CN215986161U - Test fixture and test device - Google Patents
Test fixture and test device Download PDFInfo
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- CN215986161U CN215986161U CN202121942453.8U CN202121942453U CN215986161U CN 215986161 U CN215986161 U CN 215986161U CN 202121942453 U CN202121942453 U CN 202121942453U CN 215986161 U CN215986161 U CN 215986161U
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Abstract
The application provides a test fixture of PCBA board, test fixture includes the test jig, test subassembly and control panel, test subassembly detachably installs in the test jig, test subassembly includes probe and keysets, the probe is used for the electricity to connect the PCBA board that awaits measuring, the keysets is equipped with test point and winding displacement interface, the test point is connected with probe and winding displacement interface electricity respectively, the switching winding displacement is connected to the unified electricity of winding displacement interface, the control panel sets up in the test jig, the control panel is equipped with the signal transmission interface, the signal transmission interface is connected with the switching winding displacement electricity, in order to connect the test point through the unified electricity of switching winding displacement. The application provides a test fixture can be compatible different PCBA board's test, can be general when testing many money products, has reduced the cost of labor. The application also provides a testing device.
Description
Technical Field
The application relates to the technical field of testing, in particular to a testing jig and a testing device.
Background
Printed Circuit Board (PCBA) test tools are important devices in the Assembly and processing of Circuit boards, and are usually placed at the end of the production process for testing PCB boards. The PCBA test fixture is a main tool for assisting in completing a test, and tests the electrical conduction performance of a circuit board through a test point, so that whether the whole PCB is successfully welded or not is judged, the PCBA test fixture mainly contacts the test point on the PCB through a test probe to obtain key data such as current, voltage, input and output of a circuit on a PCBA assembly board, and whether the functions of open circuit, short circuit and products of the circuit can normally run or not is detected.
The existing PCBA test fixture needs to manually search test points and connect wires when testing a PCB, leads are more when debugging the test points, and a plurality of products can not share one test fixture, so that inconvenience is brought to testing.
SUMMERY OF THE UTILITY MODEL
The embodiment of the application provides a test fixture and a test device, so as to improve the technical problem.
The embodiment of the application realizes the aim through the following technical scheme.
In a first aspect, an embodiment of the present application provides a test fixture for a Printed Circuit Board (PCBA), where the test fixture includes a test frame, a test Assembly, and a control Board. The test assembly is detachably installed in the test frame, the test assembly comprises a probe and a patch panel, the probe is used for electrically connecting a PCBA board to be tested, the patch panel is provided with a test point and a flat cable interface, the test point is electrically connected with the probe and the flat cable interface respectively, the flat cable interface is electrically connected with a switching flat cable in a unified mode, the control panel is arranged on the test frame and provided with a signal transmission interface, and the signal transmission interface is electrically connected with the switching flat cable so as to be electrically connected with the test point in a unified mode through the switching flat cable.
In one embodiment, the test jig further comprises a support plate, the probe is fixed on the support plate and penetrates through the support plate, and the support plate is further used for placing a PCBA board to be tested.
In one embodiment, the supporting plate is provided with a through hole corresponding to the probe, and the probe penetrates through the through hole and abuts against the adapter plate.
In one embodiment, the supporting plate comprises a needle plate and a supporting main plate, the probes are fixed on the needle plate and penetrate through the needle plate and the supporting main plate, and the needle plate is also used for placing the PCBA to be tested.
In one embodiment, the needle board is removably secured to a surface of the support main board and the adapter board is removably secured to a surface of the support main board facing away from the needle board.
In one embodiment, the needle board is provided with a fixture for holding a PCBA board to be tested.
In one embodiment, the test fixture further includes a pressing plate mechanism disposed on the test frame, the pressing plate mechanism is located above the supporting plate, and the pressing plate mechanism can selectively move towards or away from the probes.
In one embodiment, the pressing plate mechanism comprises a pressing plate and a driving mechanism, the pressing plate is movably arranged on the test frame, the driving mechanism is in transmission connection with the pressing plate, and the driving mechanism drives the pressing plate to selectively move towards or away from the probe.
In one embodiment, the test fixture further includes an interface extender electrically connected to the signal transmission interface, the interface extender having a plurality of signal interfaces.
