CN109001578B - Testing device and method for detecting CELL panel signal generator - Google Patents

Testing device and method for detecting CELL panel signal generator Download PDF

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CN109001578B
CN109001578B CN201810979584.XA CN201810979584A CN109001578B CN 109001578 B CN109001578 B CN 109001578B CN 201810979584 A CN201810979584 A CN 201810979584A CN 109001578 B CN109001578 B CN 109001578B
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cell panel
signal generator
signal
unit
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CN109001578A (en
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陆跟成
张可可
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Suzhou HYC Technology Co Ltd
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Suzhou HYC Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Abstract

The invention discloses a testing device and a method for detecting a CELL panel signal generator, wherein the testing device comprises: the device comprises a main control unit, a channel switching unit, an analog-to-digital conversion unit, a calculation unit and a display unit, wherein the main control unit controls the channel switching unit to receive channel signals output by each channel of a CELL panel signal generator one by one, the analog-to-digital conversion unit converts the channel signals received by the channel switching unit into digital signals, the calculation unit calculates parameters of the channel signals according to the digital signals, and the display unit displays channel signal waveforms determined by the parameters of the channel signals. The testing device and the method provided by the invention can test the channel signals output by each channel under the conditions of no load and load of the CELL panel signal generator, and are convenient to detect the signal generator; meanwhile, the channel signal output by the signal generator can be detected in real time when the CELL panel is tested, so that the misjudgment of the CELL panel caused by the problem of the signal generator is avoided.

Description

Testing device and method for detecting CELL panel signal generator
Technical Field
The invention relates to the field of electrical automation, in particular to a testing device and a method for detecting a CELL panel signal generator.
Background
At present, most of driving signals of a CELL panel are alternating current analog signals with high-speed time sequence change output by a signal generator, strict requirements are imposed on rising edge/falling edge time, signal amplitude, signal driving capability and the like of the signals, and if the signals output by the signal generator exceed a specification range, abnormal display of the CELL panel can be caused, so that the CELL panel which is originally good is easily judged as a defective product by mistake.
Generally, a signal generator for detecting a CELL panel has tens of signal channels, each channel needs to be tested before the signal generator leaves a factory, a tester usually outputs a specific waveform by using an oscilloscope, one channel is switched and measured, whether the signal waveform parameter of the output signal of each channel is within a specification range or not and whether hardware-caused output abnormality exists or not is judged, and meanwhile, the waveform and the waveform parameter also need to be stored. The discrimination by the manual test has the problems of long time consumption, easy missing test and error test.
In addition, some CELL panels also need to be subjected to a long-time high-temperature aging test in a lighting state, and when the panel is abnormal in the test, whether the panel is bad or the signal generator is abnormal at a high temperature needs to be judged, so that the normal panel shows a bad phenomenon. On one hand, the temperature in the aging box is high, a tester can easily scald when opening the box to directly measure, and meanwhile, the temperature in the box is reduced, and the result reliability of the aging test is influenced; on the other hand, some elements are poor only at high temperature, the elements return to normal after the temperature is reduced, and the signal generator cannot be taken out for measurement and confirmation; therefore, it is difficult to confirm the actual working state of the signal generator, and the CELL panel is easily judged by mistake due to the problems of the CELL panel.
Therefore, a testing device for detecting the signal generator of the CELL panel is needed to solve the above problems.
Disclosure of Invention
In order to solve at least one of the above problems, a first aspect of the present invention provides a test apparatus for detecting a CELL panel signal generator, comprising: a main control unit, a channel switching unit, an analog-to-digital conversion unit, a calculation unit and a display unit, wherein
The main control unit controls the channel switching unit to receive channel signals output by each channel of the CELL panel signal generator one by one, the analog-to-digital conversion unit converts the channel signals received by the channel switching unit into digital signals, the calculation unit calculates parameters of the channel signals according to the digital signals, and the display unit displays channel signal waveforms determined by the parameters of the channel signals.
Furthermore, the testing device further comprises a storage unit which stores preset signal parameters, and the display unit also displays preset signal waveforms determined by the preset signal parameters.
