CN106405274A - Aging test device for electronic component - Google Patents
Aging test device for electronic component Download PDFInfo
- Publication number
- CN106405274A CN106405274A CN201610728507.8A CN201610728507A CN106405274A CN 106405274 A CN106405274 A CN 106405274A CN 201610728507 A CN201610728507 A CN 201610728507A CN 106405274 A CN106405274 A CN 106405274A
- Authority
- CN
- China
- Prior art keywords
- electronic component
- guide plate
- plate
- support plate
- conductive pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000032683 aging Effects 0.000 title claims abstract description 32
- 238000012360 testing method Methods 0.000 title abstract description 29
- 238000009434 installation Methods 0.000 claims abstract description 3
- 230000001105 regulatory effect Effects 0.000 claims description 10
- 230000005611 electricity Effects 0.000 claims description 2
- 230000007547 defect Effects 0.000 abstract description 5
- 238000006243 chemical reaction Methods 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 208000003656 Electric Burns Diseases 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to an aging test device for an electronic component. The test device comprises a support plate and a lateral guiding plate. When the aging test device for the electronic component is used, it is not required to weld the electronic component onto a PCB to implement aging test, instead, the electronic component is placed in an installation groove, a lateral conductive pin and an intermediate current conducting plate are electrically with electrodes at the two ends of the electronic component respectively and then connected to an external power supply to carry out current aging test, a product is not damaged, all product can be tested by the test device, product defects are avoided effectively, use is convenient, rapid, stable and accurate, batch test is allowed, the working efficiency is improved, and the cost is reduced.
Description
Technical field
The present invention relates to electronic components test field, more particularly to a kind of electronic component ageing tester.
Background technology
With the development of electronics technology, the stability for electronic component and reliability requirement also more and more higher, especially
Apply the product in Aero-Space cause.Electronic element products can make components and parts internal electrode by high-temperature electric burn-in test
Defect and hidden danger exposes in advance it is ensured that the product dispatching from the factory can stand the test of time, for improve product stability and
Reliability has very important significance.At present, degradation directly electronic component is welded on pcb board, not only have impact on product
Product after outward appearance, and test can only abandon, and is therefore only sampled testing, such test can only this batch of coarse evaluation be produced
Moral character energy, does not reach real purpose it is impossible to effectively prevent product defects.
Content of the invention
Lead to damage product it is necessary to need electronic component is welded on pcb board for above-mentioned burn-in test based on this
Problem, provide a kind of electronic component need not be welded on can carry out on pcb board burn-in test do not damage product electronics unit
Part ageing tester.
Specific technical scheme is as follows：
A kind of electronic component ageing tester, including：
Support plate, described support plate is provided with mounting groove, and the side of described mounting groove is provided with for electric with electronic component termination electrode
The middle conductive plate connecting, described installation groove sidewall offers through hole；
Side guide plate, positioned at the side of described support plate, can move relative to described support plate, described side guide plate is installed with side
Conductive pin, described mounting groove by described through hole and can be stretched in one end of described side conductive pin, for described electronic component
Another termination electrode electrical connection.
Wherein in an embodiment, described side conductive pin has multiple, and spacing side by side is fixedly arranged on the guide plate of described side.
Wherein in an embodiment, the top of described mounting groove is provided with the upper guiding that can move relative to described mounting groove
Plate, described upper guide plate is installed with the upper conductive pin for being electrically connected with the target of described electronic component.
Wherein in an embodiment, described mounting groove be multiple, spacing side by side on described support plate, described upper conduction
Pin has multiple, and spacing side by side is fixedly arranged on described upper guide plate.
Wherein in an embodiment, described mounting groove is divided into two row by described middle conductive plate, described side guide plate
Quantity is 2, and positioned at the both sides of described support plate, the quantity of described upper guide plate is 2, is located at a described mounting groove of row respectively
Top.
Wherein in an embodiment, also include intermediate guide plate, the side of described intermediate guide plate and described upper guide plate
Face interval is oppositely arranged, and described upper guide plate is provided with the first regulating part, for adjusting the relatively described centre of described upper guide plate
Guide plate moves.