In a second aspect, an embodiment of the present application provides a testing apparatus, which includes the testing fixture and the testing apparatus in any one of the above embodiments, wherein the testing apparatus is electrically connected to the signal transmission interface.
The test fixture and the testing device provided by the embodiment of the application have the advantages that the test component is detachably installed on the test frame, the test component can be conveniently replaced to match different PCBA boards, the test of different PCBA boards is compatible, and multiple products can share one test fixture. The probe electricity is connected PCBA board and the keysets that awaits measuring, has realized that the pin between PCBA board and the keysets that awaits measuring is connected to the pin, and the keysets passes through the unified electricity of winding displacement interface and connects the switching winding displacement, avoids artifical test point wiring of looking for, has reduced the cost of labor. The switching flat cable is electrically connected with the control panel, the control panel is provided with a signal transmission interface, and a plurality of products can share one test fixture.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 shows a schematic structural diagram of a test fixture provided in an embodiment of the present application.
Fig. 2 is a schematic structural diagram of the test fixture of fig. 1 at another angle.
Fig. 3 is a schematic structural diagram illustrating the PCBA board to be tested placed on the test fixture of fig. 1.
Fig. 4 is a schematic structural diagram of the test fixture of fig. 1 at a further angle.
Fig. 5 is a schematic structural diagram of another angle of the test fixture of fig. 1.
Fig. 6 shows a schematic diagram of electrical connections between components of a testing apparatus provided in an embodiment of the present application.
Detailed Description
In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application.
Referring to fig. 1 to fig. 3, an embodiment of the present invention provides a test fixture 10 for a Printed Circuit Board (PCBA) 20, where the test fixture 10 includes a test frame 100, a test Assembly 200, and a control Board 300. The test assembly 200 is detachably mounted to the test rack 100, and the test assembly 200 includes probes 210 and an adapter plate 220, wherein the probes 210 are used for electrically connecting the PCBA board 20 to be tested. Referring to fig. 4, the adapter plate 220 is provided with a test point 211 and a flat cable interface 212, the test point 211 is electrically connected to the probe 210 and the flat cable interface 212, and the flat cable interface 212 is electrically connected to the adapter flat cable 213. Referring to fig. 2, the control board 300 is disposed on the testing jig 100, the control board 300 is provided with a signal transmission interface 310, and the signal transmission interface 310 is electrically connected to the adapting flat cable 213 so as to be electrically connected to the testing points 211 through the adapting flat cable 213.
The test rack 100 serves as a support, the test rack 100 enables the test fixture 10 to be stably placed on a horizontal table or a test bench, and the test rack 100 may be made of a metal material, such as an alloy material. The density of the metal material is high, so that the test jig 100 can be stably placed on a table top and is not easy to move, and the stability of the test process is ensured.
Referring to fig. 3, in one embodiment, the testing jig 100 further includes a supporting plate 110, the supporting plate 110 is provided with through holes 112 corresponding to the probes 210, the probes 210 are fixed on the supporting plate 110 and penetrate through the supporting plate 110, and the supporting plate 110 is further used for placing the PCBA board 20 to be tested. The supporting plate 110 can be horizontally arranged, so that the PCBA board 20 to be tested can be stably placed on the supporting plate 110 and is not easy to move, slide and the like in the testing process. The probes 210 are installed in the through holes 112 perpendicular to the support plate 110, and the probes 210 penetrate the through holes 112, and the diameter of the through holes 112 may be slightly larger than that of the probes 210. In one embodiment, the through hole 112 is adapted to the diameter of the probe 210, so that the probe 210 can be installed in the through hole 112 without shaking or tilting, and the probe 210 can be fixed in the through hole 112 to ensure that the probe 210 is perpendicular to the supporting plate 110. Since the supporting plate 110 has a certain thickness and a portion of the probes 210 are located in the through holes 112, the supporting plate 110 can provide a supporting force to the probes 210 when the probes 210 are subjected to an external force in a direction perpendicular to the supporting plate 110.
