Disclosure of Invention
The invention mainly aims to provide a testing device for an electronic cigarette mainboard, and aims to solve the technical problems of low testing efficiency and high possibility of errors in the conventional manual testing mode for the electronic cigarette mainboard.
In order to achieve the purpose, the electronic cigarette mainboard testing device provided by the invention comprises a base, wherein two testing clamps which are arranged at intervals are arranged on the base, each testing clamp comprises an objective table, a pressing plate and a driving mechanism, the objective table is used for placing a mainboard to be tested and is elastically connected with the base, the pressing plate is positioned above the objective table and is connected with the output end of the driving mechanism, one surface of the pressing plate, which faces the objective table, is provided with a testing probe, and the driving mechanism drives the testing probe to move downwards to abut against the mainboard to be tested so as to test the mainboard to be tested.
Preferably, the test probes are provided with a plurality of test points, the test points of the mainboard to be tested are provided with a plurality of test probes, and the plurality of test probes and the plurality of test points are arranged in a one-to-one correspondence manner.
Preferably, the objective table is concavely provided with a containing cavity matched with the mainboard to be tested, a first opening is formed at one end of the containing cavity, second openings are formed at two sides of the containing cavity, the objective table further comprises a limiting part, and the limiting part is installed on a cavity arm forming the containing cavity and located above the first opening.
Preferably, each test fixture further includes a positioning assembly, where the positioning assembly includes a first cylinder and a pressing head connected to an output end of the first cylinder, and the first cylinder drives the pressing head to press the main board to be tested in the first opening.
Preferably, the bottom of objective table is connected with an at least elastic component, elastic component includes first sleeve, second sleeve and reset spring, first telescopic one end is connected with the objective table, second sleeve sliding sleeve is located first telescopic other end, reset spring locate in the first sleeve and respectively with first sleeve and second sleeve are connected, the second sleeve is kept away from first telescopic one end with the base is connected.
Preferably, the pressing plate is provided with a butt column on one surface facing the object stage, a flexible portion is arranged at the free end of the butt column, and the flexible portion is driven by the driving mechanism to abut against the upper surface of the object stage.
Preferably, actuating mechanism includes backup pad and second cylinder, the backup pad is fixed in on the base, the stiff end of second cylinder with the backup pad is connected, the output with the clamp plate is connected.
Preferably, guide posts are respectively arranged on two sides of the second cylinder, one end of each guide post is connected with the base, the other end of each guide post is connected with the support plate, the pressing plate is provided with guide holes corresponding to the guide posts, and the other ends of the guide posts penetrate through the guide holes and are connected with the support plate.
Preferably, the base is provided with heat dissipation holes, and the heat dissipation holes are located on the side wall of the base.
The invention further provides an electronic cigarette mainboard test system which comprises a computer, a control power supply, an LED analyzer and the electronic cigarette mainboard test device, wherein the computer, the control power supply and the LED analyzer are all electrically connected with the test probes, the computer controls the test probes to test the mainboard to be tested, and the control power supply and the LED analyzer collect test data of the mainboard to be tested.
Compared with the prior art, the invention has the beneficial technical effects that:
according to the electronic cigarette mainboard testing device, the two mainboards to be tested are placed on the objective table, the driving mechanism drives the pressing plate to drive the testing probe to abut against the mainboard to be tested, the testing probe automatically detects various performances of the mainboard to be tested, automatic synchronous testing of the double mainboards is realized, testing efficiency is improved, testing standards are unified, and reliability of mainboard performance testing is improved.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that all directional indicators (such as up, down, left, right, front, and back) in the embodiments of the present invention are only used to explain the relative position relationship between the components, the motion situation, and the like in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicator is changed accordingly.
It will also be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present.
In addition, the descriptions related to "first", "second", etc. in the present invention are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
Example one
The invention provides an electronic cigarette mainboard testing device, and referring to fig. 1, the electronic cigarette mainboard testing device comprises a base 1, two testing clamps 2 arranged at intervals are arranged on the base 1, each testing clamp 2 comprises an objective table 21, a pressing plate 22 and a driving mechanism 23, the objective table 21 is used for placing a mainboard 3 to be tested and is elastically connected with the base 1, the pressing plate 22 is positioned above the objective table 21 and is connected with an output end of the driving mechanism 23, a testing probe 24 is arranged on one surface of the pressing plate 22 facing the objective table 21, and the driving mechanism 23 drives the testing probe 24 to move downwards to abut against the mainboard 3 to be tested so as to test the mainboard 3 to be tested.
