CN217060413U - Rotating disc type capacitance testing device - Google Patents
Rotating disc type capacitance testing device Download PDFInfo
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- CN217060413U CN217060413U CN202123280714.7U CN202123280714U CN217060413U CN 217060413 U CN217060413 U CN 217060413U CN 202123280714 U CN202123280714 U CN 202123280714U CN 217060413 U CN217060413 U CN 217060413U
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Abstract
The utility model provides a carousel formula electric capacity testing arrangement, it adopts the carousel as examining test table, has effectively shortened testing arrangement's length and has simplified equipment structure simultaneously, can will wait to detect electric capacity and directly arrange in on the carousel or take out from the carousel during unloading simultaneously, just so need not be together with loading box unloading, convenient to use. It includes the material loading district, detection zone and unloading district, loading attachment is installed in the material loading district, the probe card that is used for electric capacity to add or detect is installed to the detection zone, unloader is installed in the unloading district, it still includes the marching type carousel, the material loading district, detection zone and unloading district difference evenly distributed are on the marching type carousel, a plurality of constant head tanks have still evenly been seted up on the marching type carousel, be used for placing a plurality of electric capacity that wait to detect in every constant head tank or be used for placing the loading box that loads a plurality of electric capacities, it is connected respectively to distribute the electric capacity that the probe is arranged in with the constant head tank that corresponds or loads in the box on the probe card.
Description
Technical Field
The utility model relates to a capacitance performance testing device technical field specifically is a carousel formula capacitance testing device.
Background
A chip capacitor, such as a tantalum capacitor, a solid aluminum capacitor and the like, needs a testing device with high efficiency and low cost in production, and is a capacitor with electrodes at two ends. With the technical development of chip capacitors, a capacitor variety with a large capacitance value, high voltage resistance and a small size appears, and the capacitor can replace film capacitors with large sizes and other traditional capacitors and is applied to the field with high reliability requirements. In order to ensure the performance of the capacitors, the capacitors need to be tested after production, such as various parameters including capacity, loss, ESR ac test, leakage current, and the like.
Traditional testing arrangement generally adopts the rail mounted, for example the patent that publication number is CN210753855U discloses a check out test set for electronic components, it includes the material loading district, the detection zone, the unloading district, set up the linear delivery track that is between material loading district and unloading district, the material loading district will load the unified box that loads that has electric capacity and place on the delivery track, then detect the electric capacity that loads in the box in the unification through the detection probe card of detection zone, later load the box through the unloading district will detect after unify and carry out the unloading, the testing arrangement length that adopts above-mentioned structure is longer, be unfavorable for spatial arrangement, simultaneously, need additionally shift through the mechanism between each region and load the box, lead to equipment structure complicacy.
SUMMERY OF THE UTILITY MODEL
Longer, the inconvenient, the complicated problem of structure of use of testing arrangement length to traditional rail mounted, the utility model provides a carousel formula electric capacity testing arrangement, it adopts the carousel as examining test table, has effectively shortened testing arrangement's length and has simplified equipment structure simultaneously, convenient to operate and use.
The technical scheme is as follows: the utility model provides a carousel formula electric capacity testing arrangement, its includes feeding area, detection zone and unloading district, feeding device is installed in the feeding area, the probe card that is used for electric capacity to add or detect is installed to the detection zone, unloader, its characterized in that are installed to the unloading district: the device comprises a stepping turntable, a feeding area, a detection area and a discharging area are respectively and uniformly distributed on the stepping turntable, a plurality of positioning grooves are further uniformly formed in the stepping turntable, a plurality of capacitors to be detected or loading boxes loaded with a plurality of capacitors are placed in each positioning groove, the positioning grooves are distributed along the radius direction of the stepping turntable, a feeding device is used for placing the capacitors or the loading boxes in the positioning grooves, the discharging device is used for taking the capacitors or the loading boxes out of the positioning grooves, and probes are distributed on a probe board and used for being respectively connected with the capacitors in the corresponding positioning grooves or the capacitors in the loading boxes.