Further, the computing unit compares the parameters of the channel signals with the preset signal parameters to judge whether the corresponding channel is in fault; the display unit also displays the judgment result of whether the channel is in fault.
Furthermore, the testing device also comprises a capacitive load unit, and the main control unit controls the capacitive load unit to output capacitance values corresponding to all channels of the CELL panel signal generator so as to simulate the capacitive load of the CELL panel signal generator.
Furthermore, the testing device also comprises a resistive load unit, and the main control unit controls the resistive load unit to output resistance values corresponding to all channels of the CELL panel signal generator so as to simulate the resistive load of the CELL panel signal generator.
Furthermore, the testing device further comprises a signal processor for adjusting the amplitude of the channel signal received by the channel switching unit.
Further, when the CELL panel signal generator tests the CELL panel, the testing device is connected with the CELL panel in parallel to test channel signals output by each channel of the CELL panel signal generator in real time.
Furthermore, the testing device is an integrated machine packaged in the same shell; or
The testing device is a split machine packaged in different shells and comprises a front end and a rear end, the front end comprises a main control unit, a channel switching unit and an analog-to-digital conversion unit, the rear end comprises a computing unit and a display unit, and digital signals output by the front end are transmitted to the rear end through wired or wireless communication.
The second aspect of the present invention provides a test method for detecting a signal generator of a CELL panel, comprising:
receiving channel signals output by each channel of the CELL panel signal generator one by one;
converting the channel signal into a digital signal;
calculating parameters of the channel signals according to the digital signals;
displaying a channel signal waveform determined by a parameter of the channel signal.
Further, the test method further comprises: and displaying a preset signal waveform determined by a preset signal parameter, and comparing the parameter of the channel signal with the preset signal parameter to judge whether the corresponding channel is in fault.
Further, the test method further comprises: loading a capacitive load on the received channel signal, wherein the capacitance value of the capacitive load corresponds to each channel of the CELL panel signal generator; and/or
And loading resistive loads on the received channel signals, wherein the resistance values of the resistive loads correspond to all channels of the CELL panel signal generator.
The invention has the following beneficial effects:
aiming at the conditions of long operation time, manual error detection, missing detection and the like when the conventional CELL panel signal generator is manually detected, the invention sets up a testing device for detecting the CELL panel signal generator, can test channel signals output by each channel under the conditions of no load and load of the CELL panel signal generator, and effectively makes up the defects in the prior art; meanwhile, the channel signal output by the signal generator can be detected in real time when the CELL panel is tested, so that misjudgment of the CELL panel caused by the problem of the signal generator is avoided, and the detection accuracy of the CELL panel is improved.
Drawings
The following describes embodiments of the present invention in further detail with reference to the accompanying drawings.
FIG. 1 is a block diagram of a test apparatus according to an embodiment of the present invention;
FIG. 2 is a block diagram showing the structure of a test apparatus according to another embodiment of the present invention;
FIG. 3 is a block diagram of a test apparatus according to another embodiment of the present invention;
FIG. 4 is a block diagram showing the structure of a test apparatus according to another embodiment of the present invention;
FIG. 5 is a block diagram showing the structure of a test apparatus according to another embodiment of the present invention;
FIG. 6 is a block diagram showing the structure of a test apparatus according to another embodiment of the present invention;
FIG. 7 is a block diagram of the CELL panel signal generator, CELL panel and test apparatus according to another embodiment of the present invention;
FIGS. 8, 8a-8f, respectively, illustrate waveforms of the channel signals displayed by the testing apparatus according to another embodiment of the present invention;
fig. 9 shows a flow chart of a testing method according to another embodiment of the invention.
Detailed Description
In order to more clearly illustrate the invention, the invention is further described below with reference to preferred embodiments and the accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and is not to be taken as limiting the scope of the invention.
As shown in fig. 1, one embodiment of the present invention provides a testing apparatus for detecting a CELL panel signal generator, comprising: the device comprises a main control unit, a channel switching unit, an analog-to-digital conversion unit, a calculation unit and a display unit, wherein the main control unit controls the channel switching unit to receive channel signals output by each channel of a CELL panel signal generator one by one, the analog-to-digital conversion unit converts the channel signals received by the channel switching unit into digital signals, the calculation unit calculates parameters of the channel signals according to the digital signals, and the display unit displays channel signal waveforms determined by the parameters of the channel signals.
