CN219737548U

CN219737548U - Test rack for vibrating infrared jointed board main board

Info

Publication number: CN219737548U
Application number: CN202223470173.9U
Authority: CN
Inventors: 保占波; 张定均; 王强; 苏桂红; 张哲骞
Original assignee: Sichuan Jingteng Technology Co ltd
Current assignee: Sichuan Jingteng Technology Co ltd
Priority date: 2022-12-23
Filing date: 2022-12-23
Publication date: 2023-09-22
Anticipated expiration: 2032-12-23

Abstract

The utility model provides a test frame for a vibrating infrared jointed board main board, which is characterized in that: comprises a test substrate and a bracket assembly arranged on the test substrate; the bracket component comprises a supporting plate and a panel arranged on the supporting plate, a clamp is arranged on the panel, and an ammeter and a voltmeter are also arranged on the panel; the end, close to the panel, of the supporting plate is provided with a mounting table, a connecting rod is mounted on the mounting table, one end, far away from the mounting table, of the connecting rod is connected with a fixing assembly, the fixing assembly is located above the testing substrate, the fixing assembly comprises an upper plate and a lower plate connected with the upper plate, a spring probe is mounted on the upper plate, and the spring probe is located below the clamp; the test substrate is provided with a switch box and a wire slot. According to the utility model, the to-be-tested jointed board is tightly contacted with the spring probe through the clamp, so that no-load working current and standby current are tested on the to-be-tested jointed board.

Description

Test rack for vibrating infrared jointed board main board

Technical Field

The utility model relates to the technical field of test frames, in particular to a test frame for vibrating an infrared jointed board main board.

Background

The PCBA test frame is connected with a bonding pad or a test point on the PCB through a metal probe, and under the condition that the PCB is powered on, typical values such as a voltage value, a current value and the like of a test circuit are obtained, so that whether the tested circuit is normally conducted or not is observed.

In the prior art, no-load working current and standby current of a vibration type main board and an infrared type main board need to be tested through different test frames, and cannot be tested on the same test frame, so that the problem of high test cost exists.

Disclosure of Invention

The utility model aims to provide a test frame for vibrating an infrared jointed board main board, which is used for solving the technical problem that no-load working current and standby current of a vibrating type main board and an infrared type main board in the prior art cannot finish testing on the same test frame.

In order to achieve the above object, in one embodiment of the present utility model, a test rack for vibrating an infrared jigsaw puzzle is provided, which includes a test substrate and a bracket assembly mounted on the test substrate;

the bracket component comprises a supporting plate and a panel arranged on the supporting plate, a clamp is arranged on the panel, and an ammeter and a voltmeter are also arranged on the panel;

the end, close to the panel, of the supporting plate is provided with a mounting table, a connecting rod is mounted on the mounting table, one end, far away from the mounting table, of the connecting rod is connected with a fixing assembly, the fixing assembly is located above the testing substrate, the fixing assembly comprises an upper plate and a lower plate connected with the upper plate, a plurality of spring probes are mounted on the upper plate, and each spring probe is located below the clamp;

the test substrate is provided with a switch box and a wire slot.

Preferably, the ammeter comprises a pointer direct current ammeter of 20mA and a pointer direct current ammeter of 100mA, wherein the ammeter is a pointer direct current ammeter of 30V, and the ammeter and the pointer direct current ammeter of 20mA are positioned on the same side.

Preferably, the switch box comprises a first switch box and a second switch box, wherein a ship-shaped switch and a toggle switch are arranged in the first switch box, and a toggle switch and a round switch are arranged in the second switch box.

Preferably, the side of the test substrate, which is close to the bracket assembly, is provided with a mounting block, and the lower plate is fixed on the mounting block.

Preferably, the wire chase is located below the securing assembly.

Preferably, a limiting block is arranged above the lower plate and is positioned below the upper plate.

In summary, the beneficial effects of the utility model are as follows:

according to the utility model, the to-be-tested jointed board is tightly contacted with the spring probe through the clamp, so that no-load working current and standby current are tested on the to-be-tested jointed board. The utility model realizes that the idle working current and the standby current of the vibration type main board and the infrared type main board can be tested on the same test frame, thereby saving the test cost.

Drawings

FIG. 1 is a front view of one embodiment of the present utility model;

fig. 2 is a side view of one embodiment of the present utility model.

The device comprises a 1-test substrate, a 2-support plate, a 3-panel, a 4-clamp, a 5-ammeter, a 6-voltmeter, a 7-mounting table, an 8-connecting rod, a 9-upper plate, a 10-lower plate, an 11-spring probe, a 12-first switch box, a 13-second switch box, a 14-mounting block and a 15-limiting block.

Detailed Description

The utility model provides a test frame for vibrating an infrared jointed board main board, which is used for testing the idle working current and the standby current of a control main board for producing jointed boards of a vibrating type main board Sml20S001T50 and an infrared type main board Sml20S002BT40, and comprises a test substrate 1 and a bracket component arranged on the test substrate 1. The bracket assembly comprises a support plate 2 and a panel 3 arranged on the support plate 2, wherein the panel 3 is fixed on the support plate 2 through screws, and the panel 3 is positioned at one end of the support plate 2 far away from the test substrate 1.

