CN105699876B - General adapting fixture - Google Patents
General adapting fixture Download PDFInfo
- Publication number
- CN105699876B CN105699876B CN201610046080.3A CN201610046080A CN105699876B CN 105699876 B CN105699876 B CN 105699876B CN 201610046080 A CN201610046080 A CN 201610046080A CN 105699876 B CN105699876 B CN 105699876B
- Authority
- CN
- China
- Prior art keywords
- dials
- probe
- fixed plate
- fixed
- adapting fixture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The present invention relates to a kind of general adapting fixtures,The general adapting fixture includes the first test suite,Adapter assembly and the second test suite,First test suite includes the first dials and multiple first probes,Multiple first vias of array on first dials,Be slidably connected first probe in first via,The adapter assembly includes switching dials and multiple conductive resilient elements,Corresponding multiple multiple transfer hole of first arrays of vias,The conductive resilient element exposes one end of first via far from the restoring force of first via to provide first probe,Conductive resilient element using the general adapting fixture is convertible,So that the general adapting fixture can be adapted to the circuit board of a variety of surface treatment types,To realize the electrical testing of circuit board,To realize the matching of a variety of circuit boards,Improve the electrical testing efficiency of circuit board,Improve the production efficiency of circuit board.
Description
Technical field
The present invention and electronic device field more particularly to a kind of general adapting fixture.
Background technology
At present circuit board can all be carried out before coming into operation batch to properties carry out electrical testing, most of electricity
Road board test apparatus mainly tests circuit board properties using universal testing machine, although universal testing machine has admittedly
Determine power of test, the advantages that fixed test area and depreciation time are long, but board design updating decision causes to general at present
The use demand variation of test machine is fast, causes test machine that cannot meet and tests the circuit board of multiple structural forms, specifically
For, the inner body of universal testing machine is difficult to replace at present so that and universal testing machine is not easy to adjust to the active force of circuit board,
However the active force that the circuit board of different model can bear at present is also different, so that test machine matches the electricity of less model
Road plate is tested, and when test machine is more than circuit board active force the active force that circuit board can bear, is typically easy to cause
Circuit board is tested test-run a machine and stabs or weigh wounded, and so as to cause circuit board damage, i.e., current universal testing machine is only capable of matching less type
Number circuit board tested.Therefore universal testing machine can be assisted to survey various types of circuit boards currently without one kind
The general adapting fixture of examination, less efficient so as to cause circuit board testing, the production efficiency of circuit board reduces.
Invention content
The present invention provides one kind and improves circuit board testing efficiency by reducing probe slope, improves board production efficiency
General adapting fixture.
A kind of general adapting fixture provided by the present invention, wherein the general adapting fixture include the first test suite,
Adapter assembly and the second test suite, first test suite include the first dials and multiple first probes, first needle
Multiple first vias of array on disk, be slidably connected in first via first probe, and first probe one end is exposed
First via, the adapter assembly include switching dials and multiple conductive resilient elements, and the switching dials is fixed on described
First dials exposes first via side, and corresponding multiple multiple turns of first arrays of vias away from first probe
Hole is connect, the conductive resilient element includes the first end and second end being oppositely arranged, and the first end is fixedly connected with described first and visits
Needle one end, the second end are fixed in the transfer hole, and the conductive resilient element exposes institute to provide first probe
One end of the first via is stated far from the restoring force of first via, second test suite includes the second dials and multiple the
Two probes, second dials are fixed on the switching dials and deviate from first dials side, and the second dials array is more
A second via, second probe is interted in second via, and second probe one end is fixedly connected with the conductive bullet
Property part, the other end exposes second via.
Wherein, the switching dials includes the first fixed plate, the second fixed plate and fixing bracket, and first fixed plate is solid
Surely first dials is connected, second fixed plate is fixed on first fixed plate and deviates from first dials side, institute
It states fixing bracket to be fixed between first fixed plate and second fixed plate, so that first fixed plate and described the
Two fixed plates are mutually isolated, and first via passes through first fixed plate and second fixed plate.
