CN213581039U - MIPI testing arrangement - Google Patents

Abstract

The utility model relates to a MIPI test technical field discloses a MIPI testing arrangement, including testboard and movable mounting in the MIPI test fixture of top one side of testboard, FPC positioning slot has been seted up at the top of testboard, MIPI test fixture towards one side of testboard is equipped with 2N thimble connectors that are the matrix arrangement, 2N the thimble connector is connected with a N MIPI binding post altogether electricity, one MIPI binding post is adjacent two through two signal line electrical connection respectively the thimble connector. The utility model discloses a MIPI testing arrangement replaces current manual flying lead, has not only saved the preparation operating time before the test greatly, can also ensure electrical connection's reliability, has improved MIPI's whole efficiency of software testing.

Description

MIPI testing arrangement

Technical Field

The utility model relates to a MIPI tests technical field, especially relates to a MIPI testing arrangement.

Background

The MIPI (Mobile industry processor Interface) is an open standard and a specification established for a Mobile application processor initiated by the MIPI alliance, which improves the consistency of the application processor Interface and promotes the reuse and compatibility of Mobile devices. In an existing mobile terminal, for example, a mobile phone or a tablet computer, a camera/a display of the mobile terminal generally uses MIPI based on a differential signal when being connected to a PCB (hard board).

The connection mode of the MIPI module and the PCB has diversity, but the common mode is that the MIPI module is connected with the PCB through the transfer FPC, the MIPI routing is arranged on the transfer FPC, and the routing space of the PCB is saved to a certain extent.

At present, when MIPI is automatically tested, more tin foil wires need to be flown, an MIPI signal wire connected with an FPC is connected to an oscilloscope through flying wires, and whether an output waveform meets MIPI protocol specifications or not is observed through the oscilloscope; however, MIPI routing differs according to different MIPI module types, requirements for flying wire length and welding quality are high, once the flying wire is broken or falls off, MIPI testing needs to be repeated, and much time and energy are wasted. Therefore, how to improve the efficiency of the MIPI automated test becomes a technical problem to be solved urgently in the field.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a MIPI testing arrangement for solve above-mentioned technical problem.

To achieve the purpose, the utility model adopts the following technical proposal:

the utility model provides a MIPI testing device, including testboard and the MIPI test fixture of movable mounting in one side of the top of testboard, the top of testboard is offered with the FPC positioning slot of the shape looks adaptation of the switching FPC that awaits measuring, MIPI test fixture is equipped with 2N thimble connectors that are the matrix arrangement towards one side of the testboard; 2N MIPI test signal points are formed on the surface of the transfer FPC, and the arrangement mode of the 2N MIPI test signal points is the same as that of the 2N thimble mounting holes;

the 2N thimble connectors are electrically connected with N MIPI connecting terminals used for electrically connecting an oscilloscope in common; the MIPI connecting terminal is electrically connected with two adjacent thimble connectors through two signal wires respectively, and the lengths of all the signal wires are equal;

wherein N is a natural number of 2 or more.

Optionally, the MIPI terminal block is fixedly arranged on a surface of one side of the MIPI test fixture, which is far away from the test board;

2N thimble mounting holes which are arranged in a matrix form are formed in the surface of one side, facing the test board, of the MIPI test jig, and a thimble connector is mounted in each thimble mounting hole;

and the needle head of the thimble connector extends out of the thimble mounting hole.

Optionally, the thimble mounting hole is a through hole penetrating through the MIPI test fixture, and the signal line is fixed on a side surface of the MIPI test fixture far away from the test board.

Optionally, N is 4;

the MIPI connecting terminal comprises two clock signal connecting terminals and two data signal connecting terminals; the clock signal terminal comprises a CP signal connecting terminal and a CN signal connecting terminal, and the data signal connecting terminal comprises a DP signal connecting terminal and a DN signal connecting terminal;

the CP signal connection terminal, the CN signal connection terminal, the DP signal connection terminal and the DN signal connection terminal respectively comprise a grounding signal port;

and only one of any two adjacent pin connectors is used for electrically connecting the grounding signal ports.

Optionally, the two clock signal connection terminals are respectively disposed on two opposite sides of the matrix, and the two data signal connection terminals are respectively disposed on the other opposite sides of the matrix; and the signal wire used for electrically connecting the clock signal wiring terminal and the signal wire used for electrically connecting the data signal wiring terminal are vertically arranged.