In one embodiment, the through holes 112 may be arranged corresponding to the probes 210, for example, the number of the through holes 112 is the same as the number of the probes 210, and each probe 210 is fixed in a corresponding one of the through holes 112, such that the arrangement ensures that the probes 210 are perpendicular to the supporting plate 110, so that the probes 210 are in perpendicular contact with the PCBA board 20 to be tested. In one embodiment, the supporting plate 110 may include a plurality of through holes 112, the plurality of through holes 112 are uniformly distributed on the supporting plate 110 and penetrate the supporting plate 110, the probes 210 are detachably mounted in the through holes 112, and the probes 210 penetrate the through holes 112 and are perpendicular to the supporting plate 110. Due to the fact that the test points of the PCBA boards 20 to be tested of different types are different, the positions of the probes 210 can be changed conveniently when the types of the PCBA boards 20 to be tested are changed, and the test process is more convenient.
In one embodiment, the supporting plate 110 includes a pin plate 113 and a supporting main plate 114, the through holes 112 are provided in the pin plate 113 and the supporting main plate 114, so that the probes 210 are fixed to the pin plate 113 and penetrate through the pin plate 113 and the supporting main plate 114, and the pin plate 113 is also used for placing the PCBA board 20 to be tested. The shape and size of the pin plate 113 are adapted to the shape and size arrangement of the conventional PCBA board 20 to be tested, so that the PCBA board 20 to be tested can be stably placed on the pin plate 113.
The probes 210 may be fixed vertically to the needle board 113 with the position of the probes 210 fixed on the needle board 113. The pin plate 113 supports the probes 210, so that the probes 210 are not easy to incline or bend in the testing process, and meanwhile, the pins 210 are vertically abutted against the PCBA board 20 to be tested which is horizontally placed by the arrangement of the pin plate 113, so that the probes 210 are ensured to be in good contact with the PCBA board 20 to be tested. The pin plates 113 can be divided into different types of pin plates 113 according to different positions of the probes 210 fixed on the pin plates 113, different types of PCBA boards 20 to be tested can be correspondingly tested, and the pin plates 113 can be detached and replaced when different types of PCBA boards are tested.
In one embodiment, the pin plate 113 is detachably fixed to the surface of the support main plate 114, for example, the pin plate 113 may be mounted to the support main plate 114 by screws. In one embodiment, the pin plate 113 and the supporting main plate 114 are provided with a buckle and a slot structure, for example, the pin plate 113 is provided with a buckle structure, the supporting main plate 114 is provided with a slot structure, and the slot structure and the buckle structure can be buckled, so that the pin plate 113 can be conveniently disassembled and assembled on the supporting main plate 114. The pin plate 113 can be directly replaced when replacing the PCBA board 20 to be tested to match different kinds of PCBA boards 20 to be tested.
The pin plate 113 is provided with a fixing jig (not shown) for placing the PCBA board 20 to be tested, and the fixing jig can fix the position of the PCBA board 20 to be tested, so that the PCBA board 20 is not easily moved to disturb the test result during the test.
In one embodiment, the testing apparatus 10 further includes a pressing plate mechanism 400, the pressing plate mechanism 400 is located above the supporting plate 110, the pressing plate mechanism 400 includes a pressing plate 410 and a driving mechanism 420, the pressing plate 410 is movably disposed on the testing jig 100, the driving mechanism 420 is in transmission connection with the pressing plate 410, and the driving belt of the driving mechanism 420 drives the pressing plate 410 to selectively move toward or away from the probe 210. In one embodiment, the driving mechanism 420 may include a handle 421, the handle 421 is configured to facilitate a tester to control the pressing plate mechanism 400 to move toward the probe 210 and finally contact the PCBA board 20 to be tested, and the tester may also control the pressing force when testing different types of PCBA boards 20 to be tested, so as to better match the types of the PCBA boards 20 to be tested.
In one embodiment, the driving mechanism 420 includes a motor and a controller (not shown), and the tester can input the test parameters into the controller in advance, and the driving mechanism 420 can automatically drive the platen 410 to approach the PCBA board 20 to be tested until the platen abuts against the PCBA board 20 to be tested, without the tester operating the driving mechanism. The manual driving mechanism 420 is selected, so that a tester can control the pressing plate 410 to be pressed down more accurately, and the automatic driving mechanism 420 is selected, so that the testing process is more intelligent, convenient and automatic.