It is further characterized in that:
the interval angle of the adjacent positioning grooves is a, the detection area further comprises more than or equal to one detection station, when the number of the detection stations is more than 1, the interval angle between every two detection stations is d, d = nxa, and n is a positive integer;
the spacing angle between the adjacent positioning grooves is a, the spacing angle between the feeding area and the detecting area is b, the spacing angle between the detecting area and the discharging area is c, b = l × a, c = m × a, and l and m are positive integers respectively;
the detection area comprises one or more of a leakage current measurement station, a capacity loss measurement station, an ESR value measurement station and a current surge test station, and when the detection area comprises the leakage current measurement station, a power-on station is also arranged in front of the leakage current measurement station;
the capacitor to be detected is in a strip shape, each positioning groove is used for accommodating the strip capacitor, and the distribution mode of the probes on the probe board corresponds to the pin distribution mode of the strip capacitor;
the capacitor to be detected is granular, and each positioning groove is internally provided with an accommodating groove for accommodating a single capacitor;
the electrodes of the capacitor are positioned at one end of the capacitor, and the distribution mode of the probes on the probe board corresponds to the distribution mode of the electrodes;
the electrode is arranged upwards, and the probe board is positioned above the stepping turntable and used for moving downwards to enable the probe of the probe board to be pressed on the electrode during detection;
the electrode is arranged downwards, a through hole for a probe to extend into is formed in the bottom of the accommodating groove, the position of the through hole corresponds to the position of the electrode of the capacitor, the probe board comprises a pressing probe board positioned above the stepping turntable and a test probe board positioned below the stepping turntable, the pressing probe board is connected with a pressing probe for pressing and covering the capacitor, and the test probe board comprises a test probe for penetrating through the through hole to be contacted with the electrode;
the electrode of electric capacity is located its upper and lower both ends, the through hole that is used for the probe to stretch into is seted up to the holding tank bottom, the position of through hole corresponds with the position of the electrode of electric capacity, the probe card is including being located step-by-step carousel top push down the probe card and being located step-by-step carousel below last pressure probe card, push down the probe card with on push up and be connected with test probe respectively, push down the test probe of probe card with on push up the test probe of probe card be used for respectively with electric capacity top and below electrode contact.
After having adopted such structure, through adopting the carousel as the device that bears the weight of electric capacity, compare in rail mounted's testing arrangement, can effectively reduce device length, need not additionally set up the transfer mechanism that is used for shifting electric capacity between material loading and unloading district and detection zone simultaneously, can simplify equipment, convenient to use.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic top view of the present invention;
FIG. 3 is a schematic diagram of a striped capacitor;
FIG. 4 is a schematic diagram of the capacitance of the same electrode at the same end during testing;
FIG. 5 is a schematic diagram of the capacitance of the electrodes at the upper and lower ends during testing.
Detailed Description
As shown in fig. 1 and fig. 2, a rotating disc type capacitance testing device includes a loading area, a detection area, and a blanking area, where the loading area is provided with a loading device 1, the detection area is provided with a probe card 2 for capacitance energization or detection, the blanking area is provided with a blanking device, and the loading area, the detection area, and the blanking area are respectively and uniformly distributed on the rotating disc 3, the rotating disc 3 is also uniformly provided with a plurality of positioning slots 4, each positioning slot 4 is used for placing a plurality of capacitors to be tested, or a loading box with capacitors can be directly placed into the positioning slots 4, the positioning slots 4 are distributed along the radius direction of the rotating disc 3, the loading device 1 (such as a loading funnel or a loading sucker) is used for placing the capacitors or the loading box into the positioning slots 4, the blanking device (such as a sucker) is used for taking the capacitors or the loading box out of the positioning slots 4, probes are distributed on the probe board 2 and used for being respectively connected with the capacitors in the corresponding positioning grooves or the capacitors in the loading box, the capacitors are connected into a test circuit (test meter) or a power-up circuit through the probes, and because the mode of directly testing the capacitors in the loading box is similar to the test mode mentioned in the background technology, the embodiment is described in a mode of directly placing the capacitors in the positioning grooves.
The so-called stepping type rotary disc is a rotary disc which stops for a period of time after rotating for a fixed angle each time, the stopping time is determined according to the time required by the longest station in use and can be driven by connecting with a stepping motor, for this reason, the interval angle of adjacent positioning grooves 4 is a, the detection area also comprises more than or equal to one detection station, when the number of the detection stations is more than 1, the interval angle between each detection station is d, d = nxa, and n is a positive integer, so that after the rotary disc rotates for one or more a angles each time, the positioning groove can be positioned at each detection station, and each positioning groove can be detected.