The panel 3 is provided with a clamp 4, and the clamp 4 is used for fixing a jointed board consisting of a vibration type main board to be tested and an infrared type main board above a spring probe 11, and tightly contacting the jointed board to be tested with the spring probe 11 so as to complete the test of the jointed board to be tested. The tester realizes the fixation of the jointed board to be tested by pressing down the handle of the clamp 4 with force. The panel 3 is also provided with an ammeter 5 and a voltmeter 6, wherein the ammeter 5 comprises a pointer direct current ammeter 5 of 20mA and a pointer direct current ammeter 5 of 100mA, which are respectively positioned at the left side and the right side of the panel 3; the voltmeter 6 here is a 30V pointer dc voltmeter 6, and the voltmeter 6 is located on the same side of the panel 3 as the 20mA pointer dc voltmeter 5.

One end of the supporting plate 2, which is close to the panel 3, is provided with a mounting table 7, a connecting rod 8 is mounted on the mounting table 7, one end of the connecting rod 8, which is far away from the mounting table 7, is connected with a fixing component, and the fixing component is located above the test substrate 1. The fixing component is fixedly arranged on the supporting component through a connecting rod 8. The fixed subassembly includes upper plate 9 and the lower plate 10 that is connected with upper plate 9, installs a plurality of spring probes 11 on the upper plate 9, and every spring probe 11 is located anchor clamps 4 below, and the jointed board that awaits measuring is located between spring probe 11 and anchor clamps 4. A limiting block 15 is arranged above the lower plate 10, the limiting block 15 is located below the upper plate 9, and the limiting block 15 is used for limiting power supply wires so as to avoid disordered placement of the power supply wires.

The test substrate 1 is provided with a switch box and a wire slot, and the wire slot is positioned below the fixed component. The switch box is internally provided with a switch so as to switch the idle working current and the standby current of the test main board, and the wire slot is used for placing a power supply wire, so that the normal work of the whole test frame is ensured. The switch box includes a first switch box 12 and a second switch box 13, the first switch box 12 is located at the lower left corner of the test substrate 1, and the second switch box 13 is located at the right side of the test substrate 1. The first switch box 12 is internally provided with a boat-shaped main switch, an upper toggle switch, a middle toggle switch and a lower toggle switch, the second switch box 13 is internally provided with the upper toggle switch, the middle toggle switch and a red round switch, and the upper toggle switch, the middle toggle switch and the lower toggle switch are arranged in parallel with the red round switch.

The test base plate 1 is provided with a mounting block 14 on one side close to the bracket assembly, and the lower plate 10 of the fixing assembly is fixed on the mounting block 14.

Working principle and process: according to the utility model, when the handle of the clamp 4 is pressed down with force, the spring probe 11 is in close contact with the jointed board to be tested, so that the testing work can be performed; when the handle of the clamp 4 is pushed upwards by force, the spring probe 11 is separated from the jointed board to be tested, and the test can be finished.

Although specific embodiments of the utility model have been described in detail with reference to the accompanying drawings, it should not be construed as limiting the scope of protection of the present patent. Various modifications and variations which may be made by those skilled in the art without the creative effort are within the scope of the patent described in the claims.

Claims

1. A test bench for vibrations infrared makeup mainboard, its characterized in that: comprises a test substrate and a bracket assembly arranged on the test substrate;

the bracket assembly comprises a supporting plate and a panel arranged on the supporting plate, wherein a clamp is arranged on the panel, and an ammeter and a voltmeter are also arranged on the panel;

the device comprises a support plate, a panel, a fixture, a connecting rod, a fixing assembly and a plurality of spring probes, wherein the mounting table is arranged at one end of the support plate, which is close to the panel, the connecting rod is arranged on the mounting table, the fixing assembly is connected with the end, which is far away from the mounting table, of the connecting rod and is positioned above the test substrate, the fixing assembly comprises an upper plate and a lower plate connected with the upper plate, the upper plate is provided with the spring probes, and each spring probe is positioned below the fixture;

and the test substrate is provided with a switch box and a wire slot.

2. A test rack for vibrating an infrared jigsaw puzzle according to claim 1, wherein: the ammeter comprises a pointer direct current ammeter of 20mA and a pointer direct current ammeter of 100mA, wherein the ammeter is a pointer direct current ammeter of 30V, and the ammeter and the pointer direct current ammeter of 20mA are positioned on the same side.

3. A test rack for vibrating an infrared jigsaw puzzle according to claim 1, wherein: the switch box comprises a first switch box and a second switch box, wherein a ship-shaped switch and a toggle switch are arranged in the first switch box, and a toggle switch and a round switch are arranged in the second switch box.

4. A test rack for vibrating an infrared jigsaw puzzle according to claim 1, wherein: and one side of the test substrate, which is close to the bracket assembly, is provided with a mounting block, and the lower plate is fixed on the mounting block.

5. A test rack for vibrating an infrared jigsaw puzzle according to claim 1, wherein: the wire slot is located below the fixed component.

6. A test rack for vibrating an infrared jigsaw puzzle according to claim 1, wherein: a limiting block is arranged above the lower plate and located below the upper plate.