CN103941119B - A kind of multifunction programable signal generation parameter test system - Google Patents
A kind of multifunction programable signal generation parameter test system Download PDFInfo
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Abstract
A kind of multifunction programable signal generation parameter test system, is provided with central processing unit, memory, clock generator and PLC technology signal generating source system, data collecting system, digital signal processor and functional circuit real-time selected control module on the same tile on system substrate or on the circuit substrate of same system in package.PLC technology signal generating source system, generates the waveform voltage pumping signal set, and functional circuit real-time selected control module controls the test signal of its interior signal generator external testee of module output drive；The stress reaction analog electrical signal of the external testee of data acquisition system is also converted to stress reaction data signal；Digital signal processor processes the stress reaction data signal that data collecting system produces real-time.Invention enhances the test system reliability in high-frequency high-speed test condition, improve electromagnetism interference effect, it is achieved the collaborative test of Multifunctional height is measured, and reduces cost and takes up an area space.
Description
Technical field
The present invention relates to electrical measurement technical field, be specifically related to a kind of multifunction programable signal generation parameter test system.
Background technology
Electrical measurement is the method utilizing electronic technology to measure, and its baseband signal analysis is mainly time-domain analysis and frequency-domain analysis.Time domain measurement refers to the measurement studying tested parameter with variant time t relation, it can be further divided into time domain steady state measurement and time domain transient and measure, and is specially the response on the system under test (SUT) single time to signal after the temporal response measurement of signal and individual signals are triggered by system under test (SUT) after repeatability signal triggers.Frequency domain measurement is then the measurement studying tested parameter with variable frequency f relation, does not the most consider time factor in frequency domain measurement, and during measurement, system is in stable state, therefore is also called steady state measurement or measures stable response；Frequency domain measurement can be realized by two kinds of methods: the first carries out the collection of time domain to signal, then it is carried out Fourier transform, converts thereof into frequency-region signal, and this method is used primarily in low frequency signal analysis；It two is that the superheterodyne reception directly received by circuit hardware directly scans tuning analysis and carries out frequency domain measurement.Measuring application aspect at concrete element, material and device, existing electronic measuring instrument is mainly signal generator, digital oscilloscope and all kinds of parameter tester based on digital oscilloscope.Particularly digital oscilloscope, it can be used to study signal transient amplitude relation over time, it is also possible to is used for measuring the transient characteristics such as the amplitude of pulse, rise time, can realize spectral characteristic measurement by Fourier transform.By means of various converters, it can also be used to observe various non electrical quantity, such as change procedures such as temperature, pressure, flow, bio signal, magnetics signals.Measure the different of the performances such as parameter, measure the item, range, accuracy, frequency range, function, display mode, general and special, individual event and integration test according to it, it is numerous and jumbled that electronic measuring instrument has been divided into class, all kinds of electronic measuring instruments various in style.Owing to element, material and device electronic measuring instrument are of a great variety and most function singleness, but modern electronic devices Research tendency is measured in many reference amounts, systematicness, therefore general Study mechanism or electronic product exploitation unit the most all can configure the equipment such as various signal generator, digital oscilloscope, time domain class parameter tester and frequency domain class parameter tester.But owing to self function of each equipment limits, researcher is difficult to make these equipment realize high Collaboration test and measures, and the configuration of the most equipment too increases the funds burden of institutional units purchase of equipment and takies the storage area that laboratory is valuable.
At present, along with the raising of various electrical application system speeds, accurately measure the difficulty with repeatable measurement and be gradually increased.It is true that every wire has capacity effect, inductive effect and the electricresistance effect with frequency dependence.When low frequency low-speed situations, these effects can be ignored, and interconnection is modeled as lumped capacity or simple delay line；But when high-frequency high-speed situation, they all be can not ignore, and wire at this moment is not only wire, and be one and have the distributed parasitic element postponed with transient impedance, the element that it can couple with the most all devices, these devices include power supply, earthing or grounding means and other wires etc..At this moment signal not exists entirely in wire, but mixes with all localized electromagnetic field around wire, causes the signal on an interconnection vias to influence each other with the signal on another interconnection vias.It addition, in high-frequency high-speed occasion, the interaction of complexity also can occur between the different piece (such as encapsulation, connector, via and corner) of same interconnection vias.All these high speed effects often produce distortion and the waveform of distortion.Therefore in Modern High-Speed circuit design, chip parameter to be considered and the distributed system impact on integrated circuit, after it is also contemplated that the system integration, the electromagnetic compatibility characteristic etc. of system printed circuit domain (PCB) affects, and these have all been significantly greatly increased conventional panels level high-frequency high-speed circuit design difficulty.