Wherein in an embodiment, described side guide plate is connected by elastic component with described support plate, described side guide plate
It is provided with fixture away from described support plate one side.
Wherein in an embodiment, in described side conductive pin and described upper conductive pin, it is provided with elastic component.
Wherein in an embodiment, also include pushing assembly, described push assembly with described upper guide plate away from described
The one side of support plate abuts, and the described assembly that pushes is provided with the second regulating part, for pushing the relatively described support plate of assembly described in adjusting
Movement, described upper guide plate and described support plate elastic connection.
Wherein in an embodiment, also include base plate, on described base plate, described base plate is away from described for described support plate
The one side of support plate is provided with bolster；Described base plate is provided with locating dowel, described push assembly be provided with corresponding with described locating dowel
Location hole.
Beneficial effects of the present invention are as follows：
Using this electronic component ageing tester, electronic component need not be welded on pcb board and carry out burn-in test, only
Electronic component need to be positioned in mounting groove, by side conductive pin and middle conductive plate two termination electrodes with electronic component respectively
Electrical connection, is used for carrying out testing current, upper conductive pin is electrically connected with the target of electronic component, is used for carrying out voltage tester,
Do not damage product, therefore all products can be tested, effectively prevent product defects, convenient to use, stable accurate, can
Mass is tested, and improves operating efficiency, reduces cost.Upper guide plate can adjust the position of its relative intermediate guide plate, so that
Upper conductive pin and the target accurate positioning of electronic component, improve stability.
Brief description
Fig. 1 is the side sectional view of the electronic component ageing tester of an embodiment；
Fig. 2 is the structural representation of the electronic component ageing tester of an embodiment；
Fig. 3 is the structural representation of the support plate of electronic component ageing tester of an embodiment.
Specific embodiment
For the ease of understanding the present invention, below with reference to relevant drawings, the present invention is described more fully.In accompanying drawing
Give presently preferred embodiments of the present invention.But, the present invention can realize in many different forms however it is not limited to this paper institute
The embodiment of description.On the contrary, providing the purpose of these embodiments to be to make the understanding to the disclosure more thorough
Comprehensively.
It should be noted that when element is referred to as " being installed on " another element, it can be directly on another element
Or can also there is element placed in the middle.When an element is considered as " connection " another element, it can be direct connection
To another element or may be simultaneously present centering elements.When an element is considered as " connection " another element, it can
To be directly to another element or to may be simultaneously present centering elements.
Unless otherwise defined, all of technology used herein and scientific terminology and the technical field belonging to the present invention
The implication that technical staff is generally understood that is identical.The term being used in the description of the invention herein is intended merely to description tool
The purpose of the embodiment of body is it is not intended that in limiting the present invention.Term as used herein "and/or" includes one or more phases
The arbitrary and all of combination of the Listed Items closing.
The electronic component ageing tester of one embodiment, as depicted in figs. 1 and 2, including support plate 10 and side guide plate 20.
The one side of support plate 10 is provided with mounting groove 11, refering to Fig. 3, is used for fixing electronic component.The side of mounting groove 11 is provided with
For the middle conductive plate 12 electrically connecting with electronic component termination electrode, mounting groove 11 side wall offers through hole 13.Specifically, in
Between conductive copper sheet on conductive plate 12 electrically connect with the termination electrode of electronic component, be additionally provided with the convenient interface connecting external power supply.
Side guide plate 20 is located at the side of support plate 10, can move relative to support plate 10.Side is installed with side guide plate 20 conductive
Pin 21, mounting groove 11 can be stretched into by through hole 13 in one end of side conductive pin 21, is electrically connected for another termination electrode with electronic component
Connect.
Using this electronic component ageing tester, electronic component need not be welded on pcb board and carry out burn-in test, only
Electronic component need to be positioned in mounting groove 11, by side conductive pin 21 and middle conductive plate 12 two with electronic component respectively
Termination electrode electrically connects, and side conductive pin 21 and middle conductive plate 12 is connected with external power supply and can carry out electric current burn-in test, no
Damage product, therefore all products can be tested, effectively prevent product defects, convenient to use.
