CN210090507U

CN210090507U - Test fixture

Info

Publication number: CN210090507U
Application number: CN201920037054.3U
Authority: CN
Inventors: 郭士军; 高裕弟; 孙剑; 洪耀; 韩中伟
Original assignee: Zaozhuang Weixinnuo Electronic Technology Co Ltd
Current assignee: Zaozhuang Ruinuo Electronic Technology Co., Ltd
Priority date: 2019-01-09
Filing date: 2019-01-09
Publication date: 2020-02-18
Anticipated expiration: 2029-01-09

Abstract

A test fixture, comprising: the base is provided with a support plate; the carrier plate is provided with a first accommodating groove and a second accommodating groove which are used for accommodating the adapter plate and the plate to be detected respectively; a communication plane allowing the adapter plate in the first accommodating groove to be communicated with the plate to be tested is arranged between the first accommodating groove and the second accommodating groove, and the input end of the adapter plate and the test end of the plate to be tested are positioned in the same plane through the communication plane; the probe assembly is arranged on the carrier plate and is in conduction connection with the output end of the adapter plate; and the testing component is in conductive communication with the probe component and is used for testing the board to be tested.

Description

Test fixture

Technical Field

The utility model relates to an electron device's detection technology field, concretely relates to test fixture.

Background

With the rapid development of the electronic industry, electronic products need to be strictly tested in the manufacturing process, and the testing of the electronic products is usually realized by connecting the electronic products to a test card of a plug-in and test host and by communication between the electronic products and a tester.

Because the adapter plate needs to be frequently connected with the plate to be tested in the test process, the loss of the connecting end of the adapter plate is large, the service life of the adapter plate is short, the replacement frequency is high, and the reduction of the productivity is brought. The input that adapter plate and plate to be tested are connected in current test fixture sets up in the mounting groove opening part of plate to be tested for unsettling usually, makes it and the plate to be tested that is located the mounting groove electrically conductive switch-on, consequently when operating personnel gets when putting the plate to be tested, the plate to be tested gets into or shifts out the in-process and easily drives the buckle of adapter plate production upper and lower direction to produce the loss, reduced its life.

SUMMERY OF THE UTILITY MODEL

Therefore, the to-be-solved technical problem of the utility model lies in overcoming among the test fixture among the prior art to the junction of adapter plate and the plate that awaits measuring lack the effective support that makes it be in the coplanar, easily lead to the defect that the connecting end of adapter plate damaged to a test fixture is provided.

Therefore, the technical scheme of the utility model is as follows:

a test fixture, comprising:

the base is provided with a support plate; the carrier plate is provided with a first accommodating groove and a second accommodating groove which are used for accommodating the adapter plate and the plate to be detected respectively; a communication plane allowing the adapter plate in the first accommodating groove to be communicated with the plate to be tested is arranged between the first accommodating groove and the second accommodating groove, and the input end of the adapter plate and the test end of the plate to be tested are positioned in the same plane through the communication plane;

the probe assembly is arranged on the carrier plate and is in conduction connection with the output end of the adapter plate;

and the testing component is in conductive communication with the probe component and is used for testing the board to be tested.

Furthermore, a pressing plate is further arranged on the first accommodating groove, and the adapter plate is pressed and fixed in the first accommodating groove by the pressing plate.

Furthermore, the pressing plate is movably connected with the carrier plate.

Further, the pressing plate is fixed on the carrier plate through bolts.

Furthermore, one end of the pressing plate is pivoted with the support plate, and the other end of the pressing plate is movably connected with the support plate through a locking piece.

Furthermore, the locking piece comprises a buckle arranged on one of the pressing plate and the carrier plate and a clamping groove arranged on the other and matched with the buckle.

Furthermore, a protective layer is further arranged on the surface, in contact with the adapter plate, of the pressing plate.

Furthermore, a positioning pin for positioning the plate in the first accommodating groove and/or the second accommodating groove is/are arranged in the first accommodating groove and/or the second accommodating groove.

Furthermore, the test fixture further comprises a pressing component, wherein the pressing component presses the plate to be tested into the second accommodating groove, and the test end of the plate to be tested is in conductive connection with the input end of the adapter plate.

Furthermore, the test fixture is an I CT test fixture.

The utility model discloses technical scheme has following advantage:

the utility model provides a test fixture, include: the base is provided with a support plate; the carrier plate is provided with a first accommodating groove and a second accommodating groove which are used for accommodating the adapter plate and the plate to be detected respectively; a communicating plane allowing the adapter plate in the first accommodating groove to be communicated with the plate to be tested is arranged between the first accommodating groove and the second accommodating groove, and the communicating plane enables the input end of the adapter plate and the testing end of the plate to be tested to be located in the same plane; the probe assembly is arranged on the support plate and is in conduction connection with the output end of the adapter plate; and the test assembly is in conductive communication with the probe assembly and is used for testing the board to be tested. The first containing groove and the second containing groove which are used for containing the support plate and the plate to be tested respectively are arranged, the communicating planes which are communicated with the containing grooves are arranged between the containing grooves, the input end of the adapter plate and the testing end of the plate to be tested are located in the same plane, the connecting end part of the plate to be tested and the adapter plate is stably supported through the communicating planes, and the input end of the adapter plate is prevented from being arranged in a suspended mode, so that the situation that the testing end of the plate to be tested drives the input end of the adapter plate to bend back and forth in the process of taking and placing the plate to be tested can be avoided, the loss of the rotating plate is reduced, the service life of; because the times of replacing the adapter plate are reduced, the test productivity of the production line is improved.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the technical solutions in the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

Fig. 1 is a front view of the testing jig of the present invention;

fig. 2 is a schematic structural diagram of the carrier board in fig. 1;

fig. 3 is a schematic structural view of the lower platen group in fig. 1.

