisition module collects SPI signal;
When described main control module judges that the reset signal that described reset signal acquisition module gathers in described signal acquisition periods is all low level, output resets and successfully indicates;
Wherein, described main control module, when receiving voltage that described voltage comparison module collects and indicating well and determine that clock signal exists, SPI signal exists and resets successfully, exports described board and tests by indicating.
5. fault test card according to claim 4, is characterized in that, described fault test card also comprises:
Four-way SFP QSFP interface loopback module, receives data-signal for the QSFP interface transmitting terminal from described board, and described data-signal is sent to the QSFP interface iSCSI receiving end of described board; And when receiving described data-signal and the described data-signal of transmission is normal, exporting and connecting normal instruction, otherwise output malunion often indicates.
6. the fault test card according to claim 4 or 5, is characterized in that, described fault test card also comprises power supply provides module, for providing electric energy for described voltage acquisition module, voltage comparison module and main control module; Or
For described voltage acquisition module, voltage comparison module, main control module and QSFP interface loopback module provide electric energy.
7. the fault test card according to claim 4 or 5, is characterized in that, described fault test card also comprises display module, for display section or all indicate.
8. fault test card according to claim 4, is characterized in that, the voltage of described voltage acquisition module collection comprises 3.3V, 2.5V, 1.8V, 12V, 1.2V, 1.0V or 0.9V, or their combination in any.
CN201210311702.2A 2012-08-28 2012-08-28 A kind of fault testing method of board and fault test card CN102819477B (en)

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CN103279407B (en) * 2013-05-31 2015-09-09 大唐移动通信设备有限公司 A kind of off-line test system of ATCA veneer and subtest board
CN104298578B (en) * 2014-10-31 2017-10-13 上海原动力通信科技有限公司 Test device, system and method for board double loop power supply
CN105823938A (en) * 2015-01-04 2016-08-03 上海恩艾仪器有限公司 Method for detecting state of output board card
CN105824000A (en) * 2015-01-04 2016-08-03 上海恩艾仪器有限公司 Method for calibrating output board card
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CN107203243A (en) * 2017-05-24 2017-09-26 郑州云海信息技术有限公司 A kind of device and method of management system clock
CN107707909A (en) * 2017-10-12 2018-02-16 威创集团股份有限公司 The detection method and device of splicing device system board

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