CN109444618A - A kind of electronic component Current Voltage ageing tester and method - Google Patents

A kind of electronic component Current Voltage ageing tester and method Download PDF

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Publication number
CN109444618A
CN109444618A CN201811617898.1A CN201811617898A CN109444618A CN 109444618 A CN109444618 A CN 109444618A CN 201811617898 A CN201811617898 A CN 201811617898A CN 109444618 A CN109444618 A CN 109444618A
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China
Prior art keywords
plate
workpiece
monitor station
groups
conductive pin
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CN201811617898.1A
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Chinese (zh)
Inventor
李国志
刘玲玲
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Suzhou Burret Esther Electronic Technology Co Ltd
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Suzhou Burret Esther Electronic Technology Co Ltd
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Application filed by Suzhou Burret Esther Electronic Technology Co Ltd filed Critical Suzhou Burret Esther Electronic Technology Co Ltd
Priority to CN201811617898.1A priority Critical patent/CN109444618A/en
Publication of CN109444618A publication Critical patent/CN109444618A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/003Environmental or reliability tests

Abstract

The invention discloses a kind of electronic component Current Voltage ageing testers in electronic component technology field, the top slide of the monitor station is equipped with detection support plate, and microscope carrier conductive plate is installed on monitor station, two groups of sidesway motion blocks being symmetrically installed are provided at the top of the pedestal, and two groups of sidesway motion blocks are symmetricly set on the two sides of monitor station, two groups of sidesway motion blocks are provided with return mechanism close to the side of monitor station, and the bottom of two groups of sidesway motion blocks is bolted with clamping screw by positive/negative thread, side conductive pin is plugged on the outer wall for surveying detection plate, the stability that workpiece has in the detection process, and while the side detection plate of two groups of relative movements facilitates side conductive pin to be put into, the conductive pin of multiple groups setting can carry out the detection of multiple workpiece, effectively raise working efficiency, it avoids and causes conduction because clamping force is excessive The damage of needle and workpiece, can electric current to workpiece and voltage individually tested, can also Current Voltage test simultaneously, bring detection it is convenient while, also effectively protect workpiece for measurement, reduce production cost.

Description

A kind of electronic component Current Voltage ageing tester and method
Technical field
The present invention relates to electronic component technology field, specially a kind of electronic component Current Voltage ageing tester and side Method.
Background technique
Electronic component is the basis for forming electronic product, understands the type of common electronic component, properity and can be just Really selecting is to learn, grasp the basic of electronic technology, with the rapid development in electronics technology field, to the stabilization with electronic component The requirement of property and reliability is also gradually increasing, and checks electronic component by high temperature ageing test in electronic components test Electrode whether there is defects and hidden dangers, and element is often welded on the detection mode for damaging formula by existing degradation On pcb board, the product after testing is abandoned because of damage often, for this purpose, it is proposed that a kind of electronic component Current Voltage is old Change test device and method.
Summary of the invention
It is above-mentioned to solve the purpose of the present invention is to provide a kind of electronic component Current Voltage ageing tester and method The problem of being proposed in background technique.
To achieve the above object, the invention provides the following technical scheme: a kind of electronic component Current Voltage burn-in test fills It sets, including pedestal, stabilizer blade is provided at the bottom four corners of the pedestal, the right hand top of the pedestal is fixedly installed with detection Platform, the top slide of the monitor station are equipped with detection support plate, and microscope carrier conductive plate is equipped on monitor station, the top of the pedestal Portion is provided with two groups of sidesway motion blocks being symmetrically installed, and two groups of sidesway motion blocks are symmetricly set on the two sides of monitor station, two groups of sidesways Motion block is provided with return mechanism close to the side of monitor station, and the bottom of two groups of sidesway motion blocks is bolted with folder by positive/negative thread The left end of tight screw rod, the clamping screw is connect by bearing with pedestal, and the right end of clamping screw and setting are on the right side of pedestal Knob connection, and offered on monitor station with clamping screw match through through-hole, the top of the sidesway motion block is arranged There is survey detection plate, side conductive pin be plugged on the outer wall for surveying detection plate, and survey at the top of detection plate to be equipped with and flank terminal, The side conductive pin extends to the inner cavity of detection support plate through monitor station, and the left side top of the pedestal is equipped with column, described Fixed link is installed, and the right side activity of fixed link is plugged with telescopic rod, and the top of fixed link on the top right side outer wall of column Portion is equipped with the caging bolt being bonded through fixed link with telescopic rod, and the right end of the telescopic rod is connected with supporting table, the branch It is separately installed with turntable and fixed cylinder at the top and bottom of support platform, and the bottom of turntable is connected with power screw by bearing, institute The inner cavity for stating fixed cylinder is plugged with retracting cylinder, and power screw is plugged on the inner cavity of retracting cylinder, the bottom connection of the retracting cylinder There is upper detection plate, and binding post is installed in the outer right wall of upper detection plate, and the bottom of upper detection plate is plugged with and above connects The upper conductive pin that terminal is electrically connected, and upper conductive pin is located at the top of detection support plate.