In addition, because the feeding may be static feeding (feeding when the turntable is static) or dynamic feeding (feeding when the turntable rotates, the diagram shows dynamic feeding), when the turntable is statically fed, the interval angle between adjacent positioning slots is a, the interval angle between the feeding area and the detection area is b, the interval angle between the detection area and the blanking area is c, b = l × a, c = m × a, and l and m are positive integers, after the turntable rotates by one or more a angles, the positioning slots are located in the feeding area and the blanking area, so as to feed and discharge each positioning slot.
The detection area specifically includes one or more in leakage current measurement station, capacity loss measurement station, ESR value measurement station and the experimental station of electric current surge, when the detection area includes leakage current measurement station, still installs before the leakage current measurement station and adds the electric station.
Because the chip capacitors are different in shape, when the capacitor to be detected is in a strip shape as shown in fig. 3, each positioning groove is used for accommodating the strip capacitor, the distribution mode of the probes on the probe board corresponds to the distribution mode of the pins of the strip capacitor, and the probes are pressed on the pins of the strip capacitor by controlling the probe board to be pressed downwards, so that the capacitor is connected into a detection and power-up circuit.
And when waiting to detect the electric capacity and being the graininess, be equipped with the holding tank 5 that is used for holding single electric capacity in every constant head tank 4, a electric capacity has been placed to every holding tank.
When the capacitance is the capacitance where an electrode of a capacitance such as a tantalum capacitance is located at one end thereof, the distribution of the probes on the probe card 2 corresponds to the distribution of the electrode. Specifically, if the electrodes are arranged upward, the probe card is located above the step turntable 3 and is used to move downward by an up-and-down moving mechanism (e.g., an air cylinder) to press its probes against the electrodes at the time of inspection. When the electrodes are arranged downwards, as shown in fig. 4, the bottom of the accommodating groove 5 is provided with a through hole 6 for a probe to extend into, the position of the through hole 6 corresponds to the position of the electrode of the capacitor, the probe board 2 comprises a pressing probe board 21 positioned above the stepping turntable and a test probe board 22 positioned below the stepping turntable, the pressing probe board 21 is connected with a pressing probe 23 for pressing above the capacitor, the test probe board 22 comprises a test probe 24 for passing through the through hole 6 to contact with the electrode, and thus the probe above presses against the capacitor to enable the probe below to press on the capacitor electrode.
When the electrode of electric capacity is located its upper and lower both ends (for example ceramic electric capacity), holding tank 5 bottom is seted up and is used for the through-hole 6 that the probe stretched into, the position of through-hole 6 corresponds with the position of the electrode of electric capacity, the probe card is including being located the probe card 25 that pushes down of marching type carousel 2 top and being located the probe card 26 that pushes up of marching type carousel below, push down and be connected with test probe 24 on probe card 25 and the probe card 26 that pushes up respectively, the test probe 24 of pushing down probe card 25 and the test probe 24 of the probe card 26 that pushes up are used for contacting with the electrode of electric capacity top and below respectively.
In addition, the capacitance measuring device can further comprise an appearance detection station, the appearance of the capacitor is shot and detected through a camera, a screening station can be further arranged to screen unqualified capacitors, the capacity loss measuring station can be combined with the ESR value measuring station into one station or can be divided into two stations, two groups of charging stations and leakage current testing stations can be provided, each capacitor is tested in a 4-pin Kelvin mode by a probe card at the ESR testing station, and the probe card is pressed on electrodes of all capacitors of the current capacitor group at one time.
The scheme of the turntable type testing device for the chip electrolytic capacitors is simple in turntable movement structure, probes at all stations are easy to arrange, loading and unloading operations are easy to realize, the operation speed of all operations is slow, the operation is easy to realize by a simple structure, the reliability of the device is easy to improve, the cost of the device is greatly reduced, and the turntable type testing device is suitable for full-automatic testing of the chip capacitors with large capacity.