Optionally, the thimble connector includes a needle cylinder fixedly installed in the thimble installation hole, a spring installed in the needle cylinder, and the needle slidably sleeved in the needle cylinder; one end of the spring is fixedly connected with the needle head; when the spring is in an original state, the needle head extends out of the thimble mounting hole; and an arc end surface is formed at one end of the needle head far away from the spring.

Optionally, the MIPI connection terminal includes a MIPI front-end probe and an oscilloscope probe plugged into one end of the MIPI front-end probe away from the matrix; the MIPI front-end probe is electrically connected with the signal wire, and the oscilloscope probe is electrically connected with the input end of the oscilloscope.

Optionally, the transfer FPC of the mobile terminal is electrically connected between the PCB of the mobile terminal and the MIPI module;

the MIPI module is a camera or a display screen of the mobile terminal;

the mobile terminal is a mobile phone or a tablet computer.

Optionally, a jig mounting plate is fixedly mounted at the top of the test board;

the jig mounting plate is provided with two parallel sliding grooves; the MIPI test fixture faces one edge of the fixture mounting plate, a sliding block is fixedly arranged at a position corresponding to the two sliding grooves respectively, and the two sliding blocks are connected in the two sliding grooves in a sliding mode respectively.

Optionally, a driving member for driving the MIPI test fixture to slide along the sliding groove is further mounted on the fixture mounting plate; the driving part of the driving part is fixedly connected with the MIPI test fixture;

the driving part is a linear motor, and the driving part is a motor shaft of the linear motor.

Compared with the prior art, the beneficial effects of the utility model are that:

by adopting the MIPI testing device provided by the utility model, manual flying is not needed during testing, so that the preparation working time before testing is greatly saved, the reliability of electrical connection can be guaranteed, and the overall testing efficiency of MIPI is improved; the thimble connectors are arranged in a matrix arrangement mode, so that the routing layout of signal lines is clear, and the connection relation between the thimble connectors and the MIPI connecting terminals is more visual; during testing, the transfer FPC is only needed to be placed into the FPC positioning clamping groove, alignment between the MIPI wiring terminal and each MIPI test signal point of the transfer FPC can be completed, and operation is very simple and convenient.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without inventive exercise.

Fig. 1 is a schematic structural diagram of an MIPI testing apparatus provided in an embodiment of the present invention;

fig. 2 is the embodiment of the utility model provides a MIPI test fixture's schematic structure diagram.

In the figure:

10. a test bench; 101. an FPC positioning clamping groove; 11. a jig mounting plate; 111. a chute; 20. an MIPI test fixture; 21. a thimble connector; 22. an MIPI connection terminal; 23. and a signal line.

Detailed Description

In order to make the objects, features and advantages of the present invention more obvious and understandable, the drawings in the embodiments of the present invention are combined below to clearly and completely describe the technical solutions in the embodiments of the present invention, and obviously, the embodiments described below are only some embodiments of the present invention, but not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.

Referring to fig. 1, fig. 1 is a schematic structural diagram of an MIPI testing apparatus according to an embodiment of the present invention.

The MIPI testing device is used for testing whether the MIPI of the transfer FPC of the mobile terminal meets a preset testing requirement, for example, whether a waveform output from an MIPI testing signal point preset by the transfer FPC meets an MIPI specification or not. The switching FPC is used for electrically connecting a PCB (printed circuit board) of the mobile terminal and the MIPI (mobile industry processor interface) module, and the MIPI module is a camera or a display screen and other functional modules adopting MIPI.

It should be noted that, in this embodiment, the mobile terminal is a mobile phone or a tablet computer and other terminal devices integrated with the MIPI module. The existing mobile terminal needs to perform a plurality of tests on related functions or performances before leaving a factory; this is also the case for the transition FPC, which typically has several MIPI test signal points formed on the surface for testing convenience.

The MIPI testing device comprises a testing platform 10 and an MIPI testing jig 20 movably installed on one side of the top of the testing platform 10, wherein the top of the testing platform 10 is provided with an FPC positioning clamping groove 101 matched with the shape of a to-be-tested transfer FPC, and one side of the MIPI testing jig 20 facing the testing platform 10 is provided with 2N thimble connectors 21 arranged in a matrix manner; 2N MIPI test signal points are formed on the surface of the transfer FPC, and the arrangement mode of the 2N MIPI test signal points is the same as that of the 2N thimble mounting holes;

the 2N thimble connectors 21 are electrically connected with N MIPI connecting terminals 22 for electrically connecting the oscilloscope; wherein, an MIPI connection terminal 22 is electrically connected to two adjacent thimble connectors 21 through two signal lines 23 respectively, and the lengths of all the signal lines 23 are equal;

wherein N is a natural number of 2 or more.