Preferably, the detection support plate includes plummer, and the bottom of the plummer is provided with to be slidably connected with monitor station Support slipper, and notch is offered at the top of plummer, and offer on the two sides frid of plummer and side conductive pin The compatible pin hole of size, the two sides of the plummer are symmetrically installed with fixture.
Preferably, the fixture includes the fixinig plate that two groups of structures are identical and are bonded with plummer outer wall, the fixinig plate On be plugged with clamping bar, and clamping bar extends to the inner cavity of plummer, end of the clamping bar on the outside of fixinig plate through plummer It is connected with limit film, and the other end of clamping bar is connected with intermediate plate, and the outer wall of clamping bar is socketed with stress spring, and stress spring One end and the back of intermediate plate connect, and the other end of stress spring and the inner wall of plummer connect.
Preferably, the survey detection plate includes side plate body, and the inner cavity of the side plate body is equipped with conductive sheet, and conductive sheet Top is connect by conducting wire with terminal is flanked, and has the conductive hole for offering and matching with side conductive pin on the side plate body, and The top of conductive hole passes through the fan-shaped groove body opened up and conductive sheet connection, and side conductive pin is contacted by conductive hole with conductive sheet.
Preferably, the return mechanism includes support tube, and the left end of the support tube, which is provided with, to be connect with sidesway motion block Support chip, and the right end of support tube is socketed with slip pipe, and the right end of slip pipe is connected with contact chip, and the phase of support chip and contact chip Two sides inner wall is connect with the both ends of returning spring respectively, and returning spring is socketed on the outer wall of support tube and slip pipe.
Preferably, the retracting cylinder includes cylinder, and limit transverse sheet, and the bottom of fixed cylinder are connected at the top of the cylinder Inner cavity offers the limit translot to match with limit transverse sheet, vertical draw runner is provided on the two sides outer wall of the cylinder, and solid The inner wall of safety barrel offers the vertical chute to match with vertical draw runner, and the inner wall of the cylinder offers and power screw phase The internal thread groove matched.
A kind of electronic component Current Voltage ageing testing method, the test method include the following steps:
S1: pulling open two groups of fixinig plates, workpiece to be detected be put into the notch of plummer, unclamps fixinig plate, clamping bar is in stress Under the action of spring, so that two groups of intermediate plates are mutually shifted, by Workpiece clamping to be detected;
Workpiece: being installed on monitor station, turn knobs by S2 by the mutual cooperation of support slipper and support draw runner, so that clamping Screw rod rotation, two groups move toward one another with right-and-left threaded sidesway motion block, so that having the side detection plate phase of side conductive pin Mutually mobile, the energization end of side conductive pin passes through pin hole and a termination electrode of workpiece connects, connecing on return mechanism at this time The connection of the outer wall of contact and monitor station, by the effect of returning spring and slip pipe, comes so that clamping force will not be led because of excessive Cause workpiece damage;
S3: the side conductive pin that is inserted into conductive hole and conductive sheet contact with each other, the termination electrode electricity of side conductive pin and workpiece Connection, and microscope carrier conductive plate be electrically connected with another termination electrode of workpiece, by microscope carrier conductive plate with flank terminal and be passed through external electricity Source, so that it may carry out electric current burn-in test;
S4: turning knob, so that two sides sidesway motion block, far from monitor station, the connection of the termination electrode of side conductive pin and workpiece disconnects, The displacement of fixed link and telescopic rod, rotating table are adjusted, power screw rotates, and the retracting cylinder being spirally connected therewith moves down, so that Upper conductive pin is electrically connected with the target of workpiece, microscope carrier conductive plate and upper binding post is passed through external power supply, so that it may carry out Voltage aging test;
S5: while starting step S3 and S4, it by microscope carrier conductive plate, flanks terminal and upper binding post while being passed through external power supply, just It can carry out Current Voltage burn-in test.