Claims (10)
1. The utility model provides a carousel formula electric capacity testing arrangement, its includes feeding area, detection zone and unloading district, feeding device is installed in the feeding area, the probe card that is used for electric capacity to add or detect is installed to the detection zone, unloader, its characterized in that are installed to the unloading district: the detection device comprises a probe board and is characterized by further comprising a stepping turntable, wherein the feeding area, the detection area and the discharging area are respectively and uniformly distributed on the stepping turntable, a plurality of positioning grooves are further uniformly formed in the stepping turntable, a plurality of capacitors to be detected or loading boxes loaded with a plurality of capacitors are arranged in each positioning groove, the feeding device is used for placing the capacitors or the loading boxes in the positioning grooves, the discharging device is used for taking the capacitors or the loading boxes out of the positioning grooves, and probes are distributed on the probe board and are respectively connected with the capacitors in the corresponding positioning grooves or the capacitors in the loading boxes.
2. The capacitance measuring device of claim 1, wherein: the constant head tank is followed the radial direction of marching type carousel distributes, and is adjacent the interval angle of constant head tank is a, the detection zone still includes more than or equal to one detection station, works as when the quantity of detection station is greater than 1, each the spaced angle is d between the detection station, and d = nxa, and n is the positive integer.
3. The rotating disc type capacitance testing device as claimed in claim 1 or 2, wherein: the interval angle between the adjacent positioning grooves is a, the interval angle between the feeding area and the detection area is b, the interval angle between the detection area and the blanking area is c, b = l × a, c = m × a, and l and m are positive integers respectively.
4. The capacitance measuring device of claim 2, wherein: the detection zone includes one or more in leakage current measurement station, capacity loss measurement station, ESR value measurement station and the experimental station of electric current surge, works as when the detection zone includes leakage current measurement station, still install before the leakage current measurement station and add the electric station.
5. The capacitance measuring device of claim 1, wherein: the capacitor to be detected is in a strip shape, each positioning groove is used for accommodating the strip capacitor, and the distribution mode of the probes on the probe board corresponds to the distribution mode of pins of the strip capacitor.
6. The capacitance measuring device of claim 1, wherein: wait to detect electric capacity and be the graininess, every be equipped with the holding tank that is used for holding single electric capacity in the constant head tank.
7. The rotating disc type capacitance testing device as claimed in claim 6, wherein: the electrode of the capacitor is positioned at one end of the capacitor, and the distribution mode of the probes on the probe board corresponds to that of the electrode.
8. The capacitance measuring device of claim 7, wherein: the electrode is arranged upwards, and the probe card is positioned above the stepping turntable and used for moving downwards to enable the probe of the probe card to be pressed on the electrode during detection.
9. The rotating disc type capacitance testing device as claimed in claim 7, wherein: the electrode is arranged downwards, a through hole used for the probe to stretch into is arranged at the bottom of the containing groove, the position of the through hole corresponds to the position of the electrode of the capacitor, the probe plate comprises a pressing probe plate positioned above the stepping turntable and a test probe plate positioned below the stepping turntable, a pressing probe connected to the pressing probe plate is used for pressing the capacitor, and the test probe plate comprises a test probe used for penetrating the through hole and contacting the electrode.
10. The rotary disc type capacitance testing device according to claim 6, wherein: the electrode of electric capacity is located its upper and lower both ends, the through hole that is used for the probe to stretch into is seted up to the holding tank bottom, the position of through hole corresponds with the position of the electrode of electric capacity, the probe card is including being located step-by-step carousel top push down the probe card and being located step-by-step carousel below last pressure probe card, push down the probe card with be connected with test probe on the last pressure probe card respectively, push down the test probe of probe card with the test probe of last pressure probe card is used for contacting with the electrode of electric capacity top and below respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123280714.7U CN217060413U (en) | 2021-12-24 | 2021-12-24 | Rotating disc type capacitance testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123280714.7U CN217060413U (en) | 2021-12-24 | 2021-12-24 | Rotating disc type capacitance testing device |
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| CN217060413U true CN217060413U (en) | 2022-07-26 |
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| CN202123280714.7U Active CN217060413U (en) | 2021-12-24 | 2021-12-24 | Rotating disc type capacitance testing device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117572039A (en) * | 2023-11-17 | 2024-02-20 | 广东微容电子科技有限公司 | Test device and test method for chip three-terminal capacitive filter |
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2021
- 2021-12-24 CN CN202123280714.7U patent/CN217060413U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117572039A (en) * | 2023-11-17 | 2024-02-20 | 广东微容电子科技有限公司 | Test device and test method for chip three-terminal capacitive filter |
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