Wherein, the normal direction of relatively described first dials of the length direction of first probe tilts.
Wherein, the normal direction of relatively described second dials of the length direction of second probe tilts.
Wherein, sleeve is set in the switching via, and the conductive resilient element is fixed in the sleeve.
Wherein, the conductive resilient element is metal rectangular spring.
Wherein, first dials includes the first stacking plate of multiple stackings, and multiple first stacking plates mutually completely cut off,
Multiple first stacking plates are interspersed with the first fixed column jointly.
Wherein, second dials includes the second stacking plate of multiple stackings, and multiple second stacking plates mutually completely cut off,
Multiple second stacking plates are interspersed with the second fixed column jointly.
Wherein, which is characterized in that the first positioning column is arranged away from the switching dials side in first dials.
Wherein, the second positioning column is arranged away from the switching dials side in second dials.
General adapting fixture provided by the present invention, is slidably connected described in the first via by first dials
One probe, the interior setting conductive resilient element of switching via of the switching dials, the conductive resilient element is first spy
Needle provides elastic acting force, and the elastic force of the elastic component is adjustable, and the general adapting fixture is that circuit board is surveyed
When examination, first probe contacts on circuit board, and first probe acts on elastic acting force on circuit board, i.e. circuit
The active force that plate is born is identical as the elastic acting force of the conductive resilient element, utilizes the conductive bullet of the general adapting fixture
Property part it is convertible so that the general adapting fixture can be adapted to the circuit boards of a variety of surface treatment types, such as described
The surface stacking golden plate of circuit board, spray sheet tin or anti-oxidant plate etc., it is a variety of to realize to realize the electrical testing of circuit board
The matching of circuit board improves the electrical testing efficiency of circuit board, improves the production efficiency of circuit board.
Description of the drawings
In order to illustrate more clearly of technical scheme of the present invention, attached drawing needed in embodiment will be made below
Simply introduce, it should be apparent that, the accompanying drawings in the following description is some embodiments of the present invention, for the common skill in this field
For art personnel, without creative efforts, other drawings may also be obtained based on these drawings.
Fig. 1 is the structural schematic diagram of general adapting fixture provided by the invention.
Specific implementation mode
Below in conjunction with the attached drawing in embodiment of the present invention, the technical solution in embodiment of the present invention is carried out clear
Chu is fully described by.
Referring to Fig. 1, a kind of general adapting fixture 100 provided by the invention, the general adapting fixture 100 includes first
Test suite 10, adapter assembly 20 and the second test suite 30.First test suite 10 includes the first dials 11 and multiple
First probe 12, multiple first vias 111 of array on first dials 11 are slidably connected in first via 111 described
First probe 12.Expose first via 111 in described first probe, 12 one end.The adapter assembly 20 includes switching dials 21
With multiple conductive resilient elements 22, the switching dials 21 is fixed on first dials 11 and exposes institute away from first probe 12
State 111 side of the first via, and the multiple transfer hole of corresponding multiple first via, 111 arrays 211.The conductive resilient element 22
Including the first end 221 being oppositely arranged and second end 222, the first end 221 is fixedly connected with described first probe, 12 one end, institute
It states second end 222 to be fixed in the transfer hole 211, the conductive resilient element 22 exposes institute to provide first probe 12
One end of the first via 111 is stated far from the restoring force of first via 111.Second test suite 30 includes the second dials
31 and multiple second probes 32, second dials 31 is fixed on the switching dials 21 and deviates from 11 side of the first dials,
Multiple second vias 311 of second dials, 31 array intert second probe 32 in second via 111.Described
Two probes, 32 one end is fixedly connected with the conductive resilient element 22, and the other end exposes second via 311.
