CN218567483U

CN218567483U - Capacitor aging device

Info

Publication number: CN218567483U
Application number: CN202222288526.7U
Authority: CN
Inventors: 熊焰明
Original assignee: Jiangsu Eeest Advanced Technology Co ltd
Current assignee: Jiangsu Eeest Advanced Technology Co ltd
Priority date: 2022-08-30
Filing date: 2022-08-30
Publication date: 2023-03-03
Anticipated expiration: 2032-08-30

Abstract

The utility model provides an electric capacity aging device, it not only includes the static aging test device that can carry out static aging test to single electric capacity, still includes the dynamic aging test device that can carry out static aging test to single electric capacity, and among the dynamic aging process, electric capacity can be arranged in electric capacity loading tray, the pursuit of the electric capacity parameter of being convenient for all the time. The dynamic aging test device comprises a tunnel furnace, a conveying device penetrating through the tunnel furnace and a plurality of probe card stations arranged along the conveying device, wherein the conveying device is used for conveying the loading plate loaded with the capacitors, the probe card stations comprise probe cards and a driving device, probes are connected to the probe cards, the distribution of the probes on each probe card corresponds to the distribution of capacitor electrodes in the loading plate, and the driving device is used for driving the probe cards to move downwards or upwards and enabling the probes to be in contact with or separated from the capacitor electrodes.

Description

Capacitor aging device

Technical Field

The utility model relates to an electric capacity performance detection device technical field specifically is an electric capacity aging device.

Background

The capacitance detected in the production detection line has two forms. The other is a strip-shaped semi-finished product of which the lead frame is not completely cut off, and the semi-finished product is subjected to aging and testing operations, then is cut off and shaped into a finished product, and finally is subjected to taping and packaging. And the other method is that firstly the strip-shaped semi-finished product is cut off the lead frame and shaped into a finished product, and then the finished product of the bulk material which is changed into a single state is aged and tested, and finally the taping package is completed.

Wherein aging tests on capacitors sometimes require both static and dynamic aging of the capacitors. The static aging is generally carried out by adopting an aging test chamber, the current is generally limited within 1mA, the current is basically capacitance leakage current in the aging process, the change is small and is generally far less than 1mA, and the static aging time is long and generally takes several hours to dozens of hours; during dynamic aging, the capacitor needs to be charged and discharged for a plurality of times with certain current intensity under a high-temperature environment, the current is usually several mA to hundreds of mA, and the dynamic aging time is short, and the capacitor can be charged and discharged for one time only from several seconds to tens of seconds, so that if the dynamic aging is carried out in an aging test box, the capacitor needs to be taken out and put in frequently, the operation is complex, and the service life of related equipment is greatly shortened.

In the prior art, only capacitors in strip shapes are used, static aging and dynamic aging technologies are used simultaneously, wherein a traditional aging box technology is adopted in a static aging part, a tunnel furnace is adopted in dynamic aging, the static aging and the dynamic aging cannot be performed by the device directly for finished capacitors in single shapes, for the static aging of the capacitors in single shapes, a batch aging clamp for the capacitors is disclosed in CN208224312U of the applicant, the single capacitors are placed in a loading disc, the top of the loading disc is opened, electrodes at one end of the capacitors can be exposed after the capacitors are placed in the loading disc, then a plurality of boxes of capacitors are simultaneously placed on a PCB with a plurality of aging areas (each aging area corresponds to one loading disc) to form the aging clamp, the capacitors are connected to circuits on the PCB through contact of probes connected to the PCB and electrodes of each capacitor and are connected to circuit switching boards of the PCB, the capacitors can be connected to the aging circuit through the circuit switching boards, the aging of the capacitors can be accessed to the aging circuit through the circuit switching boards, and the capacitors are convenient for tracking the capacitors and only the static aging and the capacitors and the dynamic aging requirements are always generated when the capacitors and the capacitors are required.

SUMMERY OF THE UTILITY MODEL

Lack the problem of carrying out dynamic ageing to single electric capacity to prior art, the utility model provides an electric capacity aging device, it not only includes the static aging test device that can carry out static aging test to single electric capacity, still includes the dynamic aging test device that can carry out the dynamic aging test to single electric capacity, and among the dynamic and static ageing process, electric capacity can be located electric capacity loading dish throughout, the pursuit of the electric capacity parameter of being convenient for.

