CN210720643U

CN210720643U - Chip testing device

Info

Publication number: CN210720643U
Application number: CN201921193550.4U
Authority: CN
Inventors: 孔凡平; 杨京; 谢棋
Original assignee: Xiamen Atom Tong Electronic Technology Co ltd
Current assignee: Xiamen Atom Tong Electronic Technology Co ltd
Priority date: 2019-07-26
Filing date: 2019-07-26
Publication date: 2020-06-09
Anticipated expiration: 2029-07-26

Abstract

The utility model discloses a chip testing device, including base plate, test mainboard, chip anchor clamps, power and display screen, the test mainboard is fixed on the base plate, the test mainboard respectively with power and display screen communication connection. The chip clamp comprises a clamp body, the clamp body is horizontally arranged, a plurality of chip grooves used for placing chips to be tested are formed in the clamp body, a chip testing board is arranged at the bottom of each chip groove, and the chip testing board is in communication connection with the testing main board. The top in every chip groove respectively is equipped with a chip splint that are used for fixed chip that awaits measuring, chip splint's one end with the anchor clamps body is articulated, and the other end passes through buckle and anchor clamps body looks joint. The utility model discloses both can test single chip, also can test a plurality of chips simultaneously, chip anchor clamps space reasonable in design carries out the change of relevant subassembly easily, and the chip is put into and is taken out the convenience, easy operation, and the steadiness is strong, and efficiency of software testing is high.

Description

Chip testing device

Technical Field

The utility model belongs to the technical field of the chip test, in particular to chip testing device.

Background

With the continued development of VLSI circuits, more and more semiconductor devices are being integrated on a chip. These devices may include not only processors but also memories, input/output circuits, various conversion circuits, and the like. With the improvement of the integration of devices on a chip, the number of output pins of the chip is increased, and the definition and distribution of the pins are different according to different purposes of the chip, so that the challenge is brought to the improvement of the test efficiency. The existing chip test fixture generally tests a plurality of chips on a whole memory bank at the same time, and although the whole test efficiency is high, the test cannot be carried out on a single chip. Therefore, a chip testing device which can test an individual chip and is simple and convenient to operate needs to be designed.

Disclosure of Invention

To the above problem, an object of the present invention is to provide a chip testing apparatus capable of testing a single chip.

In order to realize the purpose, the utility model discloses a technical scheme as follows:

a chip testing device comprises a substrate, a testing mainboard, a chip clamp, a power supply and a display screen, wherein the testing mainboard is fixed on the substrate, and the testing mainboard is respectively in communication connection with the power supply and the display screen. The chip clamp comprises a clamp body, the clamp body is horizontally arranged, a plurality of chip grooves used for placing chips to be tested are formed in the clamp body, a chip testing board is arranged at the bottom of each chip groove, and the chip testing board is in communication connection with a testing mainboard. The top in every chip groove respectively is equipped with a chip splint that are used for fixed chip that awaits measuring, chip splint's one end with the anchor clamps body is articulated, the other end pass through the buckle with anchor clamps body looks joint.

Further, the buckle include integrated into one piece press splenium, connecting portion and pothook, the bottom of connecting portion through the pivot with the chip splint are articulated, the anchor clamps body be equipped with in the one side of keeping away from the test mainboard be used for with the round pin axle of pothook looks joint, the round pin axle rotates to be installed on the anchor clamps body.

Further, the base plate is arranged vertically, the base plate is fixed on a horizontal desktop, the power supply is fixed on the base plate and located below the horizontal desktop, and the display screen is fixed on the horizontal desktop and located right behind the base plate.

Furthermore, the bottom surface of the chip clamping plate is fixedly provided with a buffer block for pressing/separating the chip to be tested.

Further, still include the insulating seat, the anchor clamps body pass through the insulating seat and fix on the test mainboard.

Furthermore, the substrate is provided with a keyboard on the opposite side of the test mainboard, and the keyboard is in communication connection with the display screen.

The utility model discloses following beneficial effect has: the utility model provides a chip testing arrangement, the device both can test single chip, also can test a plurality of chips simultaneously, and chip anchor clamps space reasonable in design carries out the change of relevant subassembly easily, and the chip is put into and is taken out the convenience, easy operation, and the steadiness is strong, and the cost of manufacture is low, and efficiency of software testing is high.

Drawings

Fig. 1 is a schematic top view of the present invention.

Fig. 2 is a schematic front view of the structure of the present invention.

FIG. 3 is a schematic view of the connection between the components of the chip holder.

Description of the main component symbols: 1. a substrate; 10. a horizontal desktop; 2. testing the main board; 3. a chip clamp; 30. buckling; 301. a pressing part; 302. a connecting portion; 303. a hook; 31. a clamp body; 310. a pin shaft; 32. a chip slot; 33. a chip test board; 34. a chip clamp plate; 340. a buffer block; 4. a power source; 5. a display screen; 6. a keyboard; 7. an insulating seat.