Description of reference numerals:

1-a base; 2-a carrier plate; 3-a probe assembly; 4-a first accommodating groove; 5-a second accommodating groove; 6-pressing a plate; 7-day plate; 8-pressing the handle; 9-pressing the plate group; 91-upper laminate; 92-a lower laminate; 93-a guide bar; 10-positioning a guide rod; 11-fixing the bolt; 12-plane of communication.

Detailed Description

The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Example 1

As shown in fig. 1, the present invention provides a testing fixture, particularly an I CT testing fixture, which is not limited to the I CT testing fixture, but also can be used for other testing fixtures conducting the circuit board. It comprises a base 1, a probe assembly 3 and a test assembly. The base 1 is provided with a support plate 2, the support plate 2 is fixed on the base 1 through a fixing bolt 11, and the support plate 2 is provided with a first accommodating groove 4 and a second accommodating groove 5 which are used for accommodating the adapter plate and the plate to be detected respectively; the adapter plate is fixed in the first accommodating groove 4 through the pressing plate 6; the probe assembly 3 is arranged on the carrier plate 2 and is in conductive connection with the output end of the adapter plate; one end of a test needle in the probe component 3 is always in conductive communication with the output end of the adapter plate, the other end of the test needle is in conductive communication with the test component through a wire, and the test component tests the board to be tested through the probe component and the adapter plate.

As shown in fig. 2, a communication plane 12 allowing the interposer therein to be connected to the board to be tested is disposed between the first receiving slot 4 and the second receiving slot 5, and the communication plane 12 enables the input end of the interposer and the testing end of the board to be tested to be located in the same plane. The input end of the adapter plate is prevented from being arranged in a suspended mode through the arrangement, so that an acting force which is generated by the connecting end of the adapter plate and enables the connecting end to be bent repeatedly in the process of taking and placing the plate to be tested is avoided, the abrasion of the input end of the adapter plate when the plate to be tested is taken and placed in the test process is reduced, and the service life of the adapter plate is prolonged; the replacement frequency of the adapter plate is reduced, and therefore the test productivity is improved.

In order to conveniently take and place the adapter plate and the plate to be tested, a taking and placing groove communicated with the first accommodating groove and the second accommodating groove can be formed in the first accommodating groove 4 and the second accommodating groove 5 respectively, and fingers of operators can place or take out the adapter plate and the plate to be tested from the taking and placing groove conveniently.

The pressing plate 6 in this embodiment is correspondingly disposed above the first accommodating groove 4, the pressing plate 6 is used for pressing and fixing the adapter plate in the first accommodating groove 4, and the pressing plate 6 is movably connected to the carrier plate 2. In this embodiment, the pressing plate 6 is a strip-shaped plate, two ends of the strip-shaped plate are respectively provided with a screw hole, and the corresponding positions on the carrier plate 2 are also respectively provided with a screw hole, so that the pressing plate 6 is fixed on the carrier plate 2 through bolts or screws.

As an alternative embodiment, one end of the pressing plate 6 is pivotally connected to the carrier plate 2, and the other end is movably connected to the carrier plate 2 through a locking member. Specifically, the support plate 2 is provided with a boss which is shaped like Chinese character 'ao', an articulated shaft is articulated on the boss shaped like Chinese character 'ao', an articulated hole allowing the articulated shaft to pass through is arranged at the articulated end part of the pressing plate 6, and the two ends of the articulated shaft are respectively inserted into the boss on the support plate 2 after passing through the articulated hole. The pressure plate 6 can thus be turned over with respect to the carrier plate 2 by means of the hinge axis; the end part of the pressing plate 6, which is not provided with the articulated shaft, is provided with a locking piece, wherein the locking piece comprises a buckle arranged on one of the pressing plate 6 and the carrier plate 2 and a clamping groove arranged on the other and matched with the buckle; by means of the snap connection, the opening and locking of the pressure plate 6 can be carried out more conveniently.

In this embodiment, at least the surface of the pressing plate 6 contacting the adapter plate is further provided with a protective layer, wherein the protective layer may be a flexible rubber layer or an insulating tape attached to the inner surface of the pressing plate 6.

The test fixture in this embodiment further includes a pressing component, the pressing component presses the plate to be tested into the second accommodating groove 5, and the test end of the plate to be tested is kept in conductive connection with the input end of the adapter plate. The pressing assembly comprises a top plate 7, a pressing handle 8, a pressing plate group 9 and a positioning guide rod 10; it is vertical on base 1 that it is 7, push down handle 8 and install on it is 7, push down handle 8's output is connected with down clamp plate group 9, can drive push down clamp plate group 9 through pushing down handle 8 and move down along location guide bar 10 and will await measuring the plate pressfitting in second storage tank 5, can ensure the test end of awaiting measuring the plate and the input of keysets and keep good switching on through setting up the subassembly that pushes down, ensure the normal clear of test and improve product test performance.

In order to avoid the excessive pressure applied to the plate to be tested by the lower pressing plate group 9, as shown in fig. 3, the lower pressing plate group 9 in this embodiment is a double-layer pressing plate assembly, wherein a guide rod and a buffer spring are arranged between the upper pressing plate and the lower pressing plate, one end of the guide rod is fixed on the lower pressing plate, the other end of the guide rod is connected with a through hole in the upper pressing plate in a sliding manner, and a spring is sleeved on the guide rod between the upper pressing plate and the lower pressing plate. When pushing down handle 8 drive and pushing down subassembly 9 and wholly remove downwards, the lower clamp plate that is located the bottom at first contacts support plate 2 and treats the pick-up plate and applys the effort, the last laminate that is located upper portion thereafter overcomes the effort of spring and continues the downstream until the laminating is at the upper surface of lower laminate under pushing down handle 8's push down drive, and finally further exert the effort through lower clamp plate to the plate that awaits measuring, realized the further application of force to lower clamp plate from this, through setting up the double-deck clamp plate structure, on having ensured that the plate that awaits measuring is compressed tightly the basis, the destruction of the plate that awaits measuring that has avoided producing great impact force and causing it through setting up buffer spring again.

In this embodiment, the first receiving groove 4 and/or the second receiving groove 5 are further provided with a plurality of positioning pins for positioning the adapter plate or the plate to be tested therein, wherein the positioning pins are disposed on the edge of the adapter plate or the plate to be tested and conform to the shape of the plate, and the plate is clamped therein for positioning. At this time, grooves or concave holes corresponding to the positioning pins are respectively formed on the pressing plate 6 and the lower pressing plate of the lower pressing plate group, so that the pressing plate 6 and the lower pressing plate can be smoothly pressed in place to be attached to the surface of the carrier plate 2.

Of course, as an alternative embodiment, a plurality of positioning holes corresponding to the positioning pins may be provided on the adapter plate or the plate to be tested, and the adapter plate or the plate to be tested may be positioned by inserting the positioning pins into the positioning holes.

The upper and lower laminates in the carrier plate 2, the press plate 6, the top plate 7 and the lower press plate group 9 in this embodiment are all acrylic plates.

The utility model discloses a working process does:

firstly, accurately clamping the adapter plate into the first accommodating groove to enable the connecting end of the adapter plate to face the second accommodating groove and to be horizontally laid on the communicating plane; fixing the pressing plate on the carrier plate to fix the carrier plate;

secondly, accurately clamping the plate to be measured into the second accommodating groove, enabling the connecting end of the plate to be measured to face the adapter plate, and flatly paving the connecting end on the communicating plane to be connected with the adapter plate;

finally, an operator presses down the handle, the handle drives the lower pressing plate group 9 to move downwards, the lower pressing plate of the lower pressing plate group 9 is contacted with the carrier plate 2, and then the handle is continuously pressed down until the upper pressing plate overcomes the pressure of the spring and is pressed on the upper surface of the lower pressing plate, so that the temperature pressing of a plate to be tested is completed, and meanwhile, the testing end of the plate to be tested is communicated with the testing assembly through the adapter plate to execute testing;

and after the test is finished, taking the plate to be tested out of the second accommodating groove.

It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications can be made without departing from the scope of the invention.

Claims

1. A test fixture is characterized by comprising:

2. The test fixture of claim 1, wherein: the first containing groove is further provided with a pressing plate, and the pressing plate presses and fixes the adapter plate in the first containing groove.

3. The test fixture of claim 2, wherein: the pressing plate is movably connected with the support plate.

4. The test fixture of claim 3, wherein: the pressing plate is fixed on the support plate through bolts.

5. The test fixture of claim 3, wherein: one end of the pressing plate is pivoted with the support plate, and the other end of the pressing plate is movably connected with the support plate through a locking piece.

6. The test fixture of claim 5, wherein: the retaining member comprises a buckle arranged on one of the pressing plate and the carrier plate and a clamping groove arranged on the other and matched with the buckle.

7. The test fixture of claim 3, wherein: the surface of the pressing plate, which is in contact with the adapter plate, is also provided with a protective layer.

8. The test fixture of claim 3, wherein: and positioning pins for positioning the plates in the first accommodating groove and/or the second accommodating groove are/is arranged in the first accommodating groove and/or the second accommodating groove.

9. The test fixture of claim 3, wherein: the test fixture further comprises a pressing component, wherein the pressing component presses the plate to be tested into the second accommodating groove, and the test end of the plate to be tested is in conductive connection with the input end of the adapter plate.

10. The test fixture of any one of claims 1-9, wherein: the test fixture is an ICT test fixture.