In this embodiment, the test fixture 2 is provided with two, so as to realize synchronous automatic test of the dual-test mainboard 3. Specifically, place two mainboards 3 that await measuring on objective table 21 simultaneously, actuating mechanism 23 drives test probe 24 and moves down and await measuring mainboard 3 butt, and test probe 24 automatic operation detects each item performance of mainboard 3 that await measuring, and multichannel synchronous test accomplishes all test items in short time, has improved efficiency of software testing. Meanwhile, the test standard is unified, the manual error break of the test result is avoided, and the reliability of the performance test of the mainboard is improved.
Example two
Referring to fig. 1, a plurality of test probes 24 are provided, a plurality of test points are provided on the motherboard 3 to be tested, and the plurality of test probes 24 are arranged in one-to-one correspondence with the plurality of test points.
In this embodiment, a plurality of test probes 24 correspond to a plurality of test points on the mainboard 3 to be tested one by one, so that a plurality of test points can be conveniently and simultaneously detected at one time, and the reliability of the test is improved.
EXAMPLE III
Referring to fig. 2, the object stage 21 according to the embodiment of the present invention is concavely provided with an accommodating cavity 211 matched with the main board 3 to be tested, a first opening 213 is formed at one end of the accommodating cavity 211, second openings 214 are formed at two sides of the accommodating cavity 211, and the object stage 21 further includes a limiting member 212, where the limiting member 212 is installed on a cavity arm forming the accommodating cavity 211 and located above the first opening 213.
In this embodiment, the cavity 211 that holds in the objective table 21 is used for placing the mainboard 3 that awaits measuring, holds the cavity 211 and is constructed into the recess with mainboard 3 assorted that awaits measuring, according to the difference of mainboard 3 model and the shape that awaits measuring, will hold the cavity 211 and design into corresponding shape. The position-limiting member 212 above the accommodating cavity 211 is mainly used for limiting the main board 3 to be tested in the vertical direction, and the position-limiting member 212 may be set in various shapes. The first opening 213 is mainly used for limiting the side surface of the main board 3 to be tested, and the second opening 214 is mainly used for conveniently grabbing the main board 3 to be tested in the process of loading and taking away the main board 3 to be tested.
Example four
Referring to fig. 3, each test fixture 2 according to the embodiment of the present invention further includes a positioning assembly 25, where the positioning assembly 25 includes a first cylinder 251 and a pressing head 252 connected to an output end of the first cylinder 251, and the first cylinder 251 drives the pressing head 252 to press the main board 3 to be tested in the first opening 213.
In this implementation, locating component 25 sets up in one side of first opening 213, locating component 25 includes first cylinder 251 and hold-down head 252, first cylinder 251 selects the straight line cylinder, hold-down head 252 and the size phase-match of first opening 213 and can remove in first opening 213, before the test, first cylinder 251 drive hold-down head 252 compresses tightly the mainboard 3 that awaits measuring, carry on spacingly to mainboard 3 that awaits measuring in the side, the mainboard 3 that awaits measuring holds the steadiness in holding the chamber 211 during further assurance test.
EXAMPLE five
Referring to fig. 1 and 2, the bottom of the object stage 21 according to the embodiment of the present invention is connected to at least one elastic component 26, the elastic component 26 includes a first sleeve 261, a second sleeve 262, and a return spring, one end of the first sleeve 261 is connected to the object stage 21, the second sleeve 262 is slidably sleeved on the other end of the first sleeve 261, the return spring is disposed in the first sleeve 261 and is respectively connected to the first sleeve 261 and the second sleeve 262, and one end of the second sleeve 262 far from the first sleeve 261 is connected to the base 1.
In this embodiment, the elastic component 26 is disposed at the bottom of the object stage 21 to elastically connect the object stage 21 and the base 1, and the elastic component 26 is mainly used for buffering the impact force from the pressing plate 22 to protect the motherboard 3 to be tested. The elastic members 26 may include one or more, preferably four, members disposed at four corners of the stage 21. When one elastic member 26 is provided, the elastic member 26 is attached to the central portion of the bottom surface of the stage 21. Specifically, actuating mechanism 23 drive clamp plate 22 moves down, test probe 24 and 3 butts of mainboard that awaits measuring, objective table 21 receives pressure, first sleeve 261 of elastic component 26 slowly moves down under pressure, stop when reset spring in first sleeve 261 reaches the elasticity limit, test probe 24 detects each item performance of mainboard 3 that awaits measuring, after the test is accomplished, clamp plate 22 moves up, first sleeve 261 slowly moves up under reset spring's effect, stop when reset spring returns original length, the impact force of clamp plate 22 has effectively been cushioned, mainboard 3 that awaits measuring has further been protected.
EXAMPLE six
Referring to fig. 1, in the platen 22 according to the embodiment of the present invention, a contact column 221 is further provided on a surface facing the stage 21, and a flexible portion is provided at a free end of the contact column 221, and the flexible portion is driven by the driving mechanism 23 to contact with the upper surface of the stage 21.