Preferably, side conductive pin 21 is multiple, and spacing side by side is fixedly arranged on side guide plate 20, thus can be simultaneously to multiple electricity
Subcomponent carries out electric current burn-in test, improves efficiency.
Preferably, the top of mounting groove 11 is provided with the upper guide plate 30 that can be mounted opposite groove 11 movement, on upper guide plate 30
It is installed with the upper conductive pin 31 for electrically connecting with the target of electronic component.It is electrically connected with target by upper conductive pin 31
Connect, upper conductive pin 31 is connected with external power supply, side conductive pin 21 or middle conductive plate 12 are connected with external power supply, you can carry out
Voltage aging is tested.Be connected upper conductive pin 31, side conductive pin 21 and middle conductive plate 12 with external power supply can be simultaneously simultaneously
Carry out electric current burn-in test and voltage aging test.Further, upper guide plate 30 is provided with connecing of convenient connection external power supply
Mouthful, conveniently it is energized to upper conductive pin 31.
Preferably, mounting groove 11 is multiple, and spacing side by side is on support plate 10, consequently facilitating accurately placing electronic component,
Upper conductive pin 31 is multiple, and spacing side by side is fixedly arranged on guide plate 30, can carry out voltage aging to multiple electronic products simultaneously
Test.
Preferably, mounting groove 11 is divided into two row by middle conductive plate 12, and the quantity of side guide plate 20 is 2, positioned at support plate
10 both sides, the quantity of upper guide plate 30 is two, is located at the top of a row mounting groove 11 respectively.Thus increase further simultaneously
The number of electronic components of burn-in test can be carried out, improve testing efficiency.
Preferably, this device also includes intermediate guide plate 40, and intermediate guide plate 40 is spaced phase with the side of upper guide plate 30
To setting, intermediate guide plate 40 is identical with the bearing of trend of upper guide plate 30, and upper guide plate 30 is provided with the first regulating part 32 such as
Set screw, moves relative to intermediate guide plate 40 for adjusting upper guide plate 30.Specifically, on each, guide plate 30 is provided with two
Individual first regulating part 32, is located at the two ends of upper guide plate 30 respectively.Therefore pass through to adjust upper guide plate 30 intermediate guide plate relatively
40 is mobile, and the position of fine-tuning upper conductive pin 31 makes conductive pin 31 and the target of electronic component be accurately positioned, and improves and surveys
The stability of examination and accuracy.
Preferably, side guide plate 20 is connected by elastic component with support plate 10, and side guide plate 20 is provided with away from support plate 10 one side
Fixture 22 such as quick clip.Side guide plate 20 can easily be made near support plate 10 by clamping device 22, so that side conductive pin
21 are electrically connected with the termination electrode of the electronic component in mounting groove 11 by through hole 13, and when unclamping fixture 22, elastic reaction can make again
Side guide plate 20 is away from support plate 10, so that side conductive pin 21 is disconnected with the termination electrode of electronic component.Specifically, side guiding
Plate 20 corresponding one side positive with support plate 10 is provided with gathering sill 23, and support plate 10 is provided with lead 14, and lead 14 stretches into guiding
In groove 23, it is connected by spring 24 between support plate 10 and side guide plate 20, spring 24 is sheathed on lead 14.Further, side
Guide plate 20 is provided with the side conductive plate 25 electrically connecting with side conductive pin 21, and side conductive plate 25 is provided with convenient connection external power supply
Interface.
Preferably, it is provided with elastic component such as spring in side conductive pin 21 and upper conductive pin 31, thus making every under elastic reaction
Piece side conductive pin 21, a upper conductive pin 31 are more stable with the termination electrode of corresponding electronic component, target connection respectively.