For the most highly integrated chip, this traditional distributed function complex art trends towards gradually being replaced by SOC(system on a chip) (SOC, system on chip) integrated technology or system in package (SIP, system in package) integrated technology.SOC(system on a chip) refers to the repertoire system needed for integrated electronic product on a single chip；And system in package refers to the nude film of difference in functionality with tiling or overlap mode, surface is installed or embedment substrate, passive element as much as possible is imbedded substrate simultaneously, makes functional substrate, and the active component and passive element that can not imbed only is installed on surface.High integration both can reduce printed circuit board sizes and the number of plies, reduces integral material cost, effectively reduces manufacture and the operating cost of end product, improves production efficiency.And SOC(system on a chip) and system in package all have good electromagnetic interference inhibition.
Therefore, if using SOC(system on a chip) or system in package mode highly integrated together general various electrical measurement equipment, the test system reliability in high-frequency high-speed test condition can not only be greatly enhanced, improve electromagnetism interference effect, realize the collaborative test of Multifunctional height to measure, reduce cost and take up an area space, there is huge scientific research and economic benefit, but, there is no this type of multifunctional signal parameter test system a kind of so far on market emerge owing to various technology limit.
Summary of the invention
It is of a great variety that the task of the present invention is intended to solve current element, material and device electronic measuring instrument, function singleness mostly, cost is high, take up an area space big, it is difficult in the high-frequency high-speed accurate duplicate measurements of test condition high reliability, it is difficult to the drawbacks such as Multifunctional height collaborative test measurement, it is provided that a kind of multifunction programable signal generation parameter test system based on SOC(system on a chip) substrate or system in package substrate.
The basic technical scheme of the present invention is:
A kind of multifunction programable signal generation parameter test system, including central processing unit, memory and clock generator, it is characterised in that: it is provided with tiling or overlapped way on system substrate or on same system in package substrate on the same tile
Described central processing unit, described memory, described clock generator and PLC technology signal generating source system, data collecting system, digital signal processor and functional circuit real-time selected control module；
Memory internal memory contains program control instruction and the data message of the waveform voltage pumping signal for generating setting that user sets；
The data that central processing unit controls test system in real time according to the program control instruction set in memory process and sequential operation；
Clock generator, provides to system in real time and controls clock；
PLC technology signal generating source system, generate the waveform voltage pumping signal set according to the program control instruction set in memory, functional circuit real-time selected control module instructs the test signal controlling its interior signal generator external testee of module output drive according to the selected control of central processing unit；
Data collecting system, the modular combined multi-functional parametric testing module in Real-time Collection functional circuit real-time selected control module gathers the stress reaction analog electrical signal of external testee and is converted to stress reaction data signal；
Digital signal processor, processes, according to the algorithm routine set in memory, the stress reaction data signal that data collecting system produces real-time；
Functional circuit real-time selected control module, according to the program control instruction set in memory real-time selected control modular combined multi-functional parametric testing module.
The further improvement project of the present invention includes:
Described SOC(system on a chip) substrate is the semiconductor integrated circuit chip of single-chip.
Described system in package substrate is the multi-chip semiconductor IC substrate package of system in package, and each chip uses direct-coupled type, one or more packing forms of flush type between horizontal, intraconnection stack based on substrate, sheet to be encapsulated in a base plate for packaging.
It is connected with a computer with described central processing unit.
Described modular combined multi-functional parametric testing module includes:
Described signal generator module；
Time domain parameter test module, for measuring the parameter information relevant to variant time, and is converted into electrical parameter information；
Frequency domain parameter test module, is used for the parameter information of measurement and frequency dependence and is converted into electrical parameter information；
And/or
Digital Oscillograph Module, for showing the tested electrical parameter information of described external testee.