The platen mechanism 400 further includes a transmission member (not shown) in transmission connection with the driving mechanism 420 and the platen 410. In an embodiment, please refer to fig. 4, the pressing plate 410 further includes an abutting member 411, the abutting member 411 abuts against the PCBA board 20 to be tested in the testing process, so that the electrical connection between the probe 210 and the PCBA board 20 to be tested is more stable, the abutting member 411 may be an abutting head, the abutting head has a small contact area with the PCBA board 20 to be tested, the PCBA board 20 to be tested cannot be damaged, the number of the abutting heads may be multiple, and the multiple abutting heads may be distributed at equal intervals to apply force to the PCBA board 20 to be tested, so that the force applied to the PCBA board 20 to be tested is uniform.
In an embodiment, when the test fixture 10 includes the platen mechanism 400, adaptively, the pin plate 113 is telescopically arranged in the support main board 114, when the platen mechanism 400 applies an external force to the pin plate 113, the telescopic arrangement of the pin plate 113 enables the abutting between the probe 210 and the PCBA board 20 to be tested to have a buffer, such arrangement enables the platen mechanism 400 to be pressed down, so that the probe 210 is not easily deformed or the PCBA board 20 is damaged due to the improper force of the platen mechanism 400, and the head of the probe 210 is excessively pressed against the PCBA board 20 to be tested.
Referring to fig. 4 and 5, the adapter plate 220 is detachably fixed to the surface of the supporting main board 114 away from the needle board 113. The adapter plate 220 and the needle plate 113 are respectively fixed on the surfaces of two sides of the supporting main board 114, and the pressing plate mechanism 400 is abutted against the PCBA board 20 to be tested, so that the PCBA board 20 to be tested is electrically connected with the needle heads of the probes 210. The probe 210 penetrates through the through hole 112 and the supporting main board 114, and a pin tail of the probe 210 abuts against a test point 211 on the adapter board 220 fixed on the other side surface of the supporting main board 114. The probe 210 communicates the PCBA board 20 to be tested and the interposer 220, and realizes pin-to-pin connection between the test points 211 on the PCBA board 20 and the interposer 220, and in an embodiment, the interposer 220 may be a printed circuit board.
The flat cable interface 212 may be electrically connected to all the test points 211, and the flat cable interface 212 may be electrically connected to the 40pin patch cable 213, in other embodiments, the types of the flat cable interface 212 and the patch cable 213 are not limited. The connection between the flat cable interface 212 and the adapting flat cable 213 is stable, and the test points 211 on the adapting board 220 can be uniformly and electrically connected to the control board 300 by using the flat cable interface 212 and the adapting flat cable 213, thereby facilitating the test process of the PCBA board 20. The adapter plate 220 is uniformly and electrically connected with the adapter flat cable 213 through the flat cable interface 212, so that the wiring of test points is avoided being searched manually, and the labor cost is reduced.
In one embodiment, referring to fig. 1, the test fixture 10 further includes an interface extender 500, the interface extender 500 is electrically connected to the signal transmission interface 310, and the interface extender 500 has a plurality of signal interfaces. The interface extender 500 may be a USB extender, the control board 300 may be connected to the USB extender, and the USB extender may be connected to a computer or a digital multimeter, respectively.
The embodiment of the present application provides a testing apparatus, which includes the testing fixture 10 and the testing instrument 600 in any of the above embodiments, wherein the testing instrument 600 is electrically connected to the signal transmission interface 310. Fig. 6 shows the connection relationship between the components of the testing apparatus provided in the embodiment of the present application, the PCBA board 20 to be tested is placed on the pin plate 113, the pin plate 113 and the interposer 220 are connected by the pin 210 in a pin-to-pin manner, the interposer 220 is electrically connected to the control board 300 by the via-cable 213, the control board 300 is provided with a signal transmission interface 310, and can be connected to the interface extender 500, and the interface extender 500 can be further electrically connected to a digital multimeter and a computer as the testing apparatus 600.