In this embodiment, when the effect of butt post 221 lies in with the upper surface butt of objective table 21, flexible portion plays the cushioning effect, reduces the impact force of test probe 24 and the mainboard 3 contact that awaits measuring, because the impact force is too big when avoiding test probe 24 and the mainboard 3 contact that awaits measuring to damage test probe 24 and the mainboard 3 that awaits measuring. The flexible portion is preferably made of rubber or silicone. In addition, in order to further protect the main board 3 to be tested, a pressure sensor may be disposed at the free end of the abutment column 221, and when the pressure applied by the abutment column 221 to the stage 21 exceeds a preset threshold value, an alarm signal is immediately issued, and the power supply of the driving mechanism 23 is cut off.
EXAMPLE seven
Referring to fig. 1, the driving mechanism 23 according to the embodiment of the present invention includes a supporting plate 231 and a second cylinder 232, the supporting plate 231 is fixed on the base 1, a fixed end of the second cylinder 232 is connected to the supporting plate 231, and an output end of the second cylinder is connected to the pressing plate 22.
In this embodiment, the driving mechanism 23 is mainly used for driving the testing probe 24 to move downward to abut against the motherboard 3 to be tested. The driving mechanism 23 includes a second cylinder 232 and a supporting plate 231, a fixed end of the second cylinder 232 is connected with the supporting plate 231, and an output end is connected with the pressing plate 22. The second cylinder 232 is preferably a linear cylinder, so that the downward movement stroke of the pressing plate 22 can be accurately controlled, and the test probe 24 is prevented from being excessively abutted to the mainboard 3 to be tested.
Example eight
Referring to fig. 1, the second cylinder 232 according to the embodiment of the present invention is provided with guide posts 27 at two sides thereof, one end of each guide post 27 is connected to the base 1, the pressing plate 22 is provided with a guide hole 222 corresponding to the guide post 27, and the other end of each guide post 27 passes through one guide hole 222 to be connected to the supporting plate 231.
In this embodiment, one end of the guiding post 27 is fixedly disposed on the base 1, the other end is fixed on the supporting plate 231, and the pressing plate 22 is sleeved on the guiding post 27 through the guiding hole 222, so that the pressing plate 22 moves up and down along the guiding post 27 under the driving of the driving mechanism 23, and the pressing plate 22 is prevented from deviating when moving up and down, thereby improving the accuracy of the moving up and down of the pressing plate 22 and ensuring the accuracy of the test result.
Example nine
Referring to fig. 1, the base 1 according to the embodiment of the present invention is provided with heat dissipation holes 11, and the heat dissipation holes 11 are located on the side wall of the base 1.
In this embodiment, a load circuit is arranged in the base 1, and in the testing process, the load circuit can generate heat, and the heat is discharged to the outside through the heat dissipation holes 11 on the two sides of the base 1, so as to dissipate the heat of the load circuit in time, and avoid abnormal operation of the testing device due to overhigh temperature. The heat dissipation holes 11 are preferably provided in plural to improve the heat dissipation performance of the testing apparatus. Further, if the load is too large and the generated heat is too large, it is considered that a small-sized exhaust fan is arranged on the base 1, thereby further improving the heat dissipation function of the testing device.
The invention further provides an electronic cigarette mainboard test system which comprises a computer, a control power supply, an LED analyzer and an electronic cigarette mainboard test device, wherein the computer, the control power supply and the LED analyzer are all electrically connected with a test probe 24, the computer controls the test probe to test the mainboard to be tested 3, and the control power supply and the LED analyzer collect test data of the mainboard to be tested. The specific structure of the electronic cigarette main board testing device refers to the above embodiments, and the electronic cigarette main board testing system adopts all technical schemes of all the above embodiments, so that the electronic cigarette main board testing device at least has all the technical effects brought by the technical schemes of the above embodiments.
Specifically, a test program interface is opened through the computer, and a start button is clicked to perform performance test on the mainboard 3 to be tested. The control power supply is mainly used for carrying out short-circuit testing and current testing on the mainboard 3 to be tested, the LED analyzer is mainly used for testing the working state of the LED lamps on the mainboard 3 to be tested, after test data are collected, the computer automatically judges whether each test value is in the set technical parameter value range, PASS is displayed and is a qualified product, the test efficiency is effectively improved, the test standard is unified, the reliability of mainboard performance testing is improved, and the technical problems of visual fatigue, large accidental errors and low efficiency existing in manual observation are solved.
The above description is only a part of or preferred embodiments of the present invention, and neither the text nor the drawings should be construed as limiting the scope of the present invention, and all equivalent structural changes, which are made by using the contents of the present specification and the drawings, or any other related technical fields, are included in the scope of the present invention.