Described PLC technology signal generating source system is one or more in waveform signal occurring source, pulse signal occurring source, function signal occurring source, swept-frequency signal occurring source.
Described PLC technology signal generating source system, the number of described data collecting system are one or more.
Described time domain parameter test module, described frequency domain parameter test module are one or more in parameter analyzer, device analysis instrument, impedance instrument, frequency characteristic measurement instrument, spectrum analyzer, ferroelectricity measuring and analysing meter, magnetics test system.
Being provided with Fourier transform transition module in described digital signal processor, the time-domain signal that described time domain parameter test module is surveyed is converted to frequency-region signal by Fourier transform transition module.
Described frequency domain parameter test module is that circuit is analyzed in a kind of scanning tuning；One or more modules in described functional circuit real-time selected control module control module formula combined multi-functional parametric testing module simultaneously or sequentially.
Advantages of the present invention:
Multifunction programable signal generation parameter test system of the present invention is utilized can effectively to overcome current element, material and device electronic measuring instrument of a great variety, function singleness mostly, cost is high, take up an area space big, it is difficult in the high-frequency high-speed accurate duplicate measurements of test condition high reliability, it is difficult to the drawbacks such as Multifunctional height collaborative test measurement, strengthen the test system reliability in high-frequency high-speed test condition, improve electromagnetism interference effect, realize the collaborative test of Multifunctional height to measure, reduce cost and take up an area space.
Accompanying drawing explanation
Fig. 1 is the general structure block diagram of multifunction programable signal generation parameter test system of the present invention；
Fig. 2 is the frequency domain parameter test job procedure chart of Fig. 1；
Fig. 3 is the time domain parameter test job procedure chart of Fig. 1；
Fig. 4 is the signal generator process chart of Fig. 1.
Detailed description of the invention
Describe the present invention below in conjunction with the drawings and specific embodiments.
As it is shown in figure 1, be the general structure block diagram of multifunction programable signal generation parameter test system of the present invention.
This multifunction programable signal generation parameter test system, including central processing unit 101, memory 102, clock generator 104, PLC technology signal generating source system 103, data collecting system 105, digital signal processor 106 and functional circuit real-time selected control module 107, modularization selected control can complete signal generator, time domain parameter test, frequency domain parameter test and digital oscilloscope several functions respectively.
PLC technology signal generating source system 103 is one or more in waveform signal occurring source, pulse signal occurring source, function signal occurring source, swept-frequency signal occurring source.PLC technology signal generating source system 103 is to have frequency sweep to arrange the random waveform occurring source of function, can produce the multiple basic waveform including sine wave, triangular wave, sawtooth waveforms, square wave and impulse wave, and the complicated random waveform that user is self-editing.The number of PLC technology signal generating source system 103 and data collecting system 105 is one or more.
SOC(system on a chip) substrate is the semiconductor integrated circuit chip of single-chip.System in package substrate is the multi-chip semiconductor IC substrate package of system in package, and each chip uses direct-coupled type, one or more packing forms of flush type between horizontal, intraconnection stack based on substrate, sheet to be encapsulated in a base plate for packaging.
Embodiment one:
In conjunction with Fig. 1-3, the time domain parameter test module 120 of the present embodiment shows as ferroelectricity tester module, and frequency domain parameter test module 130 shows as sweep-frequency Békésy audiometer frequency spectrograph module.
Time domain parameter test module 120, frequency domain parameter test module 130 are one or more in parameter analyzer, device analysis instrument, impedance instrument, frequency characteristic measurement instrument, spectrum analyzer, ferroelectricity measuring and analysing meter, magnetics test system.
Frequency domain parameter test module 130 is that circuit is analyzed in a kind of scanning tuning；One or more modules in functional circuit real-time selected control module 107 control module formula combined multi-functional parametric testing module simultaneously or sequentially.
Computer 001, it operates for systems soft ware, can be connected with central processing unit 101 by serial ports or parallel port；Central processing unit 101, its data controlling test system in real time according to the program control instruction set in memory 102 process and sequential operation (in other words it can arrange data process and the sequential operation of control test system according to the program of user).Memory 102 is connected with central processing unit 101, is stored with user and sets program control instruction and the data message of the waveform voltage pumping signal for generating setting in the inner；PLC technology signal generating source system 103, generate the waveform voltage pumping signal set according to the program control instruction set in memory 102, functional circuit real-time selected control module 107 instructs the test signal controlling its interior signal generator module 110 external testee of output drive according to the selected control of central processing unit 101；Clock generator 104, provides precise and stable control clock to system, in order to the functions such as accurate control signal generation, reading, data storage, transmission in real time.
Data collecting system 105, the modular combined multi-functional parametric testing module in Real-time Collection functional circuit real-time selected control module 107 gathers the stress reaction analog electrical signal of external testee and is converted to stress reaction data signal；Digital signal processor 106 is for processing data signal real-time according to the algorithm sequential of program setting, particularly it is provided with Fourier transform transition module in digital signal processor 106, the time-domain signal that time domain parameter test module 120 is surveyed is converted to frequency-region signal by the Fourier transform transition module using Fourier transformation computation method, thus realizes spectrum measurement function.
Functional circuit real-time selected control module 107, according to the program control instruction set in memory 102 real-time selected control modular combined multi-functional parametric testing module.Modular combined multi-functional parametric testing module includes:
Signal generator module 110；
Show as the time domain parameter test module 120 of ferroelectricity tester, for measuring the parameter information relevant to variant time, and be converted into electrical parameter information；
Show as the frequency domain parameter test module 130 of sweep-frequency Békésy audiometer frequency spectrograph, be used for the parameter information of measurement and frequency dependence and be converted into electrical parameter information；
And/or
Digital Oscillograph Module 140, for showing the tested electrical parameter information of described external testee.
This functional circuit real-time selected control module 107 can gate an independent execution task in aforementioned four modular combined multi-functional parametric testing module, or the multiple modules of gating control perform or order execution task jointly simultaneously.
Embodiment two:
In conjunction with Fig. 1 or 3, this embodiment discloses the course of work block diagram of the time domain parameter test module showing as ferroelectricity tester module.
First, control PLC technology signal generating source system 103 by central processing unit 101 and generate the waveform voltage pumping signal that user edits, waveform voltage pumping signal is input to show as the time domain parameter test module 120 of ferroelectricity tester, and central processing unit 101 controls time domain parameter test module 120 and exports 121 output waveform voltage excitation signals by signal.Central processing unit 101 controls time domain parameter test module 120 and synchronizes by the signal input 122 tested response signal of reception, and data collecting system 105 is simulated signals collecting and is converted into data signal afterwards；Central processing unit 101 directly receives the digital signal information of data collecting system 105 according to user setup or processes, according to (setting) algorithm routine that user is stored in memory 102, the stress reaction data signal that data collecting system 105 produces by digital signal processor 106 real-time；Last computer 001 shows and preserves signal message, i.e. realizes ferroelectricity tester function.
Embodiment three:
In conjunction with Fig. 1 or 4, this embodiment discloses the course of work block diagram of signal generator module 110.
First, control PLC technology signal generating source system 103 by central processing unit 101 and generate the waveform voltage pumping signal that user edits, the waveform voltage pumping signal that PLC technology signal generating source system 103 generates is input to signal generator module 110, central processing unit 101 control signal generator module 110 exports 112 output waveform voltage excitation signals by signal, selectively by triggering output 111 synchronism output trigger output signals, i.e. realize signal generator function.
Certainly; the present invention also can have other various embodiments; in the case of without departing substantially from present invention spirit and essence thereof; those of ordinary skill in the art are when making various corresponding change and deformation according to the present invention, but these change accordingly and deform the protection domain that all should belong to appended claims of the invention.
Claims (10)
1. a multifunction programable signal generation parameter test system, including central processing unit, memory and clock generator, it is characterised in that: it is provided with tiling or overlapped way on system substrate or on same system in package substrate on the same tile
Described central processing unit, described memory, described clock generator and PLC technology signal generating source system, data collecting system, digital signal processor and functional circuit real-time selected control module；
Memory internal memory contains program control instruction and the data message of the waveform voltage pumping signal for generating setting that user sets；
The data that central processing unit controls test system in real time according to the program control instruction set in memory process and sequential operation；
Clock generator, provides to system in real time and controls clock；
PLC technology signal generating source system, generate the waveform voltage pumping signal set according to the program control instruction set in memory, functional circuit real-time selected control module instructs the test signal controlling its interior signal generator external testee of module output drive according to the selected control of central processing unit；
Data collecting system, the modular combined multi-functional parametric testing module in Real-time Collection functional circuit real-time selected control module gathers the stress reaction analog electrical signal of external testee and is converted to stress reaction data signal；
Digital signal processor, processes, according to the algorithm routine set in memory, the stress reaction data signal that data collecting system produces real-time；
Functional circuit real-time selected control module, according to the program control instruction set in memory real-time selected control modular combined multi-functional parametric testing module.
Multifunction programable signal generation parameter test system the most according to claim 1, it is characterised in that: described SOC(system on a chip) substrate is the semiconductor integrated circuit chip of single-chip.
Multifunction programable signal generation parameter test system the most according to claim 1, it is characterized in that: described system in package substrate is the multi-chip semiconductor IC substrate package of system in package, each chip uses direct-coupled type, one or more packing forms of flush type between horizontal, intraconnection stack based on substrate, sheet to be encapsulated in a base plate for packaging.
Multifunction programable signal generation parameter test system the most according to claim 1, it is characterised in that: it is connected with a computer with described central processing unit.
5. according to the multifunction programable signal generation parameter test system described in any claim in claim 1-4, it is characterised in that: described modular combined multi-functional parametric testing module includes:
Signal generator module；
Time domain parameter test module, for measuring the parameter information relevant to variant time, and is converted into electrical parameter information；
Frequency domain parameter test module, is used for the parameter information of measurement and frequency dependence and is converted into electrical parameter information；
And/or
Digital Oscillograph Module, for showing the tested electrical parameter information of described external testee.
Multifunction programable signal generation parameter test system the most according to claim 5, it is characterised in that: described PLC technology signal generating source system is one or more in waveform signal occurring source, pulse signal occurring source, function signal occurring source, swept-frequency signal occurring source.
Multifunction programable signal generation parameter test system the most according to claim 6, it is characterised in that: described PLC technology signal generating source system, the number of described data collecting system are one or more.
Multifunction programable signal generation parameter test system the most according to claim 5, it is characterised in that: described time domain parameter test module, described frequency domain parameter test module are one or more in parameter analyzer, device analysis instrument, impedance instrument, frequency characteristic measurement instrument, spectrum analyzer, ferroelectricity measuring and analysing meter, magnetics test system.
Multifunction programable signal generation parameter test system the most according to claim 5, it is characterized in that: be provided with Fourier transform transition module in described digital signal processor, the time-domain signal that described time domain parameter test module is surveyed is converted to frequency-region signal by Fourier transform transition module.
Multifunction programable signal generation parameter test system the most according to claim 5, it is characterised in that: described frequency domain parameter test module is that circuit is analyzed in a kind of scanning tuning；One or more modules in described functional circuit real-time selected control module control module formula combined multi-functional parametric testing module simultaneously or sequentially.
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| CN105353244A (en) * | 2015-11-16 | 2016-02-24 | 陕西航空电气有限责任公司 | Test method of voltage distortion frequency spectrum test |
| CN108614228A (en) * | 2018-05-23 | 2018-10-02 | 中国电子科技集团公司第四十研究所 | Test device, system and the equipment of module occur for broadband multiple spot reference signal |
| CN109001578B (en) * | 2018-08-27 | 2021-11-23 | 苏州华兴源创科技股份有限公司 | Testing device and method for detecting CELL panel signal generator |
| CN110307883B (en) * | 2019-05-13 | 2021-10-12 | 南京罕华流体技术有限公司 | Working condition calibration circuit for industrial metering |
| CN110307884B (en) * | 2019-05-13 | 2021-11-19 | 南京罕华流体技术有限公司 | Working condition calibration device for industrial metering |
| CN113804992A (en) * | 2020-06-16 | 2021-12-17 | 普源精电科技股份有限公司 | Test function module, multifunctional test system and method |
| CN113804937A (en) * | 2020-06-16 | 2021-12-17 | 普源精电科技股份有限公司 | Multifunctional measuring equipment, resource allocation method, measuring method, device and medium |
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