The test device provided by the embodiment of the application, the test component 200 is detachably mounted on the test frame 100, so that the test component 200 can be conveniently replaced to match different PCBA boards 20, the test device is compatible with different PCBA boards 20, and multiple products can share one test fixture 10. The probe 210 is electrically connected with the PCBA board 20 to be tested and the adapter plate 220, so that the pin-to-pin connection between the PCBA board 20 to be tested and the adapter plate 220 is realized, the adapter plate 220 is uniformly and electrically connected with the adapting flat cable 213 through the flat cable interface 212, the wiring of a test point is avoided being manually searched, and the labor cost is reduced. The adapting cable 213 is electrically connected to the control board 300, the control board 300 is provided with a signal transmission interface 310, and multiple products can share one testing fixture 10.
The description of the terms "some embodiments," "other embodiments," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this application, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this application can be combined and combined by those skilled in the art without contradiction.
The above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (10)
1. A test fixture, comprising:
a test jig;
the test component is detachably mounted on the test frame and comprises a probe and an adapter plate, the probe is used for electrically connecting a PCBA board to be tested, the adapter plate is provided with test points and a flat cable interface, the test points are respectively electrically connected with the probe and the flat cable interface, and the flat cable interface is uniformly and electrically connected with a switching flat cable; and
the control panel is arranged on the test frame and provided with a signal transmission interface, and the signal transmission interface is electrically connected with the switching flat cable so as to uniformly and electrically connect the test points through the switching flat cable.
2. The test fixture of claim 1, wherein the test fixture further comprises a support plate, the probe is fixed to the support plate and penetrates through the support plate, and the support plate is further used for placing the PCBA board to be tested.
3. The testing fixture of claim 2, wherein the supporting plate is provided with a through hole corresponding to the probe, and the probe penetrates through the through hole and abuts against the adapter plate.
4. The test fixture of claim 2, wherein the supporting plate comprises a needle plate and a supporting main plate, the probes are fixed on the needle plate and penetrate through the needle plate and the supporting main plate, and the needle plate is further used for placing the PCBA board to be tested.
5. The test fixture of claim 4, wherein the pin plate is detachably fixed to a surface of the supporting main plate, and the adapter plate is detachably fixed to a surface of the supporting main plate facing away from the pin plate.
6. The test fixture of claim 4, wherein the needle plate is provided with a fixing clamp for placing the PCBA board to be tested.
7. The testing fixture of claim 2, further comprising a pressing mechanism disposed on the testing frame, the pressing mechanism being located above the supporting plate, the pressing mechanism being selectively movable toward or away from the probes.
8. The testing fixture of claim 7, wherein the platen mechanism includes a platen movably disposed on the testing frame and a driving mechanism drivingly connected to the platen, the driving mechanism drivingly driving the platen to selectively move toward or away from the probe.
9. The test fixture of any one of claims 1-8, further comprising an interface extender electrically connected to the signal transmission interface, the interface extender having a plurality of signal interfaces.
10. A test apparatus, comprising:
the test fixture of any one of claims 1 to 9; and
and the test instrument is electrically connected with the signal transmission interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121942453.8U CN215986161U (en) | 2021-08-18 | 2021-08-18 | Test fixture and test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121942453.8U CN215986161U (en) | 2021-08-18 | 2021-08-18 | Test fixture and test device |
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| Publication Number | Publication Date |
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| CN215986161U true CN215986161U (en) | 2022-03-08 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202121942453.8U Active CN215986161U (en) | 2021-08-18 | 2021-08-18 | Test fixture and test device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115684676A (en) * | 2022-12-28 | 2023-02-03 | 昆山迈致治具科技有限公司 | Testing device and testing method based on various types of circuit boards |
| CN118068087A (en) * | 2024-04-18 | 2024-05-24 | 业展电子(惠州市)有限公司 | Detachable resistance measuring device |
-
2021
- 2021-08-18 CN CN202121942453.8U patent/CN215986161U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115684676A (en) * | 2022-12-28 | 2023-02-03 | 昆山迈致治具科技有限公司 | Testing device and testing method based on various types of circuit boards |
| CN118068087A (en) * | 2024-04-18 | 2024-05-24 | 业展电子(惠州市)有限公司 | Detachable resistance measuring device |
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