Pass through first probe 12 that is slidably connected in the first via 111 of first dials 11, the switching dials
The setting conductive resilient element 22 in 21 switching via 211, the conductive resilient element 22 are that first probe 12 provides bullet
Property active force, and the elastic force of the conductive resilient element 22 is adjustable, and the general adapting fixture 100 is that circuit board is surveyed
When examination, first probe 12 contacts on circuit board, and first probe 12 acts on elastic acting force on circuit board, i.e.,
The active force that circuit board is born is identical as the elastic acting force of the conductive resilient element 22, utilizes the general adapting fixture
100 conductive resilient element 22 is convertible, so that the general adapting fixture 100 can be adapted to a variety of surface treatment types
Circuit board, such as the surface stacking golden plate of the circuit board, spray sheet tin or anti-oxidant plate etc., to realize the electrical survey of circuit board
Examination, to realize the matching of a variety of circuit boards, improves the electrical testing efficiency of circuit board, improves the production efficiency of circuit board..
In present embodiment, first dials, 11 rectangular plate, multiple first via, 111 rectangular arrays point
Cloth.First probe 12 includes the first contact jaw 121 being oppositely arranged and the first connecting pin 122.First contact jaw 121
Expose first via 111, first connecting pin 122 is fixedly connected with the first end 221 of the conductive resilient element 22.It is described
First probe 12 is metallic conduction part, when multiple first probes 12 contact at the circuit structure on circuit board, according to circuit
The circuit structure of plate can select the first probe 12 described in any two to be connected, between the first probe 12 described to two
Micro resistance tested.And the sliding in first via 111 using first probe 12, and then described first visits
Needle 12 stretches in first via 111 so that multiple first probes 12 can be with a variety of height on match circuit plate not
Flat circuit structure increases the compactness of first probe 12 and circuit board to match the circuit board of diversified forms, and
As the length that first probe 12 exposes first via 111 is different so that first probe 12 is to circuit board
Active force is also different, to improve measuring stability, while meeting the circuit board testing of plurality of specifications, improves testing efficiency.
In other embodiment, multiple first vias 111 can also be carries out array according to the structure of circuit board.
In present embodiment, the 21 rectangular plate of switching dials.The switching dials 21 includes the be oppositely arranged
Side 21a and the second side 21b, the first side 21a are fixed on first dials 11, and the far from first probe 12
One contact jaw 121.The second side 21b is far from first dials 11.The switching via 211 is round hole, the switching
Via 211 is corresponding with first via 111, and 211 diameter of switching via is more than first via 111.Described turn
It includes the first open end 211a and the second open end 211b being oppositely arranged to take over hole 211, and the first open end 211a is opened up
In on the first side 21a, the second open end 211b is opened in the second side 21b.The of the conductive resilient element 22
One end 221 under the action of the first probe 12 can the slidings of the first open end 211b relatively, the second end 222 is solid
Due to the second open end 211b.In other embodiments, the switching via 21 can also be rectangular opening.
In present embodiment, second dials, 31 rectangular plate, multiple second via, 311 rectangular arrays point
Cloth.Second probe 32 includes the second contact jaw 321 being oppositely arranged and second connection end 322.Second contact jaw 321
Expose second via 311, the second connection end 122 is fixedly connected with the second end 222 of the conductive resilient element 22.It is described
Second probe 32 is metallic conduction part, and multiple second probes 32 contact on the circuit of test module, so as to select
Second probe 32 described in any two is connected, to connect the micro resistance test circuit between two second probes 32
Micro resistance between two first probes 12 tests multiple micro resistances on circuit board to realize.At other
In embodiment, multiple second vias 311 can also be carries out array according to the circuit structure of resistance test module.