In this embodiment, in order to realize the universality of the MIPI testing device, the routing layout of the signal line 23 is also clear, so that the connection relationship between the thimble connector 21 and the MIPI connection terminal 22 is more intuitive, and the thimble connectors 21 on the MIPI testing device are arranged in a matrix arrangement manner.

Specifically, a jig mounting plate 11 is fixedly mounted at the top of the test bench 10;

the jig mounting plate 11 is provided with two parallel sliding grooves 111, one edge of the MIPI test jig 20 is fixedly provided with a sliding block corresponding to the positions of the two sliding grooves 111, and the two sliding blocks are respectively connected in the two sliding grooves 111 in a sliding manner;

the jig mounting plate 11 is also provided with a driving piece for driving the MIPI test jig 20 to slide along the sliding groove 111; the driving part of the driving part is fixedly connected with the MIPI test fixture 20;

the driving part can adopt a linear motor or an air cylinder, and the like.

More specifically, the MIPI connecting terminal 22 is fixedly arranged on a side surface of the MIPI testing jig 20 away from the testing platform 10;

the MIPI test fixture 20 is provided with 2N thimble mounting holes arranged in a matrix on a side surface facing the test board 10, and each thimble mounting hole is provided with a thimble connector 21;

the needle of the thimble connector 21 extends out of the thimble mounting hole.

In a preferred embodiment, the thimble mounting holes are through holes penetrating through the MIPI test fixture 20, and the signal lines 23 are fixed on a side surface of the MIPI test fixture 20 away from the test board 10.

This embodiment can control the lift of MIPI test fixture 20 through the driving piece, and when the test, the tester only needs to put into FPC positioning slot 101 with switching FPC, restarts the driving piece, can accomplish the electric connection between MIPI binding post 22 and each MIPI test signal point of switching FPC, connects MIPI binding post 22 on the oscilloscope again, can test, and it is very simple and convenient to operate.

Wherein, the mode that adopts to go up and down makes thimble connector 21 conflict MIPI test signal point only be the specific implementation mode that this embodiment provided, and it can be understood that there are a lot of MIPI test fixture 20 and testboard 10's movable mounting's mode, for example, the mode through overturning can realize conflicting MIPI test signal point with thimble connector 21 equally, only need install a pivot on testboard 10, rotate through the pivot and install MIPI test fixture 20 can.

Specifically, N is 4;

the MIPI connection terminals 22 include two clock signal connection terminals and two data signal connection terminals; the clock signal terminal comprises a CP signal connecting terminal and a CN signal connecting terminal, and the data signal connecting terminal comprises a DP signal connecting terminal and a DN signal connecting terminal;

the CP signal connecting terminal, the CN signal connecting terminal, the DP signal connecting terminal and the DN signal connecting terminal respectively comprise a grounding signal port;

only one and any two of the adjacent header connectors 21 are used to electrically connect the ground signal ports.

It should be noted that, because different MIPI modules have different routing modes, and the selected signal points for measurement are different, different manufacturers do not form a uniform standard in the MIPI test signal point arrangement mode;

the MIPI module generally includes a set of clock signals and a plurality of sets of data signals, wherein a set of clock signals includes CP signals and CN signals, and a set of data signals includes a DP signal and a DN signal; during testing, generally, only one group of clock signals and one group of data signals need to be tested, for example, a camera is provided, the higher the pixel is, the more the data signal terminals are used, for example, two groups of data signals need to be used for a 200M-level pixel, and four groups of data signals need to be used for a 1600M-level pixel;

in this embodiment, a set of clock signals and a set of data signals are selected for testing. It should be understood that multiple sets of data signals may be used for testing, and should not be construed as limiting the scope of the present invention.

Specifically, two clock signal connection terminals are respectively arranged on two opposite sides of a matrix on the MIPI test fixture 20, and two data signal connection terminals are respectively arranged on the other opposite sides of the matrix on the MIPI test fixture 20; the signal line for electrically connecting the clock signal connection terminal and the signal line for electrically connecting the data signal connection terminal are vertically arranged.