Compared with prior art, the beneficial effects of the present invention are: apparatus structure is stablized, workpiece to be measured is put into plummer Notch in, be fixed by fixture, so that the stability that workpiece has in the detection process, and two groups of relative movements Side detection plate while facilitate side conductive pin to be put into, it is convenient also to bring to operation, and the conductive pin of multiple groups setting can carry out more The detection of a workpiece, effectively raises working efficiency, and the contact chip of return mechanism is and monitor station outer wall in clamp operation Contact and separate, avoids because clamping force is excessive and causes the damage of conductive pin and workpiece, after microscope carrier conductive plate is powered, The independent energization of side conductive pin and upper conductive pin is powered simultaneously, can electric current to workpiece and voltage individually surveyed Examination, can also Current Voltage test simultaneously, bring detection it is convenient while, also effectively protect workpiece for measurement, reduce life Produce cost.
Detailed description of the invention
Fig. 1 is schematic structural view of the invention;
Fig. 2 is present invention detection carrying board structure schematic diagram;
Fig. 3 is present clip structural schematic diagram;
Fig. 4 is detection plate structural schematic diagram in side of the present invention;
Fig. 5 is return mechanism structural schematic diagram of the present invention;
Fig. 6 is telescopic cylinder structure schematic diagram of the present invention.
In figure: 1 pedestal, 2 stabilizer blades, 3 detection support plates, 31 plummers, 32 support slippers, 33 notches, 34 pin holes, 35 fixtures, 351 fixinig plates, 352 clamping bars, 353 limit films, 354 intermediate plates, 355 stress springs, 4 side detection plates, 41 side plate bodies, 42 conductive sheets, 43 conductive holes, 5 return mechanisms, 51 support tubes, 52 support chips, 53 slip pipes, 54 returning springs, 55 contact chips, 6 retracting cylinders, 61 Body, 62 limit transverse sheets, 63 vertical draw runners, 64 internal thread grooves, 7 monitor stations, 8 microscope carrier conductive plates, 9 sidesway motion blocks, 10 side conductive pins, 11 flank terminal, 12 clamping screws, 13 knobs, 14 columns, 15 fixed links, 16 telescopic rods, 17 caging bolts, 18 supporting tables, 19 Turntable, 20 fixed cylinders, 21 power screws, detection plate on 22, binding post on 23, conductive pin on 24.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other Embodiment shall fall within the protection scope of the present invention.
Fig. 1-6 is please referred to, the present invention provides a kind of technical solution: a kind of electronic component Current Voltage ageing tester, Including pedestal 1, stabilizer blade 2 is provided at the bottom four corners of pedestal 1, the right hand top of pedestal 1 is fixedly installed with monitor station 7, inspection The top slide of scaffold tower 7 is equipped with detection support plate 3, and microscope carrier conductive plate 8 is equipped on monitor station 7, and the top of pedestal 1 is provided with Two groups of sidesway motion blocks 9 being symmetrically installed, and two groups of sidesway motion blocks 9 are symmetricly set on the two sides of monitor station 7, two groups of sidesway motion blocks 9 Side close to monitor station 7 is provided with return mechanism 5, and the bottom of two groups of sidesway motion blocks 9 is bolted with folder by positive/negative thread The left end of tight screw rod 12, clamping screw 12 is connect by bearing with pedestal 1, and the right end of clamping screw 12 and setting are in pedestal 1 The knob 13 on right side connects, and offers on monitor station 7 and run through through-hole, the top of sidesway motion block 9 with what clamping screw 12 matched Portion, which is provided with, surveys detection plate 4, surveys on the outer wall of detection plate 4 and is plugged with side conductive pin 10, and side conductive pin 10 can be set to Multiple groups, it is convenient that multi-group workpiece is tested, working efficiency is improved, and the top for surveying detection plate 4 is equipped with and flanks terminal 11, side Conductive pin 10 extends to the inner cavity of detection support plate 3 through monitor station 8, and the left side top of pedestal 1 is equipped with column 14, column 14 Fixed link 15 is installed, and the right side activity of fixed link 15 is plugged with telescopic rod 16 on top right side outer wall, and fixed link 15 Top is equipped with the caging bolt 17 being bonded through fixed link 15 with telescopic rod 16, and the right end of telescopic rod 16 is connected with supporting table 18, the top and bottom of supporting table 18 are separately installed with turntable 19 and fixed cylinder 20, and the bottom of turntable 19 is connected by bearing Dynamic screw rod 21, the inner cavity of fixed cylinder 20 is plugged with retracting cylinder 6, and power screw 21 is plugged on the inner cavity of retracting cylinder 6, stretches The bottom of cylinder 6 is connected with detection plate 22, and binding post 23 is equipped in the outer right wall of upper detection plate 22, and upper detection plate 22 bottom is plugged with the upper conductive pin 24 being electrically connected with upper binding post 23, and upper conductive pin 24 may be set to be multiple groups, and Upper conductive pin 24 is located at the top of detection support plate 3.