The technical scheme is as follows: the utility model provides a capacitance aging device, its includes the loading dish, static aging test device, the dynamic aging test device that are used for loading electric capacity, set up the constant head tank that is used for putting into electric capacity and exposes the capacitive electrode in the loading dish, the loading dish is arranged in through ageing anchor clamps in the static aging test device, the dynamic aging test device includes tunnel furnace, its characterized in that: the dynamic aging test device further comprises a conveying device penetrating through the tunnel furnace and a plurality of probe card stations arranged along the conveying device, wherein the conveying device is used for conveying a loading disc loaded with capacitors, each probe card station comprises a probe card and a driving device, probes are connected to the probe cards, the distribution of the probes on each probe card corresponds to the distribution of the capacitor electrodes in the loading disc, and the driving devices are used for driving the probe cards to move downwards or upwards and enabling the probes to be in contact with or separated from the capacitor electrodes.

It is further characterized in that:

when the loading discs are installed in the aging clamp, a capacitor in each loading disc is connected with a protection element in series and then is connected to a first line adapter plate of the aging clamp in parallel; the aging fixture is installed in the static aging test device through an aging rack, the aging rack comprises a second line adapter plate, the first line adapter plates of the aging fixture are connected in parallel and then connected with the second line adapter plates, and the second line adapter plates are used for being connected with the static aging test device;

the number of the aging racks is more than or equal to two;

the aging rack is transferred into the static aging test device through a carrier loader, and the aging rack is transferred into the static aging test device through a roller from the carrier loader;

the static aging test device is internally connected with power adding seats, and the number and the distribution of the power adding seats correspond to those of the second line adapter plate;

a carrier loader positioning rail is arranged in front of the static aging test device, and an aging rack positioning rail is arranged on the carrier loader;

two ends of the protection element are respectively provided with a test contact point, and the test contact points are used for connecting a voltage test device;

the first line adapter plate and the second line adapter plate respectively adopt Kelvin connection structures; and a voltage test contact end is arranged on the second line adapter plate and is used for contacting with a voltage test probe in the static aging test device.

After the structure is adopted, when a static aging test in a single capacitor form is carried out, the loading disc can be placed in the static aging test device for static aging in a mode of placing the loading disc in the aging fixture, and for the dynamic aging test in the single capacitor form, the loading disc can be placed on the conveying device to be conveyed in the tunnel furnace, and the probe card is controlled by the driving device to be pressed downwards to enable the probe to be in contact with each capacitor electrode in the loading disc to realize power-on aging, so that the static aging and the dynamic aging of a single capacitor can be realized through the device, and the capacitor can be always kept in the loading disc.

Drawings

FIG. 1 is a schematic diagram of a dynamic aging architecture;

FIG. 2 is a schematic view of a burn-in stand;

FIG. 3 is a schematic view of a carrier loader configuration;

FIG. 4 is a schematic diagram of a capacitive coupling circuit installed in a burn-in fixture;

FIG. 5 is a schematic view of a loading tray structure;

FIG. 6 is a schematic structural diagram of a static aging test apparatus;

fig. 7 is a schematic diagram of the burn-in stand placement static burn-in test apparatus.

Detailed Description

<xnotran> , 1, ( ), , 5 , 1 2 ( ), 1 ( CN208224312U , PCB , PCB PCB PCB , PCB ), 1 , 3, 3 301 302, 3 , 4 ( ), 4 , 4 1, 5, ( ), 5 6 ( , , ), 5 1 , ( , </xnotran> A longitudinal slide, etc.) for moving the probe card 5 downward or upward and bringing the probes 6 into contact with or away from the capacitive electrodes.

By adopting the structure, when static aging is carried out, the aging fixture is placed in the capacitance aging box for static aging for a long time, when dynamic aging is carried out, the capacitance is transported by the conveying device 4, when the probe card is placed at a probe card station, the probe card 5 is driven to press down to enable the probe 6 to be pressed on the capacitance electrode for power-on aging, the probe card lifts up the loading disc 1 after aging is completed and is taken away by the conveying device 4, the whole dynamic aging time is short, the operation is convenient, the tunnel furnace is basically in a continuous working state during dynamic aging, the working efficiency is high, the utilization rates of the power supply, the heating device and the driving device required by dynamic aging are higher, and the cost of dynamic aging is lower.

Referring to fig. 4, when the loading discs 1 are installed in the burn-in jig, the capacitor 101 in each loading disc 1 is connected in series with the protection element 102 (which may be a resistor or a constant current diode) and then connected in parallel to the first line adapter board of the burn-in jig, so that the short-circuit hidden danger can be avoided, and at the same time, a box of capacitors can power on all capacitors in the box of loading discs only by powering on the contacts a and B, thereby reducing the number of the power-on contacts and simplifying the structure. Similarly, the burn-in jig is installed in the static burn-in test apparatus through the burn-in stand 7 shown in fig. 2, the burn-in stand 7 includes a second line adapter board (the line adapter board may be a golden finger plug) and a support for supporting, the first line adapter boards of the plurality of burn-in jigs 72 are connected in parallel to the second line adapter board, and the second line adapter boards are used for being connected with the static burn-in test apparatus (for example, connected with slots corresponding to the golden finger plugs), so that the number of power-on contacts can be further reduced.