In a specific example, as shown in fig. 2, the CELL panel signal generator has tens of output channels, each output channel outputs a different channel signal according to a predetermined parameter, and the testing device performs no-load testing on the CELL panel signal generator. The main control unit of the test device sequentially outputs the channel numbers of the signal channels to be received to the channel switching unit through the one-out-of-more switch selection loop, for example: the signal channel switching unit is used for switching on the corresponding signal channel of the CELL panel signal generator according to the channel number output by the main control unit and receiving a channel signal. For example, the main control unit outputs a signal channel 1 to the channel switching unit, the channel switching unit switches on the signal channel 1 of the CELL panel signal generator, and the AC analog signal output by the signal channel 1 is used as input and input to the analog-to-digital conversion unit. The analog-to-digital conversion unit samples and converts the channel signal into a digital signal and transmits the digital signal to the calculation unit, the calculation unit filters the digital signal and respectively calculates parameters of the channel signal, including but not limited to a rising edge, a falling edge, high and low voltage of a waveform, positive and negative pulse width and a signal period of the channel signal, and the display unit draws the waveform of the channel signal of the signal channel 1 according to the calculated parameters. Then the main control unit outputs a signal channel 2 to the channel switching unit, the channel switching unit receives the analog signal of the No. 2 signal channel, the analog signal is converted into a digital signal by the analog-to-digital conversion unit, the parameter of the signal is calculated, and the waveform of the signal channel 2 is drawn according to the parameter. And repeating the steps until all channels of the CELL panel signal generator are detected. By the method, visual and convenient results are provided for a tester to judge whether each channel signal of the CELL panel signal generator is normal according to the display picture.
The analog-to-digital conversion unit is a high-speed analog-to-digital converter with more than 8 bits, the sampling rate is greater than 1MSPS (sample per second), namely the sampling times per second are greater than 1M, and the sampling of the high-speed changing alternating current analog signal output by the CELL panel signal generator can be realized, so that the conversion from the analog signal to the digital signal is realized.
In a preferred embodiment, as shown in fig. 3, the testing apparatus further includes a storage unit storing preset signal parameters, and the display unit further displays a preset signal waveform determined by the preset signal parameters. Because the CELL panel signal generator comprises dozens of signal channels, the signal parameters output by each signal channel are different, and in order to distinguish and judge the signal parameters of each signal channel, the testing device also comprises a storage unit for storing the preset signal parameters of each signal channel, and the display unit can draw preset signal waveforms according to the preset signal parameters.
Further, the computing unit compares the parameters of the channel signals with the preset signal parameters to judge whether the corresponding channel is in fault; the display unit also displays the judgment result of whether the channel is in fault. The calculation unit compares the parameters of the channel signals with corresponding preset signal parameters, if the difference of the signal parameters of the channel signals and the corresponding preset signal parameters is smaller than a preset standard, the signal parameters of the measured channel are considered to be normal, otherwise, the signals of the channel are considered to be abnormal; and then the judgment result is displayed through a display unit, so that the judgment of the tester is facilitated. The display unit can also display the preset signal waveform while displaying the measured channel signal waveform, and the tester can also judge according to the waveform difference of the two, judge whether the difference of the two waveforms is less than a preset standard, and further judge whether the measured channel signal is normal.
Further, in order to detect the channel signal output by the CELL panel signal generator under the load condition, in another preferred embodiment, as shown in fig. 4, the testing apparatus further includes a capacitive load unit, and the main control unit controls the capacitive load unit to output a capacitance value corresponding to each channel of the CELL panel signal generator so as to simulate the capacitive load of the CELL panel signal generator. The main control unit selects a capacitance value corresponding to a signal channel of the CELL panel signal generator according to the currently tested signal channel, the capacitive load unit is controlled to output the capacitance value as a simulation load, one end of the capacitive load is connected to the simulation signal, and the other end of the capacitive load is grounded. The analog-to-digital conversion unit converts the analog signal loaded with the capacitor into a digital signal, the calculation unit calculates the parameter of the channel signal, and the channel signal waveform is drawn according to the parameter so that a tester can conveniently detect the channel signal output by the CELL panel signal generator under the condition of capacitive load.