Specifically, the thimble connector 21 includes a needle cylinder fixedly installed in the thimble installation hole, a spring installed in the needle cylinder, and a needle slidably sleeved in the needle cylinder; one end of the spring is fixedly connected with the needle head; when the spring is in an original state, the needle head extends out of the thimble mounting hole; and an arc end face is formed at one end of the needle head far away from the spring so as to avoid damaging the MIPI test signal point.

Specifically, the MIPI connection terminal 22 includes an MIPI front-end probe and an oscilloscope probe inserted into one end of the MIPI front-end probe away from the thimble connector 21; the MIPI front-end probe is electrically connected with the signal wire 23, and the oscilloscope probe is electrically connected with the input end of the oscilloscope.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

The above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.

Claims (10)

1. The MIPI testing device is characterized by comprising a testing table and an MIPI testing jig arranged on one side of the top of the testing table, wherein an FPC (flexible printed circuit) positioning clamping groove is formed in the top of the testing table, and 2N thimble connectors arranged in a matrix manner are arranged on one side, facing the testing table, of the MIPI testing jig;

the 2N thimble connectors are electrically connected with N MIPI connecting terminals in common; the MIPI connecting terminal is electrically connected with two adjacent thimble connectors through two signal wires respectively, and the lengths of all the signal wires are equal;

wherein N is a natural number of 2 or more.

2. The MIPI testing device of claim 1, wherein the MIPI connecting terminal is fixedly arranged on one side surface of the MIPI testing jig, which is far away from the testing table;

2N thimble mounting holes which are arranged in a matrix form are formed in the surface of one side, facing the test board, of the MIPI test jig, and a thimble connector is mounted in each thimble mounting hole;

and the needle head of the thimble connector extends out of the thimble mounting hole.

3. The device of claim 2, wherein the thimble mounting holes are through holes passing through the MIPI test fixture, and the signal lines are fixed on a side surface of the MIPI test fixture away from the test board.

4. A MIPI test apparatus according to claim 1, wherein N is 4;

the MIPI connecting terminal comprises two clock signal connecting terminals and two data signal connecting terminals; the clock signal terminal comprises a CP signal connecting terminal and a CN signal connecting terminal, and the data signal connecting terminal comprises a DP signal connecting terminal and a DN signal connecting terminal;

the CP signal connection terminal, the CN signal connection terminal, the DP signal connection terminal and the DN signal connection terminal respectively comprise a grounding signal port;

and only one of any two adjacent pin connectors is used for electrically connecting the grounding signal ports.

5. An MIPI testing device in accordance with claim 4, wherein two of said clock signal terminals are provided on opposite sides of said matrix, and two of said data signal terminals are provided on opposite sides of said matrix; and the signal wire used for electrically connecting the clock signal wiring terminal and the signal wire used for electrically connecting the data signal wiring terminal are vertically arranged.

6. The MIPI testing device of claim 2, wherein the thimble connector comprises a barrel fixedly mounted in the thimble mounting hole, a spring mounted in the barrel, and the needle slidably sleeved in the barrel; one end of the spring is fixedly connected with the needle head; when the spring is in an original state, the needle head extends out of the thimble mounting hole; and an arc end surface is formed at one end of the needle head far away from the spring.

7. The MIPI testing device of claim 1, wherein the MIPI connection terminal comprises a MIPI front-end probe and an oscilloscope probe plugged into one end of the MIPI front-end probe, which is far away from the matrix; the MIPI front-end probe is electrically connected with the signal wire, and the oscilloscope probe is electrically connected with the input end of the oscilloscope.

8. The MIPI test apparatus as claimed in claim 1, wherein the relay FPC of the mobile terminal is electrically connected between the PCB of the mobile terminal and the MIPI module;

the MIPI module is a camera or a display screen of the mobile terminal;

the mobile terminal is a mobile phone or a tablet computer.

9. The MIPI testing device of claim 1, wherein a jig mounting plate is fixedly mounted on the top of the testing platform;

the jig mounting plate is provided with two parallel sliding grooves; the MIPI test fixture faces one edge of the fixture mounting plate, a sliding block is fixedly arranged at a position corresponding to the two sliding grooves respectively, and the two sliding blocks are connected in the two sliding grooves in a sliding mode respectively.

10. The MIPI testing device of claim 9, wherein a driving member for driving the MIPI testing jig to slide along the sliding groove is further mounted on the jig mounting plate; the driving part of the driving part is fixedly connected with the MIPI test fixture;

the driving part is a linear motor, and the driving part is a motor shaft of the linear motor.

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