Preferably, this device also includes pushing assembly 50, pushes assembly 50 and upper guide plate 30 one side away from support plate 10
Abut, push assembly 50 and be provided with the second regulating part 51 such as butterfly screws, push assembly 50 for regulation and move relative to support plate 10,
Upper guide plate 30 and support plate 10 elastic connection.Push assembly 50 by adjusting downwards near support plate 10, thus pushing guide plate
30 near support plate 10, so that conductive pin 31 and the target of the electronic component in mounting groove 11 is connected, and adjusts and pushes assembly 50
During away from support plate 10, elastic reaction makes guide plate 30 naturally away from support plate 10, thus upper conductive pin 31 is disconnected with target
Connect.Specifically, push assembly 50 and include briquetting 52 and gripper shoe 53, briquetting 52 is T-shaped, with upper guide plate 30 away from support plate 10
One side abut, gripper shoe 53 is then connected away from the one side of upper guide plate 30 with briquetting 52, and the second regulating part 51 is located at gripper shoe
On 53.
Preferably, this device also includes base plate 60, and, on base plate 60, base plate 60 is away from the one of support plate support plate 10 for support plate 10
Face is provided with bolster 61 such as foot pad, and specifically, bolster 61 is four.Base plate 60 and bolster 61 make this device more stable, no
Easily rock.
Preferably, base plate 60 is provided with locating dowel 62, pushes assembly 50 and is provided with location hole 54 corresponding with locating dowel 62,
Specifically, locating dowel 62 is 4.Locating dowel 62 passes through location hole 54, play the guiding role, and makes to push assembly 50 support plate 10 relatively and moves
More steady when dynamic.
When using this electronic component ageing tester, electronic component is positioned in mounting groove 11, middle conductive plate
12 are electrically connected with a termination electrode of the electronic component in mounting groove 11.After placement finishes, clamping device 22, promote side guiding
Plate 20 is close to support plate 10, so that side conductive pin 21 is electrically connected with another termination electrode of the electronic component in corresponding mounting groove 11,
Middle conductive plate 12 is connected external power supply with side conductive pin 21, you can carry out electric current burn-in test.Can pass through as needed
Adjust the position of the upper conductive pin 31 of the first regulating part 32 fine setting, make conductive pin 31 be directed at the target of electronic component, can fit
Answer the electronic component of different size.Adjusting the second regulating part 51 makes to push assembly 50 downwards near support plate 10, thus push leading
To plate 30 near support plate 10, conductive pin 31 and the target of the electronic component in mounting groove 11 is made to be connected, by upper conductive pin
31 are connected with external power supply, and side conductive pin 21 or middle conductive plate 12 are connected with external power supply, you can carry out voltage aging test.
Upper conductive pin 31, side conductive pin 21 and middle conductive plate 12 are connected with external power supply simultaneously and can carry out the aging survey of electric current simultaneously
Examination and voltage aging test.
Each technical characteristic of embodiment described above can arbitrarily be combined, for making description succinct, not to above-mentioned reality
The all possible combination of each technical characteristic applied in example is all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all it is considered to be the scope of this specification record.
Embodiment described above only have expressed the several embodiments of the present invention, and its description is more concrete and detailed, but simultaneously
Can not therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
Say, without departing from the inventive concept of the premise, some deformation can also be made and improve, these broadly fall into the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be defined by claims.
Claims (10)
1. a kind of electronic component ageing tester is it is characterised in that include：
Support plate, described support plate is provided with mounting groove, and the side of described mounting groove is provided with for being electrically connected with electronic component termination electrode
Middle conductive plate, described installation groove sidewall offers through hole；
Side guide plate, positioned at the side of described support plate, can move relative to described support plate, described side guide plate is installed with side conductive
Pin, described mounting groove by described through hole and can be stretched into, for another with described electronic component in one end of described side conductive pin
Termination electrode electrically connects.
2. electronic component ageing tester according to claim 1 it is characterised in that described side conductive pin have multiple,
Spacing side by side is fixedly arranged on the guide plate of described side.
3. electronic component ageing tester according to claim 1 is it is characterised in that the top of described mounting groove is provided with
The upper guide plate that can move relative to described mounting groove, described upper guide plate is installed with for the middle electricity with described electronic component
The upper conductive pin of pole electrical connection.
4. electronic component ageing tester according to claim 3 it is characterised in that described mounting groove be multiple, and
On described support plate, described upper conductive pin has multiple, and spacing side by side is fixedly arranged on described upper guide plate at row interval.