Detailed Description

The present invention will be further described with reference to the accompanying drawings and the following detailed description.

As shown in fig. 1 to 3, a chip testing apparatus includes a substrate 1, a test main board 2, a chip holder 3, a power supply 4, and a display screen 5. The base plate 1 is vertically fixed on the horizontal desktop 10, the test mainboard 2 is fixed on the base plate 1 and is located horizontal desktop 10 top, the base plate 1 is equipped with keyboard 6 at the opposite side of test mainboard 2, keyboard 6 and display screen 5 communication connection, the test mainboard 2 respectively with power 4 and display screen 5 communication connection, power 4 is fixed on the base plate 1 and is located the below of horizontal desktop 10, display screen 5 is fixed on horizontal desktop 10 and is located the base plate 1 directly behind.

Chip clamp 3 includes anchor clamps body 31, and anchor clamps body 31 level sets up, and anchor clamps body 31 passes through insulator seat 7 to be fixed on test mainboard 2. Set up a plurality of on the anchor clamps body 31 and be used for placing the chip groove 32 of the chip that awaits measuring, the bottom in chip groove 32 is equipped with chip testing board 33, and chip testing board 33 and test mainboard 2 communication connection. The top of each chip groove 32 is provided with a chip clamp plate 34 for fixing a chip to be tested, and the bottom surface of the chip clamp plate 34 is fixedly provided with a buffer block 340 for pressing/separating the chip to be tested. One end of the chip clamping plate 34 is hinged with the clamp body 31, and the other end is clamped with the clamp body 31 through the buckle 30. The clip 30 includes a pressing portion 301, a connecting portion 302 and a hook 303 which are integrally formed, the bottom of the connecting portion 302 is hinged to the chip clamp plate 34 through a rotating shaft 305, a pin 310 for being clipped with the hook 303 is disposed on one side of the clamp body 31 away from the test motherboard 2, and the pin 310 is rotatably mounted on the clamp body 31.

The utility model discloses a theory of operation does: the chip clamp plate 34 is opened, the chip to be tested is placed in the chip groove 32 on the clamp body 31, the chip clamp plate 34 is buckled, and the chip clamp plate 34 is buckled through the mutual buckling of the hook 303 and the pin shaft 310, so that the pins on the chip to be tested are correspondingly communicated with the contacts on the chip test board. The starting power supply 4 supplies power to the test mainboard 2 and the chip test board 33 to test the chip to be tested, and after the test is completed, the clamping hook 304 is separated from the pin shaft 310 through applying force to the pressing part 301, the chip clamping plate 34 is opened, the chip is taken out, and the test is completed. The utility model discloses both can test single chip, also can test a plurality of chips simultaneously, 3 space reasonable in design of chip anchor clamps carry out the change of relevant subassembly easily, and the chip is put into and is taken out the convenience, easy operation, and the steadiness is strong, and the cost of manufacture is low, and the efficiency of software testing is high.

While the invention has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.

Claims

1. A chip testing device is characterized in that: including base plate, test mainboard, chip anchor clamps, power and display screen, the test mainboard is fixed on the base plate, the test mainboard respectively with power and display screen communication connection, the chip anchor clamps include the anchor clamps body, anchor clamps body level set up, set up a plurality of on the anchor clamps body and be used for placing the chip groove of the chip that awaits measuring, the bottom in chip groove is equipped with the chip and surveys the board, the chip survey the board with test mainboard communication connection, the top in every chip groove respectively is equipped with a chip splint that are used for fixed chip that awaits measuring, the one end of chip splint with the anchor clamps body is articulated, the other end pass through the buckle with anchor clamps body looks joint.

2. The chip testing apparatus according to claim 1, wherein: the buckle include integrated into one piece press splenium, connecting portion and pothook, the bottom of connecting portion through the pivot with the chip splint is articulated, the anchor clamps body be equipped with in the one side of keeping away from the test mainboard be used for with the round pin axle of pothook looks joint, the round pin axle rotates to be installed on the anchor clamps body.

3. The chip testing apparatus according to claim 1, wherein: the base plate is vertically arranged, the base plate is fixed on a horizontal desktop, the power supply is fixed on the base plate and located below the horizontal desktop, and the display screen is fixed on the horizontal desktop and located right behind the base plate.

4. The chip testing apparatus according to claim 1, wherein: and the bottom surface of the chip clamping plate is fixedly provided with a buffer block for pressing/separating the chip to be tested.

5. The chip testing apparatus according to claim 1, wherein: the fixture body is fixed on the test mainboard through the insulating seat.

6. The chip testing apparatus according to claim 1, wherein: the opposite side of the base plate on the test mainboard is provided with a keyboard, and the keyboard is in communication connection with the display screen.