The number of the aging racks 7 is more than or equal to two, and when one aging rack is in the static aging test device, the other aging racks can be used for installing or disassembling the aging clamp. In order to facilitate the transfer, the aging rack 7 is transferred into the static aging test device through the carrier vehicle 8 shown in fig. 3, the rollers 71 are mounted at the bottom of the aging rack 7, so that the static aging test device can be pushed in or out conveniently, or a plurality of rows of roller tracks can be distributed in the carrier vehicle and the static aging test device to realize the movement of the aging rack. Further, with reference to fig. 6 and 7, the static aging test apparatus 9 is internally connected with the power adding sockets 901 (for example, the abovementioned gold finger slots), and the number and distribution of the second line adapter boards correspond to those of the power adding sockets 901, so that the second line adapter board can be connected to the power adding sockets after the aging rack 7 is directly pushed into the test apparatus. In order to facilitate the operation, a carrier positioning rail 902 is arranged in front of the static aging test device 9, an aging rack positioning rail 801 is arranged on the carrier 8, the aging rack is pushed on the aging rack positioning rail, the carrier is pushed to the carrier positioning rail, and the circuit adapter plate of the aging rack corresponds to the power-on seat of the test device by convenient positioning.

In addition, in order to perform a capacitance contact state test, two ends of the protection element 102 are respectively provided with a test contact point C and a test contact point D, the test contact points are used for connecting a voltage test device, for a single capacitor in parallel, a certain alternating current flows through each capacitor by applying an alternating voltage between the energized contacts a and B, if the current on a certain capacitor is too small or zero, the contact between the capacitor and the probe is poor or open, and the test of the current magnitude is obtained by reading the voltage test device connected with the test contact points.

The first line switching plate of the burn-in clamp is connected with the second line switching plate on the burn-in rack by adopting a Kelvin structure, except for power-on connection, the second line switching plate is provided with a voltage test contact end which is used for contacting with a voltage test probe in the static burn-in test device, so that a test channel for measuring the applied voltage can be arranged as required, and the test channel is finally connected to the voltage test contact end on the second line switching plate through the structure, so that the burn-in voltage on each burn-in clamp can be monitored in the burn-in process.

The above description is only for the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. The utility model provides a capacitance aging device, its includes loading dish, static aging test device, the dynamic aging test device that is used for loading the electric capacity, it is used for putting into the electric capacity and exposes the constant head tank of capacitive electrode to open in the dish to load, load the dish and arrange in through the clamp of smelting always in among the static aging test device, the dynamic aging test device includes tunnel furnace, its characterized in that: the dynamic aging test device further comprises a conveying device penetrating through the tunnel furnace and a plurality of probe card stations arranged along the conveying device, wherein the conveying device is used for conveying a loading disc loaded with capacitors, each probe card station comprises a probe card and a driving device, probes are connected to the probe cards, the distribution of the probes on each probe card corresponds to the distribution of the capacitor electrodes in the loading disc, and the driving devices are used for driving the probe cards to move downwards or upwards and enabling the probes to be in contact with or separated from the capacitor electrodes.

2. A capacitive burn-in apparatus as claimed in claim 1, wherein: when the loading discs are installed in the aging clamp, a capacitor in each loading disc is connected with a protection element in series and then is connected to a first line adapter plate of the aging clamp in parallel; the aging fixture is installed in the static aging test device through an aging rack, the aging rack comprises a second line adapter plate, the first line adapter plate of the aging fixture is connected in parallel and then connected with the second line adapter plate, and the second line adapter plate is used for being connected with the static aging test device.

3. A capacitive burn-in apparatus as claimed in claim 2, wherein: the number of the aging racks is more than or equal to two.

4. A capacitive burn-in apparatus as claimed in claim 2, wherein: the aging rack is transferred into the static aging test device through a carrier loader, and the aging rack is transferred into the static aging test device through rollers from the carrier loader.

5. A capacitive burn-in apparatus according to claim 4, wherein: and the static aging test device is internally connected with a power adding seat, and the number and the distribution of the power adding seat correspond to those of the second line adapter plate.

6. A capacitive burn-in apparatus as claimed in claim 5, wherein: and a carrier loader positioning rail is arranged in front of the static aging test device, and an aging rack positioning rail is arranged on the carrier loader.

7. A capacitive burn-in apparatus as claimed in claim 2, wherein: and two ends of the protection element are respectively provided with a test contact point, and the test contact points are used for connecting a voltage test device.

8. A capacitive burn-in apparatus as claimed in claim 2, wherein: the first line switching board and the second line switching board respectively adopt Kelvin connection structures; and a voltage test contact end is arranged on the second line adapter plate and is used for contacting with a voltage test probe in the static aging test device.