Further, the switching dials 21 includes the first fixed plate 23, the second fixed plate 24 and fixing bracket 25, described
First fixed plate 23 is fixedly connected with first dials 11, and second fixed plate 24 is fixed on first fixed plate 23 and deviates from
First dials, 11 side, the fixing bracket 25 be fixed on first fixed plate 23 and second fixed plate 24 it
Between, so that first fixed plate 23 and second fixed plate 24 are mutually isolated, first via 111 passes through described first
Fixed plate 23 and second fixed plate 24.It is mutually isolated using first fixed plate 23 and second fixed plate 24, from
And increase the thermal diffusivity of the switching dials 21, to improve testing efficiency.
Further, the normal direction of the length direction of first probe 12 first dials 11 relatively tilts.This reality
It applies in mode, multiple first probe, 12 opposed vertical directions tilt, i.e. the normal direction of first dials 11 is vertical direction.
When testing circuit board, the normal direction of the circuit board is also to be vertically arranged.Due to the 12 opposed vertical side of the first probe
To inclination, while first probe 12 can also be arranged in sliding in first via 111, so that described first visits
The length that needle 12 exposes first via 111 is different, and according to SIN function relationship, first probe 12 contacts at circuit board
One end is in the orthographic projection distance of circuit board to first via 111 can be as first probe 12 exposes described first
The length of via 111 is different and changes, i.e. first probe 12 exposes the length increase of first via 111, and described the
Orthographic projection distance of one contact jaw 121 to first via 111 in circuit board also increases therewith, on the contrary, first probe
12 length for exposing first via 111 become smaller, and first contact jaw 121 to first via 111 is in circuit board
Orthographic projection distance also reduces therewith.To the test point on the circuit board relative to first via 111 orthographic projection offset compared with
When big, the length of first via 111 can be exposed by increasing first probe 12 and increase first contact jaw
121 relatively described first vias 111 circuit board orthographic projection distance so that first contact jaw 121 can be accurate
The test point for contacting at circuit board on.When the test point of circuit board is smaller relative to the orthographic projection offset of first via 111
When, first probe 12 can be reduced and expose the length of first via 111 to reduce first contact jaw 121 relatively
First via 111 can equally allow first contact jaw 121 accurately to support in the orthographic projection distance of circuit board
It touches in the test point of circuit board, so that the test accuracy of the general adapting fixture 100 improves, is tested to improve
Yield.In compared to the prior art, relatively described first dials of first probe is fixed, needs replacing different tests
Jig, to adjust angle of first probe with respect to the first dials, to meet the first contact jaw apart from first via in electricity
The orthographic projection distance of road plate is carried out offset of the compensation circuit board test point relative to first via with this, i.e., is needed in the prior art
First probe to use slope smaller just can guarantee that test is accurate, and the first probe test deviation for using slope larger
It is larger, therefore test accuracy is high compared to the prior art for the general adapting fixture 100, and the electricity of various structures can be adapted to
Road plate, testing efficiency are high.
Further, second probe 32, first probe 12 relatively tilts, i.e. the length of second probe 32
Relatively described second dials 31 in direction tilts, that is, facilitates 32 build-out resistor of the second probe test module so that described second
The circuit that probe 32 contradicts resistance test module is tighter, improves testing efficiency.
Further, sleeve 26 is set in the switching via 211, and the conductive resilient element 22 is fixed on the sleeve 26
It is interior.The sleeve 26 passes through first fixed plate 23 and second fixed plate 24, and the sleeve 26 is to the electrically conductive elastic
Part 22 is protected, and prevents first fixed plate 23 and second fixed plate 24 and the friction of the conductive resilient element 22 from damaging
The bad conductive resilient element 22, while being also prevented from first fixed plate 23 and second fixed plate 24 is damaged.
Further, the conductive resilient element 22 is metal rectangular spring, and the conductive resilient element 22 is first spy
Needle 12 provides elastic-restoring force, while can also be that first probe 12 transmits test signal, so that described general turn
It is simple in structure to connect jig 100, reduces cost.It is removably connected to the switching dials 21 using the conductive resilient element 22, from
And the convenient replacement to the conductive resilient element 22, the elastic force size to realize the conductive resilient element 22 are adjustable.