5. electronic component ageing tester according to claim 3 is it is characterised in that described middle conductive plate will be described
Mounting groove is divided into two row, and the quantity of described side guide plate is 2, positioned at the both sides of described support plate, the quantity of described upper guide plate
For 2, it is located at the top of a described mounting groove of row respectively.
6. electronic component ageing tester according to claim 3 is it is characterised in that also include intermediate guide plate, institute
The side interval stating intermediate guide plate with described upper guide plate is oppositely arranged, and described upper guide plate is provided with the first regulating part, uses
Move relative to described intermediate guide plate in adjusting described upper guide plate.
7. electronic component ageing tester according to claim 1 is it is characterised in that described side guide plate and described load
Plate is connected by elastic component, and described side guide plate is provided with fixture away from described support plate one side.
8. electronic component ageing tester according to claim 3 it is characterised in that described side conductive pin and described on
It is provided with elastic component in conductive pin.
9. electronic component ageing tester according to claim 3 is it is characterised in that also including pushing assembly, described
Push assembly to abut away from the one side of described support plate with described upper guide plate, the described assembly that pushes is provided with the second regulating part, use
Push assembly and moves relative to described support plate described in adjust, described upper guide plate and described support plate elastic connection.
10. electronic component ageing tester according to claim 9 is it is characterised in that also include base plate, described support plate
On described base plate, described base plate is provided with bolster away from the one side of described support plate；Described base plate is provided with locating dowel, described
Push assembly and be provided with location hole corresponding with described locating dowel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610728507.8A CN106405274B (en) | 2016-08-25 | 2016-08-25 | Electronic element aging testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610728507.8A CN106405274B (en) | 2016-08-25 | 2016-08-25 | Electronic element aging testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106405274A true CN106405274A (en) | 2017-02-15 |
| CN106405274B CN106405274B (en) | 2023-12-29 |
Family
ID=58004982
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610728507.8A Active CN106405274B (en) | 2016-08-25 | 2016-08-25 | Electronic element aging testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106405274B (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108529174A (en) * | 2018-03-12 | 2018-09-14 | 武汉普赛斯电子技术有限公司 | A kind of COC agings and test fixture |
| CN109444618A (en) * | 2018-12-28 | 2019-03-08 | 苏州比雷艾斯电子科技有限公司 | A kind of electronic component Current Voltage ageing tester and method |
| CN109596968A (en) * | 2018-11-09 | 2019-04-09 | 天津航空机电有限公司 | It is a kind of for debugging the tool of multiple groups little module simultaneously |
| TWI825070B (en) * | 2018-02-09 | 2023-12-11 | 南韓商周星工程股份有限公司 | Electric power interface |
| CN118330421A (en) * | 2024-06-17 | 2024-07-12 | 浙江杭可仪器有限公司 | High-integration electronic component aging test device |
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| CN206074706U (en) * | 2016-08-25 | 2017-04-05 | 深圳振华富电子有限公司 | Electronic component ageing tester |
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| KR20000005901A (en) * | 1998-06-05 | 2000-01-25 | 가야시마 고조 | Carrier board for testing ic device |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI825070B (en) * | 2018-02-09 | 2023-12-11 | 南韓商周星工程股份有限公司 | Electric power interface |
| CN108529174A (en) * | 2018-03-12 | 2018-09-14 | 武汉普赛斯电子技术有限公司 | A kind of COC agings and test fixture |
| CN109596968A (en) * | 2018-11-09 | 2019-04-09 | 天津航空机电有限公司 | It is a kind of for debugging the tool of multiple groups little module simultaneously |
| CN109444618A (en) * | 2018-12-28 | 2019-03-08 | 苏州比雷艾斯电子科技有限公司 | A kind of electronic component Current Voltage ageing tester and method |
| CN118330421A (en) * | 2024-06-17 | 2024-07-12 | 浙江杭可仪器有限公司 | High-integration electronic component aging test device |
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| Publication number | Publication date |
|---|---|
| CN106405274B (en) | 2023-12-29 |
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