In another preferred embodiment, as shown in fig. 5, the test apparatus further includes a resistive load unit, and the main control unit controls the resistive load unit to output a resistance value corresponding to each channel of the CELL panel signal generator, so as to simulate the resistive load of the CELL panel signal generator. When signal channels of the CELL panel signal generator are detected in sequence, the main control unit controls the resistive load unit to output a matched resistance value according to a tested channel signal, and controls the resistive load unit to output the resistance value as a simulation load. The analog-to-digital conversion unit converts the analog signal loaded with the resistor into a digital signal, the calculation unit calculates the parameters of the channel signal, and the waveform of the channel signal is drawn according to the parameters, so that a tester can conveniently detect the channel signal output by the CELL panel signal generator under the resistive load condition. It is worth mentioning that the test device may comprise a capacitive load CELL and a resistive load CELL, i.e. a capacitor and a resistor are switched in simultaneously in order to more realistically simulate the load of the CELL panel signal generator.
In another preferred embodiment, as shown in fig. 6, the testing apparatus further includes a signal processor for performing amplitude adjustment on the channel signal received by the channel switching unit. When the CELL panel signal generator outputs an analog signal with high amplitude, the requirements on the analog-to-digital conversion unit are extremely strict, and the cost of the test device is greatly increased. In order to solve the problem, a signal processor is disposed at the front end of the analog-to-digital conversion unit, and the signal processor performs preprocessing such as amplitude adjustment on the analog signal, for example, performs amplitude reduction on the analog signal, that is, converts the analog signal into an analog signal suitable for processing by a common analog-to-digital conversion unit.
After the no-load and the analog load of the CELL panel signal generator are tested, the problem of channel signals output by the CELL panel signal generator when the CELL panel is tested is further solved, and particularly the channel signals output by each channel of the CELL signal generator when the CELL panel is subjected to a high-temperature aging test. In another preferred embodiment, as shown in fig. 7, when the CELL panel signal generator is used for testing the CELL panel, the testing device is connected in parallel with the CELL panel to test the channel signals output by each channel of the CELL panel signal generator in real time. And connecting the testing devices in parallel on the tested CELL panel, wherein each channel of the CELL panel signal generator sends a channel signal to the CELL panel, and the testing devices connected in parallel can detect the channel signal in real time. When the display failure of the CELL panel occurs, the testing device connected in parallel detects the channel signals output by each channel of the CELL panel signal generator so as to judge whether the display failure of the CELL panel is caused by the channel signals output by the CELL panel signal generator.
In another preferred embodiment, the testing device is an all-in-one machine packaged in the same shell; or the testing device is a split machine packaged in different shells and comprises a front end and a rear end, the front end comprises a main control unit, a channel switching unit and an analog-to-digital conversion unit, the rear end comprises a computing unit and a display unit, and digital signals output by the front end are transmitted to the rear end through wired or wireless communication. The testing device can be an integrated testing device, the testing device is packaged in the same equipment, and testing personnel can directly see a testing result through a display unit of the testing device on a testing site. For the high-temperature aging test of the CELL panel, if the integrated testing device is placed in a high-temperature box to be not beneficial to the tester to check the testing result, the testing device can be set as a split type device comprising a front end and a rear end, wherein the front end comprises a main control unit, a channel switching unit and an analog-to-digital conversion unit for acquiring and converting analog signals into digital signals, and the rear end comprises a calculation unit and a display unit for calculating parameters and displaying waveforms; and the digital signal output by the front end is transmitted to the rear end through wired or wireless communication. That is, the digital signal output by the analog-to-digital conversion unit at the front end is transmitted to the calculation unit and the display unit at the rear end through wired or wireless communication, for example, the digital signal is transmitted to an external computer through a USB cable or a network cable, the computer receives and filters the digital signal, calculates the parameter of the channel signal, and draws the waveform of the channel signal, so that the tester can observe and detect the CELL panel signal generator through a network or other methods. Therefore, as can be understood by those skilled in the art, the testing device should be set according to actual requirements, so that the testing result can be visually and conveniently viewed by the testing personnel.