Further, first dials 11 includes the first stacking plate 13 of multiple stackings, multiple first stacking plates
13 mutually isolation, multiple first stacking plates 13 are interspersed with the first fixed column 14 jointly.Multiple first stacking plates 13 are logical
It crosses first fixed column 14 to be fixed to each other, and described general using the gap increase between multiple first stacking plates 13
The thermal diffusivity of adapting fixture 100.
Further, second dials 31 includes the second stacking plate 33 of multiple stackings, multiple second stacking plates
33 mutually isolation, multiple second stacking plates 33 are interspersed with the second fixed column 34 jointly.Multiple second stacking plates 33 are logical
It crosses second fixed column 34 to be fixed to each other, and described general using the gap increase between multiple second stacking plates 33
The thermal diffusivity of adapting fixture 100.
Further, the first positioning column 15 is arranged away from 21 side of switching dials in first dials 11.Using institute
It states the first positioning column 35 to be positioned with circuit board, to improve the accuracy of micro resistance test.
Further, the second positioning column 35 is arranged away from 21 side of switching dials in second dials 31, utilizes institute
It states the second positioning column 35 to be positioned with resistance test module, to improve the accuracy of micro resistance test.
General adapting fixture provided by the present invention, is slidably connected described in the first via by first dials
One probe, the interior setting conductive resilient element of switching via of the switching dials, the conductive resilient element is first spy
Needle provides elastic acting force, and the elastic force of the elastic component is adjustable, and the general adapting fixture is that circuit board is surveyed
When examination, first probe contacts on circuit board, and first probe acts on elastic acting force on circuit board, i.e. circuit
The active force that plate is born is identical as the elastic acting force of the conductive resilient element, utilizes the conductive bullet of the general adapting fixture
Property part is convertible, so that the general adapting fixture can be adapted to various types of circuit boards, to realize circuit board
Electrical testing improves the electrical testing efficiency of circuit board to realize the matching of a variety of circuit boards, improves the production effect of circuit board
Rate.
The above is the preferred embodiment of the present invention, it is noted that for those skilled in the art
For, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications are also considered as
Protection scope of the present invention.
Claims (9)
1. a kind of general adapting fixture, which is characterized in that the general adapting fixture include the first test suite, adapter assembly and
Second test suite, first test suite include the first dials and multiple first probes, and first dials includes multiple
First stacking plate of stacking, multiple first stacking plates mutually completely cut off, and multiple first stacking plates are interspersed with first jointly
Fixed column, there are gap between multiple first stacking plates, multiple first vias of array on first dials, described first
Be slidably connected first probe in via, and first via is exposed in first probe one end, and the adapter assembly includes
Switching dials and multiple conductive resilient elements, the switching dials are fixed on first dials and expose institute away from first probe
The first via side, and corresponding multiple multiple transfer hole of first arrays of vias are stated, the conductive resilient element includes opposite sets
The first end and second end set, the first end are fixedly connected with first probe one end, and the second end is fixed on described turn
It connects in hole, the conductive resilient element exposes one end of first via far from first mistake to provide first probe
The restoring force in hole, second test suite include the second dials and multiple second probes, and second dials is fixed on described
Dials of transferring deviates from first dials side, and multiple second vias of the second dials array intert in second via
Second probe, second probe one end are fixedly connected with the conductive resilient element, and the other end exposes second via.
2. general adapting fixture according to claim 1, which is characterized in that the switching dials include the first fixed plate,
Second fixed plate and fixing bracket, first fixed plate are fixedly connected with first dials, and second fixed plate is fixed on
First fixed plate deviates from first dials side, and the fixing bracket is fixed on first fixed plate and described second
Between fixed plate, so that first fixed plate and second fixed plate are mutually isolated, first via passes through described the
One fixed plate and second fixed plate.
3. general adapting fixture according to claim 1, which is characterized in that the length direction of first probe is with respect to institute
The normal direction for stating the first dials tilts.