Wherein, detection support plate 3 includes plummer 31, and the bottom of plummer 31 is provided with the branch being slidably connected with monitor station 7 Sliding block 32 is supportted, facilitates the installation and removal of detection support plate 3, so that the detection of workpiece is efficient and convenient, and the top of plummer 31 Portion offers notch 33, offers for placing workpiece to be tested, and on the two sides frid of plummer 31 and side conductive pin The compatible pin hole 34 of 10 sizes, and pin hole 34 is multiple groups, is arranged in parallel on frid, the two sides of plummer 31 are symmetrically installed There is fixture 35, conveniently treats the clamping of test piece;
Fixture 35 includes the fixinig plate 351 that two groups of structures are identical and are bonded with 31 outer wall of plummer, facilitates manual pull-up fixture 35, Clamping bar 352 is plugged on fixinig plate 351, and clamping bar 352 extends to the inner cavity of plummer 31 through plummer 31, clamping bar 352 leans on The end in nearly 351 outside of fixinig plate is connected with limit film 353, and the other end of clamping bar 352 is connected with intermediate plate 354, and clamping bar 352 Outer wall be socketed with stress spring 355, and one end of stress spring 355 is connect with the back of intermediate plate 354, the convenient folder to workpiece Tightly, the other end of stress spring 355 is connect with the inner wall of plummer 31;
Surveying detection plate 4 includes side plate body 41, and the inner cavity of side plate body 41 is equipped with conductive sheet 42, and the top of conductive sheet 42 is by leading Line is connect with terminal 11 is flanked, and has the conductive hole 43 for offering and matching with side conductive pin 10 on side plate body 41, according to quantity Need the insertion of a certain number of conductive pins 10 is easily carried out test preparation, and the top of conductive hole 43 passes through and opens up Fan-shaped groove body and 42 connection of conductive sheet, and side conductive pin 10 is contacted by conductive hole 43 with conductive sheet 42;
Return mechanism 5 includes support tube 51, and the left end of support tube 51 is provided with the support chip 52 connecting with sidesway motion block 9, and props up The right end of support cylinder 51 is socketed with slip pipe 52, and the right end of slip pipe 52 is connected with contact chip 55, and support chip 52 and contact chip 55 Opposite sides inner wall is connect with the both ends of returning spring 54 respectively, avoids defective work piece and conduction occur because clamping force is excessive The phenomenon that needle, and returning spring 54 is socketed on the outer wall of support tube 51 and slip pipe 53;
Retracting cylinder 6 includes cylinder 61, and the top of cylinder 61 is connected with limit transverse sheet 62, and the bottom inner cavity of fixed cylinder 20 offers With the limit translot that matches of limit transverse sheet 62, it is provided with vertical draw runner 63 on the two sides outer wall of cylinder 61, and fixed cylinder 20 Inner wall offers the vertical chute to match with vertical draw runner 63, and the inner wall of cylinder 61 is offered to match with power screw 21 Internal thread groove 64;
A kind of electronic component Current Voltage ageing testing method, the test method include the following steps:
S1: pulling open two groups of fixinig plates 351, workpiece to be detected be put into the notch 33 of plummer 31, unclamps fixinig plate 351, Clamping bar 352 is under the action of stress spring 355, so that two groups of intermediate plates 354 are mutually shifted, by Workpiece clamping to be detected;
S2: workpiece is installed on monitor station 7 by the mutual cooperation of support slipper 32 and support draw runner, turn knobs 13 make Clamping screw 12 is obtained to rotate, two groups move toward one another with right-and-left threaded sidesway motion block 9, so that with side conductive pin 10 Side detection plate 4 is mutually shifted, and the energization end of side conductive pin 10 passes through pin hole 34 and connect with a termination electrode of workpiece, at this time Contact chip 55 on return mechanism 5 is connect with the outer wall of monitor station 7, by the effect of returning spring 54 and slip pipe 53, come so that Clamping force will not lead to workpiece damage because of excessive;
S4: the side conductive pin 10 being inserted into conductive hole 43 contacts with each other with conductive sheet 42, and the one of side conductive pin 10 and workpiece Termination electrode electrical connection, and microscope carrier conductive plate 8 is electrically connected with another termination electrode of workpiece, by microscope carrier conductive plate 8 and flanks terminal 11 are passed through external power supply, so that it may carry out electric current burn-in test;
S5: turning knob 13, so that two sides sidesway motion block 9 is far from monitor station 7, the connection of side conductive pin 10 and the termination electrode of workpiece It disconnects, adjusts the displacement of fixed link 15 and telescopic rod 16, rotating table 19, power screw 21 rotates, the retracting cylinder 6 being spirally connected therewith It moves down, so that upper conductive pin 24 is electrically connected with the target of workpiece, microscope carrier conductive plate 8 and upper binding post 23 is passed through outer Connect power supply, so that it may carry out voltage aging test;
S6: while starting step S4 and S5, by microscope carrier conductive plate 8, flanks terminal 11 and upper binding post 23 while being passed through external electricity Source, so that it may carry out Current Voltage burn-in test.
It although an embodiment of the present invention has been shown and described, for the ordinary skill in the art, can be with A variety of variations, modification, replacement can be carried out to these embodiments without departing from the principles and spirit of the present invention by understanding And modification, the scope of the present invention is defined by the appended.

Claims (7)

  1. It is equal at the bottom four corners of the pedestal (1) 1. a kind of electronic component Current Voltage ageing tester, including pedestal (1) It is provided with stabilizer blade (2), it is characterised in that: the right hand top of the pedestal (1) is fixedly installed with monitor station (7), the monitor station (7) top slide is equipped with detection support plate (3), and microscope carrier conductive plate (8) are equipped on monitor station (7), the pedestal (1) Top is provided with two groups of sidesway motion blocks (9) being symmetrically installed, and two groups of sidesway motion blocks (9) are symmetricly set on the two of monitor station (7) Side, two groups of sidesway motion blocks (9) are provided with return mechanism (5) close to the side of monitor station (7), and two groups of sidesway motion blocks (9) Bottom is bolted with clamping screw (12) by positive/negative thread, and the left end of the clamping screw (12) is connected by bearing and pedestal (1) It connects, and the right end of clamping screw (12) is connect with the knob (13) being arranged on the right side of pedestal (1), and is offered on monitor station (7) Survey detection plate (4), the survey are provided at the top of through-hole, the sidesway motion block (9) with what clamping screw (12) matched It is plugged on the outer wall of detection plate (4) side conductive pin (10), and surveys at the top of detection plate (4) to be equipped with and flank terminal (11), institute State the inner cavity that side conductive pin (10) extend to detection support plate (3) through monitor station (8), the left side top installation of the pedestal (1) Have column (14), be equipped with fixed link (15) on the top right side outer wall of the column (14), and the right side of fixed link (15) is living It is dynamic to be plugged with telescopic rod (16), and the limit being bonded through fixed link (15) with telescopic rod (16) is installed at the top of fixed link (15) Position bolt (17), the right end of the telescopic rod (16) are connected with supporting table (18), the top and bottom point of the supporting table (18) Turntable (19) and fixed cylinder (20) are not installed, and the bottom of turntable (19) is connected with power screw (21) by bearing, it is described The inner cavity of fixed cylinder (20) is plugged with retracting cylinder (6), and power screw (21) is plugged on the inner cavity of retracting cylinder (6), described flexible The bottom of cylinder (6) is connected with detection plate (22), and binding post (23) are equipped in the outer right wall of upper detection plate (22), and The bottom of upper detection plate (22) is plugged with the upper conductive pin (24) being electrically connected with upper binding post (23), and upper conductive pin (24) position In the top of detection support plate (3).
  2. 2. a kind of electronic component Current Voltage ageing tester according to claim 1, it is characterised in that: the detection Support plate (3) includes plummer (31), and the bottom of the plummer (31) is provided with the support slipper being slidably connected with monitor station (7) (32), it and at the top of plummer (31) offers notch (33), and is offered on the two sides frid of plummer (31) and side The compatible pin hole (34) of conductive pin (10) size, the two sides of the plummer (31) are symmetrically installed with fixture (35).
  3. 3. a kind of electronic component Current Voltage ageing tester according to claim 2, it is characterised in that: the fixture It (35) include that two groups of structures are identical and the fixinig plate (351) that is bonded with plummer (31) outer wall, grafting on the fixinig plate (351) Have clamping bar (352), and clamping bar (352) extends to the inner cavity of plummer (31) through plummer (31), the clamping bar (352) is close End on the outside of fixinig plate (351) is connected with limit film (353), and the other end of clamping bar (352) is connected with intermediate plate (354), and The outer wall of clamping bar (352) is socketed with stress spring (355), and the back of one end of stress spring (355) and intermediate plate (354) connects It connects, the other end of stress spring (355) is connect with the inner wall of plummer (31).
  4. 4. a kind of electronic component Current Voltage ageing tester according to claim 1, it is characterised in that: the survey inspection Drafting board (4) includes side plate body (41), and the inner cavity of the side plate body (41) is equipped with conductive sheet (42), and the top of conductive sheet (42) It is connect by conducting wire with terminal (11) is flanked, has to offer on the side plate body (41) and be led with what side conductive pin (10) matched Electric hole (43), and the top of conductive hole (43) passes through the fan-shaped groove body opened up and conductive sheet (42) connection, and side conductive pin (10) It is contacted by conductive hole (43) with conductive sheet (42).
  5. 5. a kind of electronic component Current Voltage ageing tester according to claim 1, it is characterised in that: the reply Device (5) includes support tube (51), and the left end of the support tube (51) is provided with the support chip connecting with sidesway motion block (9) (52), and the right end of support tube (51) is socketed with slip pipe (52), and the right end of slip pipe (52) is connected with contact chip (55), and is supported Piece (52) is connect with the both ends of returning spring (54) respectively with the opposite sides inner wall of contact chip (55), and returning spring (54) covers It connects on the outer wall of support tube (51) and slip pipe (53).
  6. 6. a kind of electronic component Current Voltage ageing tester according to claim 1, it is characterised in that: described flexible Cylinder (6) includes cylinder (61), and limit transverse sheet (62), and the bottom inner cavity of fixed cylinder (20) are connected at the top of the cylinder (61) The limit translot to match with limit transverse sheet (62) is offered, is provided with vertical draw runner on the two sides outer wall of the cylinder (61) (63), and the inner wall of fixed cylinder (20) offers the vertical chute to match with vertical draw runner (63), the cylinder (61) it is interior Wall offers the internal thread groove (64) to match with power screw (21).
  7. 7. a kind of electronic component Current Voltage ageing testing method, it is characterised in that: the test method includes the following steps:
    S1: pulling open two groups of fixinig plates (351), workpiece to be detected is put into the notch (33) of plummer (31), unclamps and fixes Piece (351), clamping bar (352) is under the action of stress spring (355), so that two groups of intermediate plates (354) are mutually shifted, by work to be detected Part clamps;
    S2: by support slipper (32) and support the mutual cooperation of draw runner that workpiece is installed on monitor station (7), turn knobs (13), so that clamping screw (12) rotates, two groups move toward one another with right-and-left threaded sidesway motion block (9), so that having The side detection plate (4) of side conductive pin (10) is mutually shifted, and the energization end of side conductive pin (10) passes through pin hole (34) and workpiece One termination electrode connection, the contact chip (55) on return mechanism (5) at this time are connect with the outer wall of monitor station (7), pass through reply The effect of spring (54) and slip pipe (53) comes so that clamping force will not lead to workpiece damage because of excessive;
    S3: the side conductive pin (10) being inserted into conductive hole (43) contacts with each other with conductive sheet (42), side conductive pin (10) with One termination electrode of workpiece is electrically connected, and microscope carrier conductive plate (8) is electrically connected with another termination electrode of workpiece, by microscope carrier conductive plate (8) it and flanks terminal (11) and is passed through external power supply, so that it may carry out electric current burn-in test;
    S4: turning knob (13), so that two sides sidesway motion block (9) is far from monitor station (7), the end electricity of side conductive pin (10) and workpiece The connection of pole disconnects, and adjusts the displacement of fixed link (15) and telescopic rod (16), rotating table (19), and power screw (21) rotates, The retracting cylinder (6) being spirally connected therewith moves down, so that upper conductive pin (24) is electrically connected with the target of workpiece, by microscope carrier conduction Plate (8) and upper binding post (23) are passed through external power supply, so that it may carry out voltage aging test;
    S5: while starting step S4 and S5, by microscope carrier conductive plate (8), flanks terminal (11) and upper binding post (23) while being passed through External power supply, so that it may carry out Current Voltage burn-in test.
CN201811617898.1A 2018-12-28 2018-12-28 A kind of electronic component Current Voltage ageing tester and method Pending CN109444618A (en)

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