In one specific example, the CELL panel signal generator tests a CELL panel, and the test device is connected in parallel to the CELL panel. The normally output channel signal waveform is shown as 8a in fig. 8, with a period of 8.0uS, a positive pulse width of 4.0uS, a rising/falling edge <0.1uS, a high level of +23v ± 0.2v, and a low level of-15 v ± 0.2 v. The positive pulse width, period, high and low levels of the channel signal waveform shown as 8b in fig. 8 are normal, but the positive pulse after the rising edge has a large reverse glitch, and the falling edge >0.1uS has exceeded the specified range. The positive pulse after the rising edge of the channel signal waveform shown as 8c in fig. 8 has a reverse glitch, the rising edge is greater than 0.1uS, and the falling edge overshoots and exceeds the specified range. When the displayed waveform appears in the following states, the waveform is in an obvious abnormal state: the negative pulse of the channel signal waveform as shown at 8d in fig. 8 is clearly abnormal; the channel signal waveform shown at 8e in fig. 8 is an oscillating wave in which a normal waveform is not seen at all; the waveform of the channel signal shown by 8f in fig. 8 is obviously poor when driving the CELL panel to be tested, and it can be judged from the gradual rising edge and the oscillation of the low level part of the waveform that the driving capability of the channel signal is not enough to drive the CELL panel to be tested. The channel signal waveforms of 8b-8d in fig. 8 can be judged that the channel signals output by the CELL panel signal generator are abnormal through the display unit of the testing device, and the channel signals output by the CELL panel signal generator shown by 8e and 8f in fig. 8 will cause the display of the CELL panel to be tested, so that the testing device can detect the CELL panel signal generator to avoid the misjudgment of the CELL panel caused by the problem of the signal generator, thereby improving the accuracy of the CELL panel detection.
Corresponding to the testing apparatus for the CELL panel signal generator provided in the foregoing embodiment, as shown in fig. 9, an embodiment of the present application further provides a testing method for detecting the CELL panel signal generator, and since the testing method provided in the embodiment of the present application corresponds to the testing apparatus provided in the foregoing embodiments, the foregoing embodiment is also applicable to the testing method provided in the embodiment, and detailed description is not repeated in this embodiment. As shown in fig. 9, the test method includes: receiving channel signals output by each channel of the CELL panel signal generator one by one; converting the channel signal into a digital signal; calculating parameters of the channel signals according to the digital signals; displaying a channel signal waveform determined by a parameter of the channel signal. Further, the test method further comprises: and displaying a preset signal waveform determined by a preset signal parameter, and comparing the parameter of the channel signal with the preset signal parameter to judge whether the corresponding channel is in fault.
In another preferred embodiment, the test method further comprises: loading a capacitive load on the received channel signal, wherein the capacitance value of the capacitive load corresponds to each channel of the CELL panel signal generator; and/or
And loading resistive loads on the received channel signals, wherein the resistance values of the resistive loads correspond to all channels of the CELL panel signal generator.
Aiming at the conditions of long operation time, manual error detection, missing detection and the like when the conventional CELL panel signal generator is manually detected, the invention sets up a testing device for detecting the CELL panel signal generator, can test channel signals output by each channel under the conditions of no load and load of the CELL panel signal generator, and effectively makes up the defects in the prior art; meanwhile, the channel signal output by the signal generator can be detected in real time when the CELL panel is tested, so that misjudgment of the CELL panel caused by the problem of the signal generator is avoided, and the detection accuracy of the CELL panel is improved.
It should be understood that the above-mentioned embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it will be obvious to those skilled in the art that other variations or modifications may be made on the basis of the above description, and all embodiments may not be exhaustive, and all obvious variations or modifications may be included within the scope of the present invention.

Claims (6)

1. A test apparatus for testing a signal generator of a CELL panel, comprising: a main control unit, a channel switching unit, an analog-to-digital conversion unit, a calculation unit and a display unit, wherein
The main control unit controls the channel switching unit to receive channel signals output by each channel of the CELL panel signal generator one by one, the analog-to-digital conversion unit converts the channel signals received by the channel switching unit into digital signals, the calculation unit calculates parameters of the channel signals according to the digital signals, and the display unit displays channel signal waveforms determined by the parameters of the channel signals;
the main control unit controls the capacitive load unit to output capacitance values corresponding to all channels of the CELL panel signal generator so as to simulate the capacitive load of the CELL panel signal generator;
the testing device also comprises a resistive load unit, and the main control unit controls the resistive load unit to output resistance values corresponding to all channels of the CELL panel signal generator so as to simulate the resistive load of the CELL panel signal generator;
when the CELL panel signal generator tests the CELL panel, the testing device is connected with the CELL panel in parallel to test channel signals output by each channel of the CELL panel signal generator in real time, wherein the channel signals comprise alternating current analog signals with time sequence changing at high speed.
2. The test device as claimed in claim 1, further comprising a storage unit storing preset signal parameters, wherein the display unit further displays a preset signal waveform determined by the preset signal parameters.
3. The testing device of claim 2, wherein the computing unit further compares the parameters of the channel signals with the preset signal parameters to determine whether the corresponding channel is faulty; the display unit also displays the judgment result of whether the channel is in fault.
4. The test apparatus of claim 1, further comprising a signal processor for performing amplitude adjustment on the channel signal received by the channel switching unit.
5. The testing device of claim 1, wherein the testing device is an all-in-one machine enclosed in a same housing; or
The testing device is a split machine packaged in different shells and comprises a front end and a rear end, the front end comprises a main control unit, a channel switching unit and an analog-to-digital conversion unit, the rear end comprises a computing unit and a display unit, and digital signals output by the front end are transmitted to the rear end through wired or wireless communication.
6. A test method using the test apparatus of any one of claims 1 to 5, comprising:
receiving channel signals output by each channel of a CELL panel signal generator one by one, wherein the channel signals comprise time sequence high-speed changing alternating current analog signals, loading capacitive loads on the received channel signals, capacitance values of the capacitive loads correspond to each channel of the CELL panel signal generator, loading resistive loads on the received channel signals, and resistance values of the resistive loads correspond to each channel of the CELL panel signal generator;
converting the channel signal into a digital signal;
calculating parameters of the channel signals according to the digital signals;
displaying a channel signal waveform determined by a parameter of the channel signal.
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CN110176200B (en) * 2019-06-11 2023-03-21 苏州华兴源创科技股份有限公司 Method and system for generating panel detection signal
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201335874Y (en) * 2008-10-07 2009-10-28 深圳市蓝韵实业有限公司 Consistency detecting device for front-end amplifying circuit channel of ultrasonic imaging equipment
CN103941119A (en) * 2014-03-27 2014-07-23 北京汇德信科技有限公司 Multifunctional programmable signal generating parameter testing system
CN204086477U (en) * 2014-10-20 2015-01-07 沈阳工程学院 A kind of multi-channel signal acquiring frock
CN106093666A (en) * 2016-08-08 2016-11-09 深圳市鼎阳科技有限公司 A kind of method and apparatus of quick detection signal generator amplitude-frequency characteristic
CN206235682U (en) * 2016-11-28 2017-06-09 浙江万里学院 A kind of versatile signal generator fault detection system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201335874Y (en) * 2008-10-07 2009-10-28 深圳市蓝韵实业有限公司 Consistency detecting device for front-end amplifying circuit channel of ultrasonic imaging equipment
CN103941119A (en) * 2014-03-27 2014-07-23 北京汇德信科技有限公司 Multifunctional programmable signal generating parameter testing system
CN204086477U (en) * 2014-10-20 2015-01-07 沈阳工程学院 A kind of multi-channel signal acquiring frock
CN106093666A (en) * 2016-08-08 2016-11-09 深圳市鼎阳科技有限公司 A kind of method and apparatus of quick detection signal generator amplitude-frequency characteristic
CN206235682U (en) * 2016-11-28 2017-06-09 浙江万里学院 A kind of versatile signal generator fault detection system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
基于FPGA的脉冲信号发生/测试仪一体化设计;杜冬 等;《电子测量技术》;20150131;第38卷(第1期);第64-68、94页 *

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