4. general adapting fixture according to claim 1, which is characterized in that the length direction of second probe is with respect to institute
The normal direction for stating the second dials tilts.
5. general adapting fixture according to claim 1, which is characterized in that sleeve is set in the switching via, it is described
Conductive resilient element is fixed in the sleeve.
6. general adapting fixture according to claim 1, which is characterized in that the conductive resilient element is metal rectangular bullet
Spring.
7. general adapting fixture according to claim 1, which is characterized in that second dials includes the of multiple stackings
Two stacking plates, multiple second stacking plates mutually completely cut off, and multiple second stacking plates are interspersed with the second fixed column jointly.
8. general adapting fixture according to claim 1, which is characterized in that first dials deviates from the switching dials
The first positioning column is arranged in side.
9. general adapting fixture according to claim 1, which is characterized in that second dials deviates from the switching dials
The second positioning column is arranged in side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610046080.3A CN105699876B (en) | 2016-01-23 | 2016-01-23 | General adapting fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610046080.3A CN105699876B (en) | 2016-01-23 | 2016-01-23 | General adapting fixture |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105699876A CN105699876A (en) | 2016-06-22 |
| CN105699876B true CN105699876B (en) | 2018-09-28 |
Family
ID=56229261
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610046080.3A Active CN105699876B (en) | 2016-01-23 | 2016-01-23 | General adapting fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105699876B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106324460B (en) * | 2016-11-08 | 2024-03-22 | 沈小晴 | Universal test mechanism with replaceable dial |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2502280Y (en) * | 2001-08-13 | 2002-07-24 | 吴志成 | Apparatus for raising test density |
| CN2689249Y (en) * | 2004-04-08 | 2005-03-30 | 颜鸿杰 | Improved structure of circuit board testing tool |
| CN1632595A (en) * | 2004-12-06 | 2005-06-29 | 陈涛 | Method and device for implementing universal adapter of tester special for circuit board |
| CN2760561Y (en) * | 2004-12-16 | 2006-02-22 | 陈涛 | Changeover panel with densely covered hole |
-
2016
- 2016-01-23 CN CN201610046080.3A patent/CN105699876B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN105699876A (en) | 2016-06-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI605650B (en) | Formed wire probe interconnect for test die contactor | |
| US9726720B2 (en) | Integrated circuit test device and integrated circuit test equipment | |
| CN102317802B (en) | Integrated unit for electrical/reliability testing with improved thermal control | |
| US8558554B2 (en) | Electrically conductive Kelvin contacts for microcircuit tester | |
| CN205594131U (en) | General switching tool | |
| JP2013032938A5 (en) | ||
| US9759745B2 (en) | Probe card | |
| JP2016524137A (en) | Probe card assembly for testing electronic devices | |
| TW201430350A (en) | Testing device | |
| WO2010034185A1 (en) | A general transferring device for testing a special testing apparatus of a circuitry board and a general jig thereof | |
| TW201512666A (en) | On-center electrically conductive pins for integrated testing | |
| CN202159074U (en) | Power-on test device for solar cell | |
| CN205091435U (en) | PCB testing arrangement | |
| US6628130B2 (en) | Wireless test fixture for printed circuit board test systems | |
| CN105699876B (en) | General adapting fixture | |
| CN106405274B (en) | Electronic element aging testing device | |
| CN203178322U (en) | Semiconductor test probe | |
| CN103941047A (en) | Circuit board signal testing clamp | |
| US20160116501A1 (en) | Semiconductor evaluation apparatus and semiconductor evaluation method | |
| CN205594030U (en) | General switching tool | |
| KR102037657B1 (en) | Probe card for electrical test and probe head for probe card | |
| CN205594029U (en) | General switching tool | |
| US8901948B2 (en) | Wafer probe card | |
| US20200371167A1 (en) | Connector inspection apparatus and connector module | |
| KR101465399B1 (en) | Vertical